Device models Mohammad Sharifkhani. A model for manual analysis.

42
Device models Mohammad Sharifkhani

Transcript of Device models Mohammad Sharifkhani. A model for manual analysis.

Page 1: Device models Mohammad Sharifkhani. A model for manual analysis.

Device models

Mohammad Sharifkhani

Page 2: Device models Mohammad Sharifkhani. A model for manual analysis.

A model for manual analysis

Page 3: Device models Mohammad Sharifkhani. A model for manual analysis.

Current-Voltage RelationsThe Deep-Submicron Era

LinearRelationship

-4

VDS (V)0 0.5 1 1.5 2 2.5

0

0.5

1

1.5

2

2.5x 10

I D (

A)

VGS= 2.5 V

VGS= 2.0 V

VGS= 1.5 V

VGS= 1.0 V

Early Saturation

Page 4: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity Saturation

(V/µm)c = 1.5

n

(m/s

)

sat = 105

Constant mobility (slope = µ)

Constant velocity

Page 5: Device models Mohammad Sharifkhani. A model for manual analysis.

Perspective

IDLong-channel device

Short-channel device

VDSVDSAT VGS - VT

VGS = VDD

Page 6: Device models Mohammad Sharifkhani. A model for manual analysis.

ID versus VGS

0 0.5 1 1.5 2 2.50

1

2

3

4

5

6x 10

-4

VGS (V)

I D (

A)

0 0.5 1 1.5 2 2.50

0.5

1

1.5

2

2.5x 10

-4

VGS (V)

I D (

A)

quadratic

quadratic

linear

Long Channel Short Channel

Page 7: Device models Mohammad Sharifkhani. A model for manual analysis.

ID versus VDS

-4

VDS (V)0 0.5 1 1.5 2 2.5

0

0.5

1

1.5

2

2.5x 10

I D (

A)

VGS= 2.5 V

VGS= 2.0 V

VGS= 1.5 V

VGS= 1.0 V

0 0.5 1 1.5 2 2.50

1

2

3

4

5

6x 10

-4

VDS (V)

I D (

A)

VGS= 2.5 V

VGS= 2.0 V

VGS= 1.5 V

VGS= 1.0 V

ResistiveSaturation

VDS = VGS - VT

Long Channel Short Channel

Page 8: Device models Mohammad Sharifkhani. A model for manual analysis.

Unified model

Page 9: Device models Mohammad Sharifkhani. A model for manual analysis.

Unified model

• Model presented is compact and suitable for hand analysis.

• Still have to keep in mind the main approximation: that VDSat is constant . – When is it going to cause largest errors?– When E scales – transistor stacks.

• But the model still works fairly well.

Page 10: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity saturation

Page 11: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity saturation

Smaller EcL Smaller VDsat Saturates quicker

Page 12: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity saturation

Page 13: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity saturation

Page 14: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity saturation

Page 15: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity Saturation

Page 16: Device models Mohammad Sharifkhani. A model for manual analysis.

Output resistance

• Slope in I-V characteristics caused by:– Channel length modulation– Drain-induced barrier lowering (DIBL)

• Both effects increase the saturation current beyond the saturation point

• The simulations show approximately linear dependence of Ids on Vds in saturation.

Page 17: Device models Mohammad Sharifkhani. A model for manual analysis.

Output resistance

Page 18: Device models Mohammad Sharifkhani. A model for manual analysis.

Output resistance

Page 19: Device models Mohammad Sharifkhani. A model for manual analysis.

Output resistance

Page 20: Device models Mohammad Sharifkhani. A model for manual analysis.

Transistor stacks

Page 21: Device models Mohammad Sharifkhani. A model for manual analysis.

Transistor stacks (Velocity sat.)

NAND Suffers less from VS

In NAND VDsat is larger

Page 22: Device models Mohammad Sharifkhani. A model for manual analysis.

Velocity Saturation

• How about NAND3?– IDSat = 1/2 of inverter IDSat (instead of 1/3)

• How about PMOS networks?

• NOR2 – 1.8x, NOR3 – 2.4x, NOR4 - 3.2x

• What is ECL for PMOS?

Page 23: Device models Mohammad Sharifkhani. A model for manual analysis.

Alpha power law

Page 24: Device models Mohammad Sharifkhani. A model for manual analysis.

Alpha power law

• This is not a physical model• Simply empirical:

– Can fit (in minimum mean squares sense) to variety of α’s, VTh

• Need to find one with minimum square error – fitted VTh

• can be different from physical• Can also fit to α = 1• What is VTh?

Page 25: Device models Mohammad Sharifkhani. A model for manual analysis.

Alpha power law

Page 26: Device models Mohammad Sharifkhani. A model for manual analysis.

I-V Curves

Regular sat.

TriodeVel. Sat.

Page 27: Device models Mohammad Sharifkhani. A model for manual analysis.

I-V curves

Page 28: Device models Mohammad Sharifkhani. A model for manual analysis.

A PMOS Transistor

-2.5 -2 -1.5 -1 -0.5 0-1

-0.8

-0.6

-0.4

-0.2

0x 10

-4

VDS (V)

I D (

A)

Assume all variablesnegative!

VGS = -1.0V

VGS = -1.5V

VGS = -2.0V

VGS = -2.5V

Page 29: Device models Mohammad Sharifkhani. A model for manual analysis.

Transistor Model for Manual Analysis

Page 30: Device models Mohammad Sharifkhani. A model for manual analysis.

The Transistor as a Switch

VGS VT

RonS D

ID

VDS

VGS = VD D

VDD/2 VDD

R0

Rmid

ID

VDS

VGS = VD D

VDD/2 VDD

R0

Rmid

Page 31: Device models Mohammad Sharifkhani. A model for manual analysis.

The Transistor as a Switch

0.5 1 1.5 2 2.50

1

2

3

4

5

6

7x 10

5

VDD

(V)

Req

(O

hm)

Page 32: Device models Mohammad Sharifkhani. A model for manual analysis.

The Transistor as a Switch

Page 33: Device models Mohammad Sharifkhani. A model for manual analysis.

MOS capacitance

• The capacitance of the MOS affects the dynamic behavior of a circuit

• Speed Caps

• Proper modeling is needed

Page 34: Device models Mohammad Sharifkhani. A model for manual analysis.

MOS Capacitance

Page 35: Device models Mohammad Sharifkhani. A model for manual analysis.

Dynamic Behavior of MOS Transistor

DS

G

B

CGDCGS

CSB CDBCGB

Page 36: Device models Mohammad Sharifkhani. A model for manual analysis.

The Gate Capacitance

tox

n+ n+

Cross section

L

Gate oxide

xd xd

L d

Polysilicon gate

Top view

Gate-bulkoverlap

Source

n+

Drain

n+W

Page 37: Device models Mohammad Sharifkhani. A model for manual analysis.

Gate Cap

Page 38: Device models Mohammad Sharifkhani. A model for manual analysis.

Gate Capacitance

S D

G

CGC

S D

G

CGC

S D

G

CGC

Cut-off Resistive Saturation

Most important regions in digital design: saturation and cut-off

Page 39: Device models Mohammad Sharifkhani. A model for manual analysis.

Diffusion Capacitance

Bottom

Side wall

Side wallChannel

SourceND

Channel-stop implant NA1

SubstrateNA

W

xj

LS

Page 40: Device models Mohammad Sharifkhani. A model for manual analysis.

Junction Capacitance

Page 41: Device models Mohammad Sharifkhani. A model for manual analysis.

Capacitances in 0.25 m CMOS process

Page 42: Device models Mohammad Sharifkhani. A model for manual analysis.

MOS Caps behavior