DISCRETE SEMICONDUCTOR TEST SYSTEM WITH … SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER ... MOSFET...

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MODEL 8910/8920 IST DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER A Complete and Cost Effective Automated Test Equipment (ATE) System for Testing of Discrete Semiconductor Components from mW to kW • Test 137 parameters and 12 different semiconductor devices • User friendly interface powered by a Windows 7 touch screen PC • Auto-calibration and self-test diagnostics • Curve tracer program built-in • USB Printer interface for printing test reports • Provides accurate Kelvin or self-calibrated Non-Kelvin testing options • Constant temperature controller heats DUTs up to 250 o C • Stores and recalls previous test programs • Provides automatic Go/No Go tests or parametric measurements • Handler interface for wafer or package level production testing • Start-up safety check prevents testing on defective, incorrect DUTs, test heads, or pin-outs • Adjustable pulsing test from 10 uS to 300 uS • Measures junction capacitances and input impedance of MOSFETs and IGBTs • Optional 6-1 IGBT module testing • Safety Start test mode to protect user from accidental test starts • Fixtures available for easier testing of module packages • Slide-out hardware cabinet for ease of servicing.

Transcript of DISCRETE SEMICONDUCTOR TEST SYSTEM WITH … SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER ... MOSFET...

MODEL 8910/8920IST DISCRETE SEMICONDUCTOR TEST SYSTEM WITH CURVE TRACER

A Complete and Cost Effective Automated Test Equipment (ATE) System for Testing of Discrete Semiconductor Components from mW to kW

• Test 137 parameters and 12 different semiconductor devices

• User friendly interface powered by a Windows 7 touch screen PC

• Auto-calibration and self-test diagnostics

• Curve tracer program built-in

• USB Printer interface for printing test reports

• Provides accurate Kelvin or self-calibrated Non-Kelvin testing options

• Constant temperature controller heats DUTs up to 250 oC

• Stores and recalls previous test programs

• Provides automatic Go/No Go tests or parametric measurements

• Handler interface for wafer or package level production testing

• Start-up safety check prevents testing on defective, incorrect DUTs, test heads, or pin-outs

• Adjustable pulsing test from 10 uS to 300 uS

• Measures junction capacitances and input impedance of MOSFETs and IGBTs

• Optional 6-1 IGBT module testing

• Safety Start test mode to protect user from accidental test starts

• Fixtures available for easier testing of module packages

• Slide-out hardware cabinet for ease of servicing.

DeviceType

Leakage Current

BreakdownVoltage

On-StateParameter

GainTrigger Parameter

LatchParameter

Hold Parameter

SwitchingParameter

BipolarTransistor

Iceo, Ices, Icev Icbo, Iebo

BVceo, BVces BVcev, BVcbo BVebo

Vce(sat)Vbe(sat)

hFE Vbe(on)

MOSFETTransistor

Idss, Igsr, Igsf Idsv

BVdss Vds(on), Ids(on) Rds(on), Vsd

gFS Vgs(th)Vgs(on)

Ciss, Coss, Crss, Zin

IGBT Ices, Igsr, Igsf BVces Vce(sat), Ic(on) Vf

gFS Vge(th)Vge(on)

Cies, Coes, Cres, Zin

TRIAC Idrm, Irrm BVrrm, BVdrm Vtm 1/2/3/4 Igt 1/2/3/4Vgt 1/2/3/4

IL 1/2/3/4 Ih 1/2/3/4

SCR Idrm, Irrm BVdrm, BVrrm Vtm Igt, Vgt IL Ih

GTO Idrm, Irrm BVdrm Vtm Igt, Vgt IL Ih

DIODE Ir BVr Vf, If

Zener Diode Ir BVz, BVr Vf

J-FET Igss BVgss Idss, Rds(on) Vds(on)

gFS Vgs(p) Id(p)

Regulator +/-Vo, +/-Ipk +/-Isc

+/-dV +/-0r, +/-Ir

Optoisolator Irrm, Ir, IceoIcbo, Iebo Ic(off), Idrm

BVceo, BVcbo BVebo

Vf, Ic(on), Vce(sat), Vtm

CTR, hFE Igt Ih

TVS Ir BVr Vbo, Ibo, dVbo

IST MODEL 8900 SERIES TESTING PARAMETERS

1 Kelvin High Power test head*1 Kelvin Low Power test head1 Self Calibrated Non-Kelvin Low Power test head

Easy to use menu driven interface

USB ports for connecting printer, keyboard, mouse

High Current Source up to 4800 A*

Temperature Control for DUT hot plate

Windows 7 Touchscreen PC

*- IST Model 8920 only

IST 8920

IST 8910

IGBT Decoder Power Source

CURVE TRACER SOFTWARE

The IST 8900 Series is powered by a touch screen PC with Curve Tracer testing

software preinstalled. Using the Curve Tracer application, the 8910/8920 is able

to generate a single curve or as many as six curves per test cycle. Each curve is

plotted from up to 32 different measurements taken by the tester within a test range

specified by the user. The data increments can be set for either linear or logarithmic

format. The resulting graph shows a precise operating point for a device under a set

of changing conditions.

Both the IST-8920 (left) and the IST-8910 (right) are able to run Curve Tracer tests on

the parameters displayed in the table below.

Bipolar Transistor

Ice(o,s,v) – BVce(o,s,v) Icbo – BVcbo

Iebo – BVebo

Ic – Vce(sat) at different Ib Ib – Vce(sat) at different Ic

Ic – Vbe(sat) Ic – hFE

MOSFET

Idss – BVds(s,v) Ids – Vds at different Vgs

Rds – Ids at different Vgs Ids – Vgs at different Vds

Rds – Vgs at different Ids

Is – Vsd Vgs(th) – Ids

Igss(f,r) – Vgss(f,r) C(i,o,r)ss – Vds

IGBT

Ices – BVces If – Vf

Vge(th) – Ice

Iges(f,r) – Vges(f,r) Ic – Vce at different Vge

C(i,o,r)es – Vce Ic – Vge at different Vce

TRIAC

Idrm – BVdrm Irrm – BVrrm

SCR

Idrm – BVdrm Irrm – BVrrm

Diode

Vf – If Ir – BVr

Zener Diode

Vf – If Iz – BVz

The IST-8920 and 8910 are mounted

on slide out drawers for ease of

maintenance.

HIGH POWER SEMICONDUCTOR TESTING WITH THE IST 8920

As power modules age, their performance degrades. Proper testing and

maintenance of semiconductor devices used in power switching can

ensure optimal performance and prevent down-time throughout a device’s

lifecycle. The IST Model 8900 Discrete Semiconductor Test System allows

you to effectively identify the percent of degradation in semiconductor

devices by simulating the exact current and voltage of the parameters used

by devices under real operating conditions. Equipped with a Constant

Temperature source, the 8900 series is able to heat devices up to 250°C

to introduce thermal stress and allow devices to be tested at their normal

operating temperatures so that failing devices can be detected earlier and

before they become a serious problem.

The comprehensive 8920 model supports high power ON-state parameter testing for Vce(sat), Vds(on), Rds(on), Vsd, Vf, and

Vtm at force currents of 400 A, 800 A, 1,600 A, 2,400 A, 3,200 A and 4,800 A.

Force voltages for Off-state parameter testing of Breakdown Voltage and Leakage Current measurements can be set to 2.5 KV,

5 KV, 7.5 KV or 10 KV.

HIGH POWER CONSTANT CURRENT WITH RELAY ASSEMBLYThe 8920 features a high power constant current source that supplies up to

48 units of a 50 A or 100 A current source in parallel, enabling automated

high current, high voltage power device testing.

KELVIN TEST FIXTURES FOR HIGH POWER TESTING

The IST 8920 includes specialized test fixtures that make it easy to setup and

measure high power devices such as IGBTs, MOSFETs, Transistors, GTOs,

SCRs, and Diodes. The test fixtures provide error-free testing while

eliminating time consuming setups needed to secure test leads and sources.

Using the test fixtures, testing can be performed at currents up to 4800 A

and at voltages up to 10 KV.

SWITCHING EFFICIENCY ANALYSIS IN POWER IGBTs & MOSFETs

At low frequencies, conduction loss is the primary driver of power loss in a device

and their performance can be assessed by measuring the DC parameters of Vce(sat),

Vds(on), and Rds(on). At higher frequencies, the Cies, Coes, and Cres parameters and

the device’s input impedance dictate the switching and driving loss.

Devices with heavy power loss will generate excess heat, leading to premature aging

of the device and poor performance. The IST 8900 Series is a complete solution that

is able to properly test high power devices as part of maintenance and production

routines to ensure optimal performance and longevity of power devices used in

today’s high frequency switching applications.

TWO MODELS TO FIT YOUR BUDGET AND TESTING NEEDS

IGBT & MOSFET DECODER MODULE

The optional IGBT & MOSFET Decoder Module allows for testing of IGBT (6-in-1,

4-in-1, 2-in-1) and MOSFET packages. A Kelvin connection is required. One unit is

tested at a time and subsequent units are activated sequentially as each test finishes.

Additional software for hand-shaking control may be required for testing of packages

with built-in control ICs.

SUPER HIGH POWER RELAY

This UL listed power enclosure is completely sealed against air and moisture to

prevent environmental factors from influencing test results. The DPDT relays provide

a switching current source of up to 3600 A and voltage up to 10 KV. (Patent Pending)

HOT PLATE STAND w/CONSTANT TEMPERATURE CONTROL

The Hot Plate Stand is controlled by the IST 8900 Series to pre-heat a DUT to its

maximum operating temperature prior to testing. Testing devices at actual operating

temperatures produce more accurate assessments of a device’s true performance

abilities.

VICE CLAMPING TEST FIXTURE

This fixture is used to test Disc Packages such as GTOs, SCRs, Triacs, and Diodes.

The fixture supplies pressure to clamp down on the DUT to connect the internal

contacts. (Patent Pending)

POWER MODULE TEST FIXTURE WITH CONSTANT TEMPERATURE CONTROL

This fixture simplifies the setup for testing power IGBT devices. Devices can be

mounted by simply positioning the device and pulling down on the lever to securely

connect the test leads. A hot plate stand is built into the fixture to allow for testing at

operating temperatures. (Patent Pending)

ACCESSORIES

The IST 8900 series test systems are available as a lower cost model in the 8910 and

as a comprehensive model in the 8920. Both systems have identical parameter testing

capabilities, but the 8920 is larger and can perform testing up to 4800 A / 10 KV.

The 8910 (shown on right) is more compact and can test up to 50 A / 2.5 KV.

IST 8910

Parameters Current Range Resolution Accuracy Test Condition

Iceo/s/v, IcboIebo, Idss/v, Igsr/f Idrm, Irrm, Igko Igss, Ir, Ic(off)

0 - 400 na 0.1 na +/-5% 0 - 10 KV

0 - 4 ua 1 na +/-2% 0 - 10 KV

0 - 40 ua 10 na +/-1% 0 - 10 KV

0 - 400 ua 0.1 ua +/-1% 0 - 10 KV

0 - 4 ma 1 ua +/-1% 0 - 10 KV

0 - 40 ma 10 ua +/-1% 0 - 5 KV

0 - 400 ma 0.1 ma +/-1% 0 - 2 KV

Parameter Voltage Range Resolution Accuracy Test Condition

BVceo/s/vBVcbo, BVebo BVdss, BVrBVdrm, BVrrm BVgss, BVz

0 - 30 V 0.05 V +/-1% 0 - 5 A

30 - 60 V 0.05 V +/-1% 0 - 2 A

60 - 2500 V 0.3 V +/-2% 0 - 40 ma

2500 V - 10 KV 1.5 V +/-3% 0 - 10 ma

Parameter Current Resolution Accuracy Test Condition

hFE, Vce(sat)Vbe(on), Vbe(sat) Vds(on), Ids, VdsRds(on), Ic(on), Vf If, Vtm +/-Vo, +/-Ipk+/-Isc, Vbo, Ibo

0 - 20 ma 5 ua +/-1% 0 - 20 V

0 - 200 ma 50 ua +/-1% 0 - 20 V

0 -2 A 0.5 ma +/-1% 0 - 20 V

0 - 25 A 6 ma +/-1% 0 - 20 V

0-50 A 12 ma +/-1% 0 - 20 V

0 - 4800 A 24 ma +/-3% 0 - 20 V

Parameter Current Resolution Accuracy Test Condition

hFE, Vgs(th)Vbe(on), Vgs(on) Vge(th), Vge(on) Igt, Vgt, ILIh, Ic(on)Igt 1/2/3/4Vgt 1/2/3/4

0 - 100 ua 20 na +/-1% 0 - 20 V

0 - 1 ma 0.2 ua +/-1% 0 - 20 V

0 -10 ma 2 ua +/-1% 0 - 20 V

0 - 100 ma 20 ua +/-1% 0 - 20 V

0 - 1 A 0.2 ma +/-1% 0 - 20 V

0 - 20 A 4 ma +/-1% 0 - 20 V

Parameter Range Accuracy Test Condition

Cies, Coes, Cres, Ciss, Coss, Crss

20 pF - 1000 nF +/-3% 0 - 60 V1 MHz - 10 KHz

Leakage Current Measurement Range

Breakdown Voltage Range

On-State Current Range

Triggering Voltage/Current Range

Capacitance Measurement Range

Physical SpecificationsUnit Dimensions Weight

8910 Mainframe 19.5”H x 21.5”D x 21”W 53 kg

8920 Mainframe 32”H x 23”D x 29.5”W 120 kg - 168 kg

IGBT 6-1 Decoder 5”H x 11”D x 12”W 15 lbs (6.8 kg)

Test Fixture for Disc Package

12”H x 10”D x 9”W 18 lbs (8.2 kg)

Test Fixture for Power Module

7”H x 12”D x 9”W 20 lbs (9.1 kg)

Test Fixture for Hot Plate Stand

4”H x 14”D x 9”W 11.6 lbs (5.2 kg)

Accessories Furnished

• 12” Touch Screen Windows 7 PC, Keyboard, & Mouse

• Known Good Transistors for Mainframe Self Testing

• AC Power Cord

• Instruction Manual

• Axial Lead Test Socket Adapter

• Multiple Application Low Power Non-Kelvin Socket Adapter

• Medium Power “3-in-Line” Kelvin Test Socket Adapter

• Univ. High Power Test Fixture Adapter w/Kelvin Connections

• Shorting Plugs for Test Socket Self-Calibration application

• Removable 4 Wheeled Dolly (8920 Only)

Optional Accessories

• IGBT & MOSFET Decoder Module

• Power Module Test Fixture w/Constant Temperature Control

• Hot Plate Heating Stand w/Constant Temperature Control for Regular Device Packages

• Vice Clamping Test Fixture for High Power Disc Packages

• Test Socket Adapter for TO-3, TO-66, & TO-204

• Single/Dual Optoisolator Test Socket Adapter

• Miniature Universal Test Clip Adapter

• Test Socket Adapter for SMD Package

• Super High Power Universal Test Fixture w/Kelvin Connections

IST 8900 SERIES TECHNICAL SPECIFICATIONS

ISTInformation Scan Technology, Inc.487 Gianni St., Santa Clara, CA 95054Phone: 408.621-0336Fax: 408.988.1908Web: www.infoscantech.com

Parameter Range Accuracy Test Condition

Zin 0.50 ohm - 20k ohm +/-5% 1 MHz - 100 KHz

Input Impedance Measurement Range