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IMPORTANT NOTICEDear customer,
As from October 1st, 2006 Philips Semiconductors has a new trade name- NXP Semiconductors, which will be used in future data sheets together with new contactdetails.In data sheets where the previous Philips references remain, please use the new links asshown below.
http://www.philips.semiconductors.com use http://www.nxp.com
http://www.semiconductors.philips.com use http://www.nxp.com (Internet)
[email protected] use [email protected](email)
The copyright notice at the bottom of each page (or elsewhere in the document,depending on the version)- © Koninklijke Philips Electronics N.V. (year). All rights reserved -is replaced with:- © NXP B.V. (year). All rights reserved. -
If you have any questions related to the data sheet, please contact our nearest sales
ofce via e-mail or phone (details via [email protected]). Thank you for yourcooperation and understanding,
NXP Semiconductors
BLF177HF/VHF power MOS transistorRev. 06 — 24 January 2007 Product data sheet
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
FEATURES
• High power gain
• Low intermodulation distortion
• Easy power control
• Good thermal stability
• Withstands full load mismatch.
APPLICATIONS
• Designed for industrial and militaryapplications in the HF/VHFfrequency range.
DESCRIPTION
Silicon N-channel enhancementmode vertical D-MOS transistorencapsulated in a 4-lead, SOT121Bflanged package, with a ceramic cap.All leads are isolated from the flange.
A marking code, showing gate-sourcevoltage (V GS ) information is providedfor matched pair applications. Referto the handbook 'General' section forfurther information.
PINNING
PIN DESCRIPTION
1 drain
2 source
3 gate
4 source
PIN CONFIGURATION
CAUTION
This product is supplied in anti-static packing to prevent damage caused byelectrostatic discharge during transport and handling. For further information,refer to Philips specs.: SNW-EQ-608, SNW-FQ-302A, and SNW-FQ-302B.
WARNING
Product and environmental safety - toxic materials
This product contains beryllium oxide. The product is entirely safe providedthat the BeO disc is not damaged. All persons who handle, use or dispose ofthis product should be aware of its nature and of the necessary safetyprecautions. After use, dispose of as chemical or special waste according tothe regulations applying at the location of the user. It must never be thrownout with the general or domestic waste.
ndbook, halfpage
MLA876
4 3
21
s
d
g
MBB072
Fig.1 Simplified outline (SOT121B) and symbol.
QUICK REFERENCE DATARF performance at T h = 25 °C in a common source test circuit.
MODE OFOPERATION
f(MHz)
VDS(V)
P L(W)
Gp(dB)
η D(%)
d 3(dB)
d 5(dB)
SSB class-AB 28 50 150 (PEP) >20 >35 <−30 <−30
CW class-B 108 50 150 typ. 19 typ. 70 − −
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
CHARACTERISTICST j = 25 °C unless otherwise specied.
SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT
V(BR)DSS drain-source breakdown voltage I D = 100 mA; V GS = 0 125 − − V
IDSS drain-source leakage current V GS = 0; V DS = 5 0 V − − 2.5 mA
IGSS gate-source leakage current V GS = ±20 V; VDS = 0 − − 1 µA
VGSth gate-source threshold voltage I D = 50 mA; V DS = 10 V 2 − 4.5 V
∆VGS gate-source voltage difference ofmatched pairs
ID = 50 mA; V DS = 1 0 V − − 100 mV
g fs forward transconductance I D = 5 A; V DS = 10 V 4.5 6.2 − S
RDSon drain-source on-state resistance I D = 5 A; V GS = 1 0 V − 0.2 0.3 Ω
IDSX on-state drain current V GS = 10 V; V DS = 1 0 V − 25 − A
C is input capacitance V GS = 0; V DS = 50 V; f = 1 MHz − 480 − pF
Cos output capacitance V GS = 0; V DS = 50 V; f = 1 MHz − 190 − pF
C rs feedback capacitance V GS = 0; V DS = 50 V; f = 1 MHz − 14 − pF
VGS group indication
GROUP
LIMITS(V) GROUP
LIMITS(V)
MIN. MAX. MIN. MAX.
A 2.0 2.1 O 3.3 3.4B 2.1 2.2 P 3.4 3.5
C 2.2 2.3 Q 3.5 3.6
D 2.3 2.4 R 3.6 3.7
E 2.4 2.5 S 3.7 3.8
F 2.5 2.6 T 3.8 3.9
G 2.6 2.7 U 3.9 4.0
H 2.7 2.8 V 4.0 4.1
J 2.8 2.9 W 4.1 4.2
K 2.9 3.0 X 4.2 4.3
L 3.0 3.1 Y 4.3 4.4
M 3.1 3.2 Z 4.4 4.5
N 3.2 3.3
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, halfpage 0
−5
MGP090
10 −1 1 1010 −2
−4
−3
−2
−1
ID (A)
T.C.(mV/K)
Fig.4 Temperature coefficient of gate-sourcevoltage as a function of drain current; typicalvalues.
VDS = 10 V; valid for T h = 25 to 70 °C.
handbook, halfpage
0
30
20
10
05 10 15
MGP091
ID(A)
VGS (V)
Fig.5 Drain current as a function of gate-sourcevoltage; typical values.
VDS = 10 V.
handbook, halfpage
0
400
300
200
10050 100 150
MGP092
RDSon(mΩ)
T j (° C)
Fig.6 Drain-source on-state resistance as afunction of junction temperature; typical
values.
ID = 5 A; V GS = 10 V.
handbook, halfpage
0
1200
800
400
020 40
Cis
Cos
60VDS (V)
C(pF)
MBK408
Fig.7 Input and output capacitance as functions
of drain-source voltage; typical values.
VGS = 0; f = 1 MHz.
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, halfpage
0
30
20
10
0100 200
MGP096
Gp(dB)
P L (W) PEP
Fig.9 Power gain as a function of load power;typical values.
Class-AB operation; V DS = 50 V; IDQ = 0.7 A;RGS = 5 Ω ; f1 = 28.000 MHz; f 2 = 28.001 MHz.
handbook, halfpage
0
60
40
20
0100 200
MGP094
η D(%)
PL (W) PEP
Fig.10 Two tone efficiency as a function of loadpower; typical values.
Class-AB operation; V DS = 50 V; IDQ = 0.7 A;RGS = 5 Ω ; f1 = 28.000 MHz; f 2 = 28.001 MHz.
handbook, halfpage
0
−20
−40
−30
−50
−60100 200
MGP097
d3(dB)
PL (W) PEP
Fig.11 Third order intermodulation distortion as a
function of load power; typical values.
Class-AB operation; V DS = 50 V; IDQ = 0.7 A;RGS = 5 Ω ; f1 = 28.000 MHz; f 2 = 28.001 MHz.
handbook, halfpage
0
−20
−40
−30
−50
−60100 200
MGP098
d5(dB)
PL (W) PEP
Fig.12 Fifth order intermodulation distortion as a
function of load power; typical values.
Class-AB operation; V DS = 50 V; IDQ = 0.7 A;RGS = 5 Ω ; f1 = 28.000 MHz; f 2 = 28.001 MHz.
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, full pagewidth
MGP095
input50 Ω
C1
C5C6
C8
L1 L2
D.U.T. L3 L6
L4R2R1
R3R4
C4C2
+VG
C3
C13
C10
C9
C11
C12
C15
+VD
C14
L5
R5 C7
output50 Ω
Fig.13 Test circuit for class-AB operation .
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
List of components class-AB test circuit (see Fig.13)
Notes
1. American Technical Ceramics (ATC) capacitor, type 100B or other capacitor of the same quality.
2. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric ( εr = 2.2),thickness 1.6 mm (Rogers 5880) .
COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO.
C1, C4, C13, C14 lm dielectric trimmer 7 to 100 pF 2222 809 07015
C2 multilayer ceramic chip capacitor(note 1)
56 pF
C3, C11 multilayer ceramic chip capacitor(note 1)
62 pF
C5, C6 multilayer ceramic chip capacitor 100 nF 2222 852 47104
C7 multilayer ceramic chip capacitor 3 × 100 nF 2222 852 47104
C8 electrolytic capacitor 2.2 µF, 63 V
C9, C10 multilayer ceramic chip capacitor(note 1)
20 pF
C12 multilayer ceramic chip capacitor(note 1)
100 pF
C15 multilayer ceramic chip capacitor(note 1)
150 pF
L1 5 turns enamelled 0.7 mm copperwire
133 nH length 4.5 mm; int.dia. 6 mm; leads2 × 5 mm
L2, L3 stripline (note 2) 41.1 Ω length 13 × 6 mm
L4 7 turns enamelled 1.5 mm copperwire
236 nH length 12.5 mm;int. dia. 8 mm;
leads 2 × 5 mmL5 grade 3B Ferroxcube wideband HF
choke4312 020 36642
L6 5 turns enamelled 2 mm copper wire 170 nH length 11.5 mm;int. dia. 8 mm;leads 2 × 5 mm
R1, R2 metal lm resistor 10 Ω, 1 W
R2 metal lm resistor 10 k Ω, 0.4 W
R3 metal lm resistor 1 M Ω, 0.4 W
R5 metal lm resistor 10 k Ω, 1 W
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, halfpage
0
10
5
0
−510 20 30
MGP099
Zi(Ω)
ri
xi
f (MHz)
Fig.14 Input impedance as a function of frequency(series components); typical values.
Class-AB operation; V DS = 50 V; IDQ = 0.7 A;P L = 150 W (PEP); R GS = 6.25 Ω ; R L = 6.25 Ω.
handbook, halfpage
0
30
20
10
010 20 30
MGP100
Gp(dB)
f (MHz)
Fig.15 Power gain as a function of frequency;typical values.
Class-AB operation; V DS = 50 V; IDQ = 0.7 A;P L = 150 W (PEP); R GS = 6.25 Ω ; R L = 6.25 Ω.
APPLICATION INFORMATION FOR CLASS-B OPERATIONRF performance in CW operation in a common source class-B test circuit (see Fig.19) .Th = 25 °C; R th mb-h = 0.2 K/W; R GS = 15.8 Ω unless otherwise specied.
MODE OFOPERATION
f(MHz)
VDS(V)
IDQ(A)
P L(W)
Gp(dB)
η D(%)
CW, class-B 108 50 0.1 150 typ. 19 typ. 70
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, halfpage
0 100 200
30
10
0
20
MGP101
Gp(dB)
P L (W)
Fig.16 Power gain as a function of load power;typical values.
Class-B operation; V DS = 50 V; IDQ = 100 mA;RGS = 15.8 Ω; f = 108 MHz.
handbook, halfpage
0
100
50
0100 200
MGP102
η D(%)
P L (W)
Fig.17 Two tone efficiency as a function of loadpower; typical values.
Class-B operation; V DS = 50 V; IDQ = 100 mA;RGS = 15.8 Ω; f = 108 MHz.
handbook, halfpage
0 1 2 4
200
0
100
3
MGP103
P L(W)
P IN (W)
Fig.18 Load power as a function of input power;
typical values.
Class-B operation; V DS = 50 V; IDQ = 100 mA;RGS = 15.8 Ω; f = 108 MHz.
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, full pagewidth
MGP104
input50 Ω
C1
C7C6 C11
C19
L1 L3
D.U.T.BLF177 L4 L8
L5
R2R1
R3
R5
R4
C2 C5
C3 C4
C16C14
C13 C15
C17
+VD
L7 C18
L6
R6 C12
C9 C10
output50 ΩL2
C8
Fig.19 Test circuit for class-B operation at 108 MHz.
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
List of components class-B test circuit (see Fig.19)
Notes
1. American Technical Ceramics (ATC) capacitor, type 100B or other capacitor of the same quality.
2. The striplines are on a double copper-clad printed circuit board, with PTFE fibre-glass dielectric ( εr = 2.2),thickness 1.6 mm (Rogers 5880) .
COMPONENT DESCRIPTION VALUE DIMENSIONS CATALOGUE NO.
C1, C2, C16, C18 lm dielectric trimmer 2.5 to 20 pF 2222 809 07004
C3 multilayer ceramic chip capacitor(note 1)
20 pF
C4, C5 multilayer ceramic chip capacitor(note 1)
62 pF
C6, C7, C9, C10 multilayer ceramic chip capacitor(note 1)
1 nF
C8 multilayer ceramic chip capacitor 100 nF 2222 852 47104
C11 multilayer ceramic chip capacitor 10 nF 2222 852 47103
C12 multilayer ceramic chip capacitor 3 × 100 nF 2222 852 47104C13, C14 multilayer ceramic chip capacitor
(note 1)36 pF
C15 multilayer ceramic chip capacitor(note 1)
12 pF
C17 multilayer ceramic chip capacitor(note 1)
5.6 pF
C19 electrolytic capacitor 4.4 µF, 63 V 2222 030 28478
L1 3 turns enamelled 0.8 mm copperwire
22 nH length 5.5 mm;int. dia. 3 mm;leads 2 × 5 mm
L2 stripline (note 2) 64.7 Ω 31 × 3 mmL3, L4 stripline (note 2) 41.1 Ω 10 × 6 mm
L5 6 turns enamelled 1.6 mm copperwire
122 nH length 13.8 mm;int. dia. 6 mm;leads 2 × 5 mm
L6 grade 3B Ferroxcube wideband HFchoke
4312 020 36642
L7 1 turn enamelled 1.6 mm copperwire
16.5 nH int. dia. 9 mm;leads 2 × 5 mm
L8 2 turns enamelled 1.6 mm copperwire
34.4 nH length 3.9 mm;int. dia. 6 mm;
leads 2 × 5 mmR1, R2 metal lm resistor 31.6 Ω, 1 W
R3 metal lm resistor 1 k Ω, 0.4 W
R4 cermet potentiometer 5 k Ω
R5 metal lm resistor 44.2 k Ω, 0.4 W
R6 metal lm resistor 10 Ω, 1 W
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, full pagewidth
MGP105
174
70
strap
strap straprivet
C1 C2
C3 C4
C8
C6C7
C5
L2L1
L3
R1 R2
R3
R4
L4 L7
L5
L8C14
C13
C12
+VDR6
L6
R5
C10C11
C9
C15
C19
C16 C18
C17
Fig.20 Component layout for 108 MHz class-B test circuit.
Dimensions in mm.The circuit and components are situated on one side of the PTFE fibre-glass board, the other side being fully metallized to serve as a ground.Earth connections are made by means of hollow rivets, whilst under the source leads and at the input and output copper straps are used for adirect contact between upper and lower sheets.
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
handbook, halfpage
0 200
4
−6
−4
MGP107
−2
0
2
100
ri
xi
Zi(Ω)
f (MHz)
Fig.21 Input impedance as a function of frequency(series components); typical values.
Class-B operation; V DS = 5 0 V; I DQ = 0.1 A;P L = 150 W; R GS = 15 Ω .
handbook, halfpage
0 200
10
0
2
MGP108
4
6
8
100
XL
ZL(Ω)
f (MHz)
RL
Fig.22 Load impedance as a function of frequency(series components); typical values.
Class-B operation; V DS = 50 V; I DQ = 0.1 A;P L = 150 W; R GS = 15 Ω .
handbook, halfpage
MBA379 Zi ZL
Fig.23 Definition of transistor impedance.
handbook, halfpage
0 200
30
10
0
20
100
MGP109
Gp(dB)
f (MHz)
Fig.24 Power gain as a function of frequency;
typical values.
Class-B operation; V DS = 50 V; I DQ = 0.1 A;P L = 150 W; R GS = 15 Ω .
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
BLF177 scattering parametersVDS = 50 V; I D = 100 mA; note 1.
Note1. For more extensive s-parameters see internet website:
http://www.semiconductors.philips.com.markets/communications/wirelesscommunicationms/broadcast
f (MHz)s 11 s 21 s 12 s 22
|s 11 | Φ |s 21 | Φ |s 12 | Φ |s 22 | Φ
5 0.86 −110.20 36.90 114.20 0.02 25.20 0.64 −84.90
10 0.83 −139.40 20.39 93.30 0.02 5.10 0.55 −112.00
20 0.85 −155.70 9.82 72.60 0.02 −13.40 0.60 −129.30
30 0.88 −161.50 5.96 59.30 0.02 −24.70 0.69 −138.00
40 0.90 −164.90 3.98 49.30 0.02 −31.70 0.76 −144.30
50 0.92 −167.10 2.83 41.90 0.01 −35.80 0.82 −149.30
60 0.94 −169.00 2.11 36.00 0.01 −36.80 0.86 −153.5070 0.96 −170.70 1.63 31.20 0.01 −33.70 0.89 −157.00
80 0.96 −172.20 1.29 27.40 0.00 −23.00 0.91 −159.90
90 0.97 −173.40 1.04 24.20 0.00 3.30 0.92 −162.40
100 0.97 −174.30 0.86 21.70 0.00 42.50 0.94 −164.50
125 0.99 −176.50 0.57 16.40 0.01 81.60 0.95 −168.80
150 0.99 −178.10 0.40 13.40 0.01 88.70 0.97 −171.90
175 0.99 −179.80 0.30 11.60 0.02 90.70 0.98 −174.50
200 1.00 179.20 0.23 11.00 0.02 90.80 0.98 −176.70
250 1.00 177.00 0.15 11.70 0.03 90.50 0.99 179.80
300 1.00 175.10 0.11 16.70 0.03 89.60 0.99 176.90350 0.99 173.30 0.08 24.10 0.04 88.30 0.99 174.30
400 1.00 171.80 0.07 33.10 0.05 88.00 0.99 171.90
450 0.99 170.10 0.07 42.70 0.05 87.80 0.99 169.60
500 0.99 168.50 0.07 51.90 0.06 86.50 0.99 167.40
600 0.99 165.40 0.07 64.20 0.07 84.90 0.99 163.10
700 0.99 162.30 0.09 70.60 0.09 83.10 0.98 158.90
800 0.99 158.90 0.10 73.80 0.10 82.20 0.98 154.80
900 0.99 155.30 0.12 74.90 0.12 80.70 0.97 150.60
1000 0.98 151.80 0.14 76.40 0.14 79.80 0.97 146.20
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NXP Semiconductors Product specication
HF/VHF power MOS transistor BLF177
PACKAGE OUTLINE
REFERENCESOUTLINEVERSION
EUROPEANPROJECTION ISSUE DATE
IEC JEDEC EIAJ
SOT121B 99-03-29
0 5 10 mm
scale
Flanged ceramic package; 2 mounting holes; 4 leads SOT121B
1 2
4 3
U3
D1
U2
H
H
b
Q
D
U1
q
A
F
c
p
w1 M M M
M Mw2
B
C
C
A
A B
α
0.25
UNIT A
mm
Db
5.825.56
0.160.10
12.8612.59
12.8312.57
28.4525.52
3.303.05
6.486.22
7.276.17
c D1 U3U2
12.3212.06
0.51
w1 w2
45 °
αU1
24.9024.63
Q
4.453.91
q
18.42
F
2.672.41
0.01inches 0.229
0.2190.0060.004
0.5060.496
0.5050.495
1.1201.005
0.1300.120
0.2550.245
0.2860.243
0.4850.475
0.020.980.97
0.1750.154
0.7250.1050.095
pH
DIMENSIONS (millimetre dimensions are derived from the original inch dimensions)
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NXP Semiconductors BLF177HF/VHF power MOS transistor
Legal information
Data sheet status
[1] Please consult the most recently issued document before initiating or completing a design.
[2] The term ‘short data sheet’ is explained in section “Denitions”.
[3] The productstatus of device(s) described in thisdocument may havechanged since this document was published andmaydiffer in case ofmultiple devices.The latestproduct statusinformation is available on the Internet at URL http://www.nxp.com .
DenitionsDraft — The document is a draft version only. The content is still underinternal review and subject to formal approval, which may result inmodications or additions. NXP Semiconductors does not give anyrepresentations or warranties as to the accuracy or completeness ofinformation included herein andshall have no liabilityfor the consequencesofuse of such information.
Short data sheet — A short data sheet is an extract from a full data sheetwith thesame product type number(s) andtitle. A short data sheet is intendedfor quick reference only and should not be relied upon to contain detailed andfull information. For detailed and full information see the relevant full datasheet, which is available on request via the local NXP Semiconductors salesofce. In case of any inconsistency or conict with the short data sheet, thefull data sheet shall prevail.
Disclaimers
General — Information in this document is believed to be accurate andreliable. However, NXP Semiconductors does not give any representations orwarranties, expressed or implied, as to the accuracy or completeness of suchinformation and shall have no liability for the consequences of use of suchinformation.
Right to make changes — NXP Semiconductors reserves the right to makechanges to information published in this document, including withoutlimitation specications and product descriptions, at any time and withoutnotice. This document supersedes and replaces all information supplied priorto the publication hereof.
Suitability for use — NXP Semiconductors products are not designed,authorized or warranted to be suitable for use in medical, military, aircraft,
space or life support equipment, nor in applications where failure or
malfunction of a NXP Semiconductors product can reasonably be expected toresult in personal injury, death or severe property or environmental damage.NXP Semiconductors accepts no liability for inclusion and/or use of NXPSemiconductors products in such equipment or applications and thereforesuch inclusion and/or use is at the customer’s own risk.
Applications — Applications that are described herein for any of theseproducts are for illustrative purposes only. NXP Semiconductors makes norepresentation or warranty that such applications will be suitable for thespecied use without further testing or modication.
Limiting values — Stress above one or more limiting values (as dened inthe Absolute Maximum Ratings System of IEC 60134) may cause permanentdamage to the device. Limiting values are stress ratings only andoperation ofthe device at these or any other conditions above those given in theCharacteristics sections of this document is not implied. Exposure to limitingvalues for extended periods may affect device reliability.
Terms and conditions of sale — NXP Semiconductors products are soldsubject to the general terms and conditions of commercial sale, as publishedat http://www.nxp.com/prole/terms , including those pertaining to warranty,intellectual property rights infringement and limitation of liability, unlessexplicitly otherwise agreed to in writing by NXP Semiconductors. In case ofany inconsistency or conict between information in this document and suchterms and conditions, the latter will prevail.
No offer to sell or license — Nothing in this document may be interpretedor construed as an offer to sell products that is open for acceptance or thegrant, conveyance or implication of any license under any copyrights, patentsor other industrial or intellectual property rights.
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Contact information
For additional information, please visit: http://www.nxp.com
For sales ofce addresses, send an email to: [email protected]
Document status [1][2] Product status [3] Denition
Objective [short] data sheet Development This document contains data from the objective specication for product development.
Preliminary [short] data sheet Qualication This document contains data from the preliminary specication.
Product [short] data sheet Production This document contains the product specication.
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http://slidepdf.com/reader/full/blf177n 19/19
NXP Semiconductors BLF177HF/VHF power MOS transistor
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Date of release: 24 January 2007Document identifier: BLF177_N_6
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Revision history
Revision history
Document ID Release date Data sheet status Change notice Supersedes
BLF177_N_6 20070124 Product data sheet - BLF177_5
Modications: • correction made to gure title of Fig.13
• correction made to note 2 on page 9
• correction made to note 2 on page 13
• correction made to gure note of Fig.20
BLF177_5(9397 750 14416)
20041217 Product specication - BLF177_4
BLF177_4
(9397 750 11579)
20030721 Product specication - BLF177_3
BLF177_3(9397 750 04059)
19980702 Product specication - BLF177_CNV_2
BLF177_CNV_2(9397 750 xxxxx)
19971216 Product specication - -