Dr Ben Black Systems Engineer National Instruments ben.black@ni Keynote Presentation … · 8-Slot...
Transcript of Dr Ben Black Systems Engineer National Instruments ben.black@ni Keynote Presentation … · 8-Slot...
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Agenda
• Trends in Automotive Electronics
• Flexible HIL Solutions
• High Speed Deterministic Data Transfer
• Distributed HIL
• Discontinuous Simulation Solvers
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The “Good” The “Bad”
The “Ugly”
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Global Automotive Industry Trends
• Consumer electronics technologies in vehicles
• Alternative Energy
• Cost Reduction
• Reduced Emissions
• Increased Safety
• Differentiation through Features
• Global Design and ManufacturingThe “Ugly”
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Automobiles Then and Now…
Mechanics and hydraulics
3 ECUs
AM/FM radio
Relay-control units
CAN
Electromechanics
15 to 80 ECUs
Telematics (Infotainment)
Power-control units
CAN, LIN, FlexRay, ...
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…and Software defines the Functionality
Engine control
unit
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Software-Based Hardware Designs
• Benefits
Rapid Advancements
New and Improved
Functionality
Lower Cost
• Challenges
More functions to test
More measurements to
make
Unique functions to test
“For the next 10 years an increase of 10%-15% of software in the
share of costs of a vehicle is forecasted every year”- McKinsey&Company Study
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Control Design Process
System
Testing
Modeling and
Design
Targeting
Rapid
Prototyping
Hardware-in-
the-Loop
Testing
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Modeling and Design
Modeling and Design Produce Controller and Plant Models
Kc
Controller
Kp
Plant
Error
Control
Output FeedbackSetpoint
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Rapid Control Prototyping
Creating a Functional Prototype of the Controller
Kc
Controller
Kp
Plant
Error
Control
Output FeedbackSetpoint
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Rapid Control Prototyping Example
NI
CompactRIO
Drivven: “We prototyped a full-authority engine control system … in just
3 man-months. In past projects, it took us at least 2 man-years and over
$500,000 to develop similar ECU systems.”
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Hardware-in-the-Loop Simulation
Testing Production Controller with Simulated Plant
Kc
Controller
Kp
Plant
Error
Control
Output FeedbackSetpoint
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What is HIL?
• The use of real-time I/O hardware to simulate the dynamic behavior of a device that interfaces to the unit under test. Dynamic – stimulus reacts to the response of the UUT (closed-
loop)
Static – stimulus ignores the response of the UUT (open-loop)
• The simulator may use programming languages, state charts, modeling languages or other methods to describe the input/output behavior (dynamics) of the device
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What is HIL?• Types of test
Functional
Parametric
Validation (V&V)
Durability (HALT/HAST)
End-of-line
…
• Methods in test
Temperature/power variation
Salt/sand spray
EM radiation
Loading/resistance
HIL Simulation
…
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The “Good” The “Bad”
The “Ugly”
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Example…the automobile
3 ECUs 15 to 70 ECUs in 10 years
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Automotive Electronics vs. CO2 Consumption
The effect...
Electronic causes 5% of a cars CO2 Emissions
State of the art Infotainment System:
4-6 Ampere ≈ 0,1 Liter gasoline ≈ 2 Gramms CO2
Innovation vs. CO2 Reduction
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The “Good” The “Bad”
The “Ugly”
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HIL for ECU Test
Challenges –
Modularity: No method of drag-and-drop ECU
hardware architecture
Flexibility: Difficult to add or swap ECUs in a current
test configuration
Wiring/Cabling: Direct I/O wiring makes re-wiring
tedious and time-consuming
Cost: Significant loss of “up-time”
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Flexible HIL Solutions
• I/O with Deterministic Data Transfer
• Integrated Signal Conditioning
• High Resolution Measurements (up to 24 bits)
• Flexible and Modular ECU/HIL Testing Environment
• Distributed Simulation
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FPGA and Reconfigurable IO
8-Slot cRIO
ADC and Integrated Signal Conditioning
FPGA on cRIO
Backplane
C-Series Modules
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FPGA and Reconfigurable IO
Knock Signal GenerationSensor Simulation
(LVDT)
Custom Serial ProtocolsCrankshaft Simulation
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Engine Control
Unit
HIL for ECU Test
Up to 100 ECUs
for a single
solution
Real-Time
ProcessorsAI, AO, DI, DO, CAN
I/O Points
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FPGA in HIL ECU Test
Bring the I/O Nodes to the ECUs
NI FPGA Backplane with
I/O Modules
ECU
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FPGA in HIL ECU Test
ECU with I/O Module Real-Time Processor
LabVIEW Real-
Time
Desktop or
Industrial PC
PXI
Rack-Mount
Controller
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High Speed Deterministic Data Transfer
• Master/Slave Architecture
• Expandable I/O
• Optimized for Single-Point Industrial Data Transfer
• Predictable Timing and Precise Synchronization
• Masters Use Off-the-Shelf Ethernet Interface
• Continuous Data Flow Through Multiple Slaves
• High Bandwidth Efficiency
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High Speed Deterministic Data Transfer
PXI
Smart Camera8-Slot cRIO
NI Masters
NI Slaves
NI 8353 Rack-Mount RT
Future
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Flexible HIL SolutionsNeed to add another ECU?
Real-Time
Processor
(Master)
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Flexible HIL SolutionsAdd another Slave to the chain
Real-Time
Processor
(Master)
Ethernet cables make re-wiring
simple
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Change out ECUs as needed with pre-
assembled ECUs and I/O modules
Real-Time
Processor
(Master)
Flexible HIL SolutionsNeed to test a different car?
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Use same RT Processor, just switch
ECU software models
Real-Time
Processor
(Master)
Flexible HIL SolutionsNeed to test a different car?
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Distributed Simulation
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Discontinuous Simulation Solvers
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Summary of Computer Simulation
What Why How
Off-linePlant (dynamic system)
Controller
Design prototype controller
Investigate behavior
Variable step : for precision
Fixed-step : for speed
Real-Time Plant (dynamic system)Validate prototype controller
Field diagnostic toolFixed step - HIL
Electrical SystemsMechanical Systems
Physical Systems Chemical Systems
Dynamic Systems Discontinuous Systems
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∫u y y(t) = u(t)
Simulation of Dynamic System
Dynamic system Differential equations
Variable step approximation
tat
u
y(a)
tb tat
u
y(a)
tbt1
y(1)
tat
u
y(a)
tbt1
y(1)
t2
y(2)
Solved through error control
In the presence of a discontinuity :
tta tbt1 t2tk-1 tk… …
Tθ
Iteratively locate the discontinuity
until(tk – tk-1) = very very small
k = non-deterministic
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Fixed-step approximation
1 step methods
t(n-1) t(n) t
uy(n)
Backward Euler
t(n-1) t(n) t
y
y(n)
y(n) = y(n-1)+Ty(n)
t(n-1) t(n) t
u
y(n-1)
y(n) Trapezoidal
t(n-1) t(n) t
y
y(n) = y(n-1)+½T(y(n)+y(n-1))
t(n-1) t(n) t
u
y(n-1)
t(n-1) t(n) t
y
y(n-1)
Forward Euler
y(n) = y(n-1)+Ty(n-1)
Simulation of Dynamic System
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Backward Euler
t(n-1)
t(n)
t
u
y(n)
Tθ
t(n-1) t(n) t
yTθ
In the presence of a discontinuity :
t(n-1) t(n) t
y Tθ
Forward Euler
t(n-1) t(n) t
u Tθ
Trapezoidal
t(n-1)
t(n)
t
u Tθ
t(n-1) t(n) t
yTθ
Simulation of Dynamic System
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Impact of discontinuity errors : Electrical system example
0 0.1 0.2 0.3 0.4 0.5
0
1
2
3
-1
-2
-3Cu
rren
t er
ror
(in
A)
Time (in s)
Ideal variable step
h
+360 Vdc
3 HP
++
-Iref
Iabc
0 0.1 0.2 0.3 0.4 0.5
0
1
2
3
-1
-2
-3
Cu
rren
t er
ror
(in
A)
Time (in s)
Standard fixed step (Ts = 20 μs)
h
Standard fixed step (Ts = 2 μs)
0 0.1 0.2 0.3 0.4 0.5
0
1
2
3
-1
-2
-3Cu
rren
t er
ror
(in
A)
Time (in s)
h
Simulation of Dynamic System with Discontinuities
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Problems :
- Where is the boundary ?
- What happens at the
boundary ?
Discontinuous system Piecewise continuous system
Boundary : special calculation
t(n)
u
y(n)
t(n-1)
y(n-1)
Tθ
y(θ )-
y(θ )+
continuous
continuous Tθ = ?
Fixed step simulation of discontinuous systems
y(θ )+
t(n)
u
y(n)
t(n-1)
y(n-1)
Tθ
y(θ )-y(n)
1
2
3
4
1 – Calculate y(n) (discontinuity undetected). 3 – Process the boundary : special calculation.
2 – Detect the discontinuity and determine Tθ. 4 – Recalculate y(n).
In fixed step :
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Cu
rren
t er
ror
(in
A)
0 0.1 0.2 0.3 0.4 0.5
0
1
2
3
-1
-2
-3
Time (in s)
Ideal variable step
h
Iabc
+360 Vdc
3 HP
+
+
-
Iref
Real-Time (Ts = 55 μs)
Cu
rren
t er
ror
(in
A)
0 0.1 0.2 0.3 0.4 0.5
0
1
2
3
-1
-2
-3
Time (in s)
h
Real-Time (Ts = 75 μs)C
urr
ent
erro
r (i
n A
)
0 0.1 0.2 0.3 0.4 0.5
0
1
2
3
-1
-2
-3
Time (in s)
h
Real-Time Simulation of Power Electronics Circuits
0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1.0-10
0
10
20
30
40
50
60
Time (in s)
An
gu
lar
velo
city
(in
rp
m)
Ideal
New (55 μs)
New (75 μs)
Motor Angular VelocityElectric Drive Test Bench
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The “Good” Approach
Flexible solutions• Customize software with LabVIEW
• Customize hardware with FPGA
• Integrate I/O nodes quickly and easily
• Distribute the simulation
Improved Solver