electron microscopes re-visioned JEOL 2100F TEM · JEM 2100F Transmission Electron Microscope 200...

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electron microscopes re-visioned 15201 NW Greenbrier Parkway, Suite C-7 • Beaverton, OR 97006 +1 503 616 4710 • [email protected] Make: JEOL Model: 2100F Condition: To be Remanufactured Availability: In Stock Warranty/Installation: Yes Location: USA Inquiry: 503 616 4710 JEOL 2100F TEM JEM 2100F Transmission Electron Microscope 200 kV maximum accelerating voltage · Electron Gun Assembly: Schottky FEG Emission-Zr/W · Specimen Anti-contamination Trap · High Tilt Analytical Pole Piece (HTP) · Point-to-point resolution: 0.25 nm, stage tilt angle: +/-45 degrees for X, +/-30 degrees for Y tilt axes, EDS solid angle: 0.13 sr · Cryoholder · Double tilt Holder (Low background) · STEM (Scaning Transmission Electron Microscope) · Image Resolution: 1.5 nm with HTP (Bright Field STEM at 200 kV) · Low Mag: 100x to 15,000x · High Mag: 20,000x to 15,000,000x · JEOL bright field detector · Gatan high angle annular dark field (HAADF) detector · Gatan Tridiem post column parallel detection EELS with 2k x 2k PIXEL ULTRASCAN 1000 CCD CAMERA · NANOTRACE EDS DETECTOR WITH NORVAR WINDOW for detection of light elements, 30 mm straight Si(Li) crystal

Transcript of electron microscopes re-visioned JEOL 2100F TEM · JEM 2100F Transmission Electron Microscope 200...

Page 1: electron microscopes re-visioned JEOL 2100F TEM · JEM 2100F Transmission Electron Microscope 200 kV maximum accelerating voltage · Electron Gun Assembly: Schottky FEG Emission-Zr/W

electron microscopes re-visioned

15201 NW Greenbrier Parkway, Suite C-7 • Beaverton, OR 97006

+1 503 616 4710 • [email protected]

Make:JEOL

Model:2100F

Condition:TobeRemanufactured

Availability:InStock

Warranty/Installation:Yes

Location:USAInquiry:5036164710

JEOL 2100F TEM

JEM2100FTransmissionElectronMicroscope200kVmaximumacceleratingvoltage·ElectronGunAssembly:SchottkyFEGEmission-Zr/W·SpecimenAnti-contaminationTrap·HighTiltAnalyticalPolePiece(HTP)·Point-to-pointresolution:0.25nm,stagetiltangle:+/-45

degreesforX,+/-30degreesforYtiltaxes,EDSsolidangle:0.13sr

·Cryoholder·DoubletiltHolder(Lowbackground)·STEM(ScaningTransmissionElectronMicroscope)·ImageResolution:1.5nmwithHTP(BrightFieldSTEMat

200kV)·LowMag:100xto15,000x·HighMag:20,000xto15,000,000x·JEOLbrightfielddetector·Gatanhighangleannulardarkfield(HAADF)detector·GatanTridiempostcolumnparalleldetectionEELSwith

2kx2kPIXELULTRASCAN1000CCDCAMERA·NANOTRACEEDSDETECTORWITHNORVARWINDOWfor

detectionoflightelements,30mmstraightSi(Li)crystal