EMC Analysis for a PCB Mounted Switching regulator using ...
Transcript of EMC Analysis for a PCB Mounted Switching regulator using ...
EMC Analysis for a PCB Mounted Switching regulator using Electromagnetic simulator
A Simple and Practical Measurement-based Modeling Method Proposal for Switching Regulator
A Simple PI Simulation Scheme Using the Model
Mitsuharu UmekawaDec. 1st , 2011
EDA Application EngineeringElectronic Measurement GroupAgilent Technologies
2011/12/1MWE2011-Workshop-04 Yokohama1
MWE2011, EMC Technology Considering RF Noise, Workshop #4Sponsored by IEICE APMC Japan National Committee
Contents
1. Introduction – SI/PI/EMC2. PDN modeling issue – VRM Measurement-based modeling3. Measurement-based DCDC Converter modeling• Evaluation board for VRM• Measurement• De-Embedding connector portion to extract DCDC converter behavior4. PI analysis using the VRM model• Evaluation board for other than VRM• Estimating SI/EMI by simulation using EM and VRM model• Comparison between simulation and measurement and validity discussion 5. Conclusion
2011/12/1MWE2011-Workshop-04 Yokohama2
SI/PI/EMC
2011/12/1MWE2011-Workshop-04 Yokohama3
Signal Integrity EMI/EMS
Power Integrity
0.2 0.4 0.6 0.8 1.0 1.2 1.40.0 1.6
0
20
40
60
80
100
120
-20
140
freq, GHz
Impe
danc
e (o
hm)
PDN Impedance
PDN Ripple causing Signal ripple
PDN(PWR/GND)causing EMI
Signal causing EMI(Normal Mode)
SSN(SSO)→PDN Ripple→Receiver wrong operation
PDN High-impedance forIC operation band
Anti-resonanceat specific frequency
OrganicallyInter-relatedand Interactive
Common Mode EMI for Differential line
Modification
DeCapoptimization
/Layout ModificationModification
DeCapoptimization
/Layout Modification
Modification
Common Mode Filter
/DeCapoptimization
/Layout Modification
Choking Beads
Protocol modification
/Layout Modification
Visualize problems using simulatorto find/predict root-cause,to estimate effectiveness of the measures
PDN modeling and issue
2011/12/1MWE2011-Workshop-04 Yokohama4
VRMIC
Input Impedance=Impedance seen from device
PDN= Power Line + VRM + GND Plane
Basic PDN Modeling Idea
Issue• VRM = DCDC Converter, Integrated Module, Non Adjustable • No easy to have VRM equivalent model
Idea• Measure VRM using VNA as a black box to extract AC characteristics• Simple and practical measurement-based modeling with EM
PWR
GND
EM or Measurement
?
Contents
1. Introduction – SI/PI/EMC
2. PDN modeling issue – VRM Measurement-based modeling
3. Measurement-based DCDC Converter modeling• Evaluation board for VRM• Measurement• De-Embedding connector portion to extract DCDC converter behavior4. PI analysis using the VRM model• Evaluation board for other than VRM• Estimating SI/EMI by simulation using EM and VRM model• Comparison between simulation and measurement and validity discussion 5. Conclusion
2011/12/1MWE2011-Workshop-04 Yokohama5
DCDC Converter Evaluation BoardSynchronous Buck type DCDC ConverterSimplified Schematic
Compensation Circuit
Output Filter
DeCap
DeCap
Vin VoutSwitching Control IC
2011/12/1MWE2011-Workshop-04 Yokohama6
(TI - TPS54310)
DCDC Converter Evaluation BoardConfigured to output 3.36V
2011/12/1MWE2011-Workshop-04 Yokohama7
67[mm]
30[m
m]
1:Buck Type DCDC converter IC [TI, TPS54310]
.1”x.1”, Connected to DCDC converter module
2:Output FilterComposed of a 1.5uF inductor and 180uF polymer capacitor
3:Output Decoupling Capacitor
1000pF ceramic
①
③
②④
⑤
⑥
⑦
⑧
4:Input Decoupling Capacitor10uF ceramic
5:Compensation circuits for feedback system6:Voltage Detection point to TPS54310 feedback pin7:Boardmount Socket
.100”x.100”, 16pins3.36V output, 3A Maximum
8:Power Terminal4-6V input
From DPS
Connection for measurement
2011/12/1MWE2011-Workshop-04 Yokohama8
From DPS(5.5[V] const., 2[A] compliance)
To SMUVNA Port1
VNA Port2
DCDC converter module
Shunt-Through measurement fixture and PCB mounting header for DCDC converter module
67[mm]
30[m
m]
From DPSMeasurementFixture
Test setups
2011/12/1MWE2011-Workshop-04 Yokohama9
①
② ③
④ ⑥⑤
⑦
1:Vectol Network Analyzer [Agilent Technologies, E5061B ]2:Gain/Phase Port
[5Hz-30Mhz]3:S-para Port
[ -3Ghz]
4:DC Power Supply/ Analyzer [Agilent Technologies, N6705 Mainframe]5:CH1 N6762A Precision DPS Module6:CH4 N6781A SMU Module
7:DUTDCDC module and shunt-through impedance measurement fixture
Measurement MethodShunt-Through Method
Shunt-through method has the advantage of measuring low impedance at low frequency.
Zdut = 50 x S21/(2 x (1-S21))where port impedance = 50Ohm
2011/12/1MWE2011-Workshop-04 Yokohama10
Where dynamic range adversely affects measurement result
Where trace noise adversely affects measurement result
DUT Examplelow impedanceat low frequency
ZO=50?dp1
ZO=50?dp2
C=3pFC1
L=240mHL1
Small residual
Calibration3 Standards are used;
LF impedance measurement• Response Through to improve transmission tracking and isolation
– Using this response cal, Inductance factor remains as residual error. For <30Mhz, now this error is thought to be small enough and ignored.
HF impedance measurement• Electrical Cal Module for 2 port full calibration to cable terminal
• 2-port Short for Auto Port extension from cable terminal to DUT
DC Blocking Capacitor
2011/12/1MWE2011-Workshop-04 Yokohama11
DCDC module measurement results
2011/12/1MWE2011-Workshop-04 Yokohama12
Measurement and DUT condition:DCDC module is turned on by DPS and SMU sinks current as electrical load.
• Various current condition shows small difference in impedance at very low frequency where a feed-back loop works.
• At higher than 10kHz frequency range, all measurements show identical response.
200mA600mA1400mA2200mAHF 30MHz-3GHz
Connector intersection
Output filter
Various impedance dependent on sunk current condition
Simplification to model a connector intersectionand EM simulation
bird’s-eye view for a connector intersection
2011/12/1MWE2011-Workshop-04 Yokohama13
EM(FEM)
AgilentADS-FEM
Validity check for EM result
Compensation Circuit
Output Filter
DeCap
DeCap
Vin VoutSwitching Control IC
2011/12/1MWE2011-Workshop-04 Yokohama14
(TI - TPS54310)
High-side SW
Low-sideSW
LDRV
HDRV
When DCDC control IC is turned off, output filter and DeCap are seen from Vout.
Turned off→High Impedance
Validity check for EM result
2011/12/1MWE2011-Workshop-04 Yokohama15
Measurement(Turned off)Filter+ConcectorFilter/DeCap Only(Reference)
• In condition that DCDC control IC is turned off, this shows good correlation between measurement and simulation.
• EM result is valid.
EM result
Filter/Decap
Impe
danc
e [O
hm]
DeEmbedding connector characteristics from DCDC evaluation board measurement result
• DeEmbedded result is about equal to output filter characteristics with DeCap.• Connector intersection is removed as expected generally.
• Measurement-based VRM model• Large reflection by the connector header/socket makes DeEmbedding difficult.
Impe
danc
e [O
hm]
Measurement(1A)DeEmbed resultFilter/DeCap Only(Turned off/Reference)
2011/12/1MWE2011-Workshop-04 Yokohama16
DeEmbedding
DCDC module’scharacteristics
Contents
1. Introduction – SI/PI/EMC2. PDN modeling issue – VRM Measurement-based modeling3. Measurement-based DCDC Converter modeling• Evaluation board for VRM• Measurement• De-Embedding connector portion to extract DCDC converter behavior4. PI analysis using the VRM model• Evaluation board for other than VRM• Estimating SI/EMI by simulation using EM and VRM model• Comparison between simulation and measurement and validity
discussion 5. Conclusion
2011/12/1MWE2011-Workshop-04 Yokohama17
Evaluation board conceptual diagram
2011/12/1MWE2011-Workshop-04 Yokohama18
50OhmTermination
DCDCConverter
DecouplingCapacitor
74LCX04FInverter IC
ExternalFunctionGenerator
ImpedanceFrom Inverter IC
WaveformObservation
Reference
Signal
DCDC converterevaluation board(discussed previously)
EMI
Evaluation board
SI/EMI evaluation board
2011/12/1MWE2011-Workshop-04 Yokohama19
100[mm]
58[mm
]
①
②
③
⑥
⑦
④
1:Boardmount Header2:74 logic 04 inverter [Toshiba, 74LCX04F]3:50 Ohm single-ended line with 50Ohm termination
130mm length4:DeCap mounting pads
⑤
5:Power Plane6:Signal input for the logic inverter IC7:Local Pattern Generation Circuits for the inverter IC
ConnectDCDC converter evaluation boardhere
Analogy and Ground/Power Plane Modeling
2011/12/1MWE2011-Workshop-04 Yokohama20
VRM
Parallel Flat Plane= Capacitor
PDN(Pwr/Gnd/VRM)= Inductance and Resistance
Dissipation of PCB Prepreg/Core= Resistance
Emission of Radiation= Resistance
IC
①
②
③
③
Note: This analogy is applied to PDN behavior at lower frequency than self-resonance point
DeCap④
Generated VRM model
Relationship between anti-resonance and reflection ratio
2011/12/1MWE2011-Workshop-04 Yokohama21
DeCouplingCapacitorPower-to-Ground model for PCB
① ② ③
④
Note: Term impedance is equal to input impedance to calculate S11 correctly.Z=50Ohm is just an example for the explanation.
PDN ParallelFlat Plane
Power Dissipation/Emission
Relationship between anti-resonance and reflection ratio
Impe
danc
e [O
hm]
S11
[dB
]
PCB OnlyWith DeCap
2011/12/1MWE2011-Workshop-04 Yokohama22
• This circuit model has anti-resonance frequency
• Putting DeCap moves anti-resonance frequency
• Reflection at Anti Resonance frequency is small,
• meaning power is consumed as real power.
Input Impedance and reflection simulationlinear(AC) analysis with DeCap optimization
2011/12/1MWE2011-Workshop-04 Yokohama23
①
②
③
④
1:DCDC converter module Frequency response
Measured impedance2:Terminated Resistor3:Current AC source and Voltage sense
50mA AC current4:DeCap for inverter IC
Measured dataas a power internal impedance
200mA case is usedfor VRM measured impedancefor this case.
DeCap
EM result(Method of Momentum)Agilent ADS-Momentum
2011/12/1MWE2011-Workshop-04 Yokohama24
Without DecapWith Optimized Decap
① ②
[MHz]10 100 1000
0
-6
-12
-18
-24
-30
2e3
1e-1
1
1e1
1e2
1e3
1e-2
Impe
danc
e [O
hm]
S11
[dB
]
70Mhz 240Mhz
Optimized DeCap1400pF SMD580pF SMDin parallel
①High impedance
- SI problemSmall reflection
- EMI problem
DeCap Optimization- Low impedance and small reflection- Current flows to low impedance path②Side effect of DeCap
installation
20Ohm
A Prediction/Estimation of SI/EMI problem from linear simulation resultsImpedance and reflection seen from IC power pin
Experimental proof of the estimationTest Setups
2011/12/1MWE2011-Workshop-04 Yokohama25
①
②
③
⑤
⑥
⑦
⑧
1:Spectrum Analyzer [Agilent Technologies, N9010A ]
9kHz to 26.5GHz2:Function Generator [Agilent Technologies, 81160A]3:EMI Scanner Probe Array[EMSCAN, EMxpert]
5kHz to 4GHz
④
4:Scanner Adapter [EMSCAN, EMxpert]5:EMI Scanner controller[EMSCAN, EMxpert software for PC]6:Osilloscope [Agilent Technologies, MSO7104B]7:DC Power Supply [Agilent Technologies, E3631A]
EMSCANEMxpertTM
Test Item No DeCap Opt. DeCap
Signal Shape at 70MHz Bad Better
EMI at 70MHz Bad Better
EMI at 240 MHz Worse
Experimental proof of the estimation for SIInverter output waveform at a termination without DeCap
2011/12/1MWE2011-Workshop-04 Yokohama26
10MHz CLK 25MHz CLK 50MHz CLK
60MHz CLK 66MHz CLK
70MHz CLK 75MHz CLK
Getting worse
Getting better again
Time-domain response analysis using IBIS
2011/12/1MWE2011-Workshop-04 Yokohama27
①②
③
1:IBIS for 74LCX04 output2:Trigger for CLK waveform generation3:Termination resistor and probe parasitics
8pF and 1nH
IC_GND
IC_PWR
IC_O
UT1
IC_O
UT2 Vout_Term
IC_PWR
IC_GND
IC_OUT1
IC_OUT2
DeCap
EM result(Method of Momentum)Agilent ADS-Momentum
Experimental proof of the estimation for SIInverter output waveform at a termination with/without DeCap66MHz CLK
2011/12/1MWE2011-Workshop-04 Yokohama28
Without DeCap With Optimized DeCap
IBIS SimulationMeasurement
IBIS SimulationMeasurement
Volta
ge a
t ter
min
atio
n[V
]
Volta
ge a
t ter
min
atio
n[V
]
• Installing DeCap improves the inverter output SI at a termination.• IBIS simulation result also shows a good correlation to
measurement result with/without DeCap.
Experimental proof of the estimation for EMI70MHz EMI Scan and Current density
2011/12/1MWE2011-Workshop-04 Yokohama29
Without DeCap With Optimized DeCap
Spe
ctru
mA
naly
zer
Sim
ulat
ion
Cur
rent
Den
sity
10[A/m]I
0.3[A/m]
10[A/m]I
0.3[A/m]
Installing DeCap suppresses the board-wide EMI at 70MHz
Experimental proof of the estimation for EMI240MHz EMI scan and Current density
without DeCap With optimized DeCap
2011/12/1MWE2011-Workshop-04 Yokohama30
10[A/m]I
0.3[A/m]
10[A/m]I
0.3[A/m]
Spe
ctru
mA
naly
zer
Sim
ulat
ion
Cur
rent
Den
sity
Installing DeCap causes anti-resonance around 240Mhz and affect the EMI
Summary and Conclusions
• Measurement-based simple and practical VRM modeling method is proposed.
• Reasonable correlation between simulation and SI/EMI measurement demonstrates validity of the VRM model and the simple linear PI simulation method.
Considerations for further study• Better connector selection to extract better VRM characteristics• Simpler VRM modeling for DeCap optimization around active devices• Case study for differential devices and evaluation of far field by common
mode change on a differential transmission line
2011/12/1MWE2011-Workshop-04 Yokohama31
Acknowledgements
I am deeply grateful to Etoh-san, Toyo Corporation (Toyo Technica), a representative of EMSCAN, about offering EMxpertlend-out for my experimental study.
2011/12/1MWE2011-Workshop-04 Yokohama32