Bruker AFM Probes

The #1 worldwide source for AFM Probes & Accessories

Agenda

• Overview

• Nanofabrication Center

• BrukerAFMprobes.com Website

• Quantity Discounts/Promotions

• Silicon Probes Family

• Silicon Nitride Probes Family

• Electrical/MFM Probes Family

• Specialty Probes Family

• New Probes

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BrukerAFMprobes.comOverview

• The only AFM instrument manufacturer that also manufactures probes, thereby offering unparalleled comprehensive AFM solutions• No other manufacturer can offer the AFM, probe, applications and service support to keep

your AFM running at peak performance!

• State-of-the-art nanofabrication center where our probes are made enabling the highest quality and performance probes on the market• Our USA-based facility contains everything needed to manufacture the best probes in the

world

• Online web store where customers can shop and search for probes or AFM-related accessories• Search by sample type, application, or any other parameter or simply chat with our online

experts to help you find the best probe for your application

• Regular promotions are offered giving customers an opportunity to get more out of their probes budget• Check back to our website regularly for updated promotions

• Extensive line of products including silicon, silicon nitride, and specialty probes to meet the needs of most AFM users

• Strong focus on development with new probes entering the market on a regular basis

• Probes stocked in depots around the world to ensure fast delivery times to meet your critical deadlines

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Bruker AFM ProbesNanofabrication Center

• The majority of our probes are made at our nanofabrication center• 20,000 square foot facility located in Camarillo, CA (1 hour south of

our AFM building in Santa Barbara)• Dedicated manufacturing space includes:

• Class 1,000 cleanroom • Class 100 photolithography bay• Test and assembly area• Separate stockroom and shipping area

• State-of-the-art manufacturing equipment includes:• Wet & dry etch• Photolithography• Deposition• Inspection

• All employees are safety certified• Incident free for over 5 years

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BrukerAFMprobes.com Website

• The one site for all your AFM probes and accessories needs• Search for probes using our Product Wizard• Use our Probe Selector to guide you to the best probe for your application• Chat with us online for advice on choosing probes or accessories• Request quotes for probes or accessories• Download our latest catalog or request a hard copy to be sent to you• Find detailed educational information about different AFM modes• Find out about the latest Bruker announcements and events

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• Check our website regularly for

updated monthly promotions

www.BrukerAFMprobes.com

• Simplified packaging• Only 2 pack sizes 10-packs or wafer

• Easy to distribute amongst groups

• Avoid probes contamination

• Same price for a wafer than 38 boxes of 10

• Quantity discounts• Buy more and pay less

• Discounts start at quantities of 2

and improve from there

Bruker Promotions & Quantity Discounts

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Silicon Probe Family

• High performance probes for all user types and sample surfacesPremium probes

• For tightest specs, sharpest tips, and best topographical images

• Models MPP, RTESPA, TESPA, OTESPA

Standard probes • To maintain exceptional quality images at a lower price than premium probes

• Models NCHV-A, FMV, CONTV-A, NCLV

Ultra-Sharp & High-Aspect Ratio probes• For achieving optimum results on unique samples

• Models TESP-SS, TESP-HAR, DLCS-10

5/15/2012 7RTESPA OTESPA NCHV-A TESP-HAR TESP-SS

Silicon Nitride Probe Family

• Newest probe designs enabling advanced AFM technologiesFastScan probes

• High speed imaging in air & fluid on Dimension FastScan and MultiMode8 ScanAsyst-HR

• Models FASTSCAN-A, FASTSCAN-B, FASTSCAN-C, SCANASYST-AIR-HR

ScanAsyst probes• Superior force control and image acquisition without effort or hassle

• Models SCANASYST-AIR, SCANASYST-FLUID, SCANASYST-FLUID+

Sharp and Standard Nitride Lever probes• For accurate force measurements and high resolution on very soft samples

• Models SNL-10, MSNL-10, MLCT, DNP, DNP-S, NP, NP-S

5/15/2012 8FASTSCAN-A SCANASYST-AIR-HR SCANASYST-AIR SNL-10 DNP

MFM and Electrical Probe Family

• Probes for reliable & accurate electrical/magnetic property analysis Magnetic Force probes

• High resolution MFM imaging on all magnetic sample types

• Models MESP, MESP-LM, MESP-LC, MESP-HM, MESP-HR, MESP-RC

Platinum and Platinum/Iridium probes• Supporting all electrical modes - PFTUNA, SCM, EFM, TUNA, CAFM, SPoM

• Models PFTUNA, SCM-PIT, SCM-PIC, OSCM-PT, RMN

Doped diamond probes• Ultra-hard coating for SSRM mode and increased lifetime in other electrical modes

• Models DDESP-10, DDESP-FM-10

5/15/2012 9MESP PFTUNA SCM-PIC OSCM-PT DDESP-10

Specialty Probes Family

• Unique probes for CDAFM, SThM, STM, Nanoindentation, and moreCritical Dimension and Deep Trench probes

• For 3D measurements of semiconductor sidewalls and trench structures on Auto AFMs

• Models CDR50C, EBD-CDR20, CDP55A, MCNT-150, MCNT-500

Scanning Thermal Microscopy and Nanoscale Thermal Analysis probes• Compatible with VITA thermal imaging module on Icon, MultiMode, and Innova AFMs

• Models VITA-DM-GLA-1, VITA-HE-GLA-1, VITA-DM-NANOTA-300

STM probes• Electrochemically etched Tungsten or precise-mechanically formed Platinum-Iridium tips

• Models DPT10, PT10, PT-ECM10, DTT10, TT10, TT-ECM10, CLST-PTBO

5/15/2012 10CDR50C MCNT-500 VITA-DM-GLA-1 DPT10 TT10

New Probes

• FastScan – Released Q4 2011• Designed for use on the Dimension FastScan AFM• Enabling high speed and high resolution imaging• FastScan-A – specifically engineered for scanning in air

• k = 17 N/m, f = 1250 kHz, aluminum reflective coating

• FastScan-B – specifically engineered for scanning in fluid• k = 4 N/m, f = 400 kHz, Ti/Au reflective coating

• FastScan-C – specifically engineered for scanning in fluid on very soft samples• k = 1.5 N/m, f = 250 kHz, Ti/Au reflective coating

• PFTUNA – Release Q4 2011• Designed for use on PeakForce TUNA• Enables conductivity mapping on fragile samples such as photovoltaics, lithium ion

cathodes and carbon nanotube assemblies• K = 0.4 N/m, f = 70 kHz, Ti/Au reflective coating

• ScanAsyst-Air-HR – Release Q3 2011• Designed for use in Air on the ScanAsyst-HR fast scanning accessory on the

MultiMode 8 AFM• Enables up to 20X faster survey scans and up to 6X faster scans with no loss of

resolution• K = 0.4 N/m, f = 130 kHz, aluminum reflective coating

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