EBB 511 – Materials Characterization

Azizan Aziz Ph.D

Projjal Basu Ph.D

Synopsis

1. Introduction

2. Characterization Techniques

2.1 X-ray Diffraction (XRD)

2.2 Scanning Electron Microscope (SEM)

2.3 Transmision Electron Microscope(TEM)

2.4 Scanning Probe Microscopy

2.4.1 Scanning Tunneling Microscope

2.4.2 Atomic Force Microscope

2.5 Fourier Transform Infra-Red (FTIR)

2.6 UV-Vis (UV)

2.7 Thermal Analysis

3. The theoretical background,instrumentation and applications of these techniques will be discuss.

Reference Books1. An Introduction to Analytical Atomic Spectrometry; L.Ebdon, E.H.

Evans, A. Fisher,S.J. Hill; Wiley; 1998

2. A Guide to Materials Characterization and Chemical Analysis; Edited by John P. Sibilia

3. Materials Science and Technology: Characterization of Materials; Volume 2A Part I dan 2B Part II

4. X-ray Diffraction : A Practical Approach; C. Suryanarayana & M. Grant Norton; Plenum Press;1998

5. X-ray Diffraction Procedures for polycrystalline and amorphous Materials; Harold P. Klug and Leroy E. Alexander ,1974

6. An Introduction To Thermal Analysis: Techniques and applications; Michael E. Brown, Chapman and Hall;1988

7. X-ray Characterisation of Materials; Ed. Eric Lifshin; Wiley-VCH ;1999

8. Scanning Probe Microscopy and Spectroscopy:Theory,Techniques and Applications; 2 edition;Ed. Dawn Bonnell; Wiley-VCH, 2000

9. Brian C. Smith, “ Fundamentals of Fourier Transform Infrared Spectroscopy” CRC Press, New York (1996)

Dana W. Mayo, et al , “ Course Notes on the Interpretation of Infrared And Raman Spectra” Wiley Interscience (2004)

Assessment

Course Work (40%)Test (15%)

Assignment (25%)**

Exam (60%)

**Titles of assigments will be made known later

Materials Characterization

• Materials Characterization has 2 main aspects- Accurately measuring the physical and chemical properties of materials

- Accurately measuring (determining) the structure of a material

- atomic level structure- Microscopic level structures

• A critical part of Materials Science and Engineering is to study the relationships between– Properties of materials– Structures and Microstructures– The processing used to make the materials– The ultimate Performance of that materials in

use

Characterisation of Solid Samples

Bulk elemntal composition

Structural Properties Surface phenomena

Dissolution step Direct solid analysis

Atomic absorption

ICP spectrometry

ICP mass spect.

Electron. microscope

SEM-EDX

CHN analyser

IR spectrom.

UV-Vis spectrom

XRD/FESEM

TEM./HRTEM

Dynamic SIMS.

Static SIMS

SEM/FESEM

XPS/SAM

dilatometry.

AFM

Excitation Source Sample Detector

Titles of Assignment

1. Scanning Probe Microscopy : Its Impact on Materials Science Research2. Atomic Force Microscopy and Its application in nanomaterials

characterisation3. Characterisation of Nanoscale characterisation4. X-ray Diffraction as a tool in Materials Characterisation5. SEM and SPM: Comparison, the variant,limitation,advantages and its

applications6. Application of FTIR in Materials Science7. AFM in surface engineering8. STM and AFM in Nanotechnology9. Application of XRD in the characterisation of Nanomaterials10.Application of UV-Vis in Materials characterisation

Only two (2) students per title. First come first serve basis. Submit the assigmnent by 10th Week - 12 September 2008Marks will be given base on originality of the work. Cut and paste from source will not carry high grade. Format should be journal standard.