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Transcript of EMC TESTING: A LABORATORY’S...
EMC TESTING: A LABORATORY’S PERSPECTIVE
PRESENTED TO THE ROCKFORD CHAPTER OF THE IEEE EMC SOCIETY - MARCH 26TH 2015 BY DEREK WALTON L F RESEARCH
WHAT IS THIS PRESENTATION
ABOUT?
Testing Rather than Design
The intent of Testing
Different Tests
Testing Pitfalls
Some debugging techniques
Laboratory Accreditation
TESTING RATHER THAN
DESIGN
Loads of info on EMC design - Much less on testing
Books
Magazines
Symposiums
Workshops
Training Courses
On-the-job Training
Standards - to a point
THE INTENT OF TESTING
To recreate, in a controlled manner, the environment in which something will operate
To verify a design performs as expected in that environment
To use engineering to overcome impractical test hurdles
To understand whats happening during a test to ensure correct EUT Evaluation
To use repeatable and reproducible methods regardless of test location
To make sure folks are ethical
“THE” EMI TEST AFTER ALL, EMI TESTS ARE ALL THE SAME RIGHT?
The four basic EMI testsConducted Emissions - The measuring of electrical noise leaving an EUT ( mostly ) on electrical conductors
Radiated Emissions - The measuring of electrical noise leaving an EUT by means ( mostly ) of radio waves
Conducted Susceptibility - The behavior of an EUT to electrical noise arriving ( mostly ) on electrical conductors
Radiated Susceptibility - The behavior of an EUT to electrical noise arriving ( mostly ) by means of radio waves
Measuring Conducted Emissions
Why do we measure conducted emissions?
Direct Connection to other devices
Low frequency indirect coupling
How do we measure conducted emissions?
Current monitor probe
Voltage probe
Line Impedance Stabilization Network ( LISN )
Absorbing Clamp
Special Case - Clicks
Conducted Emissions - Background
Are we measuring Voltage or Current?
Voltage? From where to where?
Current? Around what loop?
Conducted Emissions - BackgroundCont…
What should “X” be?
How long should “L” be?
Where do we measure?
Conducted Emissions - Current Monitor Probe
Essentially a transformer with burden resistor
Primary is the wire or bundle under test, secondary the measuring instrument ( MI )
Affords good isolation between EUT and MI
Easy to use clamp on device
Electro-statically shielded
Conversion factor usually called Transfer Impedance units dB Ohms
Same device measures any combination of wires
Conducted Emissions - Voltage Probe
Simple device similar to a current clamp or an oscilloscope probe
CVP has Isolation between EUT and MI, voltage probe has NO Isolation between EUT and MI
Electro-statically shielded
Voltage probe Ideally needs a ground connection close to measurement point - may require floating MI. CVP does not.
Conversion factor usually given in dB
Conducted Emissions - LISN
A lumped representation of impedance
Must have connection to a reference plane for measurement and safety
Sample port provides Non-Isolated signal for the MI
MI needs protection from coupled transients
Conducted Emissions - Absorbing Clamp
A variation on the current probe that tries to control impedance also
Used in place of low frequency Radiated emissions tests
Requires cable “raceway”
Typically requires multiple small sweeps
Conducted Emissions - Clicks
A transient emissions rather than continuous emissions test
Uses LISN
Special receiver or laborious manual test
Mainly used on appliances that switch regularly during operation
Conducted Emissions - Harmonic and Flicker
Most frequently required for Equipment greater than 50 Watts drawing power from the grid
Harmonics is a test to determine how much the EUT distorts the power source
Flicker is a test to determine how much the EUT disturbs the power source amplitude
Measuring Radiated Emissions
Why do we measure Radiated Emissions?
Protect over the Air signals
Minimize risk of causing undesired events
What are ambients?
Test Sites
Tools to measure Radiated Emissions?
Absorbing Clamps
E-Field Antennas
H-Field Antennas
Radiated Emissions - BackgroundMade up of Electric ( E ) and Magnetic ( H ) field components
The “nature” of a radio wave depends on how far you are from the source
Far away: Plane wave.
Ratio of E to H = 377 Ohms
Close in ( often called near-field ): It depends on the source being dI/dt or dV/dt
Ratio of E to H complex
Crossover point λ/2π ( ish )
Radiated Emissions - Ambients
What are Ambients
How can we stop them
Radiated Emissions - Test Sites
Free field Site
Ground Plane
Open Area Test Site ( OATS )
Shield Room
SAC
FAC
Turntable
Mast
Ground Plane
Reverb
Transmission Line Device
Radiated Emissions - Free Field Site
No attempt or inability to control the EMI properties of the area
Often used for in-situ testing
Advantage: Cost, Location
Disadvantage: Ambient Hell
Radiated Emissions - Ground Plane
A conducting plane that resides under the EUT and extends well beyond the area testing takes place
Provides a controlled reference plane consistent between locations
Mimics the local structure where an EUT might finally reside.
Provides an attachment point for measuring and impedance control networks
Radiated Emissions - Ground Plane
Not always the floor of the test area
Military, Aerospace, automotive tests specify a test bench with ground plane on it
Ground plane may be Copper, Aluminum, Brass, Steel, Carbon Fibre, or none
Ground plane “bonded” to chamber by low impedance connections
Physical layout of equipment on the ground plane tightly controlled by test standard
Radiated Emissions - Open Area Test SiteA ground plane constructed to meet a performance criteria typically over 2 frequency ranges:
30 MHz to 1 GHz - NSA
1 GHz to 40 GHz - SVSWR
Above 1 GHz Ground Plane covered by absorber
If covered by an RF transparent structure, NSA and SVSWR need to be volumetric
Needs to be “ Flat ”
Ideally should be Earthed
May require sheet metal in the sweet-spot, mesh may be OK elsewhere.
Edges best “ petaled “
No nearby obstructions that could reflect RF
NSA = +/- 4 dB from ideal
Radiated Emissions - CALTS
High precision ground plane specifically for antenna calibration
NSA = +/- 1 dB
Special Antennas
BIG!
FLAT!
$$$$$$
Radiated Emissions - Background - Shielding
An RF shield works by reflecting the RF - Think mirror and also by absorbing the RF - Think dissipation
Better conductivity/ Thicker material = better shield.
Shield compromised by openings, slots, seams, penetrations ( especially the EUT )
Outside signals reflected away or absorbed
Internal signals from EUT also reflected
Radiated Emissions - Semi-Anechoic Chamber (SAC)
Typically a metal box that has the walls and roof lined with absorber
Ferrite Tiles
Dissipating Cones
Still needs to meet NSA and SVSWR: must be volumetric
Radiated Emissions - Fully Anechoic Chamber (FAC)
Basically a SAC in which the floor is also covered with Absorber material
Used mainly for Radio device testing
Radiated Emissions - Turntable
SAC/FAC kills reflections, what about emissions outside of the direct antenna path?
Turntable rotates so all sides illuminate the antenna
FAC turntable may rotate in X, Y and Z planes.
Turntable must be flush with and bonded to the ground plane
Radiated Emissions - Antenna Mast
What about emissions that don't leave horizontally?
Receive antenna moves up and down a mast. Typically 1 to 4 metres
Antenna must tilt on mast to “boresight” on the EUT.
Radiated Emissions - Reverb Chamber
Conducting box with NO absorbing material
EUT resides in a “sweet-spot” in the chamber
Physical paddle rotates slowly to stir the field
EUT orientation irrelevant
Receive antenna orientation irrelevant
Significantly lower cost to own
Radiated Emissions - Transmission Line Devices
Strip-Line: A plate suspended above a ground plane
Tri-Plate: A plate suspended between two ground planes
TEM Cell: Essentially a co-ax cable with access to the area inside with one end terminated in a resistive load
GTEM: Essentially a co-ax cable with access to the area inside with one end terminated by field absorbing material as well as a restive load
Radiated Emissions - Measuring Tools
More than 1 test antenna needed
Electric fields
Reference ( Roberts ) Dipole
Biconical ( Basket ) Antenna
Log Periodic Dipole Antenna
Hybrid Bi-Log
Horn Antenna
Double Ridged Wave Guide ( DRWG ) Antenna
Monopole Rod
Magnetic Fields
Loop Antenna
Antenna Terminology
Radiated Emissions - Reference Dipole
Often Called the Roberts Dipole
Elements adjustable
Calculable factors for a given element length
Still the FCC reference Antenna
Radiated Emissions - Biconical AntennaSmall diameter elements replaced with “Egg beaters”
Fixed tuning
Newest designs calibrated by Network Analyzer
Preferred FCC test antenna
Radiated Emissions - Log Periodic Dipole Array
A series of different length dipole antennas sharing a common feed
Covers wide frequency range
With the development of NEC factors can be modeled
Preferred FCC test antenna
Radiated Emissions - Bi-Log Antenna
A combination of the biconical and log periodic antennas
Useful over a wide range of frequencies
Undesirable at close test distances
Factors need to be measured
Test Lab preferred antenna
Radiated Emissions - Background
Horn Antenna essentially open ended Waveguide
Used with a “launcher” to adapt horn to co-ax cable
Factors accurately calculable
High Gains possible
Radiated Emissions - DRWG Horn Antennas
Double Ridged Wave Guide Horn ( DRWG ) antenna uses ridges to greatly expand the useable frequency range of a horn antenna
Older DESEC Horn superseded by NEC derived model
Radiated Emissions - Monopole Rod Antenna
Monopole Rod Antenna is arguably not really a antenna
Under most circumstances the test set-up capacitively couples with the rod part of the antenna
Should the Counterpoise be grounded or not? Some antennas cannot support both test set-ups
New version has optical feeder cable
Radiated Emissions - Loop Antenna
Loop antennas are basically all the same, used for Magnetic field measuring
Most models are Electro-statically shielded
Best loops are balanced feeds
DO-160G still using a compass
Radiated Emissions - Absorbing Clamp
Not really an Antenna, but used to determine radiated emissions
Relatively repeatable measurements
Used mainly for Appliance testing
Radiated Emissions - Background
Antenna Factor
Antenna Gain
Directivity
Beam width
Side lobes
Balun Symmetry
Power
VSWR
Radiated Emissions - Background
Measuring Instrument
Receiver
Spectrum Analyser
Preselector
Peak Vs QPeak Vs Average
Cables
Filters
Preamplifiers
Attenuators
Radiated Emissions - Sanity Check
Sanity checks essential in EMC testing
Radiated Emissions best sanity check is a reference radiator
Arguably the best Ref. Rad. is a Spherical Source
Performing Conducted Susceptibility
Frequency Domain Tests
AF Conducted Susceptibility - Hz to MHz
RF Conducted Susceptibility - Hz to GHz
Time Domain Tests
Voltage Variations - Microseconds to Seconds
“Surges”- Milliseconds to Microseconds high energy
“Spikes” - Microseconds to Nanoseconds low energy
ESD
Conducted Susceptibility Background
Why Two Tests?
Conducted AF tests essentially are performed on power leads
The intent is to expose an EUT to the voltage ripple on the power source that is likely to be observed when in use.
Conducted RF tests essentially are performed on all cables
The intent is to SIMULATE the current that would be induced on a cable by an antenna too big/powerful to fit inside a shield room
Conducted Susceptibility AF Tests
Programmable Power Supply: technique supplies both EUT power and the test signal
Test signal may be one frequency OR multiple harmonics combined into a complex wave shape
Mechanism for limiting test signal independent of EUT power needed
Signal Source, Power Amplifier and Coupler: technique separately generates test signal and couples via a transformer or a capacitor
Signal Source normally an ARB
Coupling mechanism usually a transformer
EUT power supply needs protection from the test signal
Test signal difficult to discriminate on power leads due to EUT fluctuations
Conducted Susceptibility AF Tests
Conducted Susceptibility RF Tests
Coupling Decoupling Network: This device isolates the EUT and the support equipment and provides Controlled application of test signal in accordance with the theoretical model
EM Clamp: An injection transformer that contains the ability to add series impedance to the support equipment end of the cable.
Inductive Clamp ( often called a bulk current clamp ) : An RF current transformer
Conducted Susceptibility Coupling Decoupling Network
Designed to force cable impedance to be around 150 Ohms, intrudes into wiring
Intended to be used on all cables entering and leaving an EUT
Test level determined in an RF jig prior to test
Forward power is the control parameter, no limiting
Many different types
Conducted Susceptibility EM Clamp
Construction tightly controlled by CISPR
Intended to try to force EUT cable impedances to 150 Ohms with no intrusion
Test level determined in an RF jig prior to test
Forward power is the control parameter, must use limiting
Conducted Susceptibility Inductive Clamp
RF injection transformer with defined Insertion Loss
Has no ability to control cable impedances
Ideal for in-situ testing, or MIL/Aerospace/Automotive
Tests differ in use:
Forward Power
Net Power
Pre-determined limit
Real Time
Most test use limiting
Conducted Susceptibility Voltage Variations
Intent of these tests is to simulate changes in the power supply voltage and where appropriate frequency
Usually “slow” but have almost no limiting impedance
Often caused by load shedding, power transfer or application of power to a heavy load
Conducted Susceptibility Load Shedding
Typical tests:
Automotive Load Dump
Finite but very high energy change in voltage for hundreds of milliseconds
Aerospace Load Dump
A zero impedance source change in voltage for about a second
EUT must “ride” the event
Test signal derived by dedicated power supply or Surge generator.
Conducted Susceptibility Power Transfer
Fluctuations resulting in power dropping to Zero
Power Grid Load redistribution
Change over of power source
EMI
Cosmic Events
microsecond to multi-second interrupts
Multiple interrupts
Test signal derived by specialized power supply
Conducted Susceptibility Load application
Fluctuations in power that do not result in drop out
Typical causes application of heavy loads
Motors
Starters
RADARs
Ovens, Heaters
Test signal derived by dedicated power supply
Conducted Susceptibility Surges
A relatively short duration increase in power voltage, with significant energy content
A relatively short duration increase in signal voltage on lines that cross regions where changes in potential with respect to Earth is possible
Inter-plant communications
Telephone lines
Indirect Lightning
Test signal usually derived by specific simulator
Conducted Susceptibility Surges
Conducted Susceptibility Spikes
A relatively fast change in power supply voltage, usually the transient source impedance is reflected in the role played by the power cables impedance
Spikes couple on to test cable from adjacent cables and structure.
Not intended to cause damage, more intended to cause upset.
Sources: relay and solenoid coils, Switch contacts, motors, motor drives, indirect lightning
Simulated by switching inductive devices or by specific simulator.
Indirect Lightning
Multiple Burst Lightning
Conducted Susceptibility SpikesAll these spikes are couple onto Interconnect leads
Conducted Susceptibility Electrostatic Discharge
ESD simulates the injection of charge into, or onto an EUT.
Most ESD Simulators represent the human body model: there are a number of them! Most ESD events are only a few nanoseconds long
Aerospace ESD is an Air Discharge test: typically 15 kV
Commercial ESD requires Air and Contact tests, in addition, coupling plane tests are possibly required: typically 8 kV contact and 15 kV Air
Automotive ESD requires Air and also contact including directly onto EUT pins: typically up to 25 kV
Gaming machines may require up to 50 kV!
Conducted Susceptibility Electrostatic Discharge
Air Discharge Contact Discharge
Conducted Susceptibility Electrostatic DischargeHorizontal Coupling Plane Vertical Coupling Plane
Performing Radiated Susceptibility
Frequency Domain Tests
Electric Field Susceptibility - Hz to GHz
Magnetic Field Susceptibility - DC to MHz
Test Philosophies
Time Domain Tests
EMP - Microseconds
Magnetic Fields - typically damped Sine-waves
ESD
Radiated Susceptibility Background
The generation of and Electric, Magnetic or Plane Wave Field
Illegal to transmit without license
Low frequency E-Fields ( typically under 100 MHz ) difficult to generate inside a chamber = $$$$$$
High frequency E-Fields ( typically 100 MHz to low GHz ) relatively easy but still = $$$
Very high frequency E-Fields ( typically a few GHz and up ) need specialized equipment = $$$$$$$$
Magnetic fields relatively easy to generate but caution necessary
High Electric or Magnetic field strengths = $$$$$$ and potentially lethal
Radiated Susceptibility Low Frequency E-Fields
Two Primary techniques:
Transmission Line
E-Field Radiator
Radiated Susceptibility High Frequency E-Fields
Two Primary techniques:
Direct illumination by an Antenna
Indirect illumination in a Reverb chamber
Radiated Susceptibility Very High Frequency E-Fields
Two Primary techniques:
Direct illumination by an Antenna
Indirect illumination in a Reverb chamber, typical upper frequency limit of 40 GHz
Radiated Susceptibility H-Fields
Three Primary techniques:
Partial illumination by a Loop Antenna
Partial illumination by a floor mounted loop Antenna
Complete emersion in a series of coils e.g. Helmholtz
May need to cancel Earths Magnetic Field
Beware of Ferrous Materials
Radiated Susceptibility H-Fields
Radiated Susceptibility - Test Philosophies
IEC Uniform Field Plane i.e. EN61000-4-3
Real Time Illumination and control by field sensor i.e. MIL STD 461F
Substitution of EUT by Field Sensor then use forward power during the test i.e. DO-160G
Reverb Mode-Stirred or Mode-Tuned
Radiated Susceptibility - EN61000-4-3
Establishes a uniform field plane by measuring up to 20 points on a matrix and deriving a single power level replayed during testing
Places the EUT face to be tested in the UFP
Requires repositioning of the EUT to expose all sides
CW and Modulated fields different: Modulation 5.1 dB higher
Radiated Susceptibility - MIL STD 461F
Places one or more field sensors in the test set up and monitors/controls the test in real time
Test is run with modulation applied
CW and Modulation field amplitudes the same
Radiated Susceptibility - RTCA DO-160G
Places one field sensor in the test set up where the EUT normally resides
Replays forward power during the EUT test
Different modulations applied
CW and Modulation field amplitudes the same
Radiated Susceptibility - Reverb
Mode Stirred: No attempt made to position the “paddle” that stirs the field inside the chamber
Mode Tuned: The paddle is positioned in small rational increments, dwelling long enough to expose the EUT through a complete operational cycle
Very high fields possible with low power amplifiers.
Software really desirable to control test.
Radiated Susceptibility EMP
One Primary technique:
Transmission Line
Very high voltage Generator
Very fast pulse
Field measured by D-Dot probe
Radiated Susceptibility DC/Damped Sine H-Field
One Primary technique:
Multiple Coils
Very BIG coil
Very High Current
May need to be field portable
Radiated Susceptibility ESD Magnetic Field
One Primary technique:
Loop
Very high voltage Generator
Very fast pulse
Field measured by B Dot probe
EMC TESTING PITFALLS
Common EUT Pitfalls that ruin EMC Tests
Wrong EUT build, wrong software running
Unrepresentative wiring harness
Wrong wire type, length
Pigtail shields, foil shields
Inappropriate support equipment
Poor monitoring means
Requesting wrong test standard
EMC DEBUGGING TECHNIQUES
EMC Debugging Techniques
Close field Probes
AL Foil and Copper Tape
Ferrite Beads
Current Probes to isolate CM and DM noise
“Tee” filter to aid noise direction
SA 0Hz Span
SA Sweep Rate change
Capacitively coupled sense probe
EM Scan
ACCREDITATION
Laboratory AccreditationA 3rd party review of a test laboratory to assure a minimum performance level
Assessed against the requirements of ISO17025
Requires a management system
Requires MU budgets
Requires Accredited Calibrations
Assessment 1 to 4 days every 2 years
Assessors need to technically challenge the lab on over 3800 current standards (NVLAP)
Little value to a good lab
Raises status of a mediocre lab
Eliminates a bad lab
Required only for a few programs
QUESTIONS?
THANK YOU FOR LISTENING!
DEREK WALTON NCE #438 815 566 5655 WEB:WWW.LFRESEARCH.COM EMAIL:[email protected] LINKED-IN: HTTP://WWW.LINKEDIN.COM/IN/DEREKNWALTON/EN