AN1187: EFP01 Design Considerations

38
AN1187: EFP01 Design Considerations This application note provides an overview and the theory of op- eration for the EFP01 Energy Friendly Power Management IC (PMIC). Hardware design recommendations are provided along with a discussion of the software driver and how to integrate it in- to a EFR32 Wireless Gecko software project. KEY POINTS EFP01 expands the input supply range of EFR32-based systems. EFP01 reduces power consumption of systems that use EFR32 devices without an integrated DCDC converter. EFP0111 enables EFR32's radio to operate at higher output power using coin cell batteries. silabs.com | Building a more connected world. Rev. 0.8

Transcript of AN1187: EFP01 Design Considerations

Page 1: AN1187: EFP01 Design Considerations

AN1187: EFP01 Design Considerations

This application note provides an overview and the theory of op-eration for the EFP01 Energy Friendly Power Management IC(PMIC). Hardware design recommendations are provided alongwith a discussion of the software driver and how to integrate it in-to a EFR32 Wireless Gecko software project.

KEY POINTS

• EFP01 expands the input supply range ofEFR32-based systems.

• EFP01 reduces power consumption ofsystems that use EFR32 devices withoutan integrated DCDC converter.

• EFP0111 enables EFR32's radio tooperate at higher output power using coincell batteries.

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Page 2: AN1187: EFP01 Design Considerations

1. Pulse Frequency Modulation (PFM) Theory

1.1 Ideal Buck Converter Overview

1.1.1 Buck Converter Operation

In a simple, ideal buck converter (as shown in the figure below), the high-side (PMOS) and low-side (NMOS) switches are turned onand off complementarily to generate a lower output voltage from a higher input voltage.

VIN +–

VSW

IIND

COUT

PMOS

NMOS

VOUT

CIN

LIIN

ILOAD

Figure 1.1. Simplified Buck Converter

The current through the inductor (IIND) is typically limited by a fixed or programable peak current setting (IPK). The theoretical maximumoutput current an ideal buck converter can deliver is IPK/2.

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Indu

ctor

Cur

rent

, IIN

D (A

)

TON TimeTOFF

IPK

0

ILOAD

MAX

TSW

slope≅ -VOUTL ILOAD MAX≅ IPK

2

TIDLE

Switc

h Vo

ltage

, VSW

(V)

Time

VIN

0

PMOS=ONNMOS=OFF

PMOS=OFFNMOS=OFF

PMOS=OFFNMOS=ON

slope≅ LVIN-VOUT

Figure 1.2. Buck PFM Switching Waveforms

The figure above shows the voltage at the switch node (VSW) and the current through the inductor (IIND) as the (assumed ideal) PMOSand NMOS switches are enabled and disabled. Note that this switching waveform is an example of Discontinuous Conduction Mode(DCM) operation, that is, the current through the inductor is allowed to reach zero.

The waveform for a single switching cycle can be divided into three distinct time periods:1. On-time (TON): During this time, the PMOS switch is closed (forcing VSW to be equal to VIN) and the NMOS switch is opened. The

current through the inductor (IIND) during TON is determined by the following equation:

I IND = time ×V IN - VOUT

LOnce IIND reaches the IPK current limit, the converter enters the off-time period.

2. Off-time (TOFF): During this time, the PMOS switch is open and the NMOS switch is closed (forcing VSW to be equal to GND). Thecurrent through the inductor (IIND) is determined by the following equation:

I IND = time ×-VOUT

LAfter IIND reaches zero, the converter enters the idle-time period.

3. Idle-time (TIDLE): During this time, both the PMOS and NMOS switches are open. The current through the inductor (IIND) is zero.When the output voltage (VOUT) droops beyond a set threshold (determined by an internal comparator), the converter will re-enterthe on-time period and the cycle repeats. The converter can supply the maximum output load current (IPK/2) when TIDLE is zero.

The switching period (TSW) and the switching frequency (FSW) can be determined by the sum of the time periods in the switching cycle,as shown below:

TSW = TON + TOFF + T IDLE and FSW = 1TSW

The converter input current can be limited by forcing a minimum switching period, TSW. For a forced minimum switching period, themaximum battery current is determined by:

IBATT_LIMIT =L × IPK

2

2 × TSW × (V IN - VOUT )

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1.1.2 Buck Converter Output Ripple Voltage

The figure below illustrates the contribution of the different buck mode switching periods to the output ripple voltage.

Target VOUTO

utpu

t Vol

tage

(V)

TON TOFFIPK

0

ILOAD

slope≅ -VOUTL

Area inside this triangle is the charge delivered to

load through the inductor

Indu

ctor

Cur

rent

, IIN

D (A

) TIDLE

Area inside this trapezoid is the charge delivered to load

from output capacitor

VMAX

Time

VMIN

Ripple Voltage

TΔ1 TΔ2

slope≅ LVIN-VOUT

Figure 1.3. Buck Output Ripple Voltage

Ignoring the effects of capacitor ESR, the output ripple voltage (VR) for a buck converter can be approximated by

VR =Total Charge into COUT (in Coulombs)

COUT (in Farads) , where the total charge into the output capacitor (COUT) is the area of the triangle

shown in the figure above. The resulting ripple voltage equation is:

VR =L × (IPK - ILOAD)2

2 × COUT× ( 1

V IN - VOUT- 1

VOUT )From the VR equation, it can be seen that the following parameter changes increase ripple voltage (assuming all other parameters areheld constant):• Smaller output capacitance (COUT)• Smaller difference between input and output voltages (VIN - VOUT)• Larger inductor (L)• Larger peak current (IPK)• Smaller load current (ILOAD).

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1.1.3 TON Limiting

When TON limiting is enabled, the PFM controller terminates the inductor charging cycle before the programmed peak current setting(IPK, shown in red in the diagram below) is reached, resulting in a reduced peak current (I'PK, shown in blue below). This reduction inpeak current has several effects:

1. As shown in 1.1.2 Buck Converter Output Ripple Voltage, the output ripple voltage is directly proportional to the square of the peakcurrent (IPK). Therefore, because TON reduces the maximum peak current, the output ripple voltage is also reduced.

2. Because the maximum output current in an ideal buck converter is IPK/2, a reduced peak current results in a reduced maximumoutput load current.

3. For a fixed output load current, a reduced TON causes less current transferred to the load per switch event, which results in anincreased switching frequency FSW.

Time

IPK

0

T’OFF

I’PK

T’ON

TON TOFF

ILOAD

MAXI’LOAD

MAX

T’SW

TSW

IIND,TON_Max UnlimitedI’IND,TON_Max Limited

slope≅ -VOUTL

ILOAD MAX≅ IPK2

I’LOAD MAX≅ I’PK2

Indu

ctor

Cur

rent

, IIN

D (A

)

slope≅ LVIN-VOUT

Figure 1.4. TON Limiting

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1.2 Ideal Boost Converter Overview

1.2.1 Boost Converter Operation

In a simple, ideal boost converter (as shown in the figure below), the high-side (PMOS) and low-side (NMOS) switches are turned on anoff complementarily to generate a higher output voltage from a lower input voltage.

VIN +–

VSW

IIND

COUT

PMOS

NMOS

VOUT

CIN

LIIN

ILOAD

IPMOS

Figure 1.5. Simplified Boost Converter

The current through the inductor (IIND) is typically limited by a fixed or programable peak current setting (IPK). Note that the averageinput current (IIN) is the same as the average inductor current (IIND) for a boost converter. The maximum output current an ideal boostconverter can deliver is .

ILOAD_MAX =IPK2 ×

V INVOUT

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Indu

ctor

Cur

rent

, IIN

D (A

)

TON TimeTOFF

IPK

0

TSW

slope≅VIN-VOUT

Lslope≅ VIN

L

TIDLE

Switc

h Vo

ltage

, VSW

(V)

Time

VOUT

0

PMOS=ONNMOS=OFF

PMOS=OFFNMOS=OFF

PMOS=OFFNMOS=ON

Switc

h C

urre

nt, I

PMO

S (A

)

Time

IPK

0

ILOAD

MAX

slope≅VIN-VOUT

L

ILOAD MAX≅ IPK2

VIN× VOUT

IIN

AVG

IIN AVG≅ IPK2

TON+TOFF× TSW

Figure 1.6. Boost PFM Switching Waveforms

The figure above shows the voltage at the switch node (VSW) and the current through the inductor (IIND) as the PMOS and NMOSswitches are enabled and disabled. Note that this switching waveform is an example of Discontinuous Conduction Mode (DCM) opera-tion, that is, the current through the inductor is allowed to reach zero.

The waveform for a single switching cycle can be divided into three distinct time periods:1. On-time (TON): During this time, the PMOS switch is open and the NMOS switch is closed (forcing VSW to ground), effectively forc-

ing the voltage VIN across the inductor. The current through the inductor (IIND) during TON is determined by the following equation:

I IND = time ×V INL

After IIND reaches the IPK limit, the converter enters the off-time period.

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2. Off-time (TOFF): During this time, the PMOS switch is closed and the NMOS switch is open (forcing VSW to be equal to VOUT). Thecurrent through the inductor (IIND) is determined by the following equation:

I IND = time ×V IN - VOUT

LAfter IIND reaches zero, the converter enters the idle-time period.

3. Idle-time (TIDLE): During this time, both the PMOS and NMOS switches are open. The current through the inductor (IIND) is zero.When the output voltage (VOUT) drops below a set threshold (determined by an internal comparator), the converter re-enters theon-time period, and the cycle repeats. The converter can supply the maximum output load current when TIDLE is zero.

The switching period (TSW) and the switching frequency (FSW) can be determined by the sum of the time periods in the switching cycle,as shown below:

TSW = TON + TOFF + T IDLE and FSW = 1TSW

The converter input current can be limited by forcing a minimum switching period, TSW. For a forced minimum switching period, themaximum load current is determined by:

ILOAD_LIMIT =IPK2 ×

V INVOUT

×(TON + TOFF )

TSW

Likewise, for a forced minimum switching period, the maximum battery current is determined by: IBATT_LIMIT =IPK2 ×

(TON + TOFF )TSW

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1.2.2 Boost Converter Output Ripple Voltage

The figure below illustrates the contribution of the different boost mode switching periods to the output ripple voltage.

Target VOUTO

utpu

t Vol

tage

(V)

TON TOFFIPK

0

ILOAD

Area inside this triangle is the charge delivered to

load through the inductor

TIDLE

Area inside this shape is the charge delivered to load from

output capacitor

VMAX

Time

VMIN

Ripple Voltage

TΔ2

slope≅VIN-VOUT

L

Switc

h C

urre

nt, I

PMO

S (A

) TON

Figure 1.7. Boost Output Ripple Voltage

Ignoring the effects of capacitor ESR, the output ripple voltage (VR) for a boost converter can be approximated by

VR =Total Charge into COUT (in Coulombs)

COUT (in Farads) where the total charge into the output capacitor (COUT) is the area of the triangle

shown in the figure above. The resulting ripple voltage equation is given by:

VR =L × (IPK - ILOAD)2

2 × COUT × (VOUT - V IN )From the VR equation, it can be seen that the following parameter changes increase ripple voltage (assuming all other parameters areheld constant):• Smaller output capacitance (COUT)• Increased difference between output and input voltages (VOUT - VIN)• Larger inductor (L)• Larger peak current (IPK)• Smaller load current (ILOAD).

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1.3 Ideal Buck/Boost Converter Overview

1.3.1 Buck/Boost Converter Operation

In a simple, ideal buck/boost converter (as shown below), the powertrain switches are turned on and off complementarily to generate aconstant output voltage from an input voltage that may be higher or lower.

VIN +–

VSW1

IIND

COUT

PMOS1

NMOS1

VOUT

CIN

LIIN

ILOAD

VSW2

PMOS2

IOUT

NMOS2

Figure 1.8. Simplified Buck/Boost Converter

A typical buck/boost converter may operate in one of several modes, depending on the relationship between the input voltage and theoutput voltage:• Buck mode: When the input voltage is much greater than the output voltage, the PMOS2 switch is closed, the NMOS2 switch is

opened, and the PMOS1 and NMOS1 switches are controlled as described in 1.1.1 Buck Converter Operation• Boost mode: When the input voltage is much less than the output voltage, the PMOS1 switch is closed, the NMOS1 switch is

opened, and the PMOS2 and NMOS2 switches are controlled as described in 1.2.1 Boost Converter Operation• Transition mode: When the input voltage is very close to the output voltage (either higher or lower), a special switch mode may be

employed. An example of this is shown in the Figure 1.9 Buck/Boost PFM NTM Transition Switching Waveforms (Vin > Vout) onpage 11 and Figure 1.10 Buck/Boost PFM NTM Transition Switching Waveforms (Vin < Vout) on page 12 figures below

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Indu

ctor

Cur

rent

, IIN

D (A

)

TONTime

TOFF

IPK

0

ILOAD

MAX

TSW

slope≅ -VOUTL

ILOAD MAX≅ 1.15 x IPK2

TIDLE

Switc

h Vo

ltage

, VSW

1 (V

)

Time

VIN

0

slope≅ LVIN

slope≅ LVIN-VOUT

PMOS1 = ONPMOS2 = ONNMOS1 = OFF NMOS2 = OFF

TNTM

PMOS1 = ONPMOS2 = OFFNMOS1 = OFF NMOS2 = ON

PMOS1 = OFFPMOS2 = ONNMOS1 = ON

NMOS2 = OFF

PMOS1 = OFFPMOS2 = OFFNMOS1 = OFF NMOS2 = OFF

Inpu

t Cur

rent

, IIN

(A)

Time

IPK

0

ILOAD

MAX

Out

put C

urre

nt, I

OU

T (A

)

Time

IPK

0

ILOAD

MAX

ILOAD MAX≅ 1.15 x IPK2

ILOAD MAX≅ 1.15 x IPK2

Figure 1.9. Buck/Boost PFM NTM Transition Switching Waveforms (Vin > Vout)

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Indu

ctor

Cur

rent

, IIN

D (A

)

TON TimeTOFF

IPK

0

ILOAD

MAX

TSW

slope≅ -VOUTL

TIDLE

Switc

h Vo

ltage

, VSW

1 (V

)

Time

VIN

0

slope≅ LVIN

slope≅ LVIN-VOUT

PMOS1 = ONPMOS2 = ONNMOS1 = OFF NMOS2 = OFF

TNTM

PMOS1 = ONPMOS2 = OFFNMOS1 = OFF NMOS2 = ON

PMOS1 = OFFPMOS2 = ONNMOS1 = ON

NMOS2 = OFF

PMOS1 = OFFPMOS2 = OFFNMOS1 = OFF NMOS2 = OFF

Inpu

t Cur

rent

, IIN

(A)

Time

IPK

0

ILOAD

MAX

Out

put C

urre

nt, I

OU

T (A

)

Time

IPK

0

ILOAD

MAX

ILOAD MAX≅ 1.15 x IPK2

ILOAD MAX≅ 1.15 x IPK2

ILOAD MAX≅ 1.15 x IPK2

Figure 1.10. Buck/Boost PFM NTM Transition Switching Waveforms (Vin < Vout)

Transition Mode Operation (NTM)

The waveform for a single NTM switching cycle can be divided into four distinct time periods:1. On-time (TON): During this time, the powertrain switches are configured as follows:

• The PMOS1 switch is closed (forcing VSW1 to be equal to VIN)• The NMOS1 switch is opened• The PMOS2 switch is opened• The NMOS2 switch is closed (forcing VSW2 to ground)

This configuration effectively forces the voltage VIN across the inductor. The current through the inductor (IIND) during TON is deter-mined by the following equation:

I IND = time ×V INL

Once IIND reaches the IPK current limit, the converter enters the NTM-time period.

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2. NTM-time (TNTM): During this time, the powertrain switches are configured as follows:• The PMOS1 switch is closed (forcing VSW1 to be equal to VIN)• The NMOS1 switch is opened• The PMOS2 switch is closed (forcing VSW2 to be equal to VOUT)• The NMOS2 switch is opened

The current through the inductor (IIND) during TNTM is determined by the following equation:

I IND = time ×V IN - VOUT

LThe TNTM timing uses a fixed multiplier of the TON timing. After TNTM period, , the converter enters the off-time period.

3. Off-time (TOFF): During this time, the powertrain switches are configured as follows:• The PMOS1 switch is opened• The NMOS1 switch is closed (forcing VSW1 to ground)• The PMOS2 switch is closed (forcing VSW2 to be equal to VOUT)• The NMOS2 switch is opened

This configuration effectively forces the voltage -VOUT across the inductor. The current through the inductor (IIND) is determined bythe following equation:

I IND = time ×-VOUT

LAfter IIND reaches zero, the converter enters the idle-time period.

4. Idle-time (TIDLE): During this time, all powertrain switches are opened. When the output voltage (VOUT) drops below a set threshold(determined by an internal comparator), the converter re-enters the on-time period, and the cycle repeats. The converter can sup-ply the maximum output load current when TIDLE is zero.

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1.4 Ideal Pulsed-Current Low-Dropout Regulator (LDO) Overview

1.4.1 Pulsed-Current LDO Overview

Unlike a traditional LDO, a pulsed-current LDO dynamically switches on and off.

VIN +–

ILDO

COUT

LDOVOUT

CIN

IIN

ILOAD

Control

Figure 1.11. Simplified Pulsed-Current LDO

Figure 1.12 LDO Switching Waveforms on page 14 shows the current through the LDO (ILDO) as the LDO is switched on and off.

LDO

Cur

rent

(A)

TON Time

IMAX

0

TSW

TIDLE

Figure 1.12. LDO Switching Waveforms

The waveform for a single switching cycle can be divided into two distinct time periods:1. On-time (TON): During this time period, the LDO is on and delivering current IMAX.2. Idle-time (TIDLE): During this time period, the LDO is off.

The switching period (TSW) and the switching frequency (FSW) can be determined by the sum of the time periods in the switching cycle,as shown below:

TSW = TON + T IDLE and FSW = 1TSW

In a pulsed-current LDO (as shown in Figure 1.11 Simplified Pulsed-Current LDO on page 14), the current through the LDO (ILDO) istypically limited by a fixed or programmable maximum current setting (IMAX). The LDO can supply the maximum output load current

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(IMAX) when TIDLE is zero. Alternately, the input (and output) current can be limited by forcing a minimum switching period, TSW. For aforced minimum switching period, the maximum output current is determined by:

ILOAD MAX = IMAX ×TONTSW

1.4.2 Pulsed-Current LDO Output Ripple Voltage

As shown in the figure below, the output ripple voltage for a pulsed-current LDO is a function of the maximum current, the load current,and the output capacitor.

Target VOUTO

utpu

t Vol

tage

(V)

TONIMAX

0

ILOAD

Area inside this rectangle is the charge delivered to

load from LDO

LDO

Cur

rent

(A)

TIDLE

Area inside this rectangle is the charge delivered to load

from output capacitor

VMAX

Time

VMIN

Ripple Voltage

Figure 1.13. LDO Output Ripple Voltage

Ignoring the effects of capacitor ESR, the output ripple voltage (VR) for a pulsed current LDO can be approximated by

VR = TON ×(IMAX - ILOAD)

COUT

From the VR equation, it can be seen that the following parameter changes increase the ripple voltage (assuming all other parametersare held constant):• Smaller output capacitance (COUT)• Larger maximum current (IMAX)• Smaller load current (ILOAD). Note that ripple voltage is at its maximum when ILOAD is at its smallest.

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2. EFP01 Components Selection Guide

2.1 DC-DC Input/Output Capacitor

The input/output capacitors should have a temperature range reflecting the environment in which the application will be used. For ex-ample, a suitable choice might be X5R ceramic capacitors with a change in capacitance of ±15% over the temperature range -55 °C to+85 °C (standard temperature range devices) or -55 °C to +125 °C (extended temperature range devices).

Careful attention should be paid to the characteristics of the input/output capacitors over temperature and bias voltage. Some capaci-tors (particularly those in smaller packages) can experience a dramatic reduction in capacitance value as the temperature or bias volt-age increases. A change pushing the DC-DC output capacitance outside the data sheet specified limits may result in output instability.

The Murata GRM31CR71A106KA01 10 μF capacitor was used for all of the DC-DC validation and characterization testing.

Table 2.1. Recommended DC-DC Input/Output Capacitor (or equivalent)

Manufacturer Part Number Value (μF) Voltage Rat-ing (V)

Dielectric Operating Temper-ature (°C)

Package

Murata GRM31CR71A106KA01 10 ± 10% 10 X7R -55 to +125 1206

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2.2 DC-DC Inductor

The Samsung CIG22H2R2MAE inductor was used for all of the DC-DC validation and characterization testing.

Table 2.2. Example Buck Mode DC-DC Inductors

Manufacturer Part Number Value(μH)

Isaturation(mA)

DCR (Ω) Operating Temper-ature (°C)

Height(mm)

Package

Samsung CIG22H2R2MAE 2.2 ±20%

1100 0.138 ± 20% -40 to +125 2.5 ±0.20

1008/2520

Murata LQM18PZ2R2MFH 2.2 ±20%

300 0.47 (max) -55 to +125 0.8 ±0.15

0603/1608

TDK MLZ2012N2R2LT000 2.2 ±20%

170 0.156 (max) -55 to +125 0.85 ±0.20

0805/2012

Murata LQH3NPN2R2MJRL 2.2 ±20%

1800 0.0816(max)

-40 to +105 1.2 1212/3030

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Figure 2.1. Inductor Efficiency Plots, Buck Mode

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Table 2.3. Example Boost Mode DC-DC Inductors

Manufacturer Part Number Value(μH)

Isaturation(mA)

DCR (Ω) Operating Tempera-ture (°C)

Height(mm)

Package

Samsung CIG22H2R2MAE 2.2 ±20%

1100 0.138 ± 20% -40 to +125 2.5 ±0.20

1008/2520

Murata LQM18PH2R2MFR 2.2 ±20%

150 0.38 (max) -55 to +150 0.8 ±0.15

0603/1608

TDK MLZ2012N2R2LT000 2.2 ±20%

170 0.156 (max) -55 to +125 0.85 ±0.20

0805/2012

Murata LQH3NPN2R2MJRL 2.2 ±20%

1800 0.0816(max)

-40 to +105 1.2 1212/3030

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3. EFP01 Measurements

3.1 Taking Current & Efficiency Measurements

The pulsed-current operation of the PFM converter means that the input power supply current can have a very large dynamic rangewith currents in the microamp range spiking upwards of 100 mA and then returning to the microamp level. As such, taking averagecurrent measurements with a digital multi-meter (DMM) can be challenging. Below are some tips for ensuring accurate measurements.

1. For low current (nA or μA-level) measurements, the PCB should be thoroughly cleaned using alcohol and/or an ultrasonic bath.Flux and other residues left on a PCB during assembly can be responsible for several microamps of leakage current.

2. A large, very low-leakage capacitor (for example, a ceramic or several large ceramic capacitors wired in parallel) may need to beadded at the EFP01 input. Using a DMM in series with the power supply creates a low-pass filter (using the sense resistor of theDMM and the large capacitor).

3. If supported, the DMM should be configured to use the largest aperture window (number of power line cycles, or NPLC) and high-est average count.

4. If supported, any line synchronization or autozeroing capabilities of the DMM should be enabled.

3.2 EFP01 Impact on EFM32/EFR32 Current Draw

Use of EFP01 brings sizable improvements in current draw to applications using EFM32 and EFR32 devices due simply to the greaterefficiency with which its regulators operate relative to those integrated on the microcontrollers themselves. In the case where EFP01provides 1.8 V for all supplies except IOVDD on a Series 2 EFR32 device, current draw is reduced in all operating modes by nearly30%. When the EFM32/EFR32 on-chip LDO is disabled and EFP01 also provides the 1.1 V core digital supply, current draw in run(EM0) and sleep (EM2) modes is reduced again by nearly 30%. Assuming 90% operation in sleep mode, this effectively doubles run-time in battery-powered applications.

Table 3.1 EFP0104 + EFR32BG21 Current Draw Comparison on page 21 illustrates the reduction in current draw seen under com-mon operating conditions when the EFP01 provides only 1.8 V for the device power supply inputs and when it also provides the 1.1 Vcore digital supply.

Table 3.1. EFP0104 + EFR32BG21 Current Draw Comparison

Measurement EFR32BG21 Alone1 EFR32BG21 with EFP01Providing 1.8V on VOA1

EFR32BG21 with EFP01Providing 1.8V on VOA and

1.1V on VOB2

EM0 (µA/MHz) 46.4 32.7 23.4

EM2 (µA) 5.04 3.75 2.6

TX, 0 dBm PA @ +0 dBm (mA) 9.3 6.645 6.104

TX, 10 dBm PA @ +10 dBm (mA) 33.1 23.2 22.7

RX Listen @ 2 Mbps BLE (mA) 9.854 7.034 6.036

Note:1. IOVDD = VBATT = 3 V. AVDD = DVDD = PAVDD = RFVDD = 1.8 V. The EFM32/EFR32 on-chip LDO derives the core digital

supply from DVDD.2. IOVDD = VBATT = 3 V. AVDD = DVDD = PAVDD = RFVDD = 1.8 V. DECOUPLE = 1.1 V. The EFP0104 powers DECOUPLE on

the EFM32/EFR32 device. Secure Element firmware must be updated to version 1.1.3 or later to permit disabling of the core digi-tal supply LDO.

AN1187: EFP01 Design ConsiderationsEFP01 Measurements

silabs.com | Building a more connected world. Rev. 0.8 | 21

Page 22: AN1187: EFP01 Design Considerations

4. EFP01 Reference Schematics

4.1 RF Noise Filtering

At higher current levels and peak current settings, EFP01 can have ripple voltages as high as 70 mV. Because the switching frequencyof a PFM converter is linearly proportional to load current, frequency planning is not possible.

A pi filter using a small, cheap, low DCR ferrite with high real impedance at 1 MHz and up (e.g., Murata BLM18AG601SN1) can beused as shown below to filter the switching ripple.

VOA/VOB

10 µF0.1 µF

GND

1.0 µF

FB

4.7 µF

1.0 Ω

GND

To EFR32

Figure 4.1. RF Filter

4.2 Reference Schematics

The following diagrams show the circuit configurations and passive component values for different EFP01.

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 22

Page 23: AN1187: EFP01 Design Considerations

3

0.1

µF1.

0 µF

2.2

µF

GN

D

GN

D

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

d fil

ter c

ompo

nent

requ

irem

ents

can

vary

by

devic

e and

appl

icatio

n. C

onsu

lt th

e rele

vant

dat

ashe

et an

dap

plica

tion

note

s for

com

pone

nt va

lues

and

reco

mm

enda

tions

,pa

rticu

larly

for R

FVDD

and

PAVD

D.

EFR3

2 dev

ice-s

pecif

icRF

filte

ring

and

bypa

ssca

pacit

ors

0.1

µF1.

0 µF

GN

D

1.0

µF0.

1 µF

GN

D

DEC

OU

PLE

RFV

DD

PAV

DD

AVD

D

IOV

DD

DV

DD

I2C

_SC

LG

PIO

_Px

5 4

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

17

EFP_

IRQ

5 8111

1210219

6

1

16

2

1920

GN

D

VO

A S

W

1

2.2

µH

1.0

µF

BLM

18A

G60

1SN

1

FB

600

Ω

4.7

µF

1.0

Ω

GN

D

RF P

i Filt

er

GN

D

10 µ

F0.

1 µF

GN

D13

10 µ

F0.

1 µF

GN

D14

0.1

µF

GN

D

VIO

NOTE

: EFR

32 IO

VDD

and

EFP

VIO

mus

t be t

he sa

me v

olta

ge.

VO

A(3

.3V

)

VO

B(1

.8V

)7

2.2

µHVB

AT

8

10 µ

F0.

1 µF

GN

D

0.1

µF

GN

D

10 µ

F

VO

C

I2C

_SC

LI2

C_S

DA

IRQ

n

LA2

VO

A_S

W

VD

DA

LB

VDDB

VO

B

EPADDCDC_GND

GND

GND

GND

GND

GNDGND

EFP0

101

VO

A

VO

C

VIO

LA1

Figu

re 4

.2.

EFP0

101

Ref

eren

ce S

chem

atic

s

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 23

Page 24: AN1187: EFP01 Design Considerations

VB

AT

11

12 13

1517 183

5

8

10 4

219

6

1

16

2

1920

10 µ

F

2.2

µH

0.1

µF

VO

A S

W

GN

D

GN

D

GN

D

EFP_

I2C

_SD

AEF

P_I2

C_S

CL

EFP_

IRQ

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

NOTE

: Tot

al VO

B pl

us D

ECOU

PLE

capa

citan

ce m

ust n

ot ex

ceed

the E

FR32

data

shee

t max

imum

(gen

erall

y 2.75

µF)

when

VOB

pow

ers D

ECOU

PLE.

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

d fil

ter c

ompo

nent

requ

irem

ents

can

vary

by

devic

e and

appl

icatio

n. C

onsu

lt th

e rele

vant

dat

ashe

et an

dap

plica

tion

note

s for

com

pone

nt va

lues

and

reco

mm

enda

tions

,pa

rticu

larly

for R

FVDD

and

PAVD

D.

EFR3

2 dev

ice-s

pecif

icRF

filte

ring

and

bypa

ssca

pacit

ors

1.0

µF0.

1 µF

GN

D

DEC

OU

PLE

RFV

DD

PAV

DD

0.1

µF1.

0 µF

GN

D

AVD

D

I2C

_SC

LG

PIO

_Px

72.

2 µH

1.0

µF0.

1 µF

GN

D

VO

B(1

.1V

)

VO

A(1

.8V

)

2.2

µF

GN

D

1.0

µF

BLM

18A

G60

1SN

1

FB

600

Ω

4.7

µF

1.0

Ω

GN

D

RF P

i Filt

er

0.1

µF1.

0 µF

GN

D

IOV

DD

DV

DD

0.1

µF

GN

D

10 µ

F

14

0.1

µF

GN

D

VIO

NOTE

: EFR

32 IO

VDD

and

EFP

VIO

mus

t be t

he sa

me v

olta

ge.

0.1

µF

GN

D

10 µ

F

VO

CLA

2

VO

A_S

W

VO

C

I2C

_SC

LI2

C_S

DA

IRQ

n

VD

DA

LB

VDDB

VO

B

EPADDCDC_GND

GND

GND

GND

GND

GNDGND

EFP0

102

LA1

VO

A

VIO

Figu

re 4

.3.

EFP0

102

Ref

eren

ce S

chem

atic

s

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 24

Page 25: AN1187: EFP01 Design Considerations

3

0.1

µF1.

0 µF

2.2

µF

GN

D

GN

D

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

d fil

ter c

ompo

nent

requ

irem

ents

can

vary

by

devic

e and

appl

icatio

n. C

onsu

lt th

e rele

vant

dat

ashe

et an

dap

plica

tion

note

s for

com

pone

nt va

lues

and

reco

mm

enda

tions

,pa

rticu

larly

for R

FVDD

and

PAVD

D.

EFR3

2 dev

ice-s

pecif

icRF

filte

ring

and

bypa

ssca

pacit

ors

0.1

µF1.

0 µF

GN

D

1.0

µF0.

1 µF

GN

D

DEC

OU

PLE

RFV

DD

PAV

DD

AVD

D

IOV

DD

DV

DD

I2C

_SC

LG

PIO

_Px

5 4

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

17

EFP_

IRQ

5 8111

12

7

10219

6

1

16

2

1920

GN

D

VO

A S

W

1

2.2

µH

1.0

µF

BLM

18A

G60

1SN

1

FB

600

Ω

4.7

µF

1.0

Ω

GN

D

RF P

i Filt

er

GN

D

10 µ

F0.

1 µF

GN

D13

10 µ

F0.

1 µF

GN

D14

0.1

µF

GN

D

VIO

NOTE

: EFR

32 IO

VDD

and

EFP

VIO

mus

t be t

he sa

me v

olta

ge.

VO

A(3

.3V

)

VO

B(1

.8V

)2.

2 µHVB

AT

8

10 µ

F0.

1 µF

GN

D I2C

_SC

LI2

C_S

DA

IRQ

n

LA2

VO

A_S

W

VD

DA

LBLA

1

VDDB

VO

B

EPADDCDC_GND

GND

GND

GND

GND

GNDGND

EFP0

103

VO

A

VO

C

VIO

Figu

re 4

.4.

EFP0

103

Ref

eren

ce S

chem

atic

s

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 25

Page 26: AN1187: EFP01 Design Considerations

VO

A(1

.8V

)

VB

AT

LA2

11

VO

A_S

W12

VO

C13

I2C

_SC

L15

I2C

_SD

A17

IRQ

n18

VD

DA

3

LB5

LA1

7

VDDB8

VO

A10

VO

B4

EPAD 21DCDC_GND 9

GND 6GND 1

GND 16GND 2

GND 19GND 20

0.1

µF

2.2

µH

1.0

µF

10 µ

F

2.2

µH

2.2

µF

0.1

µF

VO

A S

W

GN

D

GN

D

GN

D

GN

D

GN

D

EFP_

I2C

_SD

AEF

P_I2

C_S

CL

EFP_

IRQ

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

NOTE

: Tot

al VO

B pl

us D

ECOU

PLE

capa

citan

ce m

ust n

ot ex

ceed

the E

FR32

data

shee

t max

imum

(gen

erall

y 2.75

µF)

when

VOB

pow

ers D

ECOU

PLE.

EFP0

104

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

d fil

ter c

ompo

nent

requ

irem

ents

can

vary

by

devic

e and

appl

icatio

n. C

onsu

lt th

e rele

vant

dat

ashe

et an

dap

plica

tion

note

s for

com

pone

nt va

lues

and

reco

mm

enda

tions

,pa

rticu

larly

for R

FVDD

and

PAVD

D.

EFR3

2 dev

ice-s

pecif

icRF

filte

ring

and

bypa

ssca

pacit

ors

1.0

µF

BLM

18A

G60

1SN

1

FB

600

Ω

4.7

µF

1.0

Ω

GN

D

RF P

i Filt

er

0.1

µF1.

0 µF

GN

D

1.0

µF0.

1 µF

GN

D

DEC

OU

PLE

RFV

DD

PAV

DD

AVD

D

IOV

DD

DV

DD

I2C

_SC

LG

PIO

_Px

1.0

µF0.

1 µF

GN

D

VO

B(1

.1V

)

0.1

µF

GN

D

10 µ

F

VIO

14

0.1

µF

GN

D

VIO

NOTE

: EFR

32 IO

VDD

and

EFP

VIO

mus

t be t

he sa

me v

olta

ge.

Figu

re 4

.5.

EFP0

104

Ref

eren

ce S

chem

atic

s

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 26

Page 27: AN1187: EFP01 Design Considerations

3

0.1

µF1.

0 µF

2.2

µF

GN

D

GN

D

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

d fil

ter c

ompo

nent

requ

irem

ents

can

vary

by

devic

e and

appl

icatio

n. C

onsu

lt th

e rele

vant

dat

ashe

et an

dap

plica

tion

note

s for

com

pone

nt va

lues

and

reco

mm

enda

tions

,pa

rticu

larly

for R

FVDD

and

PAVD

D.

EFR3

2 dev

ice-s

pecif

icRF

filte

ring

and

bypa

ssca

pacit

ors

0.1

µF1.

0 µF

GN

D

1.0

µF0.

1 µF

GN

D

DEC

OU

PLE

RFV

DD

PAV

DD

AVD

D

IOV

DD

DV

DD

I2C

_SC

LG

PIO

_Px

5 4

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

17

EFP_

IRQ

5 8111

12

7

10219

6

1

16

2

1920

GN

D

VO

A S

W

1

2.2

µH

1.0

µF

BLM

18A

G60

1SN

1

FB

600

Ω

4.7

µF

1.0

Ω

GN

D

RF P

i Filt

er

GN

D

10 µ

F0.

1 µF

GN

D13

10 µ

F0.

1 µF

GN

D14

0.1

µF

GN

D

VIO

NOTE

: EFR

32 IO

VDD

and

EFP

VIO

mus

t be t

he sa

me v

olta

ge.

VO

A(3

.3V

)

VO

B(1

.8V

)

VB

AT

8

10 µ

F0.

1 µF

GN

D

0.1

µF

GN

D

2.2

µH

10 µ

F

VO

C

I2C

_SC

LI2

C_S

DA

IRQ

n

LA2

VO

A_S

W

VD

DA

LBLA

1

VDDB

VO

B

EPADDCDC_GND

GND

GND

GND

GND

GNDGND

EFP0

106

VO

A

VO

C

VIO

Figu

re 4

.6.

EFP0

106

Ref

eren

ce S

chem

atic

s

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 27

Page 28: AN1187: EFP01 Design Considerations

3

5 4

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

17

EFP_

IRQ

5 8111

12 13

7

10219

6

1

16

2

1920

GN

D

VO

A S

W

1

2.2

µH

1.0

µF

BLM

18A

G60

1SN

1

FB

600

Ω

4.7

µF

1.0

Ω

GN

D

RF P

i Filt

er

VO

B(1

.1V

)

GN

D

10 µ

F0.

1 µF

GN

D

VO

A(1

.8V

) 10 µ

F0.

1 µF

GN

D

1.0

µF0.

1 µF

GN

D14

0.1

µF

GN

D

VIO

NOTE

: EFR

32 IO

VDD

and

EFP

VIO

mus

t be t

he sa

me v

olta

ge.

2.2

µF

GN

D

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

d fil

ter c

ompo

nent

requ

irem

ents

can

vary

by

devic

e and

appl

icatio

n. C

onsu

lt th

e rele

vant

dat

ashe

et an

dap

plica

tion

note

s for

com

pone

nt va

lues

and

reco

mm

enda

tions

,pa

rticu

larly

for R

FVDD

and

PAVD

D.

EFR3

2 dev

ice-s

pecif

icRF

filte

ring

and

bypa

ssca

pacit

ors

0.1

µF1.

0 µF

GN

D

1.0

µF0.

1 µF

GN

D

DEC

OU

PLE

RFV

DD

PAV

DD

IOV

DD

DV

DD

I2C

_SC

LG

PIO

_Px

0.1

µF1.

0 µF

GN

D

AVD

D

VB

AT

8

10 µ

F0.

1 µF

GN

D

2.2

µH

VO

C

NOTE

: Tot

al VO

B pl

us D

ECOU

PLE

capa

citan

ce m

ust n

ot ex

ceed

the E

FR32

data

shee

t max

imum

(gen

erall

y 2.75

µF)

when

VOB

pow

ers D

ECOU

PLE.

I2C

_SC

LI2

C_S

DA

IRQ

n

LA2

VO

A_S

W

VO

C

VD

DA

LBLA

1

VDDB

VO

B

EPADDCDC_GND

GND

GND

GND

GND

GNDGND

EFP0

107

VO

A

VIO

Figu

re 4

.7.

EFP0

107

Ref

eren

ce S

chem

atic

s

AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 28

Page 29: AN1187: EFP01 Design Considerations

VO

B(1

.1V

)5 4

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

17

EFP_

IRQ

5 81

2.2

µH

10 µ

F0.

1 µF

11

12 13

3 7

8

10

219

6

1

16

2

1920

GN

D

VO

A S

W

VO

C

GN

D

0.1

µF10

µF

GN

D

1

0.1

µF1.

0 µF

2.2

µH

2.2

µF

GN

D

GN

D

EFP_

I2C

_SC

LEF

P_I2

C_S

DA

EFP_

IRQ

NOTE

: Tot

al VO

B pl

us D

ECOU

PLE

capa

citan

ce m

ust n

ot ex

ceed

the E

FR32

data

shee

t max

imum

(gen

erall

y 2.75

µF)

when

VOB

pow

ers D

ECOU

PLE.

EFR3

2

I2C

_SD

A

NOTE

: Thi

s is a

sim

plifi

ed E

FR32

dev

ice re

pres

enta

tion.

Act

ual

deco

uplin

g an

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AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 29

Page 30: AN1187: EFP01 Design Considerations

3

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AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

silabs.com | Building a more connected world. Rev. 0.8 | 30

Page 31: AN1187: EFP01 Design Considerations

VO

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AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

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Page 32: AN1187: EFP01 Design Considerations

30.

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AN1187: EFP01 Design ConsiderationsEFP01 Reference Schematics

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Page 33: AN1187: EFP01 Design Considerations

5. EFP01 Layout Considerations

Because the DC-DC converters on EFP01 can switch high currents at a high frequency, special layout considerations are required tooptimize operation and reduce noise:

• The following connections to the EFP01 are to be made with minimum trace length and trace resistance:• • LA1, LA2, and/or LB pins to corresponding inductors

• VOA, VOB, and/or VOC outputs to corresponding 10 µF & 0.1 µF filter capacitors• Battery or main supply voltage to VDDB and/or VDDA pin(s)• DCDC_GROUND to PCB ground

• The EFP01 should be oriented on the PCB in such a way so that the DCDC inductors are located as far as possible from any noise-sensitive circuitry (e.g., a radio antenna). Ideally, the inductor(s) should be placed on the opposite side of the PCB such that there isa solid ground plane shielding the noisy inductor(s) from the sensitive RF circuitry.

• For more detailed radio-specific layout guidelines for EFR32, see application note, AN928: EFR32 Layout Design Guide.• Use an array of vias under the center GND pad to achieve datasheet specified thermal and noise performance as shown in the fig-

ure below. These should be 16 mil diameter and 8 mil drill.

Figure 5.1. Center Ground Pad Via Arrangement

AN1187: EFP01 Design ConsiderationsEFP01 Layout Considerations

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6. EFP01 SDK Support

To simplify use of the EFP01, Gecko SDK includes a driver to properly configure it for efficient operation. Use of the driver is stronglyencouraged because it includes workarounds for any errata or issues affecting device performance. For information about the driver,see the [Gecko HAL and Driver API Reference Guide] tile in Simplicity Studio.

6.1 Driver Files and Simplicity Studio Projects

EFP01 support is found in the hardware/driver/efp directory with the full path being C:\SiliconLabs\SimplicityStudio\v4\developer\sdks\gecko_sdk_suite\v2.7\hardware\driver\efp for Gecko SDK version 2.7 in the default Simplicity Studio directory. Asshown in Figure 6.1 EFP01 Device Driver Files on page 34, the driver consists of a main C file, two header files, and a templateconfiguration file.

Figure 6.1. EFP01 Device Driver Files

Simplicity Studio's wireless template projects, such as soc-empty in the Bluteooth stack, automatically include EFP01 support when thetarget is a Wireless Starter Kit (WSTK) mainboard and an EFR32 radio board that includes EFP01, e.g. the EFR32MG21 2.4 GHz 10dBm with EFP Radio Board (BRD4179B). For projects created by specifying a part number in the the Launcher's My Products paneland then clicking the New Project button, the EFP01 driver files must be manually copied into the project.

EFP01 setup is handled with other board level initialization in the project's init-board.c file with the addition of three segments ofcode. The first segment consists of the necessary header files and global variables:

#include "sl_efp.h"#include "sl_efp_efp_config.h"

static sl_efp_handle_data_t efp_handle_data;static sl_efp_handle_t efp = &efp_handle_data;

Note that the sl_efp_efp_config.h provided by the SDK is a template configuration file that can and should be customized for thespecific system at hand. Additionally, Simplicity Studio's EFP configuration tool, discussed separately in application note AN1245: EFPConfiguration Tool, generates a suitable sl_efp_efp_config.h file that can be manually copied into a project.

The second segment of code consists of local variables that need to be added to the initBoard() function:

sl_status_t status; uint8_t i2cCtrl, devRevId; uint8_t tmp;

AN1187: EFP01 Design ConsiderationsEFP01 SDK Support

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The actual EFP01 initialization is appended to the initBoard() function:

// Initialize the EFP sl_efp_init_data_t init = SL_EFP_INSTANCE_INIT; init.enable_irq_pin = false; status |= sl_efp_init(efp, &init);

// Set VOB EM23 targets sl_efp_set_vob_em23_voltage(efp, 1100); sl_efp_write_register_field(efp, EFP01_BB_IPK, 1, _EFP01_BB_IPK_BB_IPK_EM2_MASK, _EFP01_BB_IPK_BB_IPK_EM2_SHIFT);

// Set VOB target to higher level to guarantee it will overdrive the EFR32 LDO output sl_efp_set_vob_em01_voltage(efp, 1130);

// Set min peak current sl_efp_write_register_field(efp, EFP01_BK_IPK, 0, _EFP01_BK_IPK_BK_IPK_MASK, _EFP01_BK_IPK_BK_IPK_SHIFT);

// Set min Ton time sl_efp_write_register_field(efp, EFP01_BK_CTRL1, 1, _EFP01_BK_CTRL1_BK_TON_MAX_MASK, _EFP01_BK_CTRL1_BK_TON_MAX_SHIFT);

// Set max current limit sl_efp_write_register_field(efp, EFP01_BK_CTRL2, 15, _EFP01_BK_CTRL2_BK_IRI_CON_MASK, _EFP01_BK_CTRL2_BK_IRI_CON_SHIFT);

// Enable VOB sl_efp_set_vob_mode(efp, efp_vob_mode_buck);

// Make sure VOB is ready before turning off internal LDO regulator do { status = sl_efp_read_register(efp, EFP01_STATUS_LIVE, &tmp); } while (((tmp & _EFP01_STATUS_LIVE_VOB_INREG_LIVE_MASK) == 0) || (status != SL_STATUS_OK));

// Set desired peak current sl_efp_write_register_field(efp, EFP01_BK_IPK, 10, _EFP01_BK_IPK_BK_IPK_MASK, _EFP01_BK_IPK_BK_IPK_SHIFT);

// Set desired TON MAX sl_efp_write_register_field(efp, EFP01_BK_CTRL1, 7, _EFP01_BK_CTRL1_BK_TON_MAX_MASK, _EFP01_BK_CTRL1_BK_TON_MAX_SHIFT);

// Disable current limit sl_efp_write_register_field(efp, EFP01_BK_CTRL2, 0, _EFP01_BK_CTRL2_BK_IRI_CON_MASK, _EFP01_BK_CTRL2_BK_IRI_CON_SHIFT);

// Turn off EFR32xG21 internal LDO regulator sl_efp_emu_ldo_enable(efp, false);

// Set desired VOB voltage sl_efp_set_vob_em01_voltage(efp, 1100);

Setup is specific to both the EFP01 derivative and the EFR32 device being used. For example, the code above runs on theEFR32MG21 2.4 GHz 10 dBm with EFP Radio Board (BRD4179B). Initially, the EFP0104 derivative on this particular radio board deliv-ers 1.13V on its VOB output to overdrive DECOUPLE with 1.13V until the internal regulator on EFR32MG21 can be disabled, afterwhich the VOB output level is reduced to the usual 1.1V core digital supply voltage.

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Page 36: AN1187: EFP01 Design Considerations

6.2 Initialization Breakdown

1. Declare a structure of type sl_efp_init_data_t.

typedef struct { unsigned int config_size; ///< Number of register writes inside the configuration data. Set to 0 on preprogrammed parts. uint8_t *config_data; ///< Configuration data, pairs of (addr,data),(addr,data),... Set to NULL on preprogrammed parts. bool is_host_efp; ///< True if this EFP powers host SoC. sl_efp_em_transition_mode_t em_transition_mode; ///< Method for controlling EFP Energy Mode (EM) transitions. bool enable_irq_pin; ///< Initialize a GPIO pin as EFP IRQ input. GPIO_Port_TypeDef irq_port; ///< GPIO port to use for EFP IRQ GPIO pin. unsigned int irq_pin; ///< GPIO pin number to use for EFP IRQ GPIO pin. I2C_TypeDef *i2c_peripheral; ///< I2C peripheral instance pointer. GPIO_Port_TypeDef i2c_scl_port; ///< GPIO port to use for I2C SCL signal. unsigned int i2c_scl_pin; ///< GPIO pin number to use for I2C SCL signal. GPIO_Port_TypeDef i2c_sda_port; ///< GPIO port to use for I2C SDA signal. unsigned int i2c_sda_pin; ///< GPIO pin number to use for I2C SDA signal. #if defined(_SILICON_LABS_32B_SERIES_0) unsigned int i2c_port_location; ///< I2C location number to use for I2C signals. #elif defined(_SILICON_LABS_32B_SERIES_1) unsigned int i2c_scl_port_location; ///< I2C location number to use for I2C SCL signal. unsigned int i2c_sda_port_location; ///< I2C location number to use for I2C SDA signal. #endif} sl_efp_init_data_t;

Parameter details:• config_size: The output of the EFP01 Configuration Tool is a header file with address and data pairs to be written. This pa-

rameter represents the size of the address/data array. If unused, set to 0.• config_data: Contains the address and data pair data array output from the EFP01 Configuration Tool generated header file. If

unused, set to NULL.• is_host_efp: Set to True when the EFP01 is powering the EFR32/EFM32 host processor (default case).• em_transition_mode: Configures the energy mode transition method

• efp_em_transition_mode_i2c — (Default) Energy mode transitions are made using I2C communications.• efp_em_transition_mode_gpio_bitbang — Energy mode transitions are made using a bit-banged direct mode for host

processors without hardware support for EFP01 direct mode transitions. EM4 cannot be used in this mode. See additionalusage warnings in the Direct Mode Control section in the EFP01 datasheet.

• efp_em_transition_mode_emu — Energy mode transitions are made using direct mode control only on host processors withhardware support for EFP01 Direct Mode Control. EM4 is supported in this configuration. Direct mode hardware support isavailable on EFR32xG22 and later devices.

• enable_irq_pin: Use the EFP01's IRQn output.• irq_port: If enable_irq_pin is true, this specifies the host processor GPIO port to which the EFP01's IRQn output is connec-

ted.• irq_pin: If enable_irq_pin is true, this specifies the host processor GPIO pin to which the EFP01's IRQn output is connected.• i2c_peripheral: Pointer to host processor I2C peripheral that is connected to the EFP01's I2C pins.• i2c_scl_port: Specifies the host processor GPIO port to which the EFP01's I2C_SCL pin is connected• i2c_scl_pin: Specifies the host processor GPIO pin to which the EFP01's I2C_SCL pin is connected.• i2c_sda_port: Specifies the host processor GPIO port to which the EFP01's I2C_SDA pin is connected• i2c_sda_pin: Specifies the host processor GPIO pin to which the EFP01's I2C_SDA pin is connected.• i2c_port_location: For Series 1 EFR32/EFM32 devices, selects the I2C port location.• i2c_scl_port_location: For Series 2 EFR32/EFM32 devices, selects the I2C SCL port location.• i2c_sda_port_location: For Series 2 EFR32/EFM32 devices, selects the I2C SDA port location.

2. Create a driver handle for the EFP01 as shown below:

static sl_efp_handle_data_t efp_handle_data;static sl_efp_handle_t efp = &efp_handle_data;

3. Call sl_efp_init(efp, &init); passing both the EFP handle and the sl_efp_init_data_t structure, as arguments.

While the sequence above is sufficient to configure the EFP01 driver, additional board/processor specific initialization may be required.Such is the case for the EFR32MG21, as briefly discussed near the end of 6.1 Driver Files and Simplicity Studio Projects, where furtherdriver calls are be necessary to adjust regulator output prior to routine operation.

AN1187: EFP01 Design ConsiderationsEFP01 SDK Support

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7. Revision History

Revision 0.8

July, 2021• Added schematics for EFP0101, EFP0102, EFP0103, and EFP0106 in 4.2 Reference Schematics

Revision 0.7

April, 2021• Added buck/boost converter theory in 1.3.1 Buck/Boost Converter Operation.• Added missing height measurements to tables in 2.2 DC-DC Inductor.• Added schematic for EFP0107 in Figure 4.7 EFP0107 Reference Schematics on page 28.

Revision 0.6

November, 2020• Added schematic for EFP0110 in Figure 4.10 EFP0110 Reference Schematics on page 31.• Corrected the component values in Figure 4.5 EFP0104 Reference Schematics on page 26, Figure 4.8 EFP0108 Reference Sche-

matics on page 29, Figure 4.9 EFP0109 Reference Schematics on page 30 and Figure 4.11 EFP0111 Reference Schematics onpage 32.

Revision 0.5

July, 2020• Corrected the equation in 1.1.1 Buck Converter Operation.

Revision 0.4

June, 2020• 3.2 EFP01 Impact on EFM32/EFR32 Current Draw section added.

Revision 0.3

May, 2020• Updated key points on front page.

Revision 0.2

April, 2020• Language updates made throughout.• Added recommended boost mode inductors and efficiency graphs.• 4.1 RF Noise Filtering updated.• 4. EFP01 Reference Schematics improved.• 6.1 Driver Files and Simplicity Studio Projects section added.

Revision 0.1

December, 2019• Initial revision.

AN1187: EFP01 Design ConsiderationsRevision History

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Page 38: AN1187: EFP01 Design Considerations

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DisclaimerSilicon Labs intends to provide customers with the latest, accurate, and in-depth documentation of all peripherals and modules available for system and software imple-menters using or intending to use the Silicon Labs products. Characterization data, available modules and peripherals, memory sizes and memory addresses refer to each specific device, and “Typical” parameters provided can and do vary in different applications. Application examples described herein are for illustrative purposes only. Silicon Labs reserves the right to make changes without further notice to the product information, specifications, and descriptions herein, and does not give warranties as to the accuracy or completeness of the included information. Without prior notification, Silicon Labs may update product firmware during the manufacturing process for security or reliability reasons. Such changes will not alter the specifications or the performance of the product. Silicon Labs shall have no liability for the consequences of use of the infor-mation supplied in this document. This document does not imply or expressly grant any license to design or fabricate any integrated circuits. The products are not designed or authorized to be used within any FDA Class III devices, applications for which FDA premarket approval is required or Life Support Systems without the specific written consent of Silicon Labs. A “Life Support System” is any product or system intended to support or sustain life and/or health, which, if it fails, can be reasonably expected to result in significant personal injury or death. Silicon Labs products are not designed or authorized for military applications. Silicon Labs products shall under no circumstances be used in weapons of mass destruction including (but not limited to) nuclear, biological or chemical weapons, or missiles capable of delivering such weapons. Silicon Labs disclaims all express and implied warranties and shall not be responsible or liable for any injuries or damages related to use of a Silicon Labs product in such unauthorized applications. Note: This content may contain offensive terminology that is now obsolete. Silicon Labs is replacing these terms with inclusive language wherever possible. For more information, visit www.silabs.com/about-us/inclusive-lexicon-project

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