Embedded Instrumentation: Critical to Validation and Test in the Electronics Industry
-
Upload
frost-sullivan -
Category
Business
-
view
1.702 -
download
2
description
Transcript of Embedded Instrumentation: Critical to Validation and Test in the Electronics Industry
Embedded Instrumentation: Critical to Validation and Test in the Electronics
Industry
Sujan Sami, Industry Manager
Test & Measurement
March 10, 2010
2
Focus Points
1. Introduction – Traditional vs. Virtual vs. Embedded Instrumentation
2. Validation, Inspection and Test Technologies
3. Existing Technical Discontinuities
6. Conclusion
5. Market Trends and Analysis
4. Embedded Instrumentation – Solving Validation, Test and Debug Problems
3
Introduction – Traditional vs. Virtual vs. Embedded Instrumentation
Hardware
Embedded Software
Application Software
Traditional
Embedded
Traditional instruments – comprised of pre-defined hardware components.Virtual instrumentation – use of customizable software and modular instrumentation hardware.Embedded instrumentation - a concept of entrenching and enhancing the capabilities of traditional external test equipment as an additional resource on the chip and/or on dedicated instrumentation chips on a circuit board.
4
Validation, Inspection and Test Technologies
Oscilloscopes
Logic analyzers
BERTs
Test
In-circuit Testers (ICTs)
Flying Probe Testers
Boundary Scan Testers
Functional Testers
Validation, Inspection &
Test TechnologiesTest
In-circuit Testers (ICTs)
Manufacturing Defect Analyzers (MDA)
Flying Probe Testers
Boundary Scan Testers
Functional TestersInspectio
nInspection
Automated optical inspection/Automated X-ray inspection
(AOI/AXI) systems
Validation
5
Existing Technical Discontinuities
Primary Challenges Primary Challenges catering to circuit catering to circuit
boardsboards
Primary Challenges Primary Challenges catering to circuit catering to circuit
boardsboards
AccessibilityAccessibility
ComplexityComplexity
CostCost
The migration to chip interconnects speeds in excess
of 5 Gbps
The migration to chip interconnects speeds in excess
of 5 Gbps
The need for protocol-aware high-speed I/O
test
The need for protocol-aware high-speed I/O
test
Limited capacity of
testers
Limited capacity of
testers
Lack of test access for
signal integrity testing
Lack of test access for
signal integrity testing
Lack of test access for
PCB structural testing
Lack of test access for
PCB structural testing
6
Embedded Instrumentation – Solving Validation, Test and Debug Problems
Tec
hnol
ogy
Ro
adm
ap
Embedded Instrumentation
• Embedded instruments are IP inserted within chips to perform specific validation, test and debug functions. • Some of the test technologies that utilize embedded instrumentation include boundary scan test, processor-controlled test, I/O instrumentation test and core instrumentation test.• Examples of this embedded instrumentation include Intel®’s Interconnect Built-In Self Test (IBIST) for QuickPath Interconnect (QPI) and PCIe BERT/margining, and PLX Technology’s visionPAK™ PCIe packet generator/analyzer toolkit.
1998
1993
1971
1950sAnalog Oscilloscope
Analog Oscilloscope
Digital OscilloscopeDigital Oscilloscope
VXIVXI
EmbeddedInstrumentation
Present and Future
2005
PXIPXI
LXILXI
7
Market Trends and Analysis
Instruments:• Collect and analyze data.• Software based T&M
instruments.• Boundary scan testing.
Cost:• Cost-effective, agile and flexible.• Easy to use interface.• Modular Instrumentation – software used to
replace prescribed hardware functionality.
Standard:• According to Moore’s law, the number of
transistors on chips will double every two years.
• IJTAG Family of Standards: IEEE 1149.1, IEEE P1687, IEEE 1500, IEEE 1149.6, IEEE 1149.7.
Trend Analysis
Traditional Instruments Embedded
...From
Hardware Cost Software
GPIB Standard IEEE IJTAG
...To
8
Conclusion
CAPEX in downward-trend market
Access to chips critical
Development in standards and better price-to-performance ratio
Standard Busses Speed (Gbps or GT/s) Initial Adoption
PCI Express III 8.0 2010
Serial ATA III 6.0 2009
USB 3.0 4.8 2008
XAUI 3.125 2005
Intel QPI 6.4 2008
HDMI 1.3 10.2 2006
Pre Pre 19801980
Traditional Instruments
1980s1980sVirtual Instruments
2010 2010 and and
beyondbeyondEmbedded Instruments
Opportunities in the ATE
testing industry
Opportunities in the ATE
testing industry
Future of TestingFuture of Testing
© 2010, ASSET InterTech, Inc. 9
“Turning Test & MeasurementInside Out”
March 10, 2010Glenn Woppman
ASSET President and CEO“2008 EDN Innovator of the Year Finalist &
2009 EDN Innovation of the Year Finalist”
“Turning Test & MeasurementInside Out”
March 10, 2010Glenn Woppman
ASSET President and CEO“2008 EDN Innovator of the Year Finalist &
2009 EDN Innovation of the Year Finalist”
© 2010, ASSET InterTech, Inc. 10
ASSET InterTech - originASSET InterTech - origin
Spin-off of Texas Instruments in 1995
Boundary Scan Test Market leader*
Leading the efforts to establish the Embedded Instrumentation market segment
Company CharacteristicsStandards oriented
Software focused
Global
* Frost & Sullivan report for 2007 (about 30% market share) plus Agilent & Intel endorsements
© 2010, ASSET InterTech, Inc. 11
What is our T&M strategy?What is our T&M strategy?
© 2010, ASSET InterTech, Inc. 12
What is Embedded Instrumentation?What is Embedded Instrumentation?
Any logic structure within a device with a purpose of:
Design-for-Test (DFT)Design-for-Debug (DFD)Design-for-Yield (DFY)Test or Functional items.
(extract from IEEE P1687 documentation)
© 2010, ASSET InterTech, Inc. 13
Diminishing test probe accessDiminishing test probe access
Multi-layered boards with internal-only traces
BGAs and other integrated packages with inaccessible nodes, SoC, SiP, etc.
Servers Desktops Mobile Ultra-mobile
ICT/MDAAccessibility
Presented by Intel at Test Tech Forum 2008
© 2010, ASSET InterTech, Inc. 14
Degradation of high-speed signalsDegradation of high-speed signals
Intrusive, probe-based systems are not able to measure high-speed signals without disrupting their integrity
“You probe it...... you break it”
© 2010, ASSET InterTech, Inc. 15
Stacked die – no probe accessStacked die – no probe access
Through-Silicon Vias Bond Wire
© 2010, ASSET InterTech, Inc. 16
Embedded Instrumentation:Validation of this Technology Trend Embedded Instrumentation:Validation of this Technology Trend
“Software Solutions to Hardware Problems”
Transition of external hardware to chip IP + software
• µP emulation• Structural Test for printed circuit boards• Instrumentation for Validation• Structural & Functional Test & Debug for ICs
© 2010, ASSET InterTech, Inc. 17
Embedded Instrumentation: Re-Use at Each Level of IntegrationEmbedded Instrumentation: Re-Use at Each Level of Integration
Any Design Validation, Test or Debug IP embedded in a core that can be used by design, test and manufacturing engineers is an embedded instrument
© 2010, ASSET InterTech, Inc. 18
Significant Product-Life Cycle SavingsSignificant Product-Life Cycle Savings
Re-Use Saves Time and Money…but there’s more
Semiconductor PCB
© 2010, ASSET InterTech, Inc. 19
ASSET Market Opportunity and StrategyASSET Market Opportunity and Strategy
© 2010, ASSET InterTech, Inc. 20
Intel® IBIST (Interconnect Built-In Self Test)Intel® IBIST (Interconnect Built-In Self Test)
• An embedded instrument which enables high-speed I/O testing
• Bit Error Rate (BER) testing, as well as margining (eye diagrams)
• Resident in Intel® next-generation chips and chipsets
• Validates and tests QPI, PCIe, SMI and DDR3 high-speed buses
© 2010, ASSET InterTech, Inc. 21
IEEE P1687 (IJTAG) based solutionsIEEE P1687 (IJTAG) based solutions
• PLX visionPAK™ is an embedded instrument PCIe pattern generator/analyzer
• New generation of PCIe Gen 3 switch silicon incorporates tools for receiver eye capture; pattern generation; fault injection; and packet performance monitoring.
• Used by PLX to validate its own products, and by its customers to check signal integrity and manufacturing quality of their board designs.
• Gen 3 devices will run under ASSET ScanWorks®
© 2010, ASSET InterTech, Inc. 22
Non-intrusive Board Test (NBT)Non-intrusive Board Test (NBT)
• Intel® Greencity Customer Reference Board
• Convergence of Boundary Scan Test, Processor-Controlled Test, and Intel® IBIST
• Combination of three embedded instrumentation-based technologies offers unmatched levels of test coverage and cost reduction.
See the case study at http://tinyurl.com/scanworks-greencitySee the case study at http://tinyurl.com/scanworks-greencity
© 2010, ASSET InterTech, Inc. 23
24
Next Steps
Register for Frost & Sullivan’s Growth Opportunity Newsletter and keep abreast of innovative growth opportunities(www.frost.com/news)
Register for the next Chairman’s Series on Growth:
Accelerating Growth through Vertical Market Expansion: A How-To Primer (April 6) (http://www.frost.com/growth)
25
Your Feedback is Important to Us
Growth Forecasts?
Competitive Structure?
Emerging Trends?
Strategic Recommendations?
Other?
Please inform us by taking our survey.
What would you like to see from Frost & Sullivan?
Frost & Sullivan’s Growth Consulting can assist with your growth strategies
26
Follow Frost & Sullivan on Twitter
http://twitter.com/Frost_Sullivan
Frost & Sullivan on Twitter
27
For Additional Information
Sarah SaatzerCorporate CommunicationsMeasurement & Instrumentation(210) [email protected]
Sujan SamiIndustry ManagerTest & Measurement+91 – 44 – [email protected]
Kiran UnniResearch ManagerMeasurement & Instrumentation(210) 247 [email protected]