Electron Micros Coup

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Abadan Institute of 4/28/12

Click to edit Master subtitle style4/28/12

Abadan Institute of Technology

Failure Analysis

instruments:electron microscope

Abadan institute of technologyOctober 2011

Instructor:

Dr. Ashrafi

Presented by:

Elahe Shekari


2/23

Abadan Institute of 4/28/124/28/12

Agenda

Secondary electron image

Back scatter electron image

Energy dispersive spectrum (EDS)

Wavelength dispersive spectrum (WDS)

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What are SE and BSE?

Secondary electrons are low energy electrons formedby inelastic scattering and have energy of less than50eV.

Backscattered (BS)electrons are high-energyelectrons (>50 eV) fromthe primary incident

beam that are ejectedback out from thesamples.

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http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit2


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SE image

The low energy ofthese electrons allowsthem to be collected

easily. This is achievedby placing a positivelybiased grill on thefront of the SE

detector, which ispositioned off to oneside of the specimen.

The major influence on-

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Failure analysis

of a riverwatercirculatingpump shaft
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit2


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BSE image

These BSE are used toproduce a differentkind of image. Such

an image usescontrast to tell usabout the averageatomic number of the

sample.The higher the

average atomic

number, the more

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SE and BSE images88

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Energy Dispersive Analysis

Energy dispersive analysis, also knownas EDS, is a technique used to identifythe elemental composition of a sample

or small area of interest on the sample.

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During EDS, a sample is exposed toan electron beam inside a scanningelectron microscope (SEM).

These electrons collide with theelectrons within the sample, causingsome of them to be knocked out of

their orbits.The vacated positions are filled by

higher energy electrons which emit

x-rays in the process.

EDS



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EDS analysis

By analyzing the emitted x-rays, the elementalcomposition of the sample can be determined.



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WDS

Of the two X-raymicroanalysistechniques for

qualitative analysis,Wavelength DispersiveSpectrometry (WDS)analysis is distinctly

different from energydispersive (EDS)analysis.

WDS identifies the

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WDS analysis


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EDS is first used forelement identification,

for fast analysis of theentire spectrum

Using EDS, all of theenergies of the

characteristic X-raysincident on the detectorare measuredsimultaneously and dataacquisition is therefore

very rapid across theentire s ectrum

WDS is used to solvevarious spectralproblems describedelsewhere in thismodule

the resolution of anWDS detector isconsiderably betterthan that of a EDSspectrometer.

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EDS WDS

The comparison between EDSand WSD?


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The presence of tungsten in the ED spectrum(yellow) is masked by the Si K lines while the

two are clearly distinguishable in the WD

spectrum (blue).

The comparison between ESD andWSD


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The comparison between ESD andWSD

EDS and

WDS in PbS


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SE, BSE and EDS mappingmodes


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2020

EDS mapping and lineanalysis


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21 Severin, Kenneth P., 2004, Energy

Dispersive Spectrometry of CommonRock Forming Minerals. Kluwer Academic

Publishers, 225 p.--Highly recommendedreference book of representative EDSspectra of the rock-forming minerals, aswell as practical tips for spectral

acquisition and interpretation. Goldstein, J. (2003) Scanning electron

microscopy and x-ray microanalysis.

Kluwer Adacemic/Plenum Pulbishers, 689

References


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22 Petroglyph--An atlas of images using electronmicroscope, backscattered electron images,element maps, energy dispersive

x-ray spectra, and petrographic microscope ( Thissite may be offline. ) -- Eric Chrisensen, Brigham

Young University

http://serc.carleton.edu/research_education/geochemsheets/eds.html

http://www.x-raymicroanalysis.com/x-ray-microanalysis-explained/pages/tutorial2/comparisonedswds.htm

http://www.ehow.com/about_5147224_resolution-

References
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit2


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23 Krinsley, David H., 1998, Backscattered scanningelectron microscopy and image analysis ofsediments and sedimentary rocks,CambridgeUniversity Press

M Lancha, M Serrano, J Lapea, D Gmez-Briceo ,Failure analysis of a river watercirculating pump shaft

http://www.tau.ac.il/institutes/wamrc/Zahava/ZahavaSEMExamples.pdf

References
http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit3http://www.sciencedirect.com/science/article/pii/S1350630700000054#hit2

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