BF245A-B-C

13
7/27/2019 BF245A-B-C http://slidepdf.com/reader/full/bf245a-b-c 1/13 DATA SHEET Product specification Supersedes data of April 1995 1996 Jul 30  DISCRETE SEMICONDUCTORS BF245A; BF245B; BF245C N-channel silicon field-effect transistors

Transcript of BF245A-B-C

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DATA SHEET

Product specificationSupersedes data of April 1995

1996 Jul 30

 DISCRETE SEMICONDUCTORS 

BF245A; BF245B; BF245CN-channel silicon field-effecttransistors

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1996 Jul 30 2

NXP Semiconductors Product specification

N-channel silicon field-effect transistorsBF245A; BF245B;

BF245C

FEATURES

Interchangeability of drain and source connections

Frequencies up to 700 MHz.

 APPLICATIONS

LF, HF and DC amplifiers.

DESCRIPTION

General purpose N-channel symmetrical junction

field-effect transistors in a plastic TO-92 variant package.

PINNING

CAUTION

The device is supplied in an antistatic package. The

gate-source input must be protected against static

discharge during transport or handling.

PIN SYMBOL DESCRIPTION

1 d drain

2 s source

3 g gate

Fig.1 Simplified outline (TO-92 variant)

and symbol.

handbook, halfpage 1

32

MAM257 

s

dg

QUICK REFERENCE DATA

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT

VDS drain-source voltage 30 V

VGSoff  gate-source cut-off voltage ID = 10 nA; VDS = 15 V 0.25 8 V

VGSO gate-source voltage open drain 30 V

IDSS drain current VDS = 15 V; VGS = 0

BF245A 2 6.5 mA

BF245B 6 15 mA

BF245C 12 25 mA

Ptot total power dissipation Tamb = 75 C 300 mW

yfs forward transfer admittance VDS = 15 V; VGS = 0;

f = 1 kHz; Tamb = 25 C3 6.5 mS

Crs reverse transfer capacitance VDS = 20 V; VGS = 1 V;

f = 1 MHz; Tamb = 25 C 1.1 pF

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1996 Jul 30 3

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

LIMITING VALUES

In accordance with the Absolute Maximum Rating System (IEC 134).

Note

1. Device mounted on a printed-circuit board, minimum lead length 3 mm, mounting pad for drain lead minimum

10 mm 10 mm.

THERMAL CHARACTERISTICS

STATIC CHARACTERISTICS

T j = 25 C; unless otherwise specified.

Note

1. Measured under pulse conditions: tp = 300 s; 0.02.

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT

VDS drain-source voltage 30 V

VGDO gate-drain voltage open source 30 V

VGSO gate-source voltage open drain 30 V

ID drain current 25 mA

IG gate current 10 mA

Ptot total power dissipation up to Tamb = 75 C; 300 mW

up to Tamb = 90 C; note 1 300 mW

Tstg

storage temperature 65 +150 C

T j operating junction temperature 150 C

SYMBOL PARAMETER CONDITIONS VALUE UNIT

Rth j-a thermal resistance from junction to ambient in free air 250 K/W

thermal resistance from junction to ambient 200 K/W

SYMBOL PARAMETER CONDITIONS MIN. MAX. UNIT

V(BR)GSS gate-source breakdown voltage IG = 1  A; VDS = 0 30 V

VGSoff  gate-source cut-off voltage ID = 10 nA; VDS = 15 V 0.25 8.0 V

VGS gate-source voltage ID = 200  A; VDS = 15 V

BF245A 0.4 2.2 V

BF245B 1.6 3.8 V

BF245C 3.2 7.5 V

IDSS drain current VDS = 15 V; VGS = 0; note 1

BF245A 2 6.5 mA

BF245B 6 15 mA

BF245C 12 25 mA

IGSS gate cut-off current VGS = 20 V; VDS = 0 5 nA

VGS = 20 V; VDS = 0; T j = 125 C 0.5  A

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1996 Jul 30 4

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

DYNAMIC CHARACTERISTICS

Common source; Tamb = 25 C; unless otherwise specified.

SYMBOL PARAMETER CONDITIONS MIN. TYP. MAX. UNIT

Cis input capacitance VDS = 20 V; VGS = 1 V; f = 1 MHz 4 pF

Crs reverse transfer capacitance VDS = 20 V; VGS = 1 V; f = 1 MHz 1.1 pF

Cos output capacitance VDS = 20 V; VGS = 1 V; f = 1 MHz 1.6 pF

gis input conductance VDS = 15 V; VGS = 0; f = 200 MHz 250 S

gos output conductance VDS = 15 V; VGS = 0; f = 200 MHz 40 S

yfs forward transfer admittance VDS = 15 V; VGS = 0; f = 1 kHz 3 6.5 mS

VDS = 15 V; VGS = 0; f = 200 MHz 6 mS

yrs reverse transfer admittance VDS = 15 V; VGS = 0; f = 200 MHz 1.4 mSyos output admittance VDS = 15 V; VGS = 0; f = 1 kHz 25 S

f gfs cut-off frequency VDS = 15 V; VGS = 0; gfs = 0.7 of its

value at 1 kHz

700 MHz

F noise figure VDS = 15 V; VGS = 0; f = 100 MHz;

RG = 1 k (common source);

input tuned to minimum noise

1.5 dB

handbook, halfpage −10

−10−3

−10−2

−10−1

−1

150500

MGE785 

100

typ

T j (°C)

IGSS(nA)

Fig.2 Gate leakage current as a function of 

 junction temperature; typical values.

VDS = 0; VGS = 20V.

Fig.3 Transfer characteristics for BF245A;

typical values.

handbook, halfpage 

VGS (V)

ID(mA)

6

0−4 0−2

MGE789 

5

4

3

2

1

VDS = 15 V; T j = 25 C.

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1996 Jul 30 5

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

handbook, halfpage 

VDS (V)

ID

(mA)

6

00 2010

MBH555 

5

4

3

2

1

VGS = 0 V

−0.5 V

−1 V

−1.5 V

Fig.4 Output characteristics for BF245A;

typical values.

VDS = 15 V; T j = 25 C.

Fig.5 Transfer characteristics for BF245B;

typical values.

VDS = 15 V; T j = 25 C.

handbook, halfpage 

VGS (V)

ID

(mA)

15

0−4 0−2

MGE787 

10

5

handbook, halfpage 

VDS (V)

ID

(mA)

15

00 2010

MBH553 

10

5

VGS = 0 V

−0.5 V

−1 V

−1.5 V

−2 V

−2.5 V

Fig.6 Output characteristics for BF245B;

typical values.

VDS = 15 V; T j = 25 C.

Fig.7 Transfer characteristics for BF245C;

typical values.

handbook, halfpage 

VGS (V)

ID

(mA)

30

0−10 0−5

MGE788 

20

10

VDS = 15 V; T j = 25 C.

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1996 Jul 30 6

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

handbook, halfpage 

VDS (V)

ID

(mA)

30

00 2010

MBH554 

20

10

VGS = 0 V

−1 V

−2 V

−3 V

−4 V

Fig.8 Output characteristics for BF245C;

typical values.

VDS = 15 V; T j = 25 C.

Fig.9 Drain current as a function of junction

temperature; typical values for BF245A.

VDS = 15 V.

handbook, halfpage 

00 50 150T j (°C)

4

ID

(mA)

3

1

2

MGE775 

100

−0.5 V

VGS = 0 V

−1.5 V

−1 V

Fig.10 Drain current as a function of junction

temperature; typical values for BF245B.

handbook, halfpage 

00 50 150

15

5

10

MGE776 

100T j (°C)

ID

(mA)

VGS = 0 V

−2 V

−1 V

VDS = 15 V.

Fig.11 Drain current as a function of junction

temperature; typical values for BF245C.

VDS = 15 V.

handbook, halfpage 

0 50 150

20

0

MGE779 

100

4

8

12

16

T j (°C)

ID

(mA)

VGS = 0 V

−4 V

−2 V

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1996 Jul 30 7

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

Fig.12 Input admittance; typical values.

handbook, halfpage 

MGE778 

103

102

10

1

102

10

1

10−1

10 102 103

gis

(μA/V)

bis

(mA/V)

f (MHz)

bis

gis

VDS = 15 V; VGS = 0; Tamb = 25 C.

Fig.13 Common source reverse admittance as a

function of frequency; typical values.

handbook, halfpage 

MGE780 

104

103

102

10

10

1

10−1

10−2

10 102 103

brs

(μA/V)

Crs

(pF)

f (MHz)

brs

Crs

VDS = 15 V; VGS = 0; Tamb = 25 C.

Fig.14 Common-source forward transfer admittance

as a function of frequency; typical values.

VDS = 15 V; VGS = 0; Tamb = 25 C.

handbook, halfpage 10

0

MGE782 

10 102 103

2

4

6

8

gfs,

−bfs

(mA/V)

f (MHz)

−bfs

gfs

Fig.15 Common-source output admittance as a

function of frequency; typical values.

VDS = 15 V; VGS = 0; Tamb = 25 C.

handbook, halfpage 

MGE783 

103

102

10

1

10

1

10−1

10−2

10 102 103

gos

(μA/V)

bos(mA/V)

f (MHz)

bos

gos

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1996 Jul 30 8

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

Fig.16 Input capacitance as a function of 

gate-source voltage; typical values.

VDS = 20 V; f= 1 MHz; Tamb = 25 C.

handbook, halfpage 

0

6

4

2

0−2 −10

MGE777 

−4 −6 −8VGS (V)

Cis

(pF)

typ

Fig.17 Reverse transfer capacitance as a function

of gate-source voltage; typical values.

VDS = 20 V; f= 1 MHz; Tamb = 25 C.

handbook, halfpage 

0 −10

1.5

0.5

MGE781

1

Crs

(pF)

−2 −4 −6 −8

VGS (V)

typ

Fig.18 Forward transfer admittance as a function of 

drain current; typical values.

handbook, halfpage 8

6

0

MGE791

4

2

|yfs|

(mA/V)

ID (mA)

0 2010 155

BF245A

BF245B BF245C

VDS = 15 V; f= 1 kHz; Tamb = 25 C.

Fig.19 Gate-source cut-off voltage as a function of 

drain current; typical values.

VDS = 15 V; T j = 25 C.

handbook, halfpage 

0 10 30

−10

−0

MGE784 

20

−2

−4

−6

−8

BF245A

IDSS at VGS = 0 (mA)

VGSoff

at ID = 10 nA

(V)

BF245B

BF245C

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1996 Jul 30 9

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

Fig.20 Drain-source on-state resistance as a

function of gate-source voltage;

typical values.

VDS = 0; f= 1 kHz; Tamb = 25 C.

handbook, halfpage 103

10−1

1

10

102

−4−2−10

MGE790 

−3

RDSon

(kΩ)

BF245A

BF245B

BF245C

VGS (V)

Fig.21 Noise figure as a function of frequency;

typical values.

VDS = 15 V; VGS = 0; RG = 1 k; Tamb = 25 C.

Input tuned to minimum noise.

handbook, halfpage 

0

3MGE786 

1 10

typ

102 103

1

2

F

(dB)

f (MHz)

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1996 Jul 30 10

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

PACKAGE OUTLINE

UNIT A

REFERENCESOUTLINEVERSION

EUROPEANPROJECTION

ISSUE DATEIEC JEDEC JEITA

mm5.2

5.0

b

0.48

0.40

c

0.45

0.38

D

4.8

4.4

d

1.7

1.4

E

4.2

3.6

L

14.5

12.7

e

2.54

e1

1.27

L1(1)

max

L2

max

2.5 2.5

b1

0.66

0.55

DIMENSIONS (mm are the original dimensions)

Note

1. Terminal dimensions within this zone are uncontrolled to allow for flow of plastic and terminal irregularities.

SOT54 variant

A L

0 2.5 5 mm

scale

b

c

D

b1L1

d

E

Plastic single-ended leaded (through hole) package; 3 leads (on-circle) SOT54 variant

1

2

3

L2

e1

e

e1

04-06-28

05-01-10

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1996 Jul 30 11

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

DATA SHEET STATUS

Notes

1. Please consult the most recently issued document before initiating or completing a design.

2. The product status of device(s) described in this document may have changed since this document was published

and may differ in case of multiple devices. The latest product status information is available on the Internet at

URL http://www.nxp.com.

DOCUMENT

STATUS(1)

PRODUCT

STATUS(2) DEFINITION

Objective data sheet Development This document contains data from the objective specification for product

development.

Preliminary data sheet Qualification This document contains data from the preliminary specification.

Product data sheet Production This document contains the product specification.

DEFINITIONS

Product specification   The information and data

provided in a Product data sheet shall define the

specification of the product as agreed between NXP

Semiconductors and its customer, unless NXP

Semiconductors and customer have explicitly agreed

otherwise in writing. In no event however, shall an

agreement be valid in which the NXP Semiconductors

product is deemed to offer functions and qualities beyond

those described in the Product data sheet.

DISCLAIMERS

Limited warranty and liability   Information in this

document is believed to be accurate and reliable.

However, NXP Semiconductors does not give any

representations or warranties, expressed or implied, as to

the accuracy or completeness of such information and

shall have no liability for the consequences of use of such

information.

In no event shall NXP Semiconductors be liable for any

indirect, incidental, punitive, special or consequentialdamages (including - without limitation - lost profits, lost

savings, business interruption, costs related to the

removal or replacement of any products or rework

charges) whether or not such damages are based on tort

(including negligence), warranty, breach of contract or any

other legal theory.

Notwithstanding any damages that customer might incur 

for any reason whatsoever, NXP Semiconductors’

aggregate and cumulative liability towards customer for 

the products described herein shall be limited in

accordance with the Terms and conditions of commercial

saleof NXP Semiconductors.

Right to make changes   NXP Semiconductors

reserves the right to make changes to information

published in this document, including without limitation

specifications and product descriptions, at any time and

without notice. This document supersedes and replaces all

information supplied prior to the publication hereof.

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not designed, authorized or warranted to be suitable for 

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equipment, nor in applications where failure or malfunctionof an NXP Semiconductors product can reasonably be

expected to result in personal injury, death or severe

property or environmental damage. NXP Semiconductors

accepts no liability for inclusion and/or use of NXP

Semiconductors products in such equipment or 

applications and therefore such inclusion and/or use is at

the customer’s own risk.

 Appl ications   Applications that are described herein for 

any of these products are for illustrative purposes only.

NXP Semiconductors makes no representation or 

warranty that such applications will be suitable for the

specified use without further testing or modification.

Customers are responsible for the design and operation of 

their applications and products using NXP

Semiconductors products, and NXP Semiconductors

accepts no liability for any assistance with applications or 

customer product design. It is customer’s sole

responsibility to determine whether the NXP

Semiconductors product is suitable and fit for the

customer’s applications and products planned, as well as

for the planned application and use of customer’s third

party customer(s). Customers should provide appropriate

design and operating safeguards to minimize the risks

associated with their applications and products.

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1996 Jul 30 12

NXP Semiconductors Product specification

N-channel silicon field-effect transistors BF245A; BF245B; BF245C

NXP Semiconductors does not accept any liability related

to any default, damage, costs or problem which is based

on any weakness or default in the customer’s applications

or products, or the application or use by customer’s third

party customer(s). Customer is responsible for doing all

necessary testing for the customer’s applications and

products using NXP Semiconductors products in order to

avoid a default of the applications and the products or of 

the application or use by customer’s third party

customer(s). NXP does not accept any liability in this

respect.

Limiting values   Stress above one or more limiting

values (as defined in the Absolute Maximum Ratings

System of IEC 60134) will cause permanent damage tothe device. Limiting values are stress ratings only and

(proper) operation of the device at these or any other 

conditions above those given in the Recommended

operating conditions section (if present) or the

Characteristics sections of this document is not warranted.

Constant or repeated exposure to limiting values will

permanently and irreversibly affect the quality and

reliability of the device.

Terms and conditions of commercial sale   NXP

Semiconductors products are sold subject to the general

terms and conditions of commercial sale, as published at

http://www.nxp.com/profile/terms, unless otherwiseagreed in a valid written individual agreement. In case an

individual agreement is concluded only the terms and

conditions of the respective agreement shall apply. NXP

Semiconductors hereby expressly objects to applying the

customer’s general terms and conditions with regard to the

purchase of NXP Semiconductors products by customer.

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national authorities.

Quick reference data   The Quick reference data is an

extract of the product data given in the Limiting values and

Characteristics sections of this document, and as such is

not complete, exhaustive or legally binding.

Non-automotive qualified products   Unless this data

sheet expressly states that this specific NXP

Semiconductors product is automotive qualified, the

product is not suitable for automotive use. It is neither 

qualified nor tested in accordance with automotive testingor application requirements. NXP Semiconductors accepts

no liability for inclusion and/or use of non-automotive

qualified products in automotive equipment or 

applications.

In the event that customer uses the product for design-in

and use in automotive applications to automotive

specifications and standards, customer (a) shall use the

product without NXP Semiconductors’ warranty of the

product for such automotive applications, use and

specifications, and (b) whenever customer uses the

product for automotive applications beyond NXP

Semiconductors’ specifications such use shall be solely atcustomer’s own risk, and (c) customer fully indemnifies

NXP Semiconductors for any liability, damages or failed

product claims resulting from customer design and use of 

the product for automotive applications beyond NXP

Semiconductors’ standard warranty and NXP

Semiconductors’ product specifications.

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NXP Semiconductors

provides High Performance Mixed Signal and Standard Productsolutions that leverage its leading RF, Analog, Power Management,Interface, Security and Digital Processing expertise

Contact information

For additional information please visit: http://www.nxp.com

For sales offices addresses send e-mail to: [email protected]  

© NXP B.V. 2010

 All rights are reserved. Reproduction in whole or in part is prohibited without the prior written consent of the copyright owner.

The information presented in this document does not form part of any quotation or contract, is believed to be accurate and reliable and may be changedwithout notice. No liability will be accepted by the publisher for any consequence of its use. Publication thereof does not convey nor imply any licenseunder patent- or other industrial or intellectual property rights.

Customer notification

This data sheet was changed to reflect the new company name NXP Semiconductors, including new legal

definitions and disclaimers. No changes were made to the technical content, except for package outline

drawings which were updated to the latest version.

Printed in The Netherlands R77/02/pp13 Date of release:1996 Jul 30