Digital Integrated Circuits for Communication

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DIGITAL INTEGRATED CIRCUITS FOR COMMUNICATION يِ ڻ رسا ع مد ح ا سان ح اEvery Wednesday: 15:00 hrs to 18:00 hrs ع: ب ار ر ه ام س3 کان ي ڳ و6 ن ي& ئ ا) ت ي ڳ و

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Every Wednesday : 15:00 hrs to 18:00 hrs. هر اربع: شام 3 وڳي کان 6 وڳي تائين. Digital Integrated Circuits for Communication. احسان احمد عرساڻِي. My Introduction منهنجو تعارف. Ahsan Ahmad Ursani Associate Professor Dept . of Telecommunication Engineering Office No: TL-117 - PowerPoint PPT Presentation

Transcript of Digital Integrated Circuits for Communication

Page 1: Digital  Integrated  Circuits for Communication

DIGITAL INTEGRATED CIRCUITS FOR COMMUNICATIONاحسان احمد عرساڻِي

Every Wednesday:15:00 hrs to 18:00 hrs

هر اربع: وڳي 6 وڳي کان 3شام تائين

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My Introductionمنهنجو تعارف

Ahsan Ahmad Ursani Associate Professor Dept. of

Telecommunication Engineering

Office No: TL-117 Institute of

Communication Technologies

Email: Web page:

احسان احمد عرساڻيايسوسيئيٽ پروفيسرشعبو ڏور ربطيات :دفتر نمبرTL-117 انسٽيٽيوٽ آف

ڪميونيڪيشن ٽيڪناالجيز :برق ٽپال:ويب صفحو

[email protected]://sites.google.com/

a/faculty.muet.edu.pk/aau/home

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The Teaching Planتدريسي رٿا

S. No. Chapter Hours

1 Dynamc Combinational CMOS Logic 10

2 Designing Sequential Logic 17

3 Designing Memory and Array Structures 21

Total 48

Pre-Requisite: IC Design

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The Textbookنصابي ڪتاب

Digital Integrated Circuits

A Design Perspective

Jan M. Rabaey

Chapter 6, 7, & 12

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Chapter 2باب پهريون

S. No. Topic Hours1 Introduction 12 Static Latches and Registers 13 Dynamic Latches and Registers 14 Alternative Register Styles 15 Pipelining: An approach to optimize sequential 16 Speed and Power Dissipation 17 Non-Bistable Sequential Circuits 18 Perspective: Choosing a Clocking Strategy 19 110 1

Total 10

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Introduction

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Timing Metrics for Sequential Circuits

Set-Up time tsu Time before clock transition

Hold time thold Time After clock transition

worst-case propagation delay tc-q minimum delay (contamination delay) tcd Propagation Delay of combinational logic

tplogic Time period of the Clock signal T

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Timing Metrics for Sequential Circuits

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Classification of Memory Elements

Foreground Memory embedded into

logic organized as

individual registers of register banks

Background Memory Large amounts of

centralized memory core

Not the subject of this chapter

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Two types of memory

Not refreshed frequently

Circuits with Positive feedback

Multivibrators

Refreshed frequently

In order of miliseconds

Store state of parasitic capacitances of MOS

Higher performance

Lower Power Dissipation

Static Dynamic

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Latch Level-sensitive circuit Passes input D to the Output Q Output does not change in the HOLD

MODE Input just before the going into HOLD

phase is held stable during the following HOLD phase

An essential component of Edge-triggered Register

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The +ve and the –ve Latches

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A Bistable Circuit Basic Part of a memory Having two stable states Use +ve feedback

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The Bistability Principle

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Metastabilityloop gain is greater

than unityloop gain is much smaller than unity

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Transition from one state to the other

This is generally done by applying a trigger pulse at Vi1 or Vi2

The width of the trigger pulse need be only a little larger than the total propagation delay around the circuit loop, which is twice the average propagation delay of the inverters

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SR Flip Flop

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SR Flip-Flop Using NAND Gates Using NOR Gates

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CMOS clocked SR flip-flop Fully fully-complimentary

CMOS implementation of SR flip Flop requires 8 transistors

Clocked operation will require extra transistors

Two Crossed Coupled Inverters

4 extra transistors for R, S, and CLK inputs

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CMOS clocked SR flip-flop M4, M7, and M8

forms a ratioed Inverter

Q is high and R is applied

we must succeed in bringing Q below the switching threshold of the inverter M1-M2

Must increase the size of M5, M6, M7, and M8

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Example 7.1: Transistor Sizing of Clocked SR Latch

(W/L)M1= (W/L)M3= 0.5mm/0.25mm (W/L)M2 =(W/L)M4 =1.5mm/0.25mm VM = VDD/2 Q = 0 VOL (Q=0) < VM (W/L)M5-6 ≥ 2.26 (W/L)M5 = (W/L)M6 ≥ 4.5

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DC output voltage vs. individual

pulldown device Transient Response

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Example 7.2: Propagation Delay of Static SR Flip-Flop

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Problem 7.2 Complimentary CMOS SR FF

Instead of using the modified SR FF of Figure 7.8, it is also possible to use complementary logic to implement the clocked SR FF. Derive the transistor schematic (which consists of 12 transistors). This circuit is more complex, but switches faster and consumes less switching power. Explain why.

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Multiplexer-Based Latches

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Multiplexer-Based Latches

The feedback loop is off while output is changing Feedback is not to

be overridden to change the output

Transistor sizing is not critical to fuctionality

Clock load is 4Advantages Disadvantages

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NMOS latch using Pass Transistors

Clock load = 2 Degraded logic 1

passed to the first inverter (VDD-VTN) For smaller values of

VDD Less noise margin Less switching

performance Static Power Dissipation

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Master Slave Edge-triggered Register:Positive edge-triggered

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Problem 7.3: Optimization of the Master Slave Register

I1 and I2 can be removed Functionality affected ?

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Timing properties of Multiplexer-based Master-Slave Register

Set-up time Hold time Propagation Delay

Propagation Delay of Inverter (tpd_inv)

Propagation Delay of Transmision Gate (tpd_tx)

tsu = 3 tpd_inv + tpd_tx tc-q = tpd_tx (T3) + tpd_inv

(I6) thold = 0

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Master Slave Edge-triggered Register:Negative Edge-trggerred

Draw a circuit based on transmission gate multiplexers

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Set-up time simulation in SPICE Progressively skew the input with

respect to the clock edge until the circuit fails

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Set-up time simulation

Tsetup = 0.21 nsec Tsetup = 0.20 nsec

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Simulation of propagation delay

Tc-q = tpd_tx (T3) + tpd_inv (I6)

Tc-q(LH) = 160 ps Tc-q(HL) = 180 ps

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Reduced Clock Load Feedback

transmission gates removed

Clock load = 4 Ratioed Logic T1 should be

properly sized so as to be able to change the I1I2 state

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Reverse Conduction T2 can also drive

T1 I4 must be a weak

device to prevent it from driving T2

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Non Ideal Clock Signals Assumption that clock

inversion takes ZERO time Effects of Capacitive loads

dissimilar capacitive loads due to different data stored in the connecting latches

Different routing conditions of the two signals

Clock Skew

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Problems due to Clock Skew Direct Path B/W D

and Q Race Condition Can conduct on +ve

edge of clock

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Solution to Clock Skew: Pseudostatic2-phase D register

Two phase Clock signal

2 non-overlaping phases

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Dynamic Transmission Gate Edge triggered Register

tsu= tpinv tcq= 2tpinv + tptgate Needs Refereshing Clock Overlap can

cause the problem called Race

1-1 Overlap Increasing hold time

0-0 Overlap Toverlap0-0 < tT1+ tI1+ tT2 Input Signal D must

not be able to propagate through T2 During 0-0 o overlap

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C2MOS – Clocked CMOSA Clock Skew Insensitive Approach

Positive Edge Triggered Master –Slave Register

Clocked CMOS CLK=0; Master

samples the inverted version of D on X

CLK=1; Master is in the HOLD mode and Slave passes the value on X to Q

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0 – 0 Overlap

0 – 0 Overlap

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1 – 1 Overlap

1 – 1 Overlap

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C2MOS – Clock Overlap 0 – 0 overlap does not create any

problem 1 – 1 overlap puts a HOLD constraint

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Dual Edge Registers It consists of two parallel

masterslave based edge-triggered registers, whose outputs are multiplexed using the tri-state drivers

The advantage of this scheme is that a lower frequency clock (half of the original rate) is distributed for the same functional throughput, resulting in power savings in the clock distribution network

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True Single-Phase Clocked Register (TSPCR)

Positive Latch Negative Latch

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Embedded logic

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Example 7.4 Impact of embedding logic into latches on performance

Consider embedding an AND gate into the TSPC latch, as shown in Figure 7.31b. In a 0.25

mm, the set-up time of such a circuit using minimum-size devices is 140 psec. A conventional

approach, composed of an AND gate followed by a positive latch has an effective set-up time

of 600 psec (we treat the AND plus latch as a black box that performs both functions). The

embedded logic approach hence results in significant performance improvements.

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Simplified TSPC latch / Split Output

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Simplified TSPC Register

Reduced Implementaiton Area

Less Power Consumption

Reduced Clock Load

All nodes do not experience full logic swing

Reduced Performance

This also limits the amount of VDD scaling possible on the latch

ADVANTAGES DISADVANTAGES

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Single-phase edge-triggered register

CLK = 0 Sampling inverted D

on node X. The second inverter

is in the precharge mode

M6 charging up node Y to VDD.

3rd inverter is in HOLD, M8 and M9 are off.

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Positive Edge TriggeredSingle-phase edge-triggered register

On the rising edge of the clock, the dynamic inverter M4-M6 evaluates. If X is high on the rising edge, node Y discharges.

The third inverter M7-M8 is ON during the high phase, and the node value on Y is passed to the output Q.

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Positive Edge TriggeredSingle-phase edge-triggered register

On the +ve phase of the clock, X transitions to a low if D transitions to a high level.

Input must be kept stable till the value on node X before the rising edge of the clock propagates to Y. This represents the hold time of the register

hold time less than 1 inverter delay since it takes 1 delay for the input to affect X.

The propagation delay of the register is 3 inverters since the value on node X must propagate to the output Q.

Finally, the set-up time is the time for node X to be valid, which is 1 inverter delay.

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TSPC Edge-Triggered RegisterTransistor Sizing

D is low & X=Q~=1; Q=0. CLK is low, Y is precharged

high turning on M7. CLK transitions from low to

high, Y and Q~ start dis-charging simultaneously (through M4-M5 & M7-M8, respectively).

Once Y is sufficiently low, the trend on Q~ is reversed and the node is pulled high anew through M9.

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Effects of Glitch and Solution

fatal errors, as it may create unwanted events when the output of the latch is

used as a clock signal input to another register). It

reduces the contamination delay of the register.

The problem can be corrected by resizing the relative strengths of the pull-down paths through M4-M5 and M7-M8, so that Y discharges much faster than Q.

This is accomplished by reducing the strength of the M7-M8 pulldown path, and by speeding up the M4 -M5 pulldown path.

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TSPC Edge-Triggered RegisterTransistor Sizing

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