www.ERAPKOREA.co.kr

• Integrated Automatic Test Equipment (ATE) dev.

• Special Exclusive Test Equipment (STE) dev.

• Radar Signal Simulator dev.

• Simulator & CBT dev.

GSE

ERAP GSE

Equipment test sets diagnose LRU and SRU functions, and also check their errors in aeronautic electronic and ground artillery systems. The equipment selectively verifies and validates OFP installed in LRU.

It is built in open modular design to carry out most efficient compatibility for VXI or PXI products. Furthermore, various options are available including analog signals, digital signals, RF, and video signal generation. In certain circumstance, the system can be integrated with power and air coolant.

Ground Support Equipment

ERAP’s GSE

1. GSE (Ground Support Equipment) design, development, and manufacturing to

perfom component test, inspection, and diagnosis for aircrafts, helicopters,

tanks, and radar etc.

2. Custom manufacturing to make a LRU test quicker and more accurate

3. High reliability with AS 9100/ 9110 certifications

4. Utilization of advanced convergence technology including radar signal

processing etc.

5. Factory, deposit, and intermediate-level tests of LRU and SRU

ERAP’s ATE

1. Integrated automatic test equipment

to provide total solutions

2. Design concept of commercial COTS

(Commercial-Off-The Shelf) adopted

by U.S. DOD

3. Interworking with high-tech

electronic communication systems in

the aerospace industry

4. Accuracy, stability, and reliability

assurance through integrated tests,

self-simulation, and diagnostic

software

5. High-technology applicable to high

precision ATE used in state-of-the-art

industries

ERAP’s STE

1. Exclusive test equipments for specific

units and module

2. Analysis of a power signal, types of

applied signals, and expected output

values etc. after circuit analysis of the

UUT (units under test),

3. Semiautomatic or manual test

equipments with built-in a power

supply, measuring instruments, and

necessary special circuits

4. Initial cost minimization compared

with universal test equipments

ERAP GSE

LRU list for MRO capability by ARATSTM 4500

Total Solution System for Engineering Development, Production, and I & D Level MRO

1 Accelerometer Assy 17 Color Multi-function Display System (type B only)

2 Distributed Air Data Module 18 DTS (w/ unit cartridge)

3 Control Stick Transducer 19 Fault Data Recorder

4 Flight Control Test/Flutter Panel 20 Head-up Display

5 Flight Control Computer 21 Interference Blanker Unit

6 Probe Heater Monitor 22 Identification Friend or Foe

7 Rate Gyro Assembly 23 Inertial Navigation System/GPS

8 Rudder/Brake Pedal Transducer Assy 24 Intercom with Video Multiplexer Unit

9 Total Air Temperature Sensor 25 Instrument Landing System

10 Multi-function Air Data Cones 26 Multi-Function Display

11 Control Stick Grip 27 RADAR

12 Throttle 28 RADAR Altimeter

13 Throttle Grip 29 RADAR Warning Receiver

14 ECS Controller 30 Stores Management System

15 Advanced Data Processor (Mission Computer) 31 TACAN

16 Airborne Video Tape Recorder 32 UHF/VHF

GSE Military

ARATSTM 4500

Applicable Platforms

Nomenclature ModelCOMM UHF AN/ARC-187

U/VHF TALON RT-8105HF HF-9500TELETYPE MDM-2201DATALINK CONVERTER MDM-2202AN/ASQ-ICS AN/AIC-39Emergency Transmitter AN/PRT-5Crash Locator System AN/URT-26

NAV INS/SPS LN-100GAvionics Management System FMS-800TACAN AN/ARN-118VOR AN/ARN-147Radar Altimeter AN/APN-194UHF-DF OTPI DF-430LF-DF(ADF) ADF-206FDI MFD-225HSI MFD-225

DATA Digital Computer SET IDHSMagnetic Tape Transport MDLRTactical Display(TACCO,SS3) 20.1” AMLCDTactical Display(Pilot) 10” AMLCDTime Code Generator 9150-3053Key Sets KeyboardData Entry Panel 13” AMLCDPrinter PrinterTactical Display Group 20.1” AMLCD

NAV AFCS AFCSRAWS AN/APQ-107Air Data Computer ADC-2000IFF AN/APX-76, 100

N.AUD MAD/SAD AN/ASQ-508RADAR EL/M-2022A(V)3ESM AN/ALR-95(V)1EO/IRDS AN/AAQ-22

AUD Sono Signal Processor AN/AQS-970CEMPSono Receiver AN/ARR-502Acoustic Test Signal Generator XCASS Generator AN/ASA-76AAnalog Tape Recorder/Rep. AN/AQH-13

ARM Harpoon Launch System Weapon Management SystemTorpedo Presetter Torpedo Pre. Panel

ARATSTM Series

T/A-50

UH-60 F-16

ERAP GSE

RWR Software Support System

GSE Military

Main Functions

Features

UUT (Unit Under Test)

EUT simulation parameters

• Radar signal simulation system for RWR (Radar Warning Receiver) of helicopters such as UH-60 and AH-64 etc.

• Generating and uploading the emitter of RWR equipment mounted on the UH-60 helicopters.

• Enemy threat detection by generating simulated radar signals to the RWR set on the test bench

• Easy-to-use operating program• Simulation up to 40GHz radar signal• Windows-based EID (Emitter Identification

Data) processing program• Self-test function • UPS system• Easy maintenance due to modular

hardware design• Printable EID data (coding sheet,

ambiguity report)• Test Program Language and Tool :

Labview, Visual C

AH-1S, AH-64A/D, CH-47D, MH-47E, UH-60A/L, UH-1N, UH-60Q, MH-60K, OH-58C/D

Stable, Stagger, Switcher, Jitter

RWR (Model APR-39A(V)3 and etc

Application for Tacktical Operation

UH-60

Ah-1S

ARATSTM 1500RF

KT-1/KA-1 Basic / Attack Trainer Total Test Equipment

Main Functions

Features

UUT (Unit Under Test)Automatic test system for various avionics parts of KA-1 aircraft. It performs manual and automatic performance/function inspections by microprocessor technology to verify whether the parts are out-of-order or in normal condition.

• Various KA-1 component test by one test equipment.

• Printable Test reports• LabVIEW & C language-based operating

program

Application for I & D Level MROKT-1, KA-1

Matrix test equipment

Diode

Relay

DC motor driving unit

Wire assembly

Total function test panel

Relay / Time-delay relay

Linear actuator

Pedal controller

Navigation/Collision-avoidance lamp

Landing/taxing lamp

Ejection-seat actuator

FLAP control-handle assembly

Control stick

Liner Operator

Pedal Adjuster

Landing/Runway Light

FLAP Pilot Handle Assemble

Flight Control Matrix

Seat Actuator

Nav iat ion/Prevent ion of collision

Indicator

Relay

KT-1

Control handle

ARATSTM Series

ARATSTM 450

ERAP GSE

UUT (Unit Under Test)EEI, EFI, DC

Application for I & D Level MROKT-1, KA-1

Main Function

LRU Level test equipment (SRU level expandable ) to perform maintenance and problem troubleshooting through functional and operational tests on airborne equipments of a low-speed controller (KO-1 controller), such as EEI, EFI & DC

Features

• Electronic air-borne equipment tester• Supplied to 15th fighter wing• Software: Visual C++/ LabVIEW/ Modular Design• Hardware: VXI System/ Industrial GPIP meter/ Alink-429 Interface unit• Operational voltage : 115, 220 or 240VAC, 47.5~63Hz

ARATSTM 3000 Electronic Total Testing System

GSE Military

Features

Application K1, K1A1

UUT (Unit Under Test)

Main Functions• Automatic test system for various electric units of land

vehicles including K1/K1A1 tanks and aircrafts• Performance test and fault detection of 16 items in 13 kinds

of electrical units/ devices

• Software for precision control• Real-time monitoring of operating test data• Test data storage, management and output• Automatic pass or fail judgement• Printable test reports • Software-LabVIEW-based operating program/

Self-test function included

EUT name Type

Hybrid Network Box (HNB)

Distribution Box• Lamp Circuits• Lamp Pressure Switch

Circuits• Fuel Pump Circuits)

Hybrid Power Distribution Box (HPDB)

Distribution Box (Hybrid Power)

Turret Network Box (TNB)

Turret Network Box• Turret Drive Circuits• Drift Control Circuits• Lamp Circuits• Elevation Rate

Amplifier Circuits• Relay Drive Circuits

Fire Control Electronic Box (FCEU)

Control Unit

Driver Alarm Panel (DAP)

Panel

Driver Indicator Panel (DIP)

Panel

Driver Control Panel (DCP)

Panel

EUT name Type

Launcher Control Panel (LCP)

Power Distribution Panel (Fire Control)

Gunner Control Panel (GCP)

Power Distribution Panel (Fire Control)

Chief Control Panel (CCP)

Power Distribution Panel (Fire Control)

Switch Control Electronic Unit (SCEU)

Switch Control Unit

Pilot Scope Electronic Unit (PSEU)

Control Unit (Power Supply)

Gun/Turret Drive Electronic Unit (GTDEU)

Electronic Unit (Gun / Turret Drive)

ARATSTM Series

ARATSTM 2000 K1,K1A1 Tank Electric Tester I & D Level Diagnostic TPS & MRO Support

ERAP GSE

K1,K1A1 Tank Gyro Tester

Features

Application K1, K1A1

UUT (Unit Under Test) Test Parameter

Main FunctionAutomatic test equipment of gyroscope performance parameters in order by a computer test program

• Features• Software for high-precision control• High-speed control• Instrument and control• Measured value storage• Calibration of measuring instruments, controller• Real-time monitoring of operating test data• Test data storage, management and output• Automatic pass or fail judgement• Printable Test reports

Gyro input volts and frequency Phrase angle

Maximum input rate Linear acceleration error

Maximum gyro output Cross coupling

Gyro AC null Starting power

Gyro output null Running power

Gyro threshold Gyro run up time

Output sensitivity Cable disconnect circuit

Output linearity Phase angle

Low frequency noise Linear acceleration error

Friction & hysteresis

GSE Military ARATSTM 750

Cable Test for K1/K1A1 Tanks

ARATSTM Series

ARATSTM 550C

FeaturesMain Function

Specifications

• Cable insulated resistance measurement• High current transmission & characteristic

measuring • 200ft length measurement available • Testing system between Interface cabling

and 13 different electric line replace units• 13 LRU testing itself and Interface testing

with cabling & harness wiring • Diagnostic and troubleshooting

• Component measurements• Programmable thresholds• Programmable test methods• Wire list programming• Statistical data reporting• Body conductance• Programmable build methods• Shorts testing• Color graphics• Last-circuit retest• Mass bundle cables (up to 1096 points)• Shortest time looping & short test• Various adaptors (60 types)

PARAMETER LOW-VOLTAGE HIGH-VOLTAGE

MODELS Series 90-S9Series 90-S32Series 90L4Series 90L8

Series 90HV-S23Series 90HB

CAPACITY Series 90:Up to 131,072 test pointsSeries 90L4Up to 512 test pointsSeries 90L8Up to1024test points

Series 90HV:Up to 47,104 test pointsSeries 90H8:Up to 512 test points(64-point increments)

CURRENT 0.512 ma to 5.12 ma (Auto ranging) 0.512 ma to 1.0 amp

ISOLATION(Shorts Threshold)

10 ohms to 9.5 Mohms 10 ohms to 9.5 Mohms @ 5 vdc 500 kohms to 1.00 Gohms * (*Depends on test voltage)

CONTINUITY TEST VOLTAGE 5 vdc or 200 mvdc

ISOLATION TEST VOLTAGE 5 vdc or 200 mvdc 5 vdc to 1500 vdc or 200 mvdc

RAMP TIME N/A 40 volts to 10 kvolts per second

RESISTNACE TEST 1.11 ohm to 8.64 Mohms (ㅁ10% ㅁ 1 ohm)

CAPACITNACE TEST Standard Version: 1.11 nf to 9.09 mf (ㅁ 20%)

TEST SPEED Continuity: 500 points/sec, Component: 50 points/sec

High Current: 20 points/secIsolation: 20 points/ sec *(*Plus dwell & ramp-up time)

ERAP GSE

Module (PV Module) Reliability Test System

Power Distribution Unit

System Summary

• Simultaneous assessment of changes in DC output and electrical characteristic (I/V Graph) of various photovoltaic cells.

• Highly reliable results even during the short-term assessments by minimizing possible errors, and increasing the degree of precision.

• Rapid tests of various conditions.

Performance & Features

• Wide-range measurement from mass photovoltaic to small amount cells

• High speed tracking possible • MPPT functions using electronic load • Long-term reliability due to PXI System

application • Measurement of I/V Curve high resolution • Acquisition of accurate yearly/ monthly/

daily data to compare and evaluate performance improvement with data including characteristic curve measurement of photovoltaic cells

Internal Side External Side

DUT (Device Under Test): Photovoltaic Cell

GSE Commercial

Semiconductor Power Cycle Test System

System Summary

Measurement system of changes (defects) occurring from a long-term temperature alteration from high to low, which is a very important factor in thermal design of package used from the development stage of electronic devices to application fields utilizing superior H/W and Labview S/W capabilities

Performance & Features

• Simultaneous test for inner and outer mounted IPM in the controller

• P/S, V/I sensor to supply current to IGBT • Noise elimination by forming SW Module very

closely to DUT • Application of powerful and efficient cooling

system (air-cooling) • Independent or simultaneous tests for multi-

channel power semiconductor (IGBT, FET etc.)

• Power distribution within automatic test equipment• Power Inlet: 3-Phase 380V ± 10% (50Amp)• Power Outlet: 3-Phase ± 10% (More than 3 places with over 10 Amp) Single-Phase ± 10% (More than 5 places with over 15 Amp)• Frequency: 47~63 Hz (Considering service environment)• 19” Rack Mount Type, 4U Size, Aluminum case

DUT (Device Under Test): Power FET

ERAP GSE

Power Cycle Test System

System Summary

Measurement system of changes (defects) occurring from a long-term temperature alteration from high to low, which is a very important factor in thermal design of package used from the development stage of electronic devices to application fields utilizing superior H/W and Labview S/W capabilities

Performance & Features

• Simultaneous test for inner and outer mounted IPM in the controller • P/S, V/I sensor to supply current to IGBT • Noise elimination by forming SW Module very closely to DUT • Application of powerful and efficient cooling system(air-cooling) • Independent or simultaneous tests for multi-channel power semiconductor (IGBT, FET etc.)

photovoltaic cells

DUT (Device Under Test) : Module FET Power FET

GSE Commercial

Thermal Shock 4-wire Test System

System Summary

• Measurement system of changes (defects) for electrical parts occurring from their long-term temperature alteration from high to low, interworking with a temperature chamber.

• Test system to continuously measure, monitor, trouble shoot multi-channel resistance.

Performance & Features

• Continuous measurement of several resistances in order (64~256 channels)

• Application of the 4-wire resistance measurement method

• The precision of resistance measurement with high resolution (22bit)

• Wide range of temperature cycle measurement (-60~160 ℃)

• Effective monitoring of resistance change • Unconstrained channel assignment • Set-up of test periods, measurement locations,

and storage locations

DUT (Device Under Test) : Memory Semiconductor

Head Office: Migun II - #212, Yongsan-dong, Yuseong-gu, Daejeon, Korea T:+82-42-936-1968 F:+82-42-936-1978 Factory: Hansan-gil 16, Cheongbuk-myeon, Pyeongtaek-si, Gyeonggi-do, Korea T:+82-31-684-1968 F:+ 82-31-684-1908Seoul Office: Ace-Hi End 6, 19th Fl. 234, Beotkkot-ro, Geumcheon-gu, Seoul T:+82-2-586-1968 F: +82-2-586-1958 e-mail: Sales@erapkorea.co.kr Website : www.erapkorea.co.kr