AR1682J - JSR Micro · AR1682J Superior versatile 193nm Photoresist sold in large uantities...
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Transcript of AR1682J - JSR Micro · AR1682J Superior versatile 193nm Photoresist sold in large uantities...
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
AR1682J FEATURES
• Wide Process Window
• Good CD-Uniformity
• Good LER/LWR
Focus Latitude
Well balanced dense & isolated litho performance!
120nm NODE Target CD: 130nm semi-dense and isolated LineNA:0.63, Annular illumination (0.80/0.50)Substrate: organic BARCAR1682J: 320nm film thickness Focus Latitude130L325P 130 iso L negative focus best focus positive focus
• Small Mask Dependency
• Good PEB Sensitivity~1nm/C
• Good Defectivity
130L
325P
130
iso
L
negative focus best focus positive focus
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
Line Edge Roughness / Line width Roughness Target CD: 90nm dense LineNA:0.75, Annular illumination (0.89/0.50)Substrate: organic BARC. AR1682J: 270nm film thickness
Defectivity Target: Bridge and blob defectivity - Lot-to-lotInspection tool: KLA2351Pattern size: 110nm dense Line
Bright Field93%
Dark Field35%
Dark Field25%
Bright Field7%
Bright Field LER: 3.0nm LWR: 5.0nm
Dark Field LER: 2.5nm LWR: 4.8nm
Excellent LER/LEW in bright and dark field!
No mask dependency!
Consistent low defect count through different batches.
Bridge & Blob Defect
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
Consistent low defect count through different batches.
Post Exposure Bake sensitivity Target CD: 90nm dense LineNA:0.75, Annular illumination (0.89/0.50)Substrate: organic BARCAR1682J: 270nm film thickness
Improved process control by small PEBsensitivity!
PEB: 107C/60s PEB: 110C/60s PEB: 112C/60s PEB: 115C/60s PEB: 118C/60s
AR1682J available viscosities
PEB-sensitivity0.97nm/°C
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
AR1682JSuperior versatile 193nm Photoresist
sold in large quantities worldwide
90nm node
Target CD: 100nm dense and semi-dense Line NA:0.75, Annular illumination (0.89/0.50) Substrate: organic BARCAR1682J: 320nm film thickness
65nm node Target CD: 80nm dense lineNA:0.75, Dipole illumination (0.89/0.59)Substrate: organic BARCAR1682J: 210nm film thickness
Focus Latitude
100L
250P
100L
200P
negative focus best focus positive focus
Superior litho performance at tight features!
For more information, please contact [email protected]
SC A
RF V1
80L1
6P
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