Dell: Notebook Durability Study - Dell United States ... · Dell: Notebook Durability Study Test...

December 2005 www.veritest.com • [email protected]

Dell: Notebook Durability Study Test report prepared under contract from Dell Inc.

Executive summary Dell Inc. commissioned VeriTest, a service of Lionbridge Technologies Inc., to conduct a competitive notebook durability study. VeriTest conducted a series of tests to exercise the durability of the following notebook computers:

• Acer TravelMate 4652 • Dell Latitude D610 • HP Compaq nc6220 • Lenovo ThinkPad T43

Our testing consisted of conducting a series of durability tests of two units each of the four notebook models under test. After a set of preconditioning activities, we conducted a set of durability test runs on the four pairs of notebooks under test. We performed the durability study by subjecting the notebooks to the following tests:

A. Operational Free Fall Drop Test - The objective of the Operational Free Fall Drop Test was to measure the level of damage sustained while the notebook systems were dropped from a set of specific predefined heights.

B. Operational Shock Test -

The objective of the Operational Shock Test was to measure the level of damage sustained while the notebook systems were accelerated to specific levels.

C. Spill Test - The objective of the Spill Test was to measure the effects of notebook systems when

liquid is spilled on the notebook keyboard.

D. Dust Test - The objective of the Dust Test was to measure the effects of notebook systems when exposed to fibrous dust particles over an extended period.

Key findings

q In our 14-inch drop testing, the two Dell Latitude D610 notebooks were the only systems that had no bad sectors. One Lenovo notebook was unable to boot, and required a replacement hard drive to continue testing.

q In our 29-inch drop testing, one Dell notebook reported only one bad sector, and the other notebook reported no bad sectors. Three of the other six notebooks (one Acer, one HP, and one Lenovo) were unable to boot, and the Acer motherboard was permanently damaged during the test.

q In the 162G operational shock test, the two Dell notebooks passed all PC-Doctor tests and one successfully completed the WinBench 99 final run test. One HP and one Acer notebook were unable to complete the 162G operational shock test.

q In all cases, default settings were used; Lenovo ThinkPad T43’s Active Protection System was defaulted “on”.

q All notebooks in our test successfully passed the spill and dust tests.

Dell : Notebook Durability Study 2

Please refer to the Test Methodology section of this report for complete details of how we conducted these tests. All units were tested using default factory settings, including the enablement of Lenovo’s Active Protection System. In our drop testing, the two Dell Latitude D610 notebooks were the only pair of notebooks that had no bad sectors after the 14-inch operational free fall drop test. We found only one bad sector on one of the Dell Latitude D610 notebooks after the subsequent 29-inch drop test. Although some of the other notebooks were able to boot after the 14-inch free fall test, none of the other notebook pairs were able to successfully boot after the subsequent 29-inch drop tests.

In our shock testing, all of the notebooks passed the 142G operational shock test, except for one of the HP Compaq nc6220 notebooks. After the Bottom oriented shock test on this notebook, PC-Doctor found one bad sector. After subsequent shock tests, PC-Doctor was able to run to completion with no bad sectors on this notebook.

At the 162G operational shock level, the two Dell notebooks passed all PC-Doctor tests and successfully completed the WinBench 99 final run test on one of the notebooks. One HP notebook booted successfully, but was unable to run PC-Doctor after the bottom oriented shock test and could not complete the test. One Acer notebook was unable to boot after the bottom oriented shock test, while the other unable to complete this test as damage had occurred in earlier tests. Both Lenovo systems passed the 162G operational shock test.

All notebooks in our test successfully passed the spill test and dust tests.

Test Results Dell Inc. commissioned VeriTest, a service of Lionbridge Technologies Inc., to conduct a competitive notebook durability study. VeriTest conducted a series of tests to exercise the durability of the following notebook systems:

• Acer TravelMate 4652 • Dell Latitude D610 • HP Compaq nc6220 • Lenovo ThinkPad T43

Our testing consisted of conducting a series of durability tests of two units each of the four notebook models under test. We conducted all preconditioning, drop, shock, and spill testing on the premises of Dell Inc. in Austin, TX. We conducted the dust test on the premises of Professional Testing Inc (PTI), an independent, NVLAP accredited laboratory (www.ptitest.com) based in Round Rock, TX. All units were tested using factory settings. After a series of preconditioning activities on the notebooks under test, we performed the durability study by subjecting the eight notebook systems in this testbed to the following test types:


B. Operational Shock Test - The objective of the Operational Shock Test was to measure the level of

damage sustained while the notebook systems were accelerated to specific levels.

C. Spill Test - The objective of the Spill Test was to measure the effects on notebook systems when liquid is spilled on the notebook keyboard.

D. Dust Test - The objective of the Dust Test was to measure the effects on notebook systems when

exposed to fibrous dust particles over an extended period.


For complete details on the test methodology, see the Test Methodology section. We tested two identical notebooks from each notebook manufacturer. We appended the digits 01 and 02 to the notebook name. For example, the two Acer notebooks were labeled Acer-01 and Acer-02. Operational Free Fall Drop Test We dropped each notebook from a height of 14 inches and from 29 inches, in that order. Prior to running the test, we examined the hard drive within each notebook using PC-Doctor. After each drop test, we reexamined the notebook as described in the test methodology section to measure the total number of bad sectors. The table in Figure 1 illustrates the sector and notebook condition after each drop test.

Notebook 14-inch Drop Acer-01 4 Bad Sectors Acer-02 No Bad Sector Dell-01 No Bad Sector Dell-02 No Bad Sector HP-01 10 Bad Sectors HP-02 No Bad Sectors

Lenovo-01 11 Bad Sectors Lenovo-02 Unable to Boot

Figure 1. Operational 14-Inch Free Fall Drop Test Results As shown in Figure 1, we observed no bad sectors on either Dell Latitude D610 notebook after the 14-inch drop tests. Acer-01, HP-01 and Lenovo-01 exhibited bad sectors. Lenovo-02 failed to boot after the 14-inch drop test, requiring a replacement hard drive in order to continue testing.

Notebook 29-inch Drop Acer-01 3 Bad Sectors Acer-02 Unable to Boot from hard drive or from CD. Unable to complete testing Dell-01 No Bad Sector Dell-02 1 Bad Sector HP-01 Unable to Boot HP-02 142 Bad Sectors

Lenovo-01 15 Bad Sectors Lenovo-02 (Replaced HD before drop) Unable to boot

Figure 2. Operational 29-Inch Free Fall Drop Test Results As shown in Figure 2, we observed no bad sectors on the Dell -01 system and only one bad sector on the Dell-02 notebook after the 29-inch free fall drop test. Acer-01, HP-02 and Lenovo-01 exhibited bad sectors. Furthermore, Acer-02, HP-01, and Lenovo-02, were unable to boot after the 29-inch drop. The Acer-02 was unable to boot after a replacement hard drive and unable to boot from CD. As a result of the 29-inch drop test, we found the Acer-02 motherboard to have sustained damage that prevented us from performing additional tests with this notebook. Operational Shock Test We performed an operational shock test as described in the test methodology section. We performed testing at both 142G and 162G shock levels.


Figure 3 illustrates the results that we observed when performing the 142G shock testing. Each column with the Bottom, Right, Left, Front, and Back labels describes the outcome of shock testing in these different orientations. The last column, WinBench 99, describes the outcome of the full WinBench 99 test run that we conducted at the end of the five shock subtests.

Notebook Bottom Right Left Front Back WinBench 99 Acer-01 Passed Passed Passed Passed Passed Successful Acer-02 NA NA NA NA NA NA Dell-01 Passed Passed Passed Passed Passed Successful Dell-02 Passed Passed Passed Passed Passed Successful HP-01 1 Bad Sector Passed Passed Passed Passed Successful HP-02 Passed Passed Passed Passed Passed Successful

Lenovo-01 Passed Passed Passed Passed Passed Successful Lenovo-02 Passed Passed Passed Passed Passed Successful

Figure 3. Operational Shock Drop Test at 142 G Test Results

As shown in Figure 3, all of the notebooks passed the subsequent PC-Doctor test and the WinBench 99 final run test, except for the HP-01. After the Bottom oriented shock test on the HP-01 notebook, PC-Doctor found one bad sector. After subsequent shock tests, PC-Doctor was able to run to completion with no bad sectors on the HP-01 notebook. One Acer unit (Acer-02) was not able to complete this test as damage had occurred in earlier tests. Figure 4 illustrates the results that we observed when performing the 162G shock testing. Each column with the Bottom, Right, Left, Front, and Back labels describes the outcome of shock testing in these different orientations. The last column, WinBench 99, describes the outcome of the full WinBench 99 test run that we conducted at the end of the five shock subtests.

Notebook Bottom Right Left Front B Back WinBench 99 Acer-01 Unable to

Boot NA NA NA NA NA

Acer-02 NA NA NA NA NA NA Dell-01 Passed Passed Passed Passed Passed Failed Dell-02 Passed Passed Passed Passed Passed Successful HP-01 3 ( 1 from

previous shock + 2

more found) bad sectors

Passed Passed Passed Passed Failed

HP-02 Booted Successfully, but unable to

run PC-Doctor

NA NA NA NA NA

Lenovo -01 Passed Passed Passed Passed Passed Successful Lenovo -02 Passed Passed Passed Passed Passed Successful

Figure 4. Operational Shock Drop Test at 162G Test Results

As shown in Figure 4, the Lenovo notebook pair was the only pair of matching notebooks that passed all subsequent PC-Doctor tests and the WinBench 99 final run tests. The Dell notebook pair passed all PC-Doctor tests and successfully completed the WinBench 99 final run test on one of the notebooks. The Acer unit was unable to boot or run PC-Doctor successfully. The other Acer unit was not able to complete this test


as damage had occurred in earlier tests. On HP unit was unable to run PC Doctor after the first shock subtest, and the other unit passed all tests except the WinBench 99 final run. Spill Test We performed a Spill Test to measure the effects on the notebook when liquid was spilled on the notebook keyboard. As shown in Figure 5, all of the notebooks under test successfully passed the final WinBench 99 test run at the end of the spill test.

Notebook WinBench 99 Acer-01 Successful Dell-01 Successful HP-01 Successful

Lenovo-01 Successful

Figure 5. Spill Test Results Dust Test We performed one pass of the Dust Test to measure the effects on notebook systems when exposed to dust particles over an extended period. As shown in Figure 6, all of the notebooks under test successfully passed the final WinBench 99 test run at the end of the dust test.

Notebook WinBench 99 Acer-01 Successful Dell-01 Successful HP-01 Successful

Lenovo-01 Successful

Figure 6. Dust Test Results

Test Methodology Dell Inc. commissioned VeriTest, a service of Lionbridge Technologies Inc., to conduct a competitive notebook durability study. VeriTest conducted a series of tests to exercise the durability of the following notebook systems:

• Dell Latitude D610 • Lenovo ThinkPad T43 • HP Compaq nc6220 • Acer TravelMate 4652

Our testing consisted of conducting a series of durability tests on two units each of the four notebook models under test. We conducted all preconditioning, drop, shock, and spill testing on the premises of Dell Inc. in Austin, TX. We conducted the dust test on the premises of Professional Testing Inc (PTI), an independent, NVLAP accredited laboratory (www.ptitest.com) in Round Rock, TX. To ensure the repeatability and consistency of the test results, we conducted this study using two notebook systems from each vendor. Dell supplied VeriTest with all eight notebook systems in the test environment. Before testing began, VeriTest verified that all eight notebook systems were bought from authorized retail stores from respective vendors. We opened all packaging and manufacturer seals. Before conducting any durability test, VeriTest installed PC Magazine’s WinBench 99 and verified that all notebooks under test


successfully completed all benchmark tests to ensure the health of the notebooks. Other than the addition of WinBench 99 and PC-Doctor, all units were tested using the default settings as shipped. In particular, the Lenovo ThinkPad T43 systems had Active Protection System defaulted “on.” For more details regarding the PC Magazine WinBench 99 benchmark, go to http://www.veritest.com/benchmarks/winbench/default.asp . For more details regarding PC-Doctor, go to http://www.pc-doctor.com/ . Tests We performed the durability study by subjecting the eight notebook systems in this testbed to the following test types:


B. Operational Shock Test - The objective of the Operational Shock Test was to measure the level of

damage sustained while the notebook systems were accelerated to specific levels.

C. Spill Test - The objective of the Spill Test was to measure the effects of notebook systems when a Diet Coke is spilled on the notebook keyboard.

D. Dust Test - The objective of the Dust Test was to measure the effects of notebook systems when

exposed to fibrous dust particles over an extended period. Preconditioning Activities Prior to the start of testing, we conducted preconditioning activities to the notebooks under test. These activities were designed to simulate aging of the system through environmental and fatigue runs. The preconditioning activities included the following types of activity:

A. Thermal Shock Preconditioning B. Humidity Preconditioning C. Hinge Cycling Preconditioning D. Screen Marking Preconditioning

Full preconditioning procedures and observations are included Appendix A. Thermal Shock Preconditioning Notebooks were placed in a thermal shock chamber in non operational mode and subjected to 50 cycles of 30 minutes at -40°C and 30 minutes at 65°C. Humidity Preconditioning Notebooks were place in a thermal chamber and subjected to 39°C and 50% relative humidity for 24 hours. Hinge Cycling Preconditioning Notebooks were subjected to 20,000 iterations of hinge cycling from 10° to 170° hinge positions. Screen Marking Preconditioning


Notebooks were subjected to weight on the back of the display while in the closed position and vibrated on a vibration table for 30 minutes.

Test Procedure A. Operational Free Fall Drop Test - The objective of the Operational Free Fall Drop Test was to measure

the level of damage sustained while the notebook systems were dropped from a set of specific predefined heights.

For the operation free fall test, we conducted two drops. The first drop was from a height of 14 inches. The second drop was from a height of 29 inches. As explained earlier in the test methodology, we tested two notebooks of each type. For the 29-inch drop test, we dropped the first notebook in each pair at a slight angle to ensure that the collision with the ground was not square. We dropped the second notebook in each pair so that the notebook landed square with the ground upon contact. For the 14-inch drop, both drops were executed with a square landing. During the drop sequence, we ensured that the notebooks were fully charged and kept at room temperature. The drop area included commercial office grade carpeting with no padding over concrete surface. Before each drop, we ran PC-Doctor to completion to baseline the number of bad sectors the notebook contained prior to the test. We then placed the notebook on the plate of the drop tester with its base sitting flat on the plate and the screen facing forward. The display was opened at a 90° angle, relative to the keyboard plane (See Figure 6). During the drop, the notebook was powered on, running on battery power, with a full (85% or greater) battery charge. The notebook was running PC-Doctor and scanning the outside 5% of the hard drive sectors. To ensure that the hard drive head was in approximately the same location for all tests, we used an X-Ray image of the disk during the scan to ensure that PC-Doctor was running on the outside 5% of sectors.


Figure 6. Operational Free Fall Drop Test

We then released the plate and allowed the notebook to free fall until it came to rest. After the test, we rebooted each notebook and reran PC-Doctor to measure the new number of bad sectors on the hard drive. . B. Operational Shock Test - The objective of the Operational Shock Test was to measure the level of

damage sustained while the notebook systems were accelerated to specific levels. We conducted all testing at normal ambient condition of approximately 25°C (77°F) and 40% to 50% relative humidity. The operational shock test levels were 142 G (60 in/sec) and 162G (80 in/sec). We set the Pulse shape to be half-sine wave and two-millisecond duration measured at 10% acceleration from zero. The filter was set to 10 kHz. The notebooks were run from battery power. The notebook was fixed to the shock table such that it was not allowed to decouple from the table or deform from the fixture. The notebooks were tested on five sides:

1. Bottom side of notebook against table, LCD display opened at a 90-degree angle (see Figure 7). 2. Right side of notebook against table, LCD display opened at a 90-degree angle (see Figure 8). 3. Left side of notebook against table, LCD display opened at a 90-degree angle (see Figure 9). 4. Front side of notebook against table, LCD display opened at a 180-degree angle (see Figure 10). 5. Back side of notebook against table, LCD display opened at a 90-degree angle (see Figure 11).

Unit Bottom 1) Power on notebook. 2) Place the notebook as shown in Figure 7. 3) Start PC-Doctor to scan the outer 5% of the hard drive. 4) Shock the notebook. 5) Run PC-Doctor from 1% to 10% scan of the hard drive.

Drop Height = 29”

System powered on with display opened 90°

Office Carpet


Figure 7. Operational Shock Test on Unit Bottom Unit Right 1) Power on notebook. 2) Place the notebook as shown in Figure 8. 3) Start PC-Doctor to scan the outer 5% of the hard drive. 4) Shock the notebook. 5) Run PC-Doctor from 1% to 10% scan of the hard drive.

Figure 8. Operational Shock Test on Unit Right


Unit Left 1) Power on notebook. 2) Place the notebook as shown in Figure 9. 3) Start PC-Doctor to scan the outer 5% of the hard drive. 4) Shock the notebook. 5) Run PC-Doctor from 1% to 10% scan of the hard drive.

Figure 9. Operational Shock Test on Unit Left Unit Front 1) Power on notebook. 2) Place the notebook as shown in Figure 10. 3) Start PC-Doctor to scan the outer 5% of the hard drive. 4) Shock the notebook. 5) Run PC-Doctor from 1% to 10% scan of the hard drive.


Figure 10. Operational Shock Test on Unit Front Unit Back 1) Power on notebook. 2) Place the notebook as shown in Figure 11. 3) Start PC-Doctor to scan the outer 5% of the hard drive. 4) Shock the notebook. 5) Run PC-Doctor from 1% to 10% scan of the hard drive.

Figure 11. Operational Shock Test on Unit Back Post Test Run WinBench 99 and full scan of notebook using PC-Doctor.


C. Spill Test - The objective of the Spill Test was to measure the effects of notebook systems when liquid is

spilled on the notebook keyboard.

1. Set notebook on base with screen in vertical position oriented 90° to base. 2. Run the test with the notebook plugged in and the battery charged. 3. Power notebook on and run Business WinBench 99 for 2 minutes before starting the next steps. 4. While the machine is running Business WinBench 99, use a syringe to pour 20cc of Diet Coke™ on

three evenly spaced spots on the keyboard between the A and S, G and H L and ; . The total liquid poured will be 60cc.

5. Tilt the notebook towards its left side in an attempt to remove the liquid from the system, taking care to limit the motion to only one axis.

6. Wipe down surfaces of system with paper towels for 45 seconds to remove as much visible moisture as possible.

7. Shut down system. 8. Leave the notebook on it left side, on three stacked, unfolded paper towels to enhance drainage. 9. Wait for four hours and then power up the notebook. 10. Launch Microsoft Word and type on all keys and buttons. Use the TouchPad and pointing device to

verify functionality. D. Dust Test - The objective of the Dust Test was to measure the effects of notebook systems when exposed to fibrous dust particles over an extended period of time. This dust test was conducted at an independent test facility, Professional Testing (PTI), a NVLAP-accredited laboratory.

1. Set notebook on base with screen in vertical position oriented 90° to base. 2. Run the test with the notebook plugged in and the battery charged. 3. Set up notebook on dust environment turntable. 4. Ensure the temperature of the dust environment is 24°C. 5. Load fibrous dust media. 6. For a period of 16 hours, allow dust to occupy room and settle onto the open notebook/ 7. After each hour during the test, a technician cleaned the dust from the notebook keyboard and

chassis. 8. At the end of 16 hours, ramp up the chamber temperature to 35°C and hold constant for 30 minutes

(without dust loading). 9. Clean the notebook with the blower. 10. Reboot notebook and run Business WinBench 99.


Appendices

Appendix A. Preconditioning Procedures Thermal Shock Preconditioning To conduct the thermal shock preconditioning, we performed the following actions on each of the notebooks under test:

1. Examine hard drive using WinBench 99

2. Ensure the thermal shock chamber is set to room temperature (25°C).

3. Ensure systems are powered off and insert them into the chamber with the lids closed.

4. Place the notebook in the thermal shock chamber.

5. Decrease the temperature to -40°C.

6. Minimum temperature ramp rate for thermal shock is ± 40°C per minute.

7. Maintain the temperature for 30 minutes.

8. Increase the temperature to 65°C.

9. Maintain the temperature for 30 minutes.

10. Repeat steps 3 through 6 a total of 50 times.

11. After completing 50 cycles, return to 65°C for a minimum of 4 hours to evaporate any accumulated moisture.

12. Return to room temperature (25°C) before removing the notebook from the chamber.

13. Examine system for physical or operational damage. After we completed the thermal shock testing procedure, we observed bowed PCMCIA slots on the Acer and bowed optical drive bays on the Lenovo notebooks. Humidity Preconditioning We performed humidity testing on each notebook in the testbed. To conduct the humidity preconditioning, we performed the following actions on each of the notebooks under test:

1. Examine hard drive using WinBench 99.

2. Ensure the thermal chamber is set to 25°C and 50% Relative Humidity (RH).

3. Ensure systems are powered off and insert them into the chamber with the lids closed.

4. Change the conditions to 39°C/50% RH.

5. Maximum temperature transition rate is 15°C/hr and maximum humidity transition rate is 20%/hr.


7. Maintain 39°C/95%RH for 24 hours.



9. Change the conditions to 25ºC/50% RH.

10. Examine notebook for physical or operational damage After we completed the humidity testing procedure, all notebooks appeared to be in the same physical and operational order as prior to test. Hinge Cycling Preconditioning To conduct the hinge cycling preconditioning, we performed the following actions on each of the notebooks under test:

1. Using the automated hinge testing device, begin hinge cycling the notebook from approximately 10° (or nearly closed) to 170°. The notebook is manipulated to transition from a 10° hinge position to 170° position in approximately three seconds. At 10° and 170°, the notebook hinge movement is paused without movement for three seconds.

2. Allow the notebook to undergo 20,000 iterations of hinge cycling as described above.

3. Inspect notebook for damage. After we completed the hinge cycling procedure, we noted that both Acer units exhibited three to four white spots on middle / right part of screen. One Dell notebook (Dell-01) exhibited a white faded area. One HP notebook (HP-01) exhibited black waves commonly known as “curtain effect.” Screen Marking Preconditioning To conduct the screen marking preconditioning, we performed the following actions on each of the notebooks under test:

1. Place a notebook bag on the vibration table with rods around the bag to prevent the bag from falling off the table during test.

2. Place the notebook under test in the bag. 3. Place the rectangular plate with circular weights attached on top of the display cover; adjust the plate

to be at the center of the notebook display cover. 4. Use Velcro straps to secure the notebook and weights; if needed, use additional tape to prevent

motion of the plate on the notebook. 5. Vibrate the bag for 30 minutes using a random profile. 6. Inspect notebook for damage to the screen.

After we completed the screen marking procedure, we observed screen marks on seven out of eight systems. One Dell notebook (Dell-01) exhibited no marks, and the second Dell unit exhibited marks in a 54x15mm area. Both Acer units exhibited marks in an area of 153x85mm which required cleaner to remove. One HP notebook exhibited marks in an area of 18x2mm, while the other exhibited marks in a 126x77mm area. One Lenovo system exhibited marks in a 154x51mm area, and one Lenovo system exhibited marks in a 154x105mm area.


Appendix B. Test Equipment List

Test Device Manufacturer Model Number Calibration Date Due Date

Drop Tower Lansmont PDT-56E Not Required NA Figure B1. Drop Test Equipment List


Shaker Ling V830-335T Not Required NA Accelerometer PCB 353B33 6/1/2005 6/1/2006

Signal Conditioner PCB 482A16 5/17/2005 5/17/2006 Vibration Controller Dactron Dual DSP 6/1/2005 6/1/2006

Lap Top Bag N9158 Not Required NA Marking Plate NA NA 22 lb. weight, NA

Figure B2. Screen Marking Test Equipment List


Shock Tower Lansmont 6581 Not Required NA

Data Acquisition Lansmont TP3 Software Version

3.4.1 NA

Accelerometer PCB 353B18 12/28/2004 12/28/2005 Power Supply Lansmont Test Partner 7/22/2005 7/22/2006

Figure B3. Operational Shock Test Equipment List

Test Device Manufacturer Model Number Calibration Date Due Date Thermal Shock

Chamber Thermotron ATS-900-V-25-25-

AC Not Required NA Temperature

Controller Thermotron 7825 5/10/2005 5/10/2006 Figure B4. Thermal Shock Test Equipment List

Test Device Manufacturer Model Number Calibration Date Due Date Temperature

Humidity Chamber Thermotron SM 32 7800 Not Required NA Temperature

Humidity Controller Thermotron 7800 5/9/2005 5/9/2006 Figure B5. Humidity Test Equipment List


Test Device Manufacturer Model Number Calibration Date Due Date Hinge Cycle

Machine Design and

Assembly Concepts HiCym 2001 Not Required NA Hinge Cycle

Machine Design and

Assembly Concepts HiCym 1003

Torque Not Required NA Hinge Cycle

Machine Design and

Assembly Concepts HiCym 1003 Torque Not Required NA Hinge Cycle

Machine Design and

Assembly Concepts HiCym 2000 Not Required NA Controller for HiCym 2000 Eason Tech. 900X Not Required NA

Software for Hinge Cycle Machines

Design and Assembly Concepts

HiCym_2000_Rev9F.vi NA

Figure B6. Hinge Cycling Test Equipment List

We used four hinge cycler systems for this test. For first pass, i.e. Dell-01, IBM-01, HP-01, and Acer-01, we used all four hinge cyclers so that we could run the test in parallel. For the second pass, we had only two of the hinge cyclers available, so we used hinge cyclers #2 and #3 to conduct hinges testing on Dell-02, IBM-02, HP-02, and Acer-02.


PTI Cycloclastic® Dust Generator Specifications All dust tests were conducted at Professional Testing Inc (PTI), an independent NVLAP-accredited lab facility. Walk-in dust chamber consists of temperature/humidity control, rotating active/passive mode test table and dust generator.

Figure B7. PTI Cycloclastic® Dust Generator Diagram


Figure B8. PTI Cycloclastic Dust Generator Exterior

Figure B9. PTI Cycloclastic Dust Generator Interior


Appendix C. Notebook Configuration Information

Test Device Test Device Serial Number LXT750604353216594ED00 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (2 DIMMs) Motherboard Manufacturer Acer TravelMate 4650 BIOS / Version / Date Insyde (07/12/04) HD Make / Model / Size HITACHI- IC25N080ATMR04-0 (80 GB, 4200 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FBM Ultra ATA Storage Controllers - 2653 Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetLink (TM) Gigabit Ethernet

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem Agere AC97 Optical Drive TSSTcorp CD/DVDW TS -L632B OEM OS Windows XP Professional Service Pack 2 Figure C1. Acer-01 – Acer TravelMate 4652mi

Test Device Test Device Serial Number LXT750604353216596ED00 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (2 DIMMs) Motherboard Manufacturer Acer TravelMate 4650 BIOS / Version / Date Insyde (07/12/04) HD Make / Model / Size HITACHI- IC25N080ATMR04-0 (80 GB, 4200 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FBM Ultra ATA Storage Controllers - 2653 Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetLink (TM) Gigabit Ethernet

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem Agere AC97 Optical Drive TSSTcorp CD/DVDW TS -L632B OEM OS Windows XP Professional Service Pack 2 Figure C2. Acer-02 – Acer TravelMate 4652mi Acer notebooks shipped with Disk Anti-Shock Protection. Acer DASP (Disk Anti-Shock Protection) insulates the notebook components from bumps and shocks to prolong operating life and preserve data integrity.


Test Device Test Device

Serial Number D447S81 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (1 DIMM) Motherboard Manufacturer Dell Inc. Latitude D610 BIOS / Version / Date 08/11/05 HD Make / Model / Size Hitachi HTS541040G9AT00 (40 GB, 5400 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FBM Ultra ATA Storage Controllers - 2653 Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetXtreme 57xx Gigabit Controller

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem Conexant D110 MDC V.9x Optical Drive HL-DT-ST CDRW/DVD GCC4244 OEM OS Windows XP Professional service pack 2 Figure C3. Dell-01 – Dell Latitude D610

Test Device Test Device Serial Number G447S81 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (1 DIMM) Motherboard Manufacturer Dell Inc. Latitude D610 BIOS / Version / Date 08/11/05 HD Make / Model / Size Hitachi HTS541040G9AT00 (40 GB, 5400 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FBM Ultra ATA Storage Controllers - 2653 Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetXtreme 57xx Gigabit Controller

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem Conexant D110 MDC V.9x Optical Drive HL-DT-ST CDRW/DVD GCC4244 OEM OS Windows XP Professional service pack 2 Figure C4. Dell-02 – Dell Latitude D610 The Dell notebooks shipped with Dell StrikeZone technology. The StrikeZone Hard Drive Protection system was designed and developed by Dell to protect the Latitude from damage and potential loss of important business data. Using a resonant vibration damper, StrikeZone helps absorb the shock, dispersing energy away from the hard drive in the event of accidental notebook drops and bumps.



Serial Number CNU5232TMK Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (1 DIMM) Motherboard Manufacturer Hewlett-Packard 308A BIOS / Version / Date 04/13/05 HD Make / Model / Size Hitachi HTS541040G9AT00 (40 GB, 5400 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FB/FBM Ultra ATA Storage Controllers - 266F Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetXtreme Gigabit Ethernet

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem Agere Systems AC'97 Optical Drive MATSHITA UJDA765aDVD/CDRW OEM OS Windows XP Professional service pack 2 Figure C5. HP-01 – HP Compaq nc6220

Test Device Test Device Serial Number CNU5232R77 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (1 DIMM) Motherboard Manufacturer Hewlett-Packard 308A BIOS / Version / Date 04/13/05 HD Make / Model / Size Hitachi HTS541040G9AT00 (40 GB, 5400 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FB/FBM Ultra ATA Storage Controllers - 266F Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetXtreme Gigabit Ethernet

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem Agere Systems AC'97 Optical Drive MATSHITA UJDA765aDVD/CDRW OEM OS Windows XP Professional service pack 2 Figure C6. HP-02 – HP Compaq nc6220 HP Notebooks come with the Mobile Data Protection System. The HP Mobile Data Protection System helps protect the hard drive from shock and vibration and helps reduce the risk of data corruption.



Serial Number L3AD312 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (1 DIMM) Motherboard Manufacturer IBM 1875M1U BIOS / Version / Date Phoenix (07/15/05) HD Make / Model / Size Hitachi HTS541040G9AT00 (40 GB, 5400 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FBM Ultra ATA Storage Controllers - 2653 Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetXtreme Gigabit Ethernet

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem IBM Integrated 56K Modem Optical Drive MATSHITA UJDA765 DVD/CDRW OEM OS Windows XP Professional service pack 2 Figure C7. Lenovo-01 – Lenovo ThinkPad T43

Test Device Test Device Serial Number L3AD317 Processor / Speed Intel(R) Pentium(R) M processor 1.73GHz System RAM / Type / # of Slots 512 MB (1 DIMM) Motherboard Manufacturer IBM 1875M1U BIOS / Version / Date Phoenix (07/15/05) HD Make / Model / Size Hitachi HTS541040G9AT00 (40 GB, 5400 RPM, Ultra-ATA/100) HD Controller Intel(R) 82801FBM Ultra ATA Storage Controllers - 2653 Video Resolution Assigned 1024X768 Color Depth Assigned 32 bit Refresh Rate Assigned 60 Hz DAC Type Internal NIC 1. Broadcom NetXtreme Gigabit Ethernet

2. Intel(R) PRO/Wireless 2200BG Network Connection Modem IBM Integrated 56K Modem Optical Drive MATSHITA UJDA765 DVD/CDRW OEM OS Windows XP Professional service pack 2 Figure C8. Lenovo-02 – Lenovo ThinkPad T43 The Lenovo notebooks ship with Active Protection System on by default. See ftp://ftp.software.ibm.com/pc/pccbbs/mobiles_pdf/aps2mst.pdf). Systems with Active Protection System have an integrated motion sensor that continuously monitors the movement of the notebook, and, if a sudden change in motion is detected, it temporarily stops the hard drive to protect it from a potential crash. These systems are also equipped with the ThinkPad Hard Disk Drive Shock Absorber.


VeriTest (www.veritest.com), the testing division of Lionbridge Technologies, Inc., provides outsourced testing solutions that maximize revenue and reduce costs for our clients. For companies who use high-tech products as well as those who produce them, smoothly functioning technology is essential to business success. VeriTest helps our clients identify and correct technology problems in their products and in their line of business applications by providing the widest range of testing services available.

VeriTest created the suite of industry-standard benchmark software that includes WebBench, NetBench, Winstone, and WinBench. We've distributed over 20 million copies of these tools, which are in use at every one of the 2001 Fortune 100 companies. Our Internet BenchMark service provides the definitive ratings for Internet Service Providers in the US, Canada, and the UK.

Under our former names of ZD Labs and eTesting Labs, and as part of VeriTest since July of 2002, we have delivered rigorous, objective, independent testing and analysis for over a decade. With the most knowledgeable staff in the business, testing facilities around the world, and almost 1,600 dedicated network PCs, VeriTest offers our clients the expertise and equipment necessary to meet all their testing needs.

For more information email us at [email protected] or call us at 919-380-2800.

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