BI Review on Radiation Development and Testing
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Transcript of BI Review on Radiation Development and Testing
BI Review on Radiation Development and Testing
BI Review on Radiation Development and TestingSPS Beam Position Monitors:MOPOS Front-End Electronics
Jose Luis GonzalezBE/BI22/11/2013OutlineSPS Multi Orbit POsition System (MOPOS)System overviewFront-End ArchitectureRad-tol requirements, design and status Possible impact and mitigation Long-term radiation test planning and strategy BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20132BA2BA3BA4ECA4BA5ECA5BA6BA7BA1TT40TT41(CNGS)TI8(LHC)TI2(LHC)TT20(SPS NA)TT66(HiRadMat)TT60TT10(PS)SPS Multi Orbit POsition System (MOPOS) MOPOS Front-End216 BPMs in the tunnelExposed up to 100 Gy/yOptical transmission
MOPOS Read-OutIn surface buildings (BA1...6)
BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20133MOPOS: Simplified Block DiagramBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20134LogAmpsSerialADC 10MHzPickupUDRLxyFPGAOptical Link @ 2.4 Gb/sFPGADigital BoardRead-Out BoardTiming DistributionVME InterfaceSPS TunnelFront-End CHASSISSoftwareRadio FrequencyAnalogue BoardFront-End ArchitectureBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20135
Analogue BoardLog-AmpsAD8302ADL5519MAX2016ADC DriversADA4932-2THS4521Voltage regulatorsLT1963AEQTL1963-KTTLP3875-ADJTPS7A4501-KTTBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20136
PSI Irradiation Facilities (PIF)BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20137Energy: 230 MeVFlux: 1.6 108 p/cm2 sFluence: 1.874 1012 p/cm2 Current: 4.7 nACollimator: 58 mm (Si)Dose/run: 1 kGy - 105 rad/3.5 h
PSI: Analogue Test SetupBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20138
LogAmp ADL5519 & ADC-DriversBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/20139
Analogue ComponentsLogAmpsAD8302: Analog Devices, Dual Log AmpsADL5519: Analog Devices, Dual Log DetectorMAX2016: Maxim, Dual Log Detector
ADC DriversADA4932: Analog Devices, Differential ADC driverTHS4521: Texas Inst., Differential ADC driver
These components have been qualified at PSI (TID 1kGy)BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201310Voltage RegulatorsBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201311
Analogue ComponentsLow Dropout RegulatorsLT1963A: Linear Tech., LDO Regulator (1/3 bad)LP3875: National Semi., LDO Regulator (3/3 bad)TL1963A: Texas Inst., LDO RegulatorTPS7A4501: Texas Inst., LDO Regulator
These components have been qualified at PSI (TID 1kGy)BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201312Optical Transceivers Test BoardCommercial SFP ModulesDouble-fiber SFPFTTX Technology: FT3A05DSingle-fiber, bidirectionalLigent: LTE5350-BC and LTE3550-BCLightron: WSP24-313LC-I5A and WSP24-513LC-I3ASource Photonics: SPL-35-GB-CDFM and SPL-53-GB-CDFMYamasaki: 541315L-15B and 541315L-15YBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201313
PSI Test SetupEnergy: 230 MeV; Current: 2nA (~3.5 rad/s) or 3 nA (~6 rad/s); Collimator: 58 mm (Si)TID goal: 1 kGy - 105 rad/componentMeasurements every second:Communication rate: 1.25 Gb/s32-bit word sent from the controller board (FPGA, Spartan6)Electrical loopback on the SFP BoardCross-check between sent and received 32-bit word2 SFP modules tested in parallelFor each channel, 3 counters are enabled: single bit errors, multiple bit errors, total errors
BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201314Measurements Best SFP PartsBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201315
SFP Test Results SummaryLigent and Yamasaki components are very sensitive to the radiation level @ PIFSource-Photonics components are more resistant but with many error burstsFTTX and Lightron components behave much better but still generate many error bursts
For the MOPOS Front-End: decision to use the Versatile Transceiver (VTRx) developed at CERNTESTS to be done with long transmission fibres (up to 1.5 km)BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201316CERN VTRx Radiation SpecsVersatile Link Technical Specification, rev. 2 [J. Troska et al.]
BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201317
Tolerance LevelDose and fluence (20 Mev neutron equivalent)Calorimeter 10 kGy 5 x 1014 n/cm2 Tracker500 kGy 6 x 1015 n/cm2Short-Term StrategyCurrent Front-End Digital PCB (vers. 1)Analog Devices Octal 14-bit ADC: AD9252Xilinx Spartan6 FPGA (Triplication, Hamming Code Correction)CERN VTRX Optical Transceiver
Will allow the first functional tests of the MOPOS system in 2014 (both hardware and software)BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201318Long-Term Strategy: Radiation Tests for ADC & Digital PartsBeam Tests Conditions: equivalent to PSI Test Beams (230 MeV; TID: 1 kGy)
In our section there is no manpower available in 2014
BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201319Analogue/Digital Converters4065Msps LVDS Serial ADCAD9252: Analog Devices Octal 14-bit AD9259: Analog Devices Quad 14-bit
LTM9009: Linear Tech. Octal 14-bitLTC2171: Linear Tech. Quad 14-bit
ADS5294: Texas Inst. Octal 14-bitADS6442: Texas Inst. Quad 14-bit
BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201320ADC Radiation Tests (H. Takai/BNL)BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201321
TWEPP2013Digital ComponentsLow Voltage and LVDS Buffers74VCX162244: Fairchild 16-bit Buffer/Line Driver74ALVCH162244: Texas 16-bit Buffer/Line Driver74VMEH22501: Texas 8-bit Bus Transceiver
FIN1108: Fairchild 8-port LVDS Repeater
BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201322Digital Components: FPGASERDES integrated SRAM technologyXilinx SPARTAN6 (currently used)Test of the first board prototype: SPS 2014 Altera Stratix VCycling Redundancy Check of FPGA configurationPossibility to get the corresponding ASICExternal SERDES FPGA + GBT projectSRAM if failures are mostly related to SERDESAntifuse Microsemi Axcelerator AX2000 Flash RAM for SRAM configurationM25P128 NumonyxBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201323THANK YOU FOR YOUR ATTENTION!BI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201324Spare Slides: PSI Radiation TestsBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201325PSI: SFP Radiation SetupBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201326
SFP Tests: FTTX FT3A05DBI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201327
SFP Tests: Lightron I3ABI Review on Radiation Development and Testing - J.L. Gonzalez - 22/11/201328