Certificate of non-use for examining part - littelfuse.com/media/files/littelfuse/technical...
Transcript of Certificate of non-use for examining part - littelfuse.com/media/files/littelfuse/technical...
Littelfuse, Inc.
Certificate of non-use of The Controlled Substances
Company name Littelfuse, Inc
Product Covered Thyristor TO-92 Package EV series (Wire-Bonded)
Issue Date March 4, 2013
It is hereby certified by Littelfuse, Inc., that there is neither RoHS (EU Directive
2011/65/EU)-restricted substance, nor such use, for materials to be used for unit parts, for
packing/packaging materials, and for additives and the like in the manufacturing processes.
It is also certified by Littelfuse, Inc., that the products listed in this report do not contain Halogens
and their compounds judged per widely accepted industrial guidelines.
In addition, it is hereby reported to you that the parts and sub-materials, the materials to be used
for unit parts, the packing/packaging materials, and the additives and the like in the manufacturing
processes, are all composed of the following components.
Issued by
< Global EHS Engineer>
(1) Parts, sub-materials and unit parts
This document covers Thyristor TO-92 Package EV series, supplied by Littelfuse, Inc.
Please see table 1 on page 2 for the list of products covered.
<Materials used>
Please see table 2 on page 2 and table 3 on page 3 of this document.
(2) The ICP data on all measurable substances
Please see pages 3-39 attached to this document.
Remarks:
1. Pb (lead) contained in passivation glass on die bonding solder (item 3) and
silicon wafer (item 6) to be categorized as exempt in RoHS Annex III 7(a) and
7(c)-I.
Please refer to last page of this report for the extract of the applicable
exemptions of RoHS (EU Directive 2011/65/EU)
Page 1 of 3
Littelfuse, Inc.
Table 1: Littelfuse Part Number covered by this report
Standard (Catalog) Part Number SPECIAL DEVICE P/N
L0103DE MCR100-6 Any Special P/N which has base standard P/N listed in this table.
L0103ME MCR100-8
L0103NE S402ES
L0107DE S4X8ES S887S6X8ESRP
L0107ME S4X8ES1 S890S4X8ES1
L1017NE S4X8ES2 S891S6X8ES1
L0109DE S602ES
L0109ME S6X8ES
L0109NE S6X8ES1
LX803DE S6X8ES2
LX803ME S8X8ES
LX807DE S8X8ES1
LX807ME S8X8ES2
Any Standard Part Number listed here may be followed by suffix for packing options, such as RP or AP.
Table 2: Homogeneous Material Used
# Description Name of Material
Type Pages
1 Lead finish Hot solder dip metal 4-8
2 Molding compound Epoxy resin plastic 9-13
3 Die bonding solder Solder metal 14-21
Pb in this solder is exempted by RoHS Annex III 7(a). Please refer to Annex 7 for the RoHS exemption.
4 Die bonding wire Gold metal 22-28
5 Lead frame copper alloy metal 29-32
6 Silicon wafer
silicon metal 33-39
Pb is from in passivation glass on wafer and is exempted by RoHS Annex III 7(c)-I.
Please refer to Annex 7 for the RoHS exemption.
aluminum metal
glass glass
Page 2 of 3
Littelfuse, Inc.
Table 3: RoHS-regulated substance in raw materials
Components Analysis Result
Cd Cadmium
Cr Chromium
Hg Mercury
Pb Lead
PBB PBDE Total
Halogens
As Component Total
(Typical Values) < 2ppm < 2ppm < 2ppm <5 ppm*
1 < 5 ppm < 5 ppm <100ppm
Outside lead finish (Hot-Tin dipping)
See pages for the detail.
< 2ppm < 2ppm < 2ppm 49ppm*2
< 5ppm < 5ppm ---
Epoxy Resin compound (Mixture of resin, filler and fire retardant)
See pages for the detail.
< 0.5ppm < 1ppm < 2ppm < 5ppm < 5ppm < 5ppm 126 ppm
Die Bonding Solder
See pages for the detail.
< 2ppm < 2ppm < 2ppm 88wt%*3
< 5ppm < 5ppm ---
Die-bonding Wire (Au wire)
See pages for the detail.
< 0.5ppm < 1ppm < 2ppm < 5ppm < 5ppm < 5ppm ---
Lead frame (Copper Alloy, KFC )
See pages for the detail.
< 2ppm < 2ppm < 2ppm < 2ppm --- --- ---
Silicon Die (Silicon + Metal electrode + passivation glass)
See pages for the detail.
< 2ppm < 2ppm < 2ppm 2.3% *4
< 5ppm < 5ppm < 50ppm
*1 Less than 5ppm Pb content overall, excluding Pb from passivation glass on the silicon die.
*2 Pb (lead) contained in outside finish is not exempted from restriction by RoHS, but considered as process
contamination. Littelfuse does not add Pb (lead) intentionally.
*3 Pb (lead) contained in die-bonding solder is exempted from restriction by RoHS Annex III 7(a).
*4 Pb (lead) contained in Silicon wafer is from passivation glass and is exempted from restriction by RoHS Annex III 7(c)-I.
Please refer to page 40 of this report for the applicable exemptions of RoHS (EU Directive EU Directive 2011/65/EU)
Page 3 of 3
sc$Test Report No. rseorTo, xcccoRponmot4leoutu
iE46 Yongam-nBongdong€ubWanju-gunJEONEUK
The iollowing merchandise was submitted
SGS Filo o.
Timolhy JeonJinhee KimCindy ParkJerry Jung/ T*ting Peraon
YAAl3-06857
nd identified by the cli€ntas:
lssued Date: 2013.02 15 Page I of5
. AYAA1&06
: 2 0 1 3 . 0 2 . 0 6
| 2013. 02.07 to 2013.02. 15
, please refer to following page(s)
: SGS Korca lhe sample(s) selecled by applic€nlwith following rcsulls
SGS Korea Co., Ltd.
-? il) -r--let-.J*6
Jetr Jang / Chemical Lab Mg.
_sGsTest Report
S.nple De3c.iption
[at€ri.13
No. resororfl-rcr. AYAA1 3-0685
: KTt\4C-1050c
iaYAAl3{0E57 lssued Date: 2013.02.15 Pa9e2of5
.001
J
Unlt I/|DL
Cadmium (Cd) m9KS lMlh €ierence to lEc 62321 :2008. lcP 0.5 N.O.
m9KS \Mih €fe€ne to lEc 62321:2008.lcP 5 N.D,Mercury (Hs) m9KS \\llth €ference to lEc 6232112008. lcP 2 N O .
Hexavalent Chrcmium (q Vl) mgKs $Ilh refe€n@ lo IEC 62321 :2008, UV-VIS N.O
FLm. R.t .danb+BB3/PBDES
u t MDL
m0/k0 wrh €ierence to lEc 62321:2008. Gc-|,1s 5 N.D.
Wrth refeen@ to IEC 62321:2008 GCMS 5 N.D.
lllth €feen@ ro lEc 62321 :2008, GC,MS 5 N.D.
Wth €feEn@ to IEC 62321:2008, GC-MS 5 N.O.
Wlh reference lo IEC 62321 :2008, GC-MS 5 N.D.
lMrh .eie€ne to lEc 62321 :2008, GC-MS 5 N D
Wlh reierenc€ to rEc 62321 :2008. GC-MS 5 N.D.
EC 62321:2008.GC-tMS 5 N.O.
EC 62321:2008, GC MS 5 N.O
EC 62321:2008. GC MS 5 N,D.
Monobromodiphenyl ether EC 62321:2008, GC-MS 5 N,D
Wrth referene to IEC 6232112008. GC-MS 5 N.D
wth referen@ ro lEc 62321 :2008, Gc Ms 5 N.O
TelEbomodiphenyl ether wih.efeEnc€ lo rEc 62321:2008, Gc-Ms 5 N D .
Penlabromodiphenyr elhe. wth reierenc€ to lEc 62321:2008 GC-MS 5 N.D.
Hexabrcmodipheny' eiher wth €fe€nce to IEC 62321 :2008, Gc-Ms 5 N.D
Heptabromodipherryl elher wth reie€nc€ to lEc 02321 :2008. Gc Ms 5 N.D.
Oclabrcmodiphenyl eiher wth reierence to lEc 62321:2008. GC-MS 5 N.D,
Nonabromodipherryl ether wiih €le€n@ lo lEc 62321 :2008, Gc-Ms 5 N.O
Deebomodiphenyl ether wlh reierenc€ to lEc 62321:2008 GC-MS N.D.
(1)N.D. = Not detecled.(<MDL)(2) mg/kg = PPm(3) MDL = lvlethod Creteclion Limi{4)- = No regulaiion(5) Negative = undeteclable / Por(6) t'= Qualitative analysis (No L(7) ' = Boiling_water-€xt€ctbn i
Negative = Absence of CrVlPositive = Presence of C lsolulion is equalor gr€ater t
)oatng)caling; the detected concentraiion in boiling-waler-€xtlaolonan 0.02 mg/kg with 50 cm2 sample surface area.
t - . .scs (q * co ! d | , . ! : .
-
NOTE
scsTest Report
Sampl6 Doacriplion
El$3tstss
No. rssorov
: KTMC,I
AYAAI3-06857 lssued Date: 2013.02.15 Page3of5
001
)
MDL
Di{2-elhylhexyl) phthalale (DEHP) US EPA 8061A, GC/MS 50 N.D.
Dibutyl phlh€late (OBP) US EPA80614, GC/MS 50 N.D.
Benryl buryl phrhalare (BBP) mqks us EPA 80614 , GC/tVlS 50 N.O.
EEqs.AgtsslllE
il|DL
Hexsbromoctclododecane mdks USEPA 3540C, LC/IMS 5 N.D.
IOTE:(1) N.D. : Not detected.(<MDL)(2) mg&g = ppm(3) MDL = Method Delection Limi(4) _ = No rcgulation(5) Negative = undetectable / Pol(6)" = Qualitalive analysis (No L(7)' = BoilinS-waleFexlraclion:
Negalive : Absence of CrVlPositive = Pres€nce ofC lsolution is equalor grealer t
nlJ
:oatrng)oatingt lhe delected concentration in bollrng-water-exiractonan 0.02 mg/kg with 50 cm2 sample surface area.
NOT
YAAt3{6857 lssued Daler 2013.02. 15 Page 4 of 5
Picture ol Sample as Rec€ived:
NOTE:(1) N.D. = Not detected.(<MDL)(2) mgftg = ppm(3) llDL = Method Deteclion Lim(4) - = No regulation
{6) " = Oualilalive analysis (No(7)' = Boiling-waterextradion:
Negative = Absence of CrVlPositive = Pr€sence olC l
(5) Negative = Undeteclable /
ngr the detected concenlration in boiling-water€xtraclion
solution is equalor grcater 0.02 mg/kg wiih 50 c.n2 sample surrace area.
_scsTest Report No. roeor
Cd/Pb/Hg
Total Oigestion
DATA
NOTE:
The samples were dissolved lotallySeciion Chief : Gilsae Yi
(1) N.D. = Not delected.(<MDL)(2) mg/kg = ppm(3) MDL = lvethod oeteclion Li(4)- = No rcgulation(5) Negative = Undeleclable /
soldion is equalor greater
(6)1* = Qualitative analysis (No(7)' = Boiling-water-€xt€clion:
Negative = Absenc€ of CA/lPositive = Prcsence of CrVl
YAAi3-06657 lssued Date: 2013.02 15 Page5of5
Testing Flow for RoHS:CdtPb/Hg/Cf /PBBS&PBDES Testing
PB s/PBDES Cr a .
by pE-conditioning melhod accoding to above flow chadfor
DATA
Cd,Pb,Hg.
nrr)
the detected concentration in boiling-waler-€xt|acnonan 0.02 mg/kg wjlh 50 crn2 sample suriace area.
i*33r.Ilaf#:ffi -"s:--::--'::';;-:;F-rii-a j;:-{.;T:--i*-:*E*-:
"' End "'
SamDle ll€asurement
Nonmetallic liaterial
Adding Extraclion Solution
Filtration and pH AdjGtrnent
Adding 1,s-Diphenylcarbazid€for Color D€vdooment
Adding 1,5-Diphenylcarbazide
for Color Development
A R€d Color lndlcatesthe Pre3ence of CrVl
Test Report No: 10295887(1) Date: 22-Feb-13 Page 1 of 8
Heraeus Materials Singapore Pte Ltd26 Pioneer Crescent #06-11/12 West Park Bizcentral Singapore 628558
The following sample(s) was/were submitted and identified by/on behalf of the client as:
Sample Description :
Sample Receiving Date : 20-Feb-13Testing Period : 20-Feb-13 to 22-Feb-13
Test Requested : In accordance with the RoHS Directive 2011/65/EU Annex II.
Test Result(s) : Please refer to next page(s).
Conclusion : Based on the performed tests on submitted sample(s), the results complywith the RoHS Directive 2011/65/EU Annex II ; recasting 2002/95/EC.
Signed for and on behalf of SGS Testing & Control Services Singapore Pte Ltd
Y.C. ThamLaboratory Manager
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
PbSn2Ag2.5 Solder Wire
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic formatdocuments, subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability,indemnification and jurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the timeof its intervention only and within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties toa transaction from exercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content orappearance of this document is unlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report referonly to the sample(s) tested and such sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
Test Report No: 10295887(1) Date: 22-Feb-13 Page 2 of 8
Test Result(s):
Sample Description :
mg/kg n.d. 2 100
mg/kg 953739.3+ 2 1000
mg/kg n.d. 2 1000
--- Negative #(By spot test / boiling water extraction)
mg/kg n.d. - 1000mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. - 1000mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -mg/kg n.d. 5 -
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
PbSn2Ag2.5 Solder Wire
Test Item(s): Unit Method Results MDL RoHS Limit
Cadmium(Cd) With reference to IEC62321, Ed1:2008. Analysis was performed by ICP/AES
Lead (Pb) With reference to IEC62321, Ed1:2008. Analysis was performed by ICP/AES
Mercury (Hg) With reference to IEC62321, Ed1:2008. Analysis was performed by ICP/AES
Hexavalent Chromium (CrVI) With reference to IEC62321, Ed1:2008 and performed by Spot test / boiling water extraction method. (see Note 9)
Sum of PBBs
With reference to IEC62321, Ed1:2008. Analysis was performed by GC/MS
MonobromobiphenylDibromobiphenylTribromobiphenylTetrabromobiphenylHexabromobiphenylPentabromobiphenylHeptabromobiphenylOctabromobiphenyl
Pentabromodiphenyl ether
NonabromobiphenylDecabromobiphenylSum of PBDEsMonobromodiphenyl ether
0.02 mg/kg
with 50 cm2
surface area
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
Decabromodiphenyl ether
Hexabromodiphenyl etherHeptabromodiphenyl etherOctabromodiphenyl etherNonabromodiphenyl ether
Dibromodiphenyl etherTribromodiphenyl etherTetrabromodiphenyl ether
Test Report No: 10295887(1) Date: 22-Feb-13 Page 3 of 8
Test Result(s):
Sample Description :
mg/kg n.d. 50 -
mg/kg n.d. 30 -
DBP (Di-butyl phthalate) mg/kg n.d. 30 -
DEHP (Di-(2-ethylhexyl) phthalate) mg/kg n.d. 30 -
Note: (1) mg/kg = ppm ; 0.1wt% = 1000ppm(2) n.d.= Not Detected(3) MDL = Method Detection Limit(4) “-“ = Not regulated (5) * : Exceeds limit (6) # : Positive means the presence of CrVI on the tested areas. Negative means the absence of CrVI on the tested areas.(7) Spot-test:Negative = Absence of Cr(VI) coating / surface layerPositive = Presence of Cr(VI) coating / surface layerThe tested sample should be further verified by boiling-water-extraction method if the spottest result cannot be confirmed.Boiling-water extraction:Negative = Absence of Cr(VI) coating / surface layerPositive = Presence of Cr(VI) coating / surface layer the detected concentration in boiling-water-extraction solution is equal or greater than 0.02 mg/kg with 50 cm2 sample surface area.(8) Reference information:Directive 2011/65/EU recasting RoHS Directive 2002/95/EC:Hexabromocyclododecane(HBCDD), Benzyl butyl phthalate (BBP), Di-butyl phthalate (DBP), Di-(2-ethylhexyl) phthalate (DEHP )are considered as a priority for risk evaluation and substance restriction.
+Exemption: The received sample is exempted under directive 2011/65/EC Annex III Article 4(1): 7(a)lead in high melting temperature solder type solders (i.e. tin-lead solder alloys containing more than 85% of lead).
Remarks: Sample received was totally dissolved by preconditioning method for test item(s)Pb, Cd & Hg only.Lab Analyst(s): Jay, Jojo and Pheng
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
With reference to USEPA 3540C & 8270D. Analysis was performed by GC/MS
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification and jurisdictionissues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention only and within thelimits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction from exercising all their rightsand obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document is unlawful and offenders may beprosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested and such sample(s) are retained for 30 daysonly. This document cannot be reproduced except in full, without prior approval of the Company.
PbSn2Ag2.5 Solder Wire
With reference to USEPA 3540C & 8270D. Analysis was performed by GC/MS
MDL RoHS Limit
HBCDD (Hexabromocyclododecane) With reference to USEPA 3550C & 8270D. Analysis was performed by GC/MS
Test Item(s): Unit Method Results
BBP (Benzyl butyl phthalate) With reference to USEPA 3540C & 8270D. Analysis was performed by GC/MS
Test Report No: 10295887(1) Date: 22-Feb-13 Page 4 of 8
Sample photo: Sample Description :
SGS authenticate the photo on original report only
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
PbSn2Ag2.5 Solder Wire
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
Test Report No: 10295887(1) Date: 22-Feb-13 Page 5 of 8
Cr (Vl)
Remarks: Sample received was totally dissolved by preconditioning method. (CrVl method excluded)
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
Process Flow of IEC 62321 (Pb, Cd, Hg & Cr6+)
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
Pb,Cd
Solution
ICP-AES
Acid digestion by suitable acid depended on different sample material
Filtration
Residue
1) Alkali Fusion2) HCl to dissolve
Sample Measurement
Cutting / Preparation
Microwave digestion with HNO3/HCl/HF
Heat to appropriate temperature to extract
Cool, filter digestate through filter
Add diphenyl-carbazide for color development
Measure the absorbance at 540 nm by UV-VIS
Add appropriate amount of digestion reagent
Hg
Test Report No: 10295887(1) Date: 22-Feb-13 Page 6 of 8
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
High Mass Range GC/MS
Data
Process Flow of PBBs and PBDEs by GC/MS (IEC 62321)
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
First Testing Process → Optional screen process …… Confirmation process ...→
Cutting/Preparation
Sample Pre-treatment
Screening Analysis
Solvent Extraction
Concentrate/Dilute extracted solution
Filter
Test Report No: 10295887(1) Date: 22-Feb-13 Page 7 of 8
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
Cutting/Preparation
Sample Pre-treatment
Solvent Extraction
Concentrate/Dilute extracted solution
Process Flow of HBCDD by GC/MS
Filter
High Mass Range GC/MS
Data
Test Report No: 10295887(1) Date: 22-Feb-13 Page 8 of 8
SGS Testing & Control Services Singapore Pte Ltd 3 Toh Tuck Link, #01-02/03, Singapore 596228 t +65 6379 0111 f+65 6777 2914 www.sgs.com
Member of SGS Group
Process Flow of Phthalate Analysis
Test Location: 3 Toh Tuck Link, #01-02, Singapore 596228This document is issued by the Company under its General Conditions of Service accessible at www.sgs.com/terms_and_conditions.htm and, for electronic format documents,subject to Terms and Conditions for Electronic Documents at www.sgs.com/terms_e-document.htm. Attention is drawn to the limitation of liability, indemnification andjurisdiction issues defined therein. Any holder of this document is advised that information contained hereon reflects the Company’s findings at the time of its intervention onlyand within the limits of Client’s instructions, if any. The Company’s sole responsibility is to its Client and this document does not exonerate parties to a transaction fromexercising all their rights and obligations under the transaction documents. Any unauthorized alteration, forgery or falsification of the content or appearance of this document isunlawful and offenders may be prosecuted to the fullest extent of the law. Unless otherwise stated the results shown in this test report refer only to the sample(s) tested andsuch sample(s) are retained for 30 days only. This document cannot be reproduced except in full, without prior approval of the Company.
Cutting/Preparation
Sample Measurement
Soxhlet Extraction
Concentrate and dilute the extracted solvent
Filter
Analyze by high-mass range GC/MS
***End of Report***
Test Report No. regor ovLrcrsryrx r casgsTo, HEEsultc menL co.. Llo.
#693-1Gojan-dongNamdong-gutncneomKorea
The following merchandise was submitted and identified by the client as :
fssued Date: 2011.12.02 Pagel orT
SGS Fllo No.
Product Name
Item No./Pait No.
Recslved Oat6
Tgst Pedod
Test ResultsT€t Pe]fo]med
AYAA1 1-38595
Gold Bonding VMre(4N)
Gold Bonding \Mre(4N)
2011.11.29
2011 . 11 .30 to 2011 .12 .02
For further details, please refer to following page(s)
SGS Korea tested the s€mple(s) selected by applicant with following results.
SGS Korea Co. Ltd.
Timothy JeonJlnhe. KimClndy ParkJerry Jung/T6tlng Po6on
ffi
J#-ITJeffJang / Chemical Lab lilgr
_sG$Test Report No. rogor or llrcrsrvmr r -sosss
sample No. : AYAA1',1-38595 001
lssued Date: 2011.12.02 Page 2 ol T
Sample OescriptionItem No./Part No.lllatedals
: Gold Bonding Wre(4N): Gold Bonding Wre(4N)
T€t ltem. Unlt Te3t Method iIDL
cadmium {cd) wth €ference to lEc 62321:200E, ICP 0 5 N.D.
Lead (Pb) wlh reference to tEc 6232112008, ICP 5 N.D.
Merc!ry (Hg) mg/Kg Wth rcbrence to IEC 62321:2008, lcP 2 N.D.
Hexavalent chromium (crVl) By boiling wth €ierence to lEc 62321:2008 Negaiive
Anlimony {sb) mS/kS Wth refe€nce to EPA3052(SS6), US EPA60108(1996), ICP
1 0 N.D.
Tesl lisms Unit Test Method MOL Results
mg/Ks wth refeEnce to lEc 62321:2008, GC-MS 5 N.D.
DibromobiDhenvl wtn €ference to lEc 62321:2008 Gc-Ms 5 N.D.
wth rcfercnce to lEc 62321 2008, GC-ML N.D,
Terabromobiohenvl mq/ks Wth returence io IEC 62321:2008,GC-MS 5 N.D.
Pentabromobphenyl wth reference to lEc 52321 2008, GC:U! 5 N.D.
mq/kg Wth reference to IEC 62321:2008, Gc-llq 5 N.D.
Heptabromobiphenyl ms/ks Wth retu€nce to IEC 62321:2008 GC'i4q 5 N.D.
Octabromobiphenyl mq/kq Wth refer€nce to IEC 62321:2008, GC-U9 5 N.D.
Nonabromobiphenyl mg/Kg Wih efe€nce to IEC 62321 2008, GC4! 5 N.D.
Dec€bromobiphenyl Wth |ebrence to IEC 62321:200E, GC-lvtS 5 N D .
MonobromodiPh€nYl ether Wlh relerence ro lEc 62321:2008, GC-MS 5 N.D.
DibromodiphenYl ether Wth rcierence to IEC 62321:2008 GGMS 5 N.D.
Tibromodiphenyl ether With €br€nce to IEC 62321 2008 GC-MS 5 N.D,
TelrabromodiphenYl ether wfih hiFEne ro IEC 62321.2008 GC-lvlS N.D.
5 N.D.PentabromodDhenyl ether wth rcne€nce io lEc 62321 20qQi9l!!
Hexabrcmodiphenyl ether \ fih FreEne io IEC 62321:2008, GC-lVlS 5 N.O.5 N.D.
HeotabromodiPhenyl elher wnh rcbrence to lEc 62321 2008 G(-;-Ms
odabrcmodiphenyl eth€r mg/Kg Wlh rcfe€nc€ lo IEC 62321:2008, GC'MS 5 N.D.
NOTE: (1) N.O. = Not detected (<MDL)(2) mg/kg = PPm(3) MDL = Method Detectron L'm'li4)-=Noreoulationisi " = Quat-native anatysis (No Unit)(6) ' = Boiling-water-extraclion:-
Neoative = Ab6ence of CrVl coating;;ffi;= ir;;;;;icirii-Jt-ind; tr'" a"t"a"o concentration In borling-water-extraction
".'f.itio" i"
"qr"roi g*'ter than 0 d2 mg/kg with 50 cm2 sampl€ sudace area
r,g:*g?1H'l'.:,1F:'?Hi;1fi ;aii:tiir;;6i{ -
Test Report No. resor or [r-crsryaar r -$sss lssued Date: 2011.12.02 Page3 of T
Sample No.sample De6criptlonItem No./Parl No.Matedala
AYM11-38595.001Gold Bonding \Mre(4N)Gold Bonding Wre(4N)
Teat ltom3 Unit Test Method MDL
Nonabromod|Dhenvl ether wth refeEnc€ to lEc 62321:2008. GGlq 5 N.D.
Decabrcmodiphenyl ether ms&s vvnh relerencs 10 lEc 62321 :2008, GC-MS 5 N.D.
Unit Test Melhod MDL Results
Bromine(Bd Wth refe€nc€ to ASTM D 7359-08 , IC 30 N.D.
Chlorine(Cl) Wrth €ieGnce lo ASTM D 735M8 , lC 30 N.D.
Wth €Grcnce to ASTM D 7359-08,lC 30 N.D,
lodine0) mg,Kg wdh refercnc€ io ASTM D7359{8, lC 50 N.O.
Te3t ltems Unit Tesl Mothod MDL Results
Tetrabromobisphenol A mg/Kg us EPA 3540C, GC/MS 1 0 N.D.
Teat ltams Unlt T€t ethod MDL Re8ull3
PFOA(Periuorooctanioc acid) us EPA 3540C/3550C, LC/149 N.D
PFOS(PefluorooctaneSutfonates-Acid/Melal savAmide)
mg/kg us EPA 3540C4550C, LC/l\rS 1 N.D.
NOTE: (1) N.D. = Not detecled (<MDL)(2) mgi kg = PPm{3) MDL = Method Deteclion Llmt(4)-=Noregulatlon{5) " = Qualitative analvsis (No Unit)(6)' = Boiling-water-extrac'tion:
Neoative = Absenc€ of C lcoating;;:;i:;;;;; c*ii-"tind"' tn" o"t"a"o concentration in boiling-warer-exl€ction
solution is equalor greater than 0 02 mg/kg with 50 cm2 sample sunace area
ffi =.*g:H:r.g:--t;;;:l:;-;;-;;;;;..
Test Report No. regororrLrcrsrymrr-sssgs fssued D€te: 2011 . 12. 02 Page 4 ol 7
Plcturc of SamDle as Roceived:
NOTE: {1) N.D. = Not detected (<MDL)(2) mgl(g = PPm(3) MDL = Method Detection LIm(4)-=Noregulationi5) " = Qualitative analysi6 (No unit)(6)' = Boiling-wateFextraction:
Neoative = Absenc€ of CrVl coatinq;;:il;= PriiJn. ; crv co;tin;: the detected concentration in boiling-wateFextraclion
Jrtion i" eqrat o, greattr than O d2 mg/kg with 50 cm2 sample surface area'
Test Report No. rsgor ot[rctslYll'l l-sgsgs rssued Date: 2011.12. 02 PagesotT
Testing Flow Chart for RoHS:Cd/Pb/Hg/Cfl /PBBs&PBDEs Testing
Cd/Pb/Hg PBBS/PBDES cr6* Cr 6+
Nonmetallic aterial
Adding Extraction Solution
Heating to 90-95"Cfor Extraction
Filtration and pH Adiustment
Adding 1,5-Dlphenylca.bazidefor Color DeveloDment
UV.Vis
;A
The samples were dissolv€d totally by pr€-conditioning method according to above flow chart for Cd,Pb,Hg'Section Chief : GilsaeY
NOTE: (1) N.D. = Not dotected.(<MDL)(2) mg/kg = PPm(3) MDL = Method Detection Limit(4)-=Noregulation(5) " = Qualitaiive analvsis (No Unit)(6) ' = Boiling-water-extraction:
Negative = Abs€nce of CrVI coatingPo;itive = Presence of CrVl coatnd; the detected concentraton in boiling-water-extractionsolution is equal or greater than 0 02 mgy'kg with 50 cm2 sample surfac€ area'
Hffii#i&*-iEsfi$-qE#efitr|s#**+@Hltr'j.Effi
DA
scs Korc. co Lld I r !:,oFr !a?i:i,
ilechanic_SampleM€chanic_Sample
Sample ileasurement
Clean-up with FlColumn
DATA
ilechanic_Sample
Metallic lrlaterial
Spot Test / BoillngWater Extraction
Adding 1,5-Diphenylcarbazide
for Color Development
A Red color Indicatesthe P.eaence of Cr6+
DATA
Test Report No. regor onrcrsryrar r -sesss fssued Date: 2011 . 12. 02 Paga 6 ol 7
Flow Chart for Halogen Test
NOTE: (1) N.D. = Not detec'ted.(<MDL)(2) mgikg = PPm(3) MDL = Melhod Deteclion Limit(4)-=Noregulation(5) '* = Qualitative analysis (No Unit)(6)' = Boiling-water-extrac.tion:
Negative = Absen6 of CM coatingPositive = Prosence of CrVl coating; the detected concenfation in boiling_water-extractionsolution is equal or greater than 0.02 mg/kg with 50 cm2 sample surlace area.
ffi 5ffi ;* *--gc*':'rc:s;:*'#;-B*f
Sample screening using XRF.
Liquid coniaining water(>8o%)?
Welgh the samples into the combBtion boat
Add ab3orption solution into the bomb or tube.
Admit 02 gas or 02 +Ar2 gas and stad the combugtion.
Allow durlng abgorption of the burnt gag.
Analyze abgorbed solution using lon Chromatography.
Data
Test Report No. regor orllrcrsryrrr r -sasss lssued Dater 2011 . 12. 02 Page 7 of 7
Flow Chart for PFOS/PFOA Test
NOTE: (1) N.D. = Not detec{ed-(<MDl)(2) mg/kg = ppm(3) MDL = Method Deteclion Limit(4)-=Noregulation(5) " = Qualitative analysis (No Unit)(6) ' = Boiling-water-extraclaon:
Negative = Abs€nce of CrVl coatingPo;tive = Presence of CrVl co€tind; the detecled concentmtion in boiling-water_extractionsolution is equal or greater lhan 0 02 mg/kg with 50 cm2 sample surface area'
r n: r$r 6! (ni f {: tr:i {rr:5! !i ,$Jffi!,.r: i, !r \!j!:s!r!!Jat
Sample pr€treatment / Separation
Sample extraction
ConcentraterDllute Extracted solution
Analysis was performed by HPLC/lttS
QA, OC review / Check analysis result
Data
Test Report No.
Client : TSP - T Co.,Ltd.Norutem R€gionT.Banldang, A. ilu
The following sample(s) was^^/ere
Sample DescriptionSample No.Sample ConditionQuantity Submittedlvaterial TypeSize (t x w)Item NameLot No.Country of OriginCounhy of DestinationBuyer's Name
sample Receiving DateTesting Peiod
Test Requested
Test Method
Test Results
Signed for andSGS (Thailand)
on behalf ofLimited
PtaY*Pompana LirathpongHardlines T€6ting Itanagel
rfubLfubhkfub'fdy,Mid!&
SGS {rt]airaidl Lio
^ArIEI-
l/Page I ot,lDate : 23-Jan-2013
I Estate 123 lloo 4,lamphun SlOO0Thailand
ubmitted and identified by/on behalf ofthe client as:
Lead
attached photograph
KOBE MaterialKFC0.381 43.0 mm.FT (FrA-34)81211+03KoleaI nalKEC:
18-J18-J
(1 ) |
Customer
-2013-2013 to 23-Jan-2013
with the RoHS Directive 2011/65/EU Annex ll ; recasting 2002/95/Ec
use method LBTY-08409 with reference toby ICP-OES.
(2) method LBTY-08409 with reference toum content Analyzed by ICP-OES.
method LBry-08408 with reference tory content,Analyzed by ICP-OES.
method LBTY-06378 with reference to IEC 62321ent Chromium by Colodess and Colored Chromate
ric Method, Analyzed by UV-MS speckometry.
refer to next page.
M'tuh.e;M*tu tt i#
IEC 62321 Ed1:2008for Lead
|EC62321 Ed1i2008for
1EC62321 Ed.1:2008 for(3)
(4) Ed.1:2008forCoating on MetalJ
' M , 4 i " h - d d f t c @
Le.lsvssvicr. 1113 gi nana lll5g n|tb Inod Onng tr.o Ya.nam &t|!r0r10120I r€6l()n6a(E41 2S174ES$ I +66l0l214 816830756 xMldr.cdn
SGSI
Test Report No. 2394TEST RESULTS
Tesl result€ by chemicalmethod
:23-Jan-2013
.:Ntrttd\t/Page 2 of4
mg/kg)
T€lr lt€m (3): Method Result (1)(Ref€r to)
UDL RoHS Limit
Lead (Pb) ( 1 ) 26 2 '1000
cadmium (cd) (2) 2 100
Mercury (H9) (3) 2 1000
lexavalent Chrom ium {C.Vl) by Spottest / boiling water extraction
(oplional)
(4) 1000
Te€t Part DesciptionResull (1) metal
(a) mgt tg = ppm;01wP/6 = 1000(b) n.d. = Not Detected(c)MDL = Melhod Detection Limi(d) spot-rest
Negative- Absence oi C lcc(Ihe lested sample should be
Boilin g-waler-€xtraction:Negative = Absence of C^/I oPositive = Presence of CfVl c'greater than 0.02 mg/kg with 5
(€) '1" = Not t€sulat€d(0 For corrosion protection costinis unavailable and thus results ofat the time oftesling
SGS llh.ilaidl
ing, Positive = Prcsence of C l coatingidher ver'fied by boiling-water-extraciion method il the spot test result cannot be
tingting;the detected concentration in boilingwater-etaction solution isequalor
i on metals: lnformation on storage condiiions and production dete ol the tested sample(Vl) represent status of lhe sample atthe time of testing represent stalus or the sample
h!;k,r{,htup'!"*E
j I tab.rldr Ssvtsr aU23 Sd Fai. l[ 50 Bdtlt lll to€d C|!isB*s YainaNa &.Col 10lA)Ir {6opm3611 aat186s I r€[email protected]| m3o58 tvivwroxs|'I x-..cb33sarr
Test Report No. Date :23-Jan-2013
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r.or.,.i.r: ar..,.t.rn,. a..il.. Cxt: t.l.r.F. rr.r.n.la, tl....rr. r.r ar...tnar.r.rv t
IEC 62321 : Pb/cd/Hdc'.1PAAr/PBOB TBtine
hl.rl.r rtr...3..nirrr. r.r.rndcr.n, {cr...r. trrntlD!.r..r r. ...x.rr...)
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,dd.'g r "rdlrur/€,b.rd.
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SGSTest ReDort No.
SAT'PLE'ATTACHMENT
tu&o.dLrandr6.copydt/E bBad-,fubrfu.fublt6'frdy,Mffi
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d}@t.d&Br*.&4e @'ee.-tuthtur.t b44.Eid6 r r. h cdM !+ ^ts".6.t
Date :23-Jan-2013
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Signature glidForQuedionPlease Ghfiwith SGSwww.tw.sal-om
Test Report No.:CE/2012B1363 Oale :201?J11114
LITE-ON SEMICONDUCTOR CORP.2&1, WU SHIN STREET, TAWU LUNG, KEELUNG, TAIWAN
Tho following sampl.(s) was/wer. submltted and identified by/on behalf of tho client as:
Page: 1 of 7
lr|| tlfifitttl
Sample DescriptionStyle/ltem No.Sample Receiving OateTesting Period
WAFERTHYRISTOR2012t111082012t 1 I tog r O 2012J11 | I 4
Test Reouo6ted : (1) As specified by client, to test Cadmium, Lead, Me.cury, Cr(Vl)' PBB6, PBDEScontents in the submitted t€mple.
(2) A6 specified by client, to test Halogen_Fluodne, Chlorine, Bromine, lodinecontents in the submitted 6amPle.
Please refer to next page(s).
: Please refer to next page(s).
T.5t Method
Te€t R€auqs)
NW,q,vi\
iedbra
Test Report No. : CE/201281363
LITEON SEMICONDUCTOR CORP.28-1, WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN
Date:2012111114 Page.2 d 7
tl|| ltlt lllllll
T€st R€aultls)
PART MME No.1 MIXED ALL PARTS (2 TYPES)
Test lten(s) Unlt irethod MDLResultNo.t
Cadmium (Cd) mgft9 Wttr reference to IEC 623211 2008 andperformed by |CP4ES.
2 n.d.
Lead (Pb) mdls Wittr reference to IEC 62321: 2008 andpedormed by |CPAES.
10900
Mercury (Hg) mgkg With referenca to IEC 62321 i 2008 andpedormed by lCPiES.
2 n-o.
Fexavalent Chromium cr(Vl) ms,/KgWit-n reference to IEC 62321 i 2008 andperformed by UV-VIS.
n.o.
Sum of PBB6
mg/kg,aar""alwith reference to lEc 6232'1:
performed by GC/MS.
5n.d.
Monobromobiphenyl n.d.
Dibromobiphenyl n.o.
Tribromobiphenyl 5 n.d.
Ietrabomobiphenyl 5 n.d.
PentabromobiPhenYl 5 n.d.n-o.Hexabromobiphenyl
5 n.d.tteptaorornobiptrenytoclabromobiphenyl 5 n.o.
Nonabromobiphenyl 5 n.d.
Decabromobiphenyl 5 | n.d.
Sum ol PBDEs n.d.
Monobromodiph€nyl eth€r 5 n.d.
5 n.o.Dibromodiphenyl etherTribromodiphenyl ether 5 n.d.
fetrabromodiphenyl ether n.d.
5 n.d.Pentabromodiphenyl elherHexabomodiphenyl ether 5 n.d.
n.d.Heptabromodiphenyl ether
n.d.Oclabromodiphenyl ether
5n.d.
NonabromodiphenYl etherDecabromodiphenyl ether n.d.
ffiffif
Test Report No. I CE/201281363 Oale | 201?,11114
LITE.ON SEMICONDUCTOR CORP,28-1. WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN
l,lote :1. mg/kg = ppm i 0.1wt% = 1o00ppm2. n.d. = Not Det€cted3. MDL = Method Det€ction Limit4 . " - "=No tRegu la ted5. The sample(s) was/w€re analyzed on behalf of the applicant as mixing sample in one testing
The above result(s) v/as/teere only given as the infomality value
NaraF rc rY ldvm/ r I - f r i L l l r f L rn l ] :
Page: 3 of 7
ttl|flltrItIatt]l
Test ltem(s) Unit Method MDLResultNo.l
HalogenHalogen-Fluorine (F)(CAS No.: 14762-9,1-8)
mg/KgWith reference to BS EN 14582:2007.An€lysis \ras perform€d by lC-
50 n.d.
Halogen-Chlorine (Cl)(CAS No.: 22537-15-1)
50 n.o.
Halogen-Bromine (Br)(CAS No.:10097-32-2)
50 n.d.
Halogenlodine (l)(CAS No.: 14362-44-8)
50 n .d .
Test Report No. : CE/2012,81363 Oa,'e'. 2012h1h4 Page: 4 of 7
l]fitlllfllll]ILITE-ON SEMICONDUCTOR CORP.2&1, WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN
1) These samples were dissolved totally by pre-conditioning method according to below iow chart.( Cf' test method excluded )
of measurementr Troy Chang
cf.
ICP.AES
Sample Material Digestion Acid
S'teel, crpper, aluminum, solder Aqua regia, HNq, HCl, HF, HrO,
Glass HNO3/HF
Gold, platinum, palladium, ceramic Aqua regia
Silver HNO3
Plastic HrSOi HrOr, HNO3, HCI
Others Added apprcpriate reag€nt to totaldioeslion
Note" : (1) For non-metallic material, add alkeline digestion reagent and heat to 90-9511(2) For metallic matedal, add pure water and heat to boiling.
a ; ; ; ; : : : - - ; - ' ' A j : . ; ' a l ls..; P""t"d o€€ar
"" r"br' o" req
ii'o ri'iil<ir<;;r' ri;q.;-ss. -bld 6r'ms.{c-dtr"*ti@mn. onlmnbd*.{"@n.n'ei's d conoblqe- aDotumP;;;;;;;bitu hd6mturcn $d,i"sd,@o" '*' dd d hd;/;i h$ ; ' . ; i i ; i ; ; ; . - , ?sd *h in ne r rEo ' c r ' en ta
"m . " i ; i " r + c "m* oe F5po*b l t v s t odsc " r ' noh t s
;d;,;" ;;;*6,"q,.1.." "gtu
a"o "d,sa-"'*,
ta ti;"d;;iu;;;ia- dd'.i" @di;;N tu r'u,i6ei dhubn ,0rco1o, hi' r*bn oli. o;;;;ii,ii:i;o oir;;,s 5*t"r,
, r r 4 i L n ! ; t 1 r r r . t
2) Name of the person who made measurement Climbgreat Yang
Add appropriate amount of
digestion reagent
Microwave digestion withAcid digestion by suitable aciddeDended on difierent s€mDlematerial {as below table)
Heat to appropriate
temperalure to ext act
Cool, filter digestate
through fitterAlkali FusionHClto dissolve
Add diphenyl-carbazide for
color development
measure the absorbance
at 540 nm by UV-VIS
Test Report No. : CE/201281363
LITE-ON SEIVICONDUCTOR CORP,28.1, WU SHIN STREET, TA WU LUNG, KEELUNG, TAIWAN
Date.2012111114
PBB/PBDE analytical FLOW CHART
Name ofthe person who made measuement Roman WongName of ihe pe6on in charge of mea6urement: Troy Chang
Page: 5 of 7
[||[lrtl|||tt!!rr
I
I
First testing proc€ss -----|
Optional scr€en Process ..'.
Confirmation process - .>
Screen analysisr . . . . . . r . . r , ! t r . . . r r I r ! . . . r
V
Sample extractjorvsoxhlet method
concentaate/DiluteExfacted solution
Analysis by GC/MS
vlgEue Report
,ifF#}:",sT;t::,,; IJ: :T:i4 l:fl [:::::;::::H:$;":,;il;;,,'-*;; d;.{;#;;,, ndb ' . . doccbmJ ldodmnE$Fdo+ -smo .q " ' " *o : t i . " im "
d!"*d*, .* ' "-* '* ;" . ; \ , "- ;dd; ' ; . ' 'd* '=dj .-*. ' . ' - - . . " . ' ' ' ' ' ' ' ' " ; ; i ' i " " - . i ;n# i ' in i * r . im," , 'y
o*" . - , . -^ . . . ' . . ' ; ; ; i . 'o . . - ' i la" - ' * .e* .or.ry-='" -'. "
* -,;:.iii*p-L#.i;r o*mm'"*'"t' aniftde- -rrbse*'oFd"j
, ) I n i . { . I s l r t t
Filter
Test ReportLITE-ON SEMICONDUCTOR CORP.2&1. WU SHIN STREET. TA WU LUNG, KEELUNG, TAIWAN
No. : CEl2012l/81363 Dale:2012111114
Analytical flow chart of halogen content'1) Md€ of the person who nEcle nEasurerEnt: Rita Chen2) Mfip of the person in charge of nEasurenBnt Troy Chang
Page: 6 of 7
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. M ' n d ' 9 8 5 1 ' e p o n ' * : 0 1 ! l o l Td ; ; ; : : ; ; i . : . r . ' / . 0 . r
" 4 i
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. . t e ' . t o ' ' a ' s ' s ^ . i ; ' ' ' ' i ; ; - ; ; c ; ; 6 " i ' 9h - * * iD ' Id m 6 o€lons 'nd* 'T 'd6;o' dod sn i r'" orJml' 6n'd
.. ., iii-.ip-;* i dt o; o;;;idJnm' do ore@i ?i F p'
: : " i r ' " ] ! ' l I r . w , . h * " k " N i w i i , i . , ; r f n l : E ' i
Sanple pretreatfiEnt / Separation
Weighting and putting sarnple in cell
Orygen Bomb Con$ustion / Absorption
Dilution to fi)@d volunE
Analysi6 w6 perfonned by lC
Test Report No. : C92012/81363 D8le | 201?,11114 Paget 7 ol7
lll]ltttllflllllllLITE-ON SEMICONDUCTOR CORP,28-1, WU SHIN STREET. TA WU LUNG, KEELUNG, TAIWAN
*' End of Repod '-
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B1363
81363