Chapter-08-Polymer Testing 2E - Hanser Publications

Fig.: 8.1Chapter 8: Busse, G.: Non-Destructive Polymer Testing. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

component

excitation E (t)(”in”)

response A (t)(”out”)

E

t

direct:– amplitude– phase– frequency– propagation time– damping– reflection

indirect:propertiesmaterial/component:– fibers– interfaces– damages

waveoscillation

– electromagnetic– acoustic– thermal

a

a

a

s

s

s

PEAl

Fe

10

10

10

10

10

2

1

0

-1

-25 10 20 50 100

U (kV)

;

(cm

)

as

-1


focus

+

X-ray tube

manipulator

x

zy

samplewith defect

intensity

detector(fluorescence)

deepest shadowpartial shadow

videocamera

computer forimage recording and processing


electron beam

sample

X-ray pin beam

diaphragms

detector array

X-r

ay tu

bede

tect

ors

with

aper

ture

dia

phra

gms


source

collimationsample

scattering film

beam block

Iabs

Iref

beam block0.3

-0.3

0.0

scat

terin

g an

gle

(°)

XY scan


120

150

180

210

240270

300

330

0

30

6090

2100

2000

1900

1800

1700

1700

1800

1900

2000

2100

refra

ctio

n si

gnal


0.25

0.20

0.15

0.10

0.05

0.00

.

crack orientation crack orientation

0.25

0.20

0.15

0.10

0.05

0.002000

1800

1600

1400

1200

1000

800

600

2000

1800

1600

1400

1200

1000

800

600

inte

nsity

(CP

S)

d

(a.u

.)

.in

tens

ity (C

PS

)

d (a

.u.)


laser beam

transparent film

diode array


laser

beamsplitterscanner

x y

objective

focal plane

confocal pinhole

filterdetector(photo multiplier)


100 µm

8020

0

200

80604020

00 100 200 300 400 500 600 700 800

distance (µm)

z (µm)

y (µm)

z (µ

m)

0

400600

800

200400

600800x (µm)


L

2L

Moire fringes distance


observer

laserbeam splitter

photographic platehologram

object virtual image

beam splitterphotographic plate

hologram

laser


beam splitter

laser

lens 3

lens 4

lens 1

lens 2

CCD camera

computer

object


illumination beam

reference beam

lens systemdiaphragm detectorsample

X2X3


Y

XZ


A A

10

8

6

4

2

veneer stripewood plate

150 mm

A-A

OLI A

OLI

hole

dia

met

er (m

m)

0.5

mm

2.5

mm


thermalexpansion

control unit

monitor with ESPI pattern

defect withheat emission

sample object beam

lens

lens

laser

beam splitter

reference beam

CCD camera


impact

delamination


thermal extension of acomponent without defect

stringer thickness of outer skin 4 mmstringer fracture

with delamination

local extension

1 2 3stringer fracture

1 2 3stringer


100

90

80

70

60

50

40

30

20

10

0 0 10 20 30

500460

380340

420

9080

7060

5040

3020

100 0

5

10

15

2025

340380420

460500


quartz bar

microwavesensor

waveguide

moldingcavity


L = L ─ LIIT

Tn =1 n n0

TL L L

microwaverefraction index nresonator length LII

II0


E

receiver

selective coupler

rectangular waveguide

reflector

sample

sample holder

transmitter


field intensity vector E

rotation angle

0 90 180 degree 360

rotation angle

orientation angle

reso

nato

r len

gth

anis

otro

py

diel

ectri

c th

ickn

ess


gate

+


10 10 10 10 10 10-2 -1 0 1 2 3

10

10

10

0

-1

-2

f (kHz)

10 min

20 min30 min

40 min50 min

60 min

tan


Y

X

Z

manipulatorPCsoftware

transducer

water bath

samplecomponent

defectEE

DE

RSE

RSEDEEE

time

ampl

itude

trans

duce

rem

itter

and

sen

sor


0 10 20 30 40 50

1

2

x (mm)

EE

RSEDE

t (µs

)


x coordinate

A

B

C

EE

RSE

time

and/

or d

epth


1.0

0.8

0.6

0.4

0.2

00 50 100 150 200 250 300 350 400

(°)

V (

a.u.

)0

theoryexperiment

PP 5 wt.-% GF= 2.25 MHz

= 45° = 10.7°

2


composite

composite

fiber

ultrasound emitterand sensorultrasound emitter

and sensor


0 90 180 270 3600 90 180 270 360 (°)

0 90 180 270 360 (°) (°)

ba c

sign

al

sign

al

sign

alFig.: 8.38

Chapter 8: Busse, G.: Non-Destructive Polymer Testing. In: Grellmann, W., Seidler, S. (Eds.): Polymer Testing. Carl Hanser Verlag, Munich (2013) 2. Edition

sensor450 kHz

emitter450 kHz

embeddedactuator

air-ultrasoundtransmission

sensor450 kHz

actuator =ultrasound emitter

excitationat 450 kHz

Institute for AircraftConstruction

embeddedactuator


60

50

40

30

20

10

00 10 20 30 40 50 60 70

(°)

sample

sensor

emitter

0

s0

a0

A (a

.u.)


1530

1520

1510

1500

1510

1520

1530

1200

800

400

0

400

800

1200

1500

1000

500

0

500

1000

1500

180

150

120

210

240270

300

330

9060

30

0

180

150

120

210

240270

300

330

9060

30

0180

150

120

210

240270

300

330

9060

30

0


550

540

530

520

510

1400

1000

600

20010 20 30 40 50

x (mm)

10 20 30 40 50

x (mm)

A (a

.u.)

ba

A (a

.u.)


500

400

300

200

1000 50 100 150 200 250

x (mm)

A (a

.u.)


crack

sample

generatedultrasound

optical system

exciting laser detecting laser

detector

confocalFabry-Perot


joint lineLcal

AE sensorµ30S

approx. 60 mmlength approx. 160 mm

40

30

20

10

00.25 0.75 1.25 1.75

positioning (mm)

a

cb 40

30

20

10

00.25 0.75 1.25 1.75

frequ

ency


frequ

ency

positioning (mm)

80 82 84 86 88 90 92 94 96 98

1.2

1.00.8

0.60.4

0.20

180015001200

900

600

300

f (kHz)

0


0 J0.5 J 1.0 J1.5 J2.0 J2.5 J

22 24 26 28 30 32 34

89

88

87

86

85

f (kHz)

1.000

0.998

0.993

0.9880 0.5 1.0 1.5 2.0 2.5

experimentrepetition experiment

E (J)k

phas

e an

gle

of a

dmitt

ance

(°) ba


76.0

75.5

75.0

74.5

74.0

73.50 600 1200 1800 2400

t (s)

reso

nant

freq

uenc

y (H

z)


0 2 4 6 8 10 12 14 16 18800

900

1000

1100

1200

1300

(%)

0 wt.-% GF5 wt.-% GF

30 wt.-% GFV

(m

s )

Lam

b


-1

-30

-25

-20

-15

-10

-5

0

5

10

(%)

0

5

10

15

20

25

30

I II III IV

0 2 4 6 8 10 12 14 16 18

0 2 4 6 8 10 12 14 16 18

(M

Pa)

non-

linea

r par

amet

er


0 10 20 30 40 50 60 700

10

20

30

40

50

60

70

80

1. cycle2. cycle3. cycle4. cycle

(MPa)

phas

e sh

ift (a

.u.)


225 kHz~


excitation

defect

component

scan

laser vibrometer

laser vibrometer linear behavior

non-linear behavior+ +


0 50 100 150 200 f (kHz)

-140

-160

-180

-200

f (kHz)

damage-free delaminations

0 50 100 150 200

-140

-160

-180

-200rel.

ampl

itude

(dB

)

rel.

ampl

itude

(dB

)


0 10 30 5020 40

0.05

0.04

0.03

0.02

0.01

0.00

f (kHz)

a

b c

v (

mm

s

)2

2-2


02468

101214161820

0 2 5 7 10 12 15 17

35 mm

245 mm

t (min)

025

50 100 150 200

2551015

20

354555

55

45

35

0 5 10 15 20t (min)

60

50

40

30

20

140

mm

a b

c d1.3 mm2.2 mm3.3 mm3.9 mm5.0 mm6.1 mm

T (°

C)

cont

rast

250

1.3 mm2.2 mm3.3 mm3.9 mm5.0 mm6.1 mm12 mm


IR detector

t0 t1/2

100 %

50 %

0 %t = 0

0.1388 L2

a =t1/2

flash


IR camera

thermal wavedefect

component on defect reflectedthermal wave

PC

framegrabber

D/A board

dimmerpack

phase/amplitudeFFT

optical wave

halogen spotlight


optical wave

defect component

thermal wave

component

defect

elastic wave thermal wave

sonotrode


31 2

4

5

coupling position80 mm

pos. defect depth

1 delamination 0.2 mm




38 m

m

5 intact d = 5 mm


pos. 3

pos. 2

pos. 4

pos. 5Tamb.

burst300 ms

1 2 3t (s)

pos. 5

pos. 4

0 0.4 0.8 1.2 1.6 2.0f (kHz)

a b

T (a

.u.)

A (a

.u.)


a b c d e


ultrasound converter

stringer fracturedelamination of outer skinstringer

ab

dc


63

62

61

60

59

580.22 0.26 0.30 0.34 0.38 0.42

dielectric loss

bad glued joints

good glued joints

reso

nant

freq

uenc

y (H

z)


defect detection

defect characterization

evaluation of relevance according to operating safety(defect or damage?)

defect propagation, damage mechanisms(which criterion propagates defect or damage?)

prediction using NDTdata for safe reamaining

service lifetime consequency:prevention of

damage-relevant defects


Chapter-08-Polymer Testing 2E - Hanser Publications

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Transcript of Chapter-08-Polymer Testing 2E - Hanser Publications