±14,000°/sec Digital Gyroscope Sensor

Data Sheet ADIS16266

Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners.

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FEATURES

Yaw rate gyroscope with range scaling

±3500°/sec, ±7000°/sec, and ±14,000°/sec settings

2429 SPS sample rate

Wide sensor bandwidth: 360 Hz

No external configuration required to start data collection

Start-up time: 170 ms

Sleep mode recovery time: 2.5 ms

Factory-calibrated sensitivity and bias

Calibration temperature range: −40°C to +70°C

SPI-compatible serial interface

Relative angle displacement output

Embedded temperature sensor

Programmable operation and control

Automatic and manual bias correction controls

Bartlett window FIR filter length, number of taps

Digital I/O: data ready, alarm indicator, general-purpose

Alarms for condition monitoring

Sleep mode for power management

DAC output voltage

Single-command self-test

Single-supply operation: 4.75 V to 5.25 V

3.3 V compatible digital lines

2000 g shock survivability

Operating temperature range: −40°C to +105°C

APPLICATIONS

Platform control and stabilization

Navigation

Medical instrumentation

Robotics

GENERAL DESCRIPTION

The ADIS16266 is a programmable digital gyroscope that combines

industry-leading MEMS and signal processing technology in a

single compact package. It provides accuracy performance that

would otherwise require full motion calibration with any other

MEMS gyroscope in this performance class. When power is

applied, the ADIS16266 automatically starts up and begins

sampling sensor data, without requiring configuration commands

from a system processor. An addressable register structure and a

common serial peripheral interface (SPI) provide simple access to

sensor data and configuration settings. Many digital processor

platforms support the SPI with simple firmware level instructions.

The ADIS16266 provides several programmable features for

in-system optimization. The Bartlett window FIR filter length and

sample rate settings provide users with controls that enable noise

vs. bandwidth optimization. The digital input/output lines offer

options for a data ready signal that helps the master processor

efficiently manage data coherency, an alarm indicator signal for

triggering master processor interrupts, and a general-purpose

function for setting and monitoring system level digital controls/

conditions.

The ADIS16266 is pin-compatible with the ADIS1625x and

ADIS1626x families and comes in an LGA package (11.2 mm ×

11.2 mm × 5.5 mm) that meets Pb-free solder reflow profile

requirements, per JEDEC J-STD-020. It offers an extended

operating temperature range of −40°C to +105°C.

FUNCTIONAL BLOCK DIAGRAM RSTDIO2 VCC

SELF-TEST

ADIS16266

DIO1

SCLK

GND

DIN

DOUT

CS

TEMPERATURE

SENSOR

POWER

SUPPLY

AUX

ADC

AUX

DAC

VREF

FILT

RATE

CLOCK

CALIBRATION

CONTROLLER

ALARMS

FILTER

USER

CONTROL

REGISTERS

SPI

PORT

INPUT/

OUTPUT

OUTPUT

DATA

REGISTERS

MEMS

GYROSCOPE

SENSOR

POWER

MANAGEMENT

11117-001

Figure 1.

ADIS16266 Data Sheet

Rev. A | Page 2 of 24

TABLE OF CONTENTS Features .............................................................................................. 1

Applications ....................................................................................... 1

General Description ......................................................................... 1

Functional Block Diagram .............................................................. 1

Revision History ............................................................................... 2

Specifications ..................................................................................... 3

Timing Specifications .................................................................. 5

Absolute Maximum Ratings ............................................................ 6

ESD Caution .................................................................................. 6

Pin Configuration and Function Descriptions ............................. 7

Typical Performance Characteristics ............................................. 8

Theory of Operation ........................................................................ 9

Sensing Element ........................................................................... 9

Data Sampling and Processing ................................................... 9

User Interface ................................................................................ 9

Basic Operation............................................................................... 10

Reading Sensor Data .................................................................. 10

User Registers .................................................................................. 11

Output Data Registers................................................................ 12

Device Configuration ................................................................ 13

Digital Signal Processing ............................................................... 14

Decimation Filter (Update Rate) .............................................. 14

Frequency Response .................................................................. 14

Dynamic Range .......................................................................... 14

Calibration ....................................................................................... 15

System Tools .................................................................................... 16

Diagnostics .................................................................................. 17

Alarms .............................................................................................. 18

Product Identification ................................................................ 19

Applications Information .............................................................. 20

Assembly ...................................................................................... 20

Bias Optimization....................................................................... 20

Interface PCB .............................................................................. 21

Outline Dimensions ....................................................................... 22

Ordering Guide .......................................................................... 22

REVISION HISTORY

1/14—Rev. 0 to Rev. A

Changes to General Description Section ...................................... 1

10/12—Revision 0: Initial Version

Data Sheet ADIS16266

Rev. A | Page 3 of 24

SPECIFICATIONS TA = −40°C to +105°C, VCC = 5.0 V, angular rate = 0°/sec, ±1 g, ±14,000°/sec range setting, unless otherwise noted.

Table 1.

Parameter Test Conditions/Comments Min Typ Max Unit

SENSITIVITY1 Clockwise rotation is positive output

25°C, dynamic range = ±14,000°/sec2 4.17 °/sec/LSB

25°C, dynamic range = ±7000°/sec 2.08 °/sec/LSB

25°C, dynamic range = ±3500°/sec 1.04 °/sec/LSB

Initial Tolerance 25°C, dynamic range = ±14000°/sec, VDD = 5 V ±0.5 ±2 %

Temperature Coefficient 4.75 V < VDD < 5.25 V 200 ppm/°C

Nonlinearity Best fit straight line 0.1 % of FS

BIAS

Initial Error ±15 °/sec

In-Run Bias Stability 25°C, 1 σ 470 °/hour

Angular Random Walk 25°C, 1 σ 21.5 °/√hour

Linear Acceleration Effect 25°C, 1 σ 0.1 °/sec/g

Temperature Coefficient 0.35 °/sec/°C

Voltage Sensitivity VCC = 4.75 V to 5.25 V, μ ± 1 σ 7.5 °/sec/V

NOISE PERFORMANCE

Output Noise 25°C, ±14,000°/sec range, no filtering 11.2 °/sec rms

25°C, ±7000°/sec range, 4-tap filter setting 7.2 °/sec rms

25°C, ±3500°/sec range, 16-tap filter setting 3.4 °/sec rms

Rate Noise Density 25°C, f = 25 Hz, ±14,000°/sec range, no filtering 0.44 °/sec/√Hz rms

FREQUENCY RESPONSE

3 dB Bandwidth 360 Hz

Sensor Resonant Frequency 16 18 20 kHz

SELF-TEST STATE

Change for Positive Stimulus ±14,000°/sec dynamic range setting 150 500 LSB

Change for Negative Stimulus ±14,000°/sec dynamic range setting −500 −150 LSB

Internal Self-Test Cycle Time 30 ms

ADC INPUT

Resolution 12 Bits

Integral Nonlinearity ±2 LSB

Differential Nonlinearity ±1 LSB

Offset Error ±4 LSB

Gain Error ±2 LSB

Input Range 0 2.5 V

Input Capacitance During acquisition 20 pF

ON-CHIP VOLTAGE REFERENCE 2.5 V

Accuracy 25°C −10 +10 mV

Temperature Coefficient ±40 ppm/°C

Output Impedance 70 Ω

DAC OUTPUT 5 kΩ/100 pF to GND

Resolution 12 Bits

Relative Accuracy For Code 101 to Code 4095 4 LSB

Differential Nonlinearity 1 LSB

Offset Error ±5 mV

Gain Error ±0.5 %

Output Range 0 2.5 V

Output Impedance 2 Ω

Output Settling Time 10 µs

ADIS16266 Data Sheet

Rev. A | Page 4 of 24

Parameter Test Conditions/Comments Min Typ Max Unit

LOGIC INPUTS Internal 3.3 V interface

Input High Voltage, VINH 2.0 V

Input Low Voltage, VINL 0.8 V

Logic 1 Input Current, IINH VIH = 3.3 V ±0.2 ±10 µA

Logic 0 Input Current, IINL VIL = 0 V

All Except RST −40 −60 µA

RST The RST pin has an internal pull-up. −1 mA

Input Capacitance, CIN 10 pF

DIGITAL OUTPUTS Internal 3.3 V interface

Output High Voltage, VOH ISOURCE = 1.6 mA 2.4 V

Output Low Voltage, VOL ISINK = 1.6 mA 0.4 V

SLEEP TIMER

Timeout Period3 0.5 128 sec

START-UP TIME

Initial Start-Up Time 170 ms

Sleep Mode Recovery 2.5 ms

Reset Recovery 78 ms

Flash Memory Update Time 40 ms

Flash Memory Test Time 18 ms

Self-Test Time 30 ms

FLASH MEMORY

Endurance4 20,000 Cycles

Data Retention5 TJ = 55°C 10 Years

CONVERSION RATE

Sample Rate 2429 SPS

Sample Rate Tolerance ±3 %

POWER SUPPLY

Operating Voltage Range, VCC 4.75 5.0 5.25 V

Power Supply Current 41 mA

Sleep mode 400 µA 1 Characterization data represents ±4σ to fall within the ±1% limit. 2 The maximum guaranteed measurement range is ±14,000°/sec. The sensor outputs measure beyond this range, but performance is guaranteed. 3 Guaranteed by design. 4 Endurance is qualified as per JEDEC Standard 22, Method A117, and measured at −40°C, +25°C, +85°C, and +125°C. 5 Retention lifetime equivalent at a junction temperature (TJ) of 55°C, as per JEDEC Standard 22, Method A117. Retention lifetime decreases with junction temperature.

Data Sheet ADIS16266

Rev. A | Page 5 of 24

TIMING SPECIFICATIONS

TA = 40C to +85C, VCC = 5.0 V, unless otherwise noted.

Table 2.

Parameter Description Min1 Typ Max1 Unit

fSCLK Serial clock (not shown in figures) 0.01 2.5 MHz

tDATARATE Data rate period 32 8s

tSTALL Stall period between data 9 8s

tCS Chip select to clock edge 48.8 ns

tDAV Data output valid after SCLK falling edge2 100 ns

tDSU Data input setup time before SCLK rising edge 24.4 ns

tDHD Data input hold time after SCLK rising edge 48.8 ns

tDF Data output fall time (not shown in figures) 5 12.5 ns

tDR Data output rise time (not shown in figures) 5 12.5 ns

tSFS CS high after SCLK edge3 5 ns

1 Guaranteed by design; not production tested. 2 The MSB presents an exception to this parameter. The MSB clocks out on the falling edge of CS. The remaining DOUT bits are clocked after the falling edge of SCLK

and are governed by this specification. 3 This parameter may need to be expanded to allow for proper capture of the LSB. After CS goes high, the DOUT line enters a high impedance state.

Timing Diagrams

CS

SCLK

tDATARATE

tSTALL

11117-002

Figure 2. SPI Chip Select Timing

CS

SCLK

DOUT

DIN

1 2 3 4 5 6 15 16

R/W A5 A4 A3 A2 D2

MSB DB14

D1 LSB

DB13 DB12 DB10DB11 DB2 LSBDB1

tCS tSFS

tDAV

tDHDtDSU

*

*NOT DEFINED 11117-003

Figure 3. SPI Timing (Using SPI Settings Typically Identified as CPOL = 1, CPHA = 1)

ADIS16266 Data Sheet

Rev. A | Page 6 of 24

ABSOLUTE MAXIMUM RATINGS Table 3.

Parameter Rating

Acceleration

Any Axis, Unpowered, 0.5 ms 2000 g

Any Axis, Powered, 0.5 ms 2000 g

VCC to GND −0.3 V to +6.0 V

Digital Input/Output Voltage to GND −0.3 V to +5.3 V

Analog Inputs to GND −0.3 V to +3.5 V

Operating Temperature Range1 −40°C to +105°C

Storage Temperature Range1 −65°C to +150°C

1 Extended exposure to temperatures outside the temperature range of −40°C

to +85°C can adversely affect the accuracy of the factory calibration. For best accuracy, store the part within the temperature range of −40°C to +85°C.

Stresses above those listed under Absolute Maximum Ratings

may cause permanent damage to the device. This is a stress

rating only; functional operation of the device at these or any

other conditions above those indicated in the operational

section of this specification is not implied. Exposure to absolute

maximum rating conditions for extended periods may affect

device reliability.

ESD CAUTION