Aluminum Doped Zinc Oxide Thin Film for Organic …...ii Aluminum Doped Zinc Oxide Thin Film for...
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Aluminum Doped Zinc Oxide Thin Film for Organic Photovoltaics
by
Fanjie Wei
A thesis submitted in conformity with the requirements for the degree of Master of Applied Science
Graduate Department of Materials Science and Engineering University of Toronto
© Copyright by Fanjie Wei (2010)
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Aluminum Doped Zinc Oxide Thin Film for Organic Photovoltaics
Fanjie Wei
Master of Applied Science
Graduate Department of Material Science and Engineering
University of Toronto
2010
Abstract
Aluminum Doped Zinc Oxide (AZO) produced by radio frequency (RF) magnetron
sputtering is thought to be the prospective replacement of the de facto standard indium tin oxide
(ITO) anode in organic solar cells. In order to achieve a proper resistivity and transmittance of
AZO thin film compared to ITO, a systematic study was done to optimize the sputtering
conditions. In this work, two primary parameters: target-substrate distance and sputtering power,
were optimized, and a optimized film thickness was determined. A poly(3-hexylthiophene)
(P3HT) and [6,6]-phenyl C61 butyric acid methyl ester (PCBM) bulk-heterojunction organic
solar cell was fabricated based on the optimized parameters and the power conversion efficiency
reached 0.83%. A theoretical analysis is given to explain the optimization process. This work
provides a clear pathway to substitute AZO for ITO in organic solar cells for future mass
production.
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Acknowledgments
During the last two years, I am really happy to have the chance to work with so many
exceptionally diligent and brilliant people.
Firstly and foremost, I would like to express my sincere thanks to my supervisor Prof.
Zheng-Hong Lu, for his support throughout my project. Professor Lu not only provides the
direction for me, but also motivates all the individuals in this group.
I would like to thank all the members in Lu’s group: Dr. Dan Grozea, Dr. S.W Tsang, Dr
Stella Tang, Dr Julia Jin, Dr Hui Wang, Mark Greiner, Michael Helander, Zhibin Wang, Dong
Gao, Jacky Qiu. I would like to express my gratitude to all these people for their insightful views
and generous help when I meet difficulties which were usual for me. Especially, I am deeply
thankful to Dr Stella Tang. We worked together on sputtering system for a long time. I want to
say my most gratitude to her for a lot of useful discussions and her generosity to provide help to
me at any time.
I would like to thank my friends Yao Ma and Daniel Wen for all the theoretical
discussions and their help to use the SEM facility.
Finally, I am very grateful to my parents and my younger brother and cousins. If it were
not for their support, I may not overcome the difficulties during the last two years.
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Table of Contents
Abstract
Acknowledgements
Table of Contents
List of Tables and Figures
Chapter 1 Introduction………………………………………………………..01
1.1 Organic Solar Cell.……………………………………………………………01
1.1.1 Motivation For Solar Cell…….…...….....……………………………01
1.1.2 Photovoltaics…….…...……………………………………………….05
1.1.3 Organic Solar Cell……......……….………………………………….06
1.2 Motivation for Alumina Doped Zinc Oxide….….…………………………..14
1.2.1 ITO Drawbacks………………………………………………………..14
1.2.2 Alumina Doped Zinc Oxide……………….………………………….16
Chapter 2 Experimental……………………………………………………...20
2.1 Experimental Facilities………...……………………………………………..21
2.1.1 Sputtering Chamber………….….……………...……………………21
2.1.2 Spin Coating and Aluminum Evaporation…………..……………..25
2.1.3 Testing System….…………………………………………………….25
2.2 Experimental Procedures……………...…………………..………………...27
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Chapter 3 Characterization of AZO…………………………………………29
3.1 Optimization of Target to Substrate Distance…….….……………..…….29
3.2 Drude Theory…………………………………………..……………………..34
3.3 Qualitative Explanation………..………………………….…………………37
3.4 Optimization of Deposition Power…...…..…… …………………………..41
3.5 Optimization of Thickness ….………….…………………………………...46
3.6 Conclusions………………………...………………………………………...47
Chapter 4 Application in OPVs.…………….………………………………48
Chapter 5 Summary………………………………………………………….50
References...….……...…………………………………………………………52
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List of Tables
Table 1.1 The parameters of ITO and the minimum requirements on alternative TCOs….…..17
Table 1.2 The resistivity and dopant content for ZnO films doped with various dopands [48]..18
Table 2.1 Target to substrate distances and their positions……………………………………..24
Table 3.1 The sheet resistance and resistivity as a function of distances for different power
levels………………………………………………………………………………....29
Table 3.2 Surface resistance and resistivity as a function of thickness for particular target-
substrate distances and power of 50W ……..………………………………………..32
Table 3.3 Resistivity as a function of substrate-target distance with the film thickness 600nm
and deposition power 100W…………………………………………………….…….33
Table 3.4 The deposition rates in different powers…...……………………………….….…….41
Table 3.5 Surface resistance and resistivity as a function of power at constant film thickness of
500nm and target to substrate distance of 8cm………..…………………………..…..42
Table 3.6 Comparison of ITO and optimized AZO properties…...………………………….…47
Table 4.1 The device performance of optimized AZO based solar cell………...……………...49
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List of Figures
Figure 1.1 World oil price in dollars from 1986 to 2010 [2]………………..……………………1
Figure 1.2 The trend in globally averaged temperature near the Earth's surface [3]…………….2
Figure 1.3 The breakdown of current and estimated energy sources from 2000 to 2100 [4]…....3
Figure 1.4 World landmass required to provide 18 TW of solar electricity assuming 8% cell
efficiency. The colors in the map show the local solar irradiance averaged over three
years from 1991 to 1993 (24 hours a day) taking into account the cloud coverage
available from weather satellites. ……………………....……………………………4
Figure 1.5 Historical module prices of solar cells historical …………………………………….4
Figure 1.6 The evolution of best research-cell efficiencies in history…………………………...6
Figure 1.7 Estimated PV module prices and the market proportions for the three generations of
solar cells [12]………………………………………………………………………..7
Figure 1.8 The important milestones in the development of organic solar cells...………………8
Figure 1.9 The competitive position of every solar technology is mainly determined by the
factors efficiency, lifetime and cost.…………………………………………………9
Figure 1.10 (left) OLED mode of operation, (right) organic PV mode of operation. In both cases
an organic material is sandwiched between two electrodes. Typical electrode
materials are shown in the figure. In PVs electrons are collected at the metal
electrode and holes are collected at the ITO electrode. The reverse happens in a
LED: electrons are introduced at the metal electrode (cathode), which recombine
with holes introduced at the ITO electrode (anode). [23]..…………………………10
Figure 1.11 The chemical structures of P3HT and PCBM……...………………………………11
Figure 1.12 The mechanism of organic photovoltaics [10]…………......………………………12
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Figure 1.13 General mechanism for photoenergy conversion in excitonic solar cells………….12
Figure 1.14 Energy levels and light harvesting [23]………..…………………………..………13
Figure 1.15 The schematic current-voltage (I-V) curve of a polymer-fullerene BHJ solar
cell[23]………………………………………………………............…….………..13
Figure 1.16 Worldwide Indium production from 2002 to 2006 [33]………….………………..15
Figure 1.17 Unit price of indium in 1998 dollars per ton from 1987 to 2007 [33]……….…….15
Figure 2.1 Schematic of the sputtering chamber.……………………………………………...20
Figure 2.2 The homemade sputtering substrate holder………………………………………..21
Figure 2.3 The sputtering machine used in our lab. On the left is the sputtering chamber from
outsite. On the right is the control panel. Below is a view of the inside of the
machine, three targets are put symetrically in it..……………………….…………23
Figure 2.4 The machines used for spin coating and metal deposition. On the left is the spin
coater, which is stored in a glove box. On the right are the cluster tools used for
metal and LiF vacuum deposition………………………………………………….25
Figure 2.5 On the Left is the simulated AM1.5G solar illuminations, on the right is the testing
facilities used in organic solar cell testing…………………………………………26
Figure 2.6 Schematic of four points probes……………………………………………..……..26
Figure 3.1 Resistivity as a function of target to substrate distance for different power levels...30
Figure 3.2 Transmittance spectrum in the visible range (150W 8cm)…………………………31
Figure 3.3 Resistivity as a function of film thickness for material deposited in 50W….……...32
Figure 3.4 Resistivity as a function of substrate-target distance for a 600nm thick film at
100W…………………………………………………………………………….…33
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Figure 3.5 The transmittance spectrum in the visible range for 600nm thick AZO thin films
deposited at different target to substrate distances with power of 100W………….34
Figure 3.6 The reflectance and transmittance spectra of an AZO film produced by pulsed laser
deposition…………………………………………………………………………..36
Figure 3.7 The correlation between the transmittance edge in the IR and the Carrier
concentration…………..……………………………………………………………38
Figure 3.8 The transmittance spectrum in the visible and IR range with different target to
substrate distances for 600nm thick films deposited with 100W power……….….38
Figure 3.9 XPS spectra of 600nm thick AZO thin films deposited with different target to
substrate distances using power 100W ……………………………………………39
Figure 3.10 SEM images of 600nm thick AZO thin films deposited with different target to
substrate distances using 100W power...………………………………………..…40
Figure 3.11 Deposition rate as a function of power…………………………….………………42
Figure 3.12 Resistivity as a function of power for a film thickness of 500nm and target to
substrate distance of 8cm ……….……….………………………………..………43
Figure 3.13 The transmittance spectra in the visible range for 500nm thick films deposited with
different sputtering power levels at a target to substrate distance of 8cm…………43
Figure 3.14 The transmittance spectra in the visible and IR range for 500nm thick films
deposited with different sputtering power at target to substrate distance 8cm..…...44
Figure 3.15 SEM images of 500nm thick AZO thin films deposited with different sputtering
power levels of a target to substrate distance 8cm………………….……….……..45
Figure 3.16 Surface resistance as a function of thickness for sputtering power levels of 200W
and 250W………………………………………………………………………..…46
Figure 4.1 The standard structure of an AZO based organic solar cell………………………..48
x
Figure 4.2 I-V curve of an organic solar cell with an AZO anode deposited with the optimized
parameters…………………………………………………………………..….….48
1
Chapter 1 Introduction
1.1 Organic Solar Cell
1.1.1 Motivation for Solar Cell
Total global energy consumption in 2020 is estimated to be 20TW [1]. More than half of
our energy supply is derived from nonrenewable energy sources such as petroleum, coal or
natural gas, while only a small fraction is derived from renewable energy sources. Two main
factors have contributed to the recent boom in renewable energy production.
Firstly, oil prices are becoming extremely expensive. In July 2008, the price reached
$147.27 per barrel [1]. The enormous price fluctuations of oil prices have highlighted the strong
dependence on oil and have contributed to political and economic instability in many oil-
importing countries. Figure1.1 shows the world oil price in dollars from 1986 to 2008. We can
observe the radical increase in oil price in the last 30 years. On the one hand, the oil price has
been steadily increasing from $20 per barrel in the 1980’s to more than $140 per barrel in recent
years, On the other hand, the oil price also tend to fluctuate as a result of any political or
economical turbulence in the world, which makes the situation worse for many countries’ stable
development.
Figure 1.1 World oil price in dollars from 1986 to 2010. [2]
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Secondly, the environmental problem is a main concern in the pursuit of renewable
energy. From Figure 1.2, we can see the trend of global temperature over the last 150 years after
the industrial revolution. The temperature has increased 1.4°F since the industrial revolution. In
spite of much debate during the recent Copenhagen Conference, we must admit that the carbon
dioxide ( 2CO ) emission from oil consumption may contribute to future environmental costs that
cannot be ignored. We should not only be concerned about global warming, but also the impact
of other pollutants such as 2SO , CO produced by the burning of oil and coal in thermal power
stations and cars.
Figure 1.2 The trend in globally averaged temperature near the Earth's surface. [3]
Since there are huge demands for renewable energy in the next decades, which renewable
energy source will be dominant in the future?
Figure 1.3 shows the breakdown of current and estimated energy sources from 2000 to
2100. According to recent estimates, in 2100, solar energy will play the most important role in
the global power supply: more than half of the electricity will be generated by photovoltaic (PV)
technology.
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Figure 1.3 The breakdown of current and estimated energy sources from 2000 to 2100. [4]
There are several reasons why solar energy is expected to make up more than half of our
energy supply. First of all, solar is almost an eternal energy source. Global annual energy
consumption is currently estimated to be 15.8TW, increasing to 20TW in 2020. But the Sun’s
radiation onto the surface of the earth corresponds to 120,000 TW per year, which means each
hour the sun delivers to earth the amount of energy used by humans in an entire year! [5] Figure
1.4 shows the area required to produce 18 TW from PV sources; 6 sites globally, with a total area
of 910,019 km2. Secondly, other kinds of renewable energies have significant drawbacks. For
example, nuclear energy is currently an economic energy source compared to solar energy.
However, the fission products will remain for a million years, which will be harmful to the
environment. Thirdly, the solar energy price is decreasing quickly. Figure 1.5 shows the trend in
per module pricing of solar cells. We can estimate that in 10 years, solar energy can compete
with on-grid fossil fuel, and should even be able to achieve the United States Department of
Energy (DOE) cost goals.
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Figure 1.4 World landmass required to provide 18 TW of solar electricity assuming 8% cell
efficiency. The colors in the map show the local solar irradiance averaged over
three years from 1991 to 1993 (24 hours a day) taking into account the cloud
coverage available from weather satellites. [4]
Figure 1.5 Historical module prices of solar cells historical. [4]
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1.1.2 Photovoltaics
A solar cell is a device that can capture sunlight energy and then convert it to electricity
directly by photovoltaic effects. There have been three generations of photovoltaics.
1st Generation: The first generation photovoltaics are based on crystalline silicon
technology, which was first developed more than 50 years ago. It has succeeded in achieving
market penetration. For single crystalline based solar cells, the maximum theoretical efficiency
for this type of device is approximately 30%. [6] The highest practical efficiency for crystalline
silicon solar cell is 29% [7]. However, crystalline silicon solar cells have their drawbacks: the
silicon wafers are fragile; the process is very labor and energy intensive, etc. Hence the broad
application of the first generation solar cell technology is limited.
2nd Generation: The second generation photovoltaics are defined as thin film
technologies. Amorphous silicon (a-Si), copper indium gallium diselenide (CIGS), or cadmium
telluride (CdTe) are used as the semiconductor. The promise of low cost power has not been
realized, and efficiency remains lower than that of 1st generation solar cells. The highest
efficiency of 19.9% for CIGS solar cell has been achieved by The United States National
Renewable Energy Lab (NREL) [8].
3rd Generation: It has been estimated that third generation solar technologies will achieve
higher efficiencies and lower costs than first or second generation technologies. Today, the third
generation approaches being investigated include dye-sensitized solar cells, organic
photovoltaics, tandem cells, etc. The organic solar cell is among the most promising alternatives
in the future due to its enormous merits. Until now, the highest efficiency of 6.5% [9] for organic
photovoltaic is achieved by all solution tandem solar cells. There is still a gap to commercialize
organic solar cells. In order to commercialize it, a minimum efficiency of 15% is required.
Figure 1.6 depicts the evolution of best research-cell efficiencies. The first generation
silicon based solar cell has achieved very high efficiency and accounts for the major commercial
market globally. The second generation solar cell such as CdTe and CIGS thin film solar cells
will emerge and penetrate into the photovoltaics market. For organic solar cells, there is still a
long way to go before it can be commercialized
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Figure 1.6 The evolution of best research-cell efficiencies in history. [8]
1.1.3 Organic Solar Cell
As we know the silicon based solar cell has been commercialized for a few years, but
there are still unsolved problems in order to completely realize the promise of low cost and high
efficiency. Since there are many stubborn problems such as expensive highly purified silicon
wafer, environmental unfriendly techniques in the manufacturing process in silicon solar cell
industry, we can see many attractive features of organic solar cells compared to the first
generation solar cells, among them are: [10]
● Large area coating by spin coating technology
● Easy integration in different devices
● Potential of flexibility and semi-transparency.
● Significant cost reduction compared to traditional solutions such as refined, highly purified
silicon crystal
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● The potential to be manufactured in a continuous printing process
● Substantial ecological advantages compared to the environmental unfriendly first generation Si
based solar cell
For all the above features, organic solar cell is a less expensive alternative to inorganic
semiconductors like Si. The superior material properties of polymers (plastics) and the potential
for mass production with cheap processing techniques have made organic photovoltaics
(especially polymer solar cell) the most promising technology in the near future.
Until now, the highest efficiency of organic solar cell is not more than 6.5%, which is
much less than the first and second generation solar cells. However, according to Stephen
Forrest’s calculation, the maximum theoretical efficiency for organic power conversion
efficiency is about 20%. [11] Figure1.7 shows us the estimated PV module prices and the market
proportions for the three generations of solar cells. Once we can achieve efficiency of more than
15% for organic solar cells in the future, considering the much less expensive fabrication costs
for organic solar cells compared with the other types of solar cells, organic solar cells will beat
all the other rivals.
Figure 1.7 Estimated PV module prices and the market proportions for the three generations of
solar cells. [12]
8
Becquerel was the first one who actually observed the photo-electrochemical process
[13,14]. In 1839, Becquerel discovered a photocurrent when platinum electrodes, covered with
silver bromide or silver chloride, were illuminated in aqueous solution. Anthracene was the first
organic material in which photoconductivity was observed by Pochettino in 1906 [15]. The big
breakthrough in organic photovoltaics was achieved by Tang in 1986 when he introduced the
first donor-acceptor (DA) device more than a decade ago [16]. After 1986, large progress has
been realized by scientists. Until now, two main methods have been investigated in the effort to
develop organic PV devices[17]: the donor-acceptor bi-layer[18,19,20], usually by vacuum
deposition of small molecular components, and the bulk hetero-junction (BHJ ) [21,22], which
represents the ideal case as a bi-continuous composite of donor and acceptor phases and mainly
is in the form of polymer and processed in solution. The highest efficiency is about 6.5%, which
is achieved by all solution tandem solar cells. There is still a gap to commercialize organic solar
cells. In order to commercialize it, a minimum efficiency of more than 15% is required. The
important milestones in the development of organic solar cell can be described as Figure 1.8.
Figure1.8 The important milestones in the development of organic solar cells.
9
Figure 1.9 The competitive position of every solar technology is mainly determined by the
factors efficiency, lifetime and costs.
In the energy market, the competitive position of every solar technology is mainly
determined by the factors efficiency, lifetime and costs, as shown in Figure 1.9 [10]. All these
three factors must be judged before any practical research can be done. This figure reveals the
important restrictions of successful commercialization of solar cells. All three aspects must be
fulfilled at the same time. Otherwise they will be limited to a niche market. Other criteria such as
semi-transparency, flexibility are beneficial but not enough to make up for a significant
deficiency in one of the triangle’s corners.
An organic solar cell device is the reverse of an organic light emitting diode (OLED), a
technology which has already been commercialized. In both cases an organic material is
sandwiched between two electrodes. Electrons are collected at the metal electrode and holes are
collected at the indium tin oxide (ITO) electrode. Most organic semiconductors are intrinsic
semiconductors and the primary excitation is a Coulomb bound exciton. Figure 1.10 shows us
the modes of OLED and Organic PVs.
10
Figure 1.10 (left) OLED mode of operation, (right) organic PV mode of operation. In both
cases an organic material is sandwiched between two electrodes. Typical electrode
materials are shown in the figure. In PVs electrons are collected at the metal
electrode and holes are collected at the ITO electrode. The reverse happens in a
LED: electrons are introduced at the metal electrode (cathode), which recombine
with holes introduced at the ITO electrode (anode).
A planar-layered structure is the basic structure of organic solar cells. An organic light-
absorbing layer is sandwiched between anode and cathode. A semi-transparent layer is used as
one electrode where light can be transmitted through it and absorbed by the organic functional
layer. Indium-tin-oxide (ITO) is the most used transparent electrode layer in organic PVs. ITO is
often used as anode. The other electrode---cathode is often aluminum, calcium, magnesium, or
gold. Nowadays, poly(3-hexylthiophene) (P3HT) and fullerene derivative [6,6]-phenyl- butyric
acid methyl ester (PCBM) are the most used organic light-harvesting materials. P3HT serves as
an electron donor and transporter of holes to the cell anode, while PCBM network acts as an
electron acceptor and transporter of electrons to the cell cathode [20, 24, 25, 26, 27, 28]. The
chemical structures of P3HT and PCBM are shown in Figure 1.11. PCBM was first synthesized
by Fred Wudl et al. at the UC Santa Barbara [29].
11
Figure 1.11 The chemical structures of P3HT and PCBM.
The fundamental mechanism of organic solar cells is the reverse of OLEDs. Figure 1.12
and Figure 1.13 illustrate the mechanism of organic photovoltaics. Although there are more than
one mechanism to describe their behavior, the commonly accepted mechanism has four
steps[10]:
1) Absorption of light and generation of excitons
2) Diffusion of the excitons
3) Dissociation of the excitons with generation of charge
4) Charge transport and charge collection
When light is absorbed, an electron is promoted from the highest occupied molecular
orbital (HOMO) to the lowest unoccupied molecular orbital (LUMO) and an exciton is formed.
This process will be followed by the exciton diffusion and dissociation. The electron and hole
then will reach the cathode and anode. The charge separation is achieved by the asymmetrical
ionization energy/work functions of the electrodes.
12
Figure 1.12 The mechanism of organic photovoltaics. [10]
Figure 1.13 General mechanism for photoenergy conversion in excitonic solar cells.
13
By irradiation, an electron is promoted to the LUMO leaving a hole in the HOMO.
Electrons are collected at the Al electrode and holes at the ITO electrode. This process can be
described by Figure1.14, in this figure, stands for work function, means electron affinity,
IP is defined as ionization potential and gE is the optical band gap.
Figure1.14 Energy levels and light harvesting. [23]
Figure1.15 The schematic current-voltage (I-V) curve of a polymer-fullerene BHJ solar cell.
[23]
14
scJ is the short-circuit current density, ocV is the open circuit voltage. mJ and mV are the
current and voltage at the maximum power point. The fill factor (FF) which is defined as the
ratio of area of maximum rectangle fitted in the 4th
quadrant I-V and the product of ocV and scI
and efficiency ( ) are defined as following:
( )( )
( )( )
m m
sc oc
J VFF
J V
( )( )out m m
in in
P J VFF
P P
1.2 Motivation for AZO
1.2.1 ITO Drawbacks
ITO is one of the most widely used transparent conducting oxides (TCOs). It is a solid
solution of indium(III) oxide (accounts for 90% by weight) and tin oxide (for 10% by weight).
ITO is transparent in thin layers. It will become yellow or grey in the bulk. ITO is a degenerately
doped n-type semiconducting oxide, with bandgap of approximately 3.75eV. [30, 31]
Recently, in the organic electronics industry, ITO plays an important role mainly in the
following fields: OLED thin film technology for solid state lighting, flat-panel screens, large-
area PV efforts, liquid crystal displays, etc. ITO can fulfill a compromise between electrical
conductivity and optical transparency. ITO serves as anode in OLED and organic solar cells. The
commonly used deposition methods of ITO include sputtering, electron beam evaporation or
physical vapor deposition.
However, the large use of ITO in the flat panel industry, combined with the shortage of
indium resources globally, has made the price of ITO increase significantly in the past few years.
The cost of indium tin oxide in 2006 reached more than 10 times its price in 2003 due to the
explosion of the flat panel display market [32, 33]. Figure 1.16 depicts the annual indium
consumption and prices. Figure 1.17 shows the price of indium in 1998 dollars per ton from 1987
to 2007.
15
In 2006, the consumption of indium was 500t; it has since doubled in 2002. And the price
in 2006 is 8 times higher than that in 2002. An even bigger problem is that the indium overall
reserves in the world is only 16000 tons based on concentrations of indium in zinc ores [34],
which means we will run out of indium in less than 10 years. Although estimates may vary due
to the unexpected factors, we still can conclude that the demand for indium is expected to grow
radically and hence the indium price will increase greatly in the near future as well.
Figure 1.16 Worldwide Indium production from 2002 to 2006. [33]
Figure 1.17 Unit price of indium in 1998 dollars per ton from 1987 to 2007. [33]
300
350
400
450
500
550
2002 2003 2004 2005 2006Ind
ium
Wo
rld
Co
nsu
mp
tio
n (
t)
Year
16
In addition, ITO also has other eternal drawbacks due to the material properties: such as
lacking of flexibility of ITO layer, lacking of chemical stability, fragility and the toxicity of
indium element. All of the above mentioned problems urge us to explore alternatives to the ITO
anode. Some alternative TCO films have been investigated by scientists, among them are:
1) Transparent polymer thins film such as Poly(3,4-ethylenedioxythiophene):Poly(styrene
sulfonate). The conductivity of PEDOT:PSS can reach 1000 S/cm[35]. In addition, it is
transparent and absorption is less than 10% in the visible spectrum. [36]. However,
PEDOT is unstable and the processing is difficult and costly.
2) Carbon nanotubes (CNTs) can solve the problem of film fragility since CNTs have very
good materials and mechanical properties. In addition, CNTs have good electrical
conductivity compared with traditional metals [37]. However, CNTs are extremely
expensive and are difficult to obtain uniform dispersions of the CNT thin films.
3) Transparent conducting oxides such as Alumina doped Zinc Oxide, Gallium doped Zinc
Oxide, etc are prospective alternatives to ITO.
All three alternative transparent conducting thin films are now under investigation by
scientists, and of course are still not yet fully commercially realized. In this thesis, I will explore
the possibility of transparent conducting metal oxide as an alternative to ITO.
1.2.2 Alumina Doped Zinc Oxide
Comparable properties of transparent conductive oxide thin films and economic
considerations must be offered for the ITO alternatives. The required characteristic of an
alternative TCO to replace ITO are summarized in Table1.1. In order to be comparable with ITO
thin film, the replacement TCO must fulfill the basic criteria as given on the right side of Table
1.1.
A lot of effort has been put into a number of transparent conducting metal oxides.
However, most research focused on p-type metal oxides which served as a buffer layer between
the anode and hole transporting layer. The commonly tried oxides include xNiO [38], 2CuAlO
[39], 2CuGaO [40], 3MoO [41], etc.
17
Table 1.1 The parameters of ITO and the minimum requirements of on alternative TCO.
ITO TCOs
Transparency 90% >80%
Resistivity Low (1x10-4
Ωcm) <1x10-3
Ωcm
Work function 4.7eV Comparable
Thickness 100nm <300nm
Sheet Resistance 12Ω/□ <100 Ω/□
Price Expensive Inexpensive
Toxicity Yes No
Reserves Rare Large
Nowadays, TCOs that have been commercialized and act as the anode are n-type metal
oxides doped with other compounds such as 2SnO or 2 3In O . We can achieve high transparency
as well as proper electrical conductivity by selecting a wide-bandgap oxide through the
introduction of substitutional dopants. Nowadays, zinc oxide based thin films have attracted
people’s interest for its good properties and potential huge applications. The following are the
applications of zinc oxide based derivatives. [42,43,44,45]:
● Organic photovoltaics
● Laser diodes and OLED display
● Transparent thin-film transistors
● Biosensor
● Zinc oxide nanorod sensor
● Diluted magnetic semiconductors
18
Zinc oxide’s function as a highly conductive transparent material was discovered in 1982
by Minami [46]. Later in 1984, he found that although the pure zinc oxide thin film is
conductive, the thermal stability is not good enough. It will become unstable beyond 150°C. In
high temperature more than 150°C, the resistivity may not be stable [47]. Minami added Al in
Zinc Oxide and found that the thin film will become more stable compared with un-doped zinc
oxide thin film [47]. Other elements such as Ga, In, Ti, Ge Hf can also be doped in Zinc Oxide
and hence modify the properties of the thin film.
Table1.2 shows the resistivities, and dopant content for ZnO films doped with various
dopants. According to the table, we can conclude that Al, Ga and B doped zinc oxide has the
highest conductivity. Among them, Al doped zinc oxide attracts our attention for two reasons:
1) Aluminum and zinc are two cheap elements and the reserves are huge
2) Aluminum and zinc are non-toxic materials
Table 1.2 The resistivity and dopant content for ZnO films doped with various dopants. [48]
Doant Doping Content(at.%) Resistivity ( 410 cm )
Al 1.6-3.2 1.3
Ga 1.7-6.1 1.2
B 4.6 2.0
Y 2.2 7.9
In 1.2 8.1
19
Sc 2.5 3.1
Si 8.0 4.8
The potential of mass production of the non-toxic and inexpensive aluminum doped zinc
oxide thin film in the future drives us to explore the compromise between optical properties and
electrical properties for AZO thin film and its application in organic solar cells. Chapter 2 will
introduce the sputtering facility used in the experiments, the homemade substrate holder and the
relevant experimental setup. Chapter 3 will be the main content of this thesis. In this chapter, we
discuss the step by step characterization processes and optimized results. In chapter 4, a real
organic solar cell based on the optimized AZO anode is fabricated and measured. Chapter 5 will
summarize the former work and present the conclusion and the future work.
20
Chapter 2 Experimental
2.1 Experimental Facilities
2.1.1 Sputtering Chamber
Figure 2.1 Schematic of the sputtering chamber.
Sputtering is a process whereby atoms are ejected from a solid target material due to
bombardment of the target by energetic particles. Figure 2.1 shows the schematic of the basic
sputtering system used in our lab. The target is at the bottom, the substrate holder is homemade.
A, B, C and D represent four sputtering distances. Figure 2.2 shows us the homemade sputtering
substrate holder.
21
Figure 2.2 The homemade sputtering substrate holder.
Magnetron sputtering technology was first developed in the 1970’s. [49, 50, 51] It didn’t
take long to commercialize it. Since the 1980’s, a lot of research interest was focused on reactive
sputtering of thin films. Magnetron sputtering was at first used for the deposition of metals and
optical films. It was not until a few years later that magnetron sputtering technique was used to
deposit transparent conductive oxides.
Magnetron sputtering has several advantages compared to other thin-film deposition
methods such as evaporation, chemical vapor deposition (CVD) etc. [52, 53, 54]
● Higher energy input into the growing film
● Low substrate temperatures (room temperature)
● Good thickness uniformity and high density of the films
● High deposition rates (up to 12µm per min)
● Good adhesion on the substrate
● Materials with very different vapour pressures can be sputtered easily
22
● Many kinds of compounds can be deposited directly from metallic target by reactive sputtering
in rare/reactive gas mixtures
● Inexpensive deposition method
● Scalable to large area substrates
Penning reported the principle of magnetron sputtering for the first time in 1936. [55]
During the whole sputtering process, air is evacuated continuously from the chamber by vacuum
turbo pumps. A certain amount of Argon gas is fed continuously. A strong magnetic field is
created by magnet inside the chamber. The target is flushed with cooling water. The uniformity
of the thin film is achieved by rotating the substrate in the sputtering chamber during the
deposition.
There are 4 basic steps of the sputtering process [56]:
1 Plasma forming-----high voltage is applied to the target, the argon gas becomes ionized
and thus a gaseous plasma forms along the magnetic field.
2 Secondary electrons created---- Inside the plasma the argon atoms are collided by free
electrons. The atoms become positively charged ions and secondary electrons are created.
3 Target materials ejected----These ions are continuously accelerated towards the negatively
charged target surface. Argon ions are fired at the target surface and transfer their kinetic energy
into it. By this, the materials of the target material are ejected in the form of neutral particles -
either individual atoms, clusters of atoms or molecules. This atom ejection is called sputtering.
4 Thin film growth---- The ejected target materials fly towards the substrate at different
angles. There, they condense on the surface and deposit as a thin layer.
23
Figure2.3 The sputtering machine used in our lab. On the left is the sputtering chamber from
outsite. On the right is the control panel. Below is a view of the inside of the machine,
three targets are put symetrically in it.
24
One mechanical pump is installed for rough pumping and another cryo pump for fine
pumping. The crystal monitor is installed to detect the deposition rate and the thickness by
correlating deposited metal thickness to the amount of deviation from its original crystal resonant
frequency. The deposition rate and thickness can be changed by adjusting different parameters.
There are mainly four parameters that can be changed to adjust the deposition condition
during the experiment. That is the distance between the target and substrate, the sputtering
power, the flow rate of gas and deposition time.
The substrate holder for the sputtering machine is home-made. There are four positions in
this holder. Position A, B, C and D represent different distances between the sputtering target
and sample holders. The different distances are as shown in Table 2.1.
Table 2.1 Target to substrate distances.
A B C D
8cm 12cm 16cm 19cm
Distance is an important parameter that we will change in our characterization
experiments. The sputtering power is controlled by an RF-sputtering-AE RFX-600. For metal
targets, the power can’t exceed 350W. For dielectric targets and targets attached to a backing
plate, the power should be limited to 300W or less.
The Mass Flow Controllers(MFC) on the control panel is used to control the flow rate of
gases. The flow rate of argon and oxygen are parameters that we can change in the deposition
process. In my experiments, there is no oxygen during the deposition; the flow rate of argon is
kept to be 5sccm.
When all the other parameters are kept unchanged, the film thickness is proportional to
deposition time. We can adjust the film properties by changing the deposition time.
25
2.1.2 Spin Coating and Aluminum Evaporation
Figure 2.4 shows the spin coater used in our experiments and the cluster tools used for
metal deposition. Polymer is spin coated on top of the anode layer. The spin coater’s spin speed
and time can be adjusted. Two sequential steps can be chosen. At the first step, the spin time can
vary from 0 second to 18 second; for the second steps; the spin time can vary from 0 to 60
seconds. The maximum spin speed is 10000rpm.
The LiF buffer layer and Al cathode are deposited in the cluster tool. The cluster tool is
used to deposit small molecular thin films and metal layers.
Figure 2.4 The machines used for spin coating and metal deposition. On the left is the spin
coater, which is stored in a glove box. On the right are the cluster tools used for
metal and LiF vacuum deposition.
2.1.3 Testing System
Device current density versus voltage (J-V) characteristics was measured using a
Keithley 6430 sub-femptoamp meter under 2100 /mW cm simulated AM1.5G solar illumination.
The testing system used in our lab is shown in Figure 2.5.
26
Figure 2.5 On the Left is the simulated AM1.5G solar illuminations, on the right is the testing
facilities used in organic solar cell testing.
During the measurements of resistance and resistivity, we use four points measurement to
determine the resistance. A four point probe is a apparatus for measuring the resistivity of
semiconductor samples. It is achieved by passing a current through two outer probes and
measuring the voltage through the inner probes. Figure 2.6 is the schematic of four points probes.
Figure 2.6 Schematic of four points probe. [56]
27
XPS (X-ray Photoelectron Spectroscopy) is a quantitative spectroscopic technique that
measures the elemental composition, chemical state and electronic state of the elements that exist
within a material.
2.2 Experimental Procedures
In order to achieve a compromise between the electrical resistivity and optical
transparency, I will optimize the different parameters of sputtering and hope to find a proper
condition in which the resistivity and transparency can achieve a balance.
The Aluminum Doped Zinc Oxide target was purchased from Kurt J. Lesker. The AZO
target contains 98% of Zinc Oxide and 2% of Alumina, the target diameter is ''2.00 and the
purity is 99.99%.
Aluminum doped Zinc Oxide was sputtered to a bare glass substrate. Before sputtering,
the substrate was cleaned in de-ionized water, a standard regiment of acetone and methanol,
followed by UV-ozone treatment for 11 minutes in order to increase the work function of AZO
thin film. UV-ozone treatment also can create the most conductive films possibly due to
reduction in the number of oxygen vacancies in the AZO lattice, leading to reduced impurity
scattering and higher electron mobility[graham]. The substrates were attached to the homemade
substrate holder as shown in Figure 2.2.
The base pressure of the sputtering machine was ~10-7
Torr. During sputtering, I kept the
flow rate of argon at 5sccm, and no oxygen was used in the optimization. The power was varied
from 50W to 300W. The target to substrate distances were 8cm, 12cm, 16cm and 19cm. After
sputtering, the AZO thin film was UV-ozone treated for 15 minutes.
Spin coating was conducted in a glove box. P3HT and PCBM were purchased from
American Dye Source Inc. PCBM (13.6mg/mL):P3HT(17mg/mL) solution was prepared in 1,2-
dichlorobenzene in a nitrogen-filled glove box, then stirred in dark for 8 hours at 50℃ . This
solution was spin-coated on the various AZO substrates at 500rpm for 45s. The polymer layer
was dried for 24 hours at room temperature in a glove box. Lithium fluoride and aluminum films
were thermally evaporated in a vacuum chamber with base pressure ~10-7
Torr. Film thicknesses
28
were monitored using a calibrated quartz crystal monitor. The final device structure was as
follows: AZO/ PCBM:P3HT (65 nm)/ LiF (1 nm) )/Al (80 nm).
29
Chapter 3 Characterization of AZO
3.1 Optimization of Target to Substrate Distance
Distance is a very important factor that is a determinant for electrical and optical
properties of sputtered thin film. The distance also plays an important role in the morphology of
the thin film surface. In our characterization experiment, the first parameter we optimized was
distance.
We sputtered a series of samples with different target to substrate distances at power
levels of 50W, 100W and 150W. Table 3.1 is the sheet resistance and resistivity for the
aforementioned samples.
Table 3.1 the sheet resistance and resistivity as a function of distances for different power levels.
Power(W) Distance(cm) Thickness(nm) Sheet
Resistance(Ω/□ )
Resistivity(Ωcm)
50 8 2170 6.7 1.45E-3
50 12 1580 90 1.42E-2
50 16 1015 6330 6.3E-1
50 19 533 49900 2.6
100 8 2170 8.3 1.8E-3
100 12 1580 14.8 2.4E-3
100 16 1015 285 2.9E-2
100 19 533 34900 1.86
150 8 2170 7.74 1.67E-3
150 12 1580 6.4 1.01E-3
150 16 1015 191 1.93E-2
150 19 533 13200 0.7
30
According to Table 3.1, we can conclude that for a specific power, the resistivity of the
thin film is sensitive to the target to substrate distance. By decreasing the distance from 19cm to
8cm, the sheet resistance and resistivity can be decreased dramatically. Thus we can conclude
that shorter target to substrate distance is better.
In order to better understand the correlation between the thin film properties and target-
substrate distance, we plot the curve of resistivity as a function of distance of different power
levels as shown in Figure3.1.
7 8 9 10 11 12 13 14 15 16 17 18 19 20
1E-3
0.01
0.1
1
Re
sis
tivity (
oh
m c
m)
Distance (cm)
50W
100W
150W
Figure 3.1 Resistivity as a function of target to substrate distance for different power levels.
From Figure 3.1, we know that the resistivity decreases in similar fashion for different
power. We also know that the deposition power also plays a role in determining the electrical
properties. From the above curve, we can observe that the resistivity will decrease as power
increase with distances kept the same. Generally speaking, higher power can contribute to
decrease in resistivity.
Optical transmittance is another important property that can determine the performances
of organic solar cells. Below, we compare the optical property for these thin film devices.
31
200 300 400 500 600 700 800 900 1000 1100
0
20
40
60
80
100
Tra
nsm
itta
nce
(%)
Wavelength (nm)
2568nm
1925nm
1160nm
605nm
270nm
Figure 3.2 Transmittance spectrum in the visible range (150W 8cm).
Figure 3.2 shows the transmittance spectrum for AZO thin film prepared at a 150W and
a deposition distance 8cm; this shows that the AZO thin films are fairly transparent. Even when
we increase the film thickness from 270nm to 2568nm, the transmittance will only decrease
slightly, from about 90% to 80% in the visible range.
To further compare the resistivity as a function of thickness, at the same power, a series
of samples with different thickness and target-substrate distances were deposited.
As concluded above, the resistivity is very sensitive to target-substrate distance, thus for
large distances like 16cm and 19cm, the resistivity is too high to have practical use in devices.
We will focus on two distances: 8cm and 12cm. For these two distances, we sputtered a series of
devices with different thickness and compare their resistivities. Table 3.2 shows the surface
resistance and resistivity as a function of thickness for a particular target-substrate distances and
power of 50W. We plot the curve of resistivity as a function of thickness in Figure 3.3.
According to the curve, we know that 8cm is the optimized target substrate distance. And for a
specific distance, during the first few hundreds of film thickness, the resistivity decreased
dramatically, but it will become relatively stable if we continue increase the device thickness.
This suggests that the optimized device is in the circle zone.
32
Table 3.2 Surface resistance and resistivity as a function of thickness for particular target-
substrate distances and power of 50W.
50W 8cm 280nm 539nm 855nm 1800nm 2950nm
S.R(Ω/□) 1200 1150 91 12 4.1
Resistivity
(Ωcm)
3.36E-2 6.19E-2 1.80E-3 2.1E-3 1.2E-3
50W 12cm 184nm 397nm 737nm 1126nm 1869nm
S.R(Ω/□) 350000 25000 804 108 91
Resistivity
(Ωcm)
6.4 1.0 5.9E-2 1.2E-2 1.7E-2
0 1000 2000 3000
1E-3
0.01
0.1
1
10
0 1000 2000 3000
1E-3
0.01
0.1
1
10
Re
sis
tivity (
oh
m c
m)
Thickness (nm)
8cm
12cm
Figure 3.3 Resistivity as a function of film thickness for material deposited in 50W.
From Figure 3.3, we confirm that at the same target-substrate thickness and the same
power, the resistivity will decrease as the film thickness increases. On the other hand, when
thickness and deposition power are kept the same, the target-substrate distance also plays an
important role in decreasing the resistivity.
33
Table 3.3 shows the resistivity as a function of substrate-target distance with the same
thickness and deposition power. We plot the curve in Figure3.4.
Table 3.3 Resistivity as a function of substrate-target distance with the film thickness 600nm
and deposition power 100W.
100W 600nm 8cm 12cm 16cm 19cm
S.R(Ω/□) 600 1150 7800 29900
Resistivity(Ωcm) 3.6E-3 6.9E-3 4.7E-2 1.8E-1
8 10 12 14 16 18 20
0.01
0.1
Re
sis
tivity (
oh
m.c
m)
Distance (cm)
Figure 3.4 Resistivity as a function of substrate-target distance for a 600nm thick film at 100W.
According to above curve, when power and film thickness are kept unchanged, the target
to substrate distance will play an important role in determining the film resistivity. The resistivity
will increase from 3.6E-3Ωcm at the distance 8cm to 1.8E-1Ωcm at the distance 19cm. In
conclusion, the resistivity will decrease dramatically as the target-substrate distance decrease and
other parameter are kept the same. The target-substrate distance is a primary parameter in
34
determining the electrical property of the AZO thin film. As we shorten the distance between
target and substrate, we can achieve a more conductive thin film anode.
Figure3.5 shows the transmittance spectrum in the visible range for 600nm AZO thin
films deposited at 100W at different target to substrate distances. We can conclude that in the
visible spectrum, the transmittance does not change when we change the target-substrate distance.
At all four distances, the transmittances are more than 90% in visible spectrum.
Figure3.5 The transmittance spectrum in the visible range for 600nm thick AZO thin films
deposited at different target to substrate distances with power of 100W.
3.2 Drude Model
It is observed that some metal oxide semiconductor behaves like dielectrics, in the visible
region are fairly transparent, while in the infrared region, these films behave like metals and have
high reflectance[57-62]. Plasma wavelength, which is a characteristic parameter for the metal
oxide thin film, defines the crossover between the two different behaviors.
The plasma wavelength will move to shorter wavelength as the free-electron density in
the film increases.
Reflectance is given by the equation3.1: [63]
400 600 800
-20
-10
0
10
20
30
40
50
60
70
80
90
100
8cm
12cm
16cm
19cm
Tra
nsm
itta
nce
(%
)
Wavelength (nm)
35
2 2 2 2( 1) / ( 1)R n n (3.1)
Where n is the refractive index, is the extinction coefficient.
In our case, the reflectance of AZO thin film at the plasma wavelength is very small (less
than 5%), is close to zero. Hence, the following approximations are valid:
2 2
min ( 1) / ( 1) 0R n n (3.2)
Then, the refractive index n at the plasma wavelength is close to 1.0, and the real part of
the dielectric function is 2
1 1n .0
According to Drude theory: [64,68]
The free-electron concentration is a function of plasma frequency by the following
equation: [65, 66,67,68]
2 2 * 2
0/ ( 1)p e eN e m ( 3.3)
Where is the high-frequency dielectrics function, e is the electron charge, em is the
mass of the electron, *
em is the effective mass of electron in the conduction band. is the Drude
scattering frequency and defined by the following relation:
*/ ee m
is the mobility of the electrons. The value of and *
em are 4 and 0.38 em .
36
Figure3.6 The reflectance and transmittance spectra of an AZO film produced by pulsed laser
deposition.
Figure 3.6 shows us the reflectance and transmittance spectra of AZO film by pulsed
laser deposition. In the visible range, transmittance is high and constant while the reflectance is
low. In the IR range, transmittance decreases while the reflectance starts to increase. From the
above curve, we see that the samples exhibited a minimum in the reflectance spectra. Such
minimum is expected to take place near the plasma frequency. The relation is given by the
following equation:
1/2
min ( / 1)p (3.4)
Hence, if min can be determined from the reflectance minimum, p can be calculated.
By substituting the values p , , 2 and *
em into equation 3.4, carrier density can be calculated
for all samples, which can be compared with the data derived from the Hall mobility.
In our characterization experiments, we will do a quantitative analysis on our
experimental data.
37
3.3 Qualitative Explanation According to the experiments, decreasing the distance between target and substrate will
decrease the resistivity without sacrificing the transmittance in visible range.
It is well known, that conductivity is proportional to carrier concentration and carrier mobility.
1/ N (3.5)
Here the carrier mobility is related to grain size. The bigger the grain size, the higher the
carrier mobility.
Where is the conductivity, is the resistivity. N is the carrier concentration, is the
carrier mobility.
This can be understood as: the larger the grain size, the less grain boundary. The barrier in
the grain boundary is a primary factor that can stop the free carrier from moving in the thin film.
We can conclude that conductivity is proportional to carrier mobility, which is proportional to
grain size. The grain size information can be obtained from SEM image.
On the other hand, the carrier density N is relevant to the transmittance spectra in IR according to
Drude theory. We can calculate the free carrier density N according to the transmittance and
reflectance spectrum in IR.
According to Drude theory, N is proportional to p , which is called Plasma frequency
and p is proportional to min . That means carrier density N is proportional to min .
min stands minimum reflectance spectra near plasma frequency. When transmittance spectra in
IR moves to shorter wavelength, the reflectance spectra also moves to shorter spectra, which
means min will move to shorter wavelength and hence min move to larger frequency[63]. We
can conclude that when min move to larger frequency, carrier concentration will increase in
consequence.
In summarize, the faster the edge of the transmittance spectra decreased in IR (the more
transmittance spectra in IR moves to shorter wavelength), the higher the plasma frequency will
shift and the larger the carrier concentration, and hence the higher the conductivity. We can
conclude relationship as shown in Figure3.7.
38
Figure 3.7 The correlation between the transmittance edge in the IR and the Carrier
concentration.
In the distance optimizing experiment, if we extend the spectrum from visible range to IR
range, we can see the spectrum as in Figure 3.8. In the IR range, the transmittance at shorter
substrate-target distances decreases faster, which is related to the smaller resistivity. We can
explain the phenomena by the aforementioned theory [68,69].
500 1000 1500 2000 25000
50
100
8cm
12cm
16cm
19cm
Tra
nsm
itta
nce
(%)
Wavelength (nm)
Figure 3.8 The transmittance spectrum in the visible and IR range with different target to
substrate distances for 600nm thick films deposited with 100W power.
According to Figure 3.8, we can see that with decreasing target to substrate distance, the
absorption edge of the AZO films moves toward shorter wavelengths.
39
Figure3.9 XPS spectra of 600nm thick AZO thin films deposited with different target to
substrate distances using power 100W.
According to XPS of AZO with different target-substrate distances, we know that the
peak shapes and peak positions don’t differ within experimental error. The C1s peak in 16cm
sample was carbon contamination. And the atomic ratio of Zn:Al is about 95: 5 for all the
samples in error range, which means the oxidizes all had Zn:O ratio of approximately 1:1. We
therefore infer by the Drude Theory and the facts that all the samples have the same ratio of
Zn:O that shorter target to substrate distance resulted in higher free carrier concentration for the
AZO films, which will contribute to the decrease in the resistivity.
40
We also took SEM image of sputtered AZO thin films as shown in Figure3.10:
Figure3.10 SEM images of 600nm thick AZO thin films deposited with different target to
substrate distances using 100W power.
And according to the SEM image, the grain size is bigger for smaller target to substrate
distance. The bigger grain size, thus larger electron mobility, will increase the conductivity for
samples with low substrate-target distance.
41
The phenomena can also be understood by the following theory: the Aluminum ion
doping is achieved by replacing Zn ion by Al. Since Al has one more electron than Zn ion, the Al
is more active than Zn and hence has a better conductivity. While increasing the sputtering
distance, there will be more chances for the Al ion to oxidize into the insulating Alumina with no
free electrons. If we sputter AZO with a shorter target to substrate distance, more free Al ions
can reach the thin film and hence make the AZO thin film more conductive. That is why the
carrier density will decrease as sputtering distance increases.
3.4 Optimization of Deposition Power
Power is another parameter that is critical to improve the property of AZO thin film and
the sputtering efficiency.
Table3.4 The deposition rates for different powers.
The deposition rate increased from 0.2angstrom/s to 3angstrom/s. as the deposition power
increased from 50W to 300W. It means that in higher power, we will deposit in a much more
efficient way, which has important implications in industry production. We plot the curve of the
deposition as a function of power in figure 3.11.
Power 50W 100W 150W 200W 250W 300W
Deposition rate
( / s )
0.2 0.7 1 1.5 2.2 2.8
42
Figure3.11 Deposition rate as a function of power.
In order to compare the influence of power on the resistivity of thin films with the same
thickness and the same substrate-target distance, we deposit a series of AZO thin films with
different power, while the other parameters are kept the same. Table 3.5 shows the surface
resistance and resistivity as a function of power in the same film thickness of 500nm thickness
films deposited at a target to substrate distance of 8cm. We plot the curve of surface resistance
and resistivity as a function of power in Figure 3.12 according to Table 3.5.
Table 3.5 Surface resistance and resistivity as a function of power at constant film thickness of
500nm and target to substrate distance of 8cm.
8cm 500nm 150W 200W 250W 300W
S.R(Ω/□ ) 334 148 76.4 67.1
Resistivity(Ωcm) 9.3E-3 4.1E-3 2.13E-3 1.86E-3
0 100 200 300
0
1
2
3
De
po
sitio
n R
ate
(A
ng
str
om
/s)
Power (W)
43
Figure 3.12 Resistivity as a function of power for a film thickness of 500nm and target to
substrate distance of 8cm.
From the curve of Figure 3.12, we know that with the same thickness and distance, if we
increase the power, it will decrease the resistivity of the AZO thin film. In addition, at higher
power, it will be more efficient to deposit the required thickness. We can conclude that higher
power is better. But if the power is too high, the deposition is not consistent and there is a critical
point at which an increase of deposition power does not improve device performance.
400 600 8000
10
20
30
40
50
60
70
80
90
100
150W
200W
250W
300WTra
nsm
itta
nce (
%)
Wavelength (nm)
Figure3.13 The transmittance spectra in the visible range for 500nm thick films deposited with
different sputtering power levels at a target to substrate distance of 8cm.
150 200 250 300
0.002
0.004
0.006
0.008
0.01
Re
sis
tivity (
oh
m c
m)
Power (W)
44
Figure3.13 shows the transmittance in the visible range. We know from the figure that the
transmittance in the visible spectrum is about 90% for all 4 deposition powers, which is
comparable to ITO.
If we enlarge the range of the curve from visible to IR, we can see the spectrum as in
Figure 3.14.
Figure 3.14 The transmittance spectra in the visible and IR range for 500nm thick films
deposited with different sputtering power at target to substrate distance 8cm.
In the IR range, the transmittance with higher power will decrease faster, which is related
to the smaller resistivity. This can be explained by the Drude Theory [67,68] mentioned above.
From the above spectrum, we can see that in the IR range, with increasing power, the
absorption edge of the AZO films moves toward smaller wavelengths. We therefore infer by the
Drude Theory that higher power resulted in higher free carrier concentration for AZO films,
which decreases the resistivity. But the decrease is not as significant as compared to the effect of
distance.
The SEM images of sputtered AZO thin film sputtered with different power levels can be
compared in Figure 3.15.
1000 2000
0
50
100
T
ran
sm
itta
nce
(%
)
Wavelength(nm)
150W
200W
250W
300W
45
Figure 3.15 SEM images of 500nm thick AZO thin films deposited with different sputtering
power levels of a target to substrate distance 8cm.
According to the SEM images in Figure 3.15, there is no significant difference in grain
size and hence in the electron mobility.
Here we can conclude the following: Increasing the power will decrease the resistivity
without sacrificing the transparency. 200W and 250W are the optimal powers. In power 300W,
the sputtering environment is not stable. It means at the power of 300W, the deposition rate is not
consistent, hence we choose moderate power of 200W and 250W as our optimized powers.
46
3.5 Optimization of thickness
Thickness is also an important parameter that is critical to the properties of thin films.
Generally speaking, for thin film applications, 300nm or less is a proper thickness. In our
experiments, not only a compromise between the optical transmittance and electrical resistivity
needed to pursued, but also the thickness had to be kept below 300 nm.
As shown in Figure3.2, the AZO thin film is fairly transparent from 270nm to 2568nm.
That means with a thickness of about 300nm, the transmittance is in an acceptable range. The
circled area in Figure3.16 is the optimized area, in which the thickness and surface resistance can
achieve a balance
Figure 3.16 Surface resistance as a function of thickness for sputtering power levels of 200W
and 250W.
Figure 3.16 shows us the surface resistance as a function of thickness for the deposition
power of 200W and 250W. In order to have comparable characteristics with ITO, we optimize
the thickness of AZO to the range between 300nm and 400nm. When the thickness is between
300nm and 400nm, the resistivity is about 3E-3 ohm cm, the sheet resistance is about
80ohm/square, and the transmittance is more than 90%.
50 100 150 200 250 300 350 400 450
100
1000
S.R
(ohm
/sqr)
Thickness (nm)
250W
200W
47
3.6 Conclusions
From above analysis, we conclude the optimized parameters are as following:
1) 8cm is the optimized distance.
2) 200W and 250W are the optimized sputtering powers
3) Thickness between 300nm and 400nm is the optimized thickness
Table 3.6 Comparison of ITO and optimized AZO properties.
ITO TCOs
Transparency 90% 90%
Resistivity Low (1x10-4
Ωcm) 1x10-3
Ωcm
Work function 4.7eV 4.7eV
Thickness 100nm 300-400nm
Sheet Resistance 12Ω/□ 80Ω/□
Prices Expensive Inexpensive
Toxicity Yes No
Reserves Rare Large
We can conclude after a systematic investigation, as shown in Table 3.6, an AZO thin
film anode which is not only comparable to ITO in electrical, optical and chemical properties,
but also able to overcome the drawbacks of ITO, such as the expensive price, the toxicity and the
low reserves.
48
Chapter 4 Application in OPVs
Organic photovoltaics are one of the most important applications of transparent AZO thin
films. Since the parameters have been optimized, a device is made to demonstrate progress by
fully replacing an ITO anode with AZO. As we know from the last chapter, during sputtering,
the flow rate of Ar is 5sccm, the pressure is 5mTorr, the optimized Power is 200W, the target to
substrate distance is 8cm and the film thickness is 300nm.
The solar cell structure is as in Figure4.1:
Figure4.1 The standard structure of an AZO based organic solar cell.
Figure 4.2 shows the I-V curve of an organic solar cell with an AZO anode deposited with
the optimized sputtering parameters.
Figure 4.2 I-V curve of an organic solar cell with an AZO anode deposited with the optimized
parameters.
-1 0 1
0
10
Cu
rre
nt
De
nsity (m
A/c
m2
)
Voltage (V)
49
Table 4.1 The device performance of optimized AZO based solar cell.
From Table 4.1, we know that the efficiency of AZO based organic solar cell reached
0.82%, the open circuit voltage is about 0.56V, the short circuit current density is 2.77mA/ cm2
,
the fill factor is 0.53, which are comparable to pure ITO based organic solar cell.
We have achieved the first step for the future replacement of ITO by AZO, fabricated by
R.F magnetron sputtering technology.
VOC
(V)
JSC
(mA/cm2
)
FF ηP
(%)
0.56 2.77 0.53 0.82
50
Chapter 5 Summary
Transparent conducting oxides have attracted increasing attention from researchers
globally for their excellent electrical and optical properties. Among them, aluminum doped zinc
oxide is one of the most promising materials. In my research, AZO has been proved to be a
promising alternative for the commonly used ITO in organic photovoltaics. With step by step
optimization of sputtering parameters, we can determine the sputtering parameters that can
produce an AZO thin film which is not only comparable to ITO in optical and electrical
properties, but also able to overcome the drawbacks of ITO.
We can conclude the transparent conducting AZO optimization as following:
1) Decreasing the distance between substrate and target will aid the production of optimized
AZO
2) Increasing sputtering power will benefit to increase the conductivity of AZO thin film,
but the effect is not as significant as the target to substrate distance
3) Increasing the sputtering power will increase the deposition rate and hence make the
sputtering more efficient
4) The film can reach a balance between optical properties and electrical properties at a film
thickness of about 300nm
The phenomena can be explained by Drude theory. According to this theory, the film
resistivity is related to the free carrier concentration, which can be calculated by the absorption
and transmittance spectrum in IR range. By comparing the edge decreasing of spectrum in IR,
combined with the SEM image, in which the carrier mobility can be calculated, the differences in
resistivity at different parameters can be analyzed.
The optimized AZO thin film was used for the fabrication of P3HT:PCBM based polymer
solar cells. The efficiency reached 0.82%. It is a hopeful step to fully realize the replacement of
ITO by AZO.
However, there are still more studies required in the future.
1) Since the substrate holder is homemade, we can only choose from 4 substrate-target
distances for the optimization. Distance is the primary parameter that can decrease the
resistivity radically. In the future, an even shorter distance substrate holder can be made
to test the limit on the decrease in resistivity due to distance.
51
2) Oxygen is another important gas that can be added to the sputter system to change the
defect structure of AZO. By adjusting the ratio of oxygen, the doping rate of aluminum
ion in zinc oxide can be studied and optimized.
3) The morphology of AZO thin films and its influence on the performance of devices can
be studied by AFM
4) A buffer layer with a higher work function (such as NiOx ) between the AZO and the
polymer can be added in order to optimize PV performances
52
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