cetisPV-Moduletest-Flat1-EL-HSready-to-operate compact combination of a Class A+A+A+ IV-tester and a fully automated EL-inspection system for integration in module production lines

h a l m

cetisPV product linecetisPV product line

cetisPV-Moduletest-Flat1-EL-HSready-to-operate compact combination of a Class A+A+A+ IV-tester and a fully automated EL-inspection system for integration in module production lines

The cetisPV-ModuletestFlat1-EL-HS is a ready-to-operate compact combination of a Class A+A+A+ IV-tester and a fully automated EL-inspection system for integration in module production lines.

An reduced footprint and module transport as well as examination on typical conveyor level height allow an easy integration into production lines. Solar modules are loaded sunny-side down making additional handling of modules with robots unnecessary and allowing valueable space savings on your production ground.

The system is equipped with the h.a.l.m. typical fl ashing and exact measuring performances including the programmable pulsed solar simulator cetisPV-XF2. The simulator provides highly stable irradiance output over extraordinary long fl ash times from a single light source and programmable fl ash profi les to match the demands of current and up-coming solar cell technologies. In combination with the high reso-lution IV-curvetracer cetisPV-CT-L1, basic and advanced parameters can be measured with a standard deviation of better than 0.1%.

Correction to STC is calculated with values from a mono- or multicrystalline solar cell with integrated PT100 sensor cetisPV-MON1. The system is controlled by a ready to go application software package PVControl featuring as standard function: statistical analysis, extended evaluations of series and shunt resistance, hysteresis measurements, database storage, and documentation generation.

EL-inspection system

The EL-inspection is based upon a moving camera scanning-system. The images are captured by max. 6 cameras. The cells are scanned individually and combined into a 64 Mpixel image. The pixel resolution is below 0.17 mm and allows the detection of defects of 0.2 mm² or bigger sizes. The cycle time for the inspection is below 25 seconds. The standard power supply is capable of measuring modules of up to 80 V and 12 Amps. The integrated EL-system is developed by pi4_robotics GmbH.

The graphical user interface of pi4_control software allows the management of different products in software recipes which include image capturing and analysis settings as well as device parameters. Images are saved into a temporal ring buffer. The inspection analysis is saved in a database.

Optional automatic analysis and error detection for multi and mono technology

Captured electroluminescence images may be processed by the automatic analysis and error detection software according to different error types. The following errors are detectable:• cracks and micro cracks• dark spots• dark grid fi nger defects• brightness classifi cation

The cetisPV-ModuletestFlat1-EL-HS is an excellent solution combining high level IV-measurement and EL- inspection in only one system. It easily tests and transports the photo-voltaic module in a production line.

Technical Specifications

Sun simulator Class A+A+A++

Non-uniformity of irradiance in test plane Class A+, (less than ±1 %, IEC60904-Ed.2)

Spectral match Class A+ (less than ±12,5 %, IEC60904-Ed.2)

Temporal instability of irradiance Class A++ (less than ±0,5 %, IEC60904-Ed.2)

Flash duration • 10…60 ms standard set-up

• 10…200 ms with booster unit cetisPV-XF2-PB

Power requirements 6500 VA, 3 phase, 400 V, slow blow fuse

EL-images 1 MPx per cell, up to 72 MPx

EL-analysis Optional automatic crack and other defect detection

System size 2800 mm x 1600 mm x 1327 mm

Cycle time 45 s including module transport, IV-testing and EL-inspection

Module size Flexibly adjustable, minimum size 645 mm x 1000 mm,

maximum size 1000 mm x 2000 mm

Conveyor level 900 mm or higher, belt level adjustable

Module contacting (option) Automatic module contacting via adapters. Includes 8 contacting adapters

for circular module preparation before the testing and inspection stage.

Module feed Short edge leading

Additional components 19” rack for IV-testing components (cetisPV-XF2-M, measuring devices)

PLC connection Various interfaces available: Profi bus, Digital IO

User interface 2 monitor and control consoles for individual confi guration

of the IV- and EL-system.

Technical data are subject to change without notice.

h.a.l.m. elektronik gmbh Burgstrasse 106 60389 Frankfurt /Germany Tel +49 (0) 69 94 33 53-0 Fax +49 (0) 69 94 33 53-41 info@halm.de www.halm.de