Amplifier Characterization in the millimeter wave range Conference... · MillimeterWave Converter...
Transcript of Amplifier Characterization in the millimeter wave range Conference... · MillimeterWave Converter...
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Amplifier Characterization in
the millimeter wave range
Tera Hertz : New opportunities for industry3-5 February 2015
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Millimeter Wave Converter Family
ZVA-Z75
ZVA-Z90
ZVA-Z110
ZVA-Z110E
ZVA-Z140
ZVA-Z170
ZVA-Z220
ZVA-Z325
V Band (WR15)
E Band (WR12)
W Band (WR10)
F Band (WR08)
D Band (WR06)
G Band (WR05)
J Band (WR03)
Manual Attenuator
Y Band (WR02)
ZVA-Z500
Electronic Attenuator
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Converter block diagram
(ZVA-Z110, WR10 band)
x3 x2
REF
MEAS
LO
RF
M = 6
N = 8
N = 8
Legend: Waveguide WR10
Coaxial (PC3,5/SMA)
Attenuator(manual)
LNA +20dB
LNA +20dB
+10dB
TEST PORT
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Rohde & Schwarz ZVA-Z110RF, LO, IF parameters
ı Source Input (from VNA):� Frequency Range: 12.5 GHz to 18.333334 GHz (x6)� Input power range: +4 dBm to +10 dBm
ı Local Oscillator Input (from VNA/ext source)� Frequency Range: 9.3375 GHz to 13.74875 GHz (x8)� Input power Range: +5 dBm to +10dBm
ıMeasurement/Reference Output (to VNA)� Frequency Range: 10 MHz to 300 MHz
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Material measurements in the millimeter wave range
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Amplifier Characterization
Compression point measurement , e.g. 1dB CP
ı Requires power sweep capabilityı For accurate compression measurements we need
� A flat input power @ DUT input� A defined (calibrated) power level @ DUT input
ı Consequence : Power calibration is a must
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ZVA-Z110E with electronic power control
ı 75 to 110GHz with electronic power controlı 0 to 25 dB attenuationı Allows power sweep and
compression point measurementon amplifiers
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Electronic power control
To R&S®ZVA-Z110E
Option R&S®ZVA-B8
Full automatic compression point measurement at 110 GHz
25dB Electronic Power Sweep Range
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Power Sweep by RF input variationExample WR10 band
ı Power sweep range of 70dB by RF input power variationı Frequency dependency can be calibrated out by software tool
Output power relative to max output power / dB
RFin power / dBm
@ 75, 80, 85, 90, 95, 100, 105 and 110 GHz
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Power Calibration
in the millimeter wave range
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Precise power calibration
up to 110GHz
Unique power measurements from DC
up to 110GHz with 1.0mm connector
Unique power measurements from DC
up to 110GHz with 1.0mm connector
First millimeter power sensor that is
traceable to a national metrology
institute
First millimeter power sensor that is
traceable to a national metrology
institute
S-Parameters of waveguide transition
can be loaded directly into sensor for
accurate power measurements
S-Parameters of waveguide transition
can be loaded directly into sensor for
accurate power measurements
USB interface means the power sensor
can be used directly with the ZVA or PC
running the free NRP analysis software.
USB interface means the power sensor
can be used directly with the ZVA or PC
running the free NRP analysis software.
Lowest uncertainty 0.040 to 0.318dB
Highest Linearity 0.010dB @110GHz
30% faster than competition
Lowest uncertainty 0.040 to 0.318dB
Highest Linearity 0.010dB @110GHz
30% faster than competition
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Power calibration above 110GHz
Compatibility with VDI (Erickson)
PM4/5 Calorimeter power meter
for use from 75GHz to 2 THz.
Compatibility with VDI (Erickson)
PM4/5 Calorimeter power meter
for use from 75GHz to 2 THz.
Compatibility for power
measurements up to 220GHz with
the ELVA DPM power meter.
Compatibility for power
measurements up to 220GHz with
the ELVA DPM power meter.
Flexible ZVA external device
implementation allows customer
developed drivers
Flexible ZVA external device
implementation allows customer
developed drivers
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Power Calibration on the Wafer
WR10
Wafer
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Goal : Power calibration in the reference plane of the DUT (amplifier)
Problem : No access with coaxial power meter possible
Solution:
ı Characterization of the S-parameter between coaxial interface and the wafer prober tip
ı Correction of the coaxial power calibration with this loss list
Challenges for accurate Power
Levels On-Wafer
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Power Correction with Loss List
Coax plane
Wafer
Loss list
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Power Calibration in Reference
Plane on the Wafer
1st Step:
UOSM calibration to characterize the connection between coaxial interface and on-wafer reference plane
⇒ Power loss list for each port
Alternatively ´Delta´ Calibration between coaxial plane and On-Wafer plane
2nd Step:
Power calibration at the coaxial interfaces using the power loss list from the 1st step.
1 mmMatch ISS-Match
UnknownThrough
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Millimeter Wave Imaging Systems
Phase Error Sensitivity
Tera Hertz : New opportunities for industry3-5 February 2015
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Technology choices
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Planar 2D-Array
Digital-Beamforming
Multistatic sparsearray
Active system
E-Band
+ 3D Images+ Compact
+ high dynamic range+ indoor operation
+ synthetic focusing+ high flexibility+ adjustable illumination
+ technology reuse+ sufficient RF power+ high bandwidth+ mm resolution+ good penetration
+ feasible+ Reduce cost+ Reduce power+ faster
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Multistatic imaging - Focusing
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Reconstruction in space domain
x
y
z
Tx
Rx
2D-Array
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Incident waveReflected wave
Principle of Operation
ı Person is illuminated by microwaves with very low intensity(No X-rays → non ionizing radiation)
ı Waves penetrate the clothing(but not the skin)
ı Scanner detects the reflected (backscattered) signal from the skin or concealed objects
ı Unique technique analysing reflections from floor mirror
ı Automatic evaluation and analysis of image data by an automatic detection software (algorithm)
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metallic and non-metallicplastics ceramicsexplosivesliquids and gelspowder
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Technical Overview PanelCluster
94 receive antennas
94 transmit antennas
ı Aperture 2 m x 1 m
ı 3008 Tx & 3008 Rx elements in 32 Clusters
ı Data acquisition time≈ 16 ms for QPS100 (per scan)≈ 64 ms for QPS200 (single)
ı Frequency 70 to 80 GHz (λ ≈ 4 mm)
ı High resolution < 2 mm
ı Image dynamic range > 30 dB
ı Processing time≈ 7 sec (QPS100, result of front scan)≈ 10 sec (QPS100, complete result)≈ 7 sec (QPS200, complete result)
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System Block Diagram
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Digital Signal Processing Chain
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digitized IF signals
DDC, low-pass filter
correct forsystem drift
system errorcorrection
image reconstruction
automatic detectionalgorithm
detectionresult
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Sources of Noise
ı Various sources of errorswithin the systemı Dominant errors:
� Thermal noise of receiver� Phase noise of signal
source� Temperature drift (phase
drift of received signal), compensated byreferencing
� Antenna crosstalk, compensated by systemerror correction
ı Noise affects performance ofcompensation
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Cross-coupling
ı As a systematic signal, residual cross-coupling shows up as artifact within themicrowave image
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Test scenario – ideal image
ı Resolution test chartı Dynamic range test („bed of nails“)ı Heavy averaging used for best
available data quality� more than 40 dB noise andartifact free image dynamic range
ı This data is used as referencedata set and modified by addingsystematic and random phaseerrorsı The modified data are
reconstructed and effects of phaseerrors on image quality areexamined
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Test scenario – systematic phase drift added (e.g.
temperature drift)ı Systematic phase drift of 20
degree added to raw dataı Cross-coupling is not
compensated completely� shows up as artifactı Dynamic range is decreased
to 27 dBı When omitting channels with
high cross-coupling fromadjacent transmitters, dynamic range is 33 dB
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complete dataset high-cc omitted
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Systematic Phase Errors - Summary
ı Normally the cross coupling between the antennas is calibrated out (Match calibration)ı But if temperature drift (= phase error, phase drift) happens the cross coupling
can not be fully eliminatedı Consequence : Artifacts come up in the pictureı Measures :
� Omitting channels with high cross coupling
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Test scenario – random phase added (e.g. source
phase noise)
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complete dataset high-cc omitted
ı Random phase drift, standarddeviation 20 degree added toraw dataı Random error � no
systematic artifacts, but significant increase in noise levelı Dynamic range is decreased
to 33 dBı When omitting channels with
high cross-coupling fromadjacent transmitters, dynamic range is 36 dB
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Random Phase Errors - Summary
ı Noise level increasesı No artifactsı Consequences :
� Decrease in dynamic range� Unclear pictureı Measures :
� Reference channels near Tx/Rx antennas� Omitting channels with high cross coupling
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Other application areas for microwave imaging
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Non-Destructive Test with 3D-Pictures (QPS100)
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Thank you for yourattention
1950 : World´́́́s first Vector Network Analyzer - made by R&S
> 50 years of experience in network analysis
Direct display of S-Parameters in a complex plane