A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 1 LM80 Reliability...

A Company of Good People

Copyright© Seoul Semiconductor All Rights Reserved

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LM80 Reliability data for STW8Q2PA

2010. 06. 10


Copyright© Seoul Semiconductor All Rights Reserved 2

1. Number of LED Light Sources tested20ea per test

2. Description of LED light sourcesPKG tested: TOP 5630 Series

Part No. STW8Q2PA

3. Description of auxiliary equipmentSTW8Q2PA of the 5630 series are soldered to reliability board that can accommodate up to 20 devices. STW8Q2PA LEDs are connected in series strings of up to 20 devices and driven by constant current sources of three. Reliability boards are mounted in a reliability chamber that maintain constant thermal surrounding. The test boards are cyclically removed from the chamber for testing.

Tester: integrating Cylinder, a computer-controlled x-y table, programmable current-source meter, and relay switching-matrix. STW8Q2PA is positioned next to the cylinder and driven by a constant current source. IV, forward current, chromaticity is measured for each TOP LEDs.

4. Operating cycleLEDs are driven with a constant DC Voltage.

5. Ambient conditions including airflow, temperature and relative humidityThe case temperature within the chamber with minimal airflow was characterized by several thermocouples connecting to reliability board. Ambient temperature and the relative humidity was also characterized in the specified chambers. All test data were read after condition reached thermal equilibrium.



6. Case temperature (test point temperature)The thermal characterization results are summarized in the table below.

7. Drive Current of the LED light source during lifetime test.@100mA

8. Lumen maintenance data and forward current along with average value, standard deviation minimum and maximum lumen maintenance value for all of the LED light sources.See table.

Required LM80 test temperature (Ts)

Forward Current Actual Ta

25℃ 100 mA 13℃

55℃ 100 mA 37℃

85℃ 100 mA 71℃



Stress condition: Ts 25 , 100mA℃Voltage data

Stress condition: Ts 25 , 100mA℃IV data

Stress condition: Ts 25 , 100mA℃Normalized IV data

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 3.172 3.159 3.196 3.205 3.218 3.207 3.211

Avg 3.068 3.068 3.078 3.077 3.084 3.070 3.092

Min 3.006 2.967 2.975 2.968 2.969 3.004 3.015

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 9.522 9.401 9.399 9.369 9.339 9.288 9.229

Avg 8.651 8.511 8.461 8.444 8.419 8.394 8.324

Min 8.217 8.029 7.963 7.932 7.921 7.995 7.909

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 1.000 0.999 0.997 0.995 0.992 0.996 0.993

Avg 1.000 0.984 0.978 0.976 0.973 0.970 0.962

Min 1.000 0.968 0.959 0.958 0.957 0.949 0.937






　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 3.225 3.263 3.263 3.278 3.279 3.275 3.279

Avg 3.149 3.158 3.152 3.160 3.164 3.167 3.177

Min 2.988 3.000 3.000 3.016 3.020 3.027 3.040

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 9.173 9.113 9.108 9.099 9.068 8.952 8.779

Avg 9.025 8.917 8.810 8.781 8.760 8.670 8.584

Min 8.826 8.729 8.605 8.548 8.531 8.309 8.245

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 1.000 1.000 0.999 0.998 0.995 0.986 0.970

Avg 1.000 0.988 0.976 0.973 0.971 0.961 0.951

Min 1.000 0.974 0.961 0.954 0.952 0.940 0.934






　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 9.170 9.101 9.028 9.007 8.984 8.821 8.778

Avg 9.092 8.888 8.812 8.759 8.732 8.610 8.507

Min 9.005 8.661 8.562 8.449 8.424 8.320 8.308

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 1.000 0.999 0.990 0.987 0.986 0.968 0.961

Avg 1.000 0.969 0.969 0.963 0.960 0.947 0.936

Min 1.000 0.957 0.949 0.937 0.935 0.924 0.922

　 0hr 1000hr 2000hr 3000hr 4000hr 5000hr 6000hr

Max 3.15 3.16 3.17 3.18 3.19 3.18 3.18

Avg 3.24 3.27 3.28 3.29 3.30 3.30 3.29

Min 3.00 2.99 3.03 3.04 3.05 3.04 3.05



9. Observation of LED light source failures including the failure conditions and time of failure.No failures occurred during these tests.

10. LED light source monitoring intervalTested at 0, 1000, 2000, 3000, 4000, 5000, 6000hr

11. Chromaticity shift reported over the measurement time.

Stress condition: Ts 25 , 100mA℃Chromaticity data

　 0 hr 1000 hr 2000 hr 3000 hr 4000 hr 5000 hr 6000 hr

　 Initial ᇫ u' ᇫ u' ᇫ u' ᇫ u' ᇫ u' ᇫ u'

Max. 0.0000 0.0000 -0.0005 -0.0001 -0.0008 -0.0007 -0.0013

Avg. 0.0000 -0.0005 -0.0007 -0.0008 -0.0013 -0.0015 -0.0024

Min. 0.0000 -0.0009 -0.0011 -0.0014 -0.0024 -0.0034 -0.0045

Initial ᇫ v' ᇫ v' ᇫ v' ᇫ v' ᇫ v' ᇫ v'

Max. 0.0000 0.00087 0.00043 0.0007 0.0000 -0.0007 -0.0014

Avg. 0.0000 0.00026 -0.00001 -0.0003 -0.0009 -0.0018 -0.0030

Min. 0.0000 -0.00018 -0.00053 -0.0014 -0.0026 -0.0044 -0.0049





　 0 hr 1000 hr 2000 hr 3000 hr 4000 hr 5000 hr 6000 hr


Max. 0.0000 -0.0002 -0.0003 -0.0001 -0.0004 -0.0014 -0.0011

Avg. 0.0000 -0.0004 -0.0006 -0.0005 -0.0009 -0.0021 -0.0030

Min. 0.0000 -0.0008 -0.0009 -0.0012 -0.0017 -0.0026 -0.0042

　 Initial ᇫ v' ᇫ v' ᇫ v' ᇫ v' ᇫ v' ᇫ v'

Max. 0.0000 0.00060 0.00061 0.0006 0.0002 -0.0009 -0.0004

Avg. 0.0000 0.00037 0.00018 0.0000 -0.0004 -0.0023 -0.0036

Min. 0.0000 -0.00035 -0.00021 -0.0011 -0.0015 -0.0030 -0.0055

　 0 hr 1000 hr 2000 hr 3000 hr 4000 hr 5000 hr 6000 hr


Max. 0.0000 -0.0002 -0.0007 -0.0007 -0.0013 -0.0024 -0.0031

Avg. 0.0000 -0.0007 -0.0012 -0.0015 -0.0022 -0.0038 -0.0043

Min. 0.0000 -0.0013 -0.0019 -0.0021 -0.0028 -0.0057 -0.0058

　 v' ᇫ v' ᇫ v' ᇫ v' ᇫ v' ᇫ v' ᇫ v'

Max. 0.0000 -0.00014 -0.00036 -0.0020 -0.0028 -0.0030 -0.0032

Avg. 0.0000 -0.00091 -0.00112 -0.0028 -0.0037 -0.0045 -0.0050

Min. 0.0000 -0.00169 -0.00184 -0.0034 -0.0044 -0.0063 -0.0065

A Company of Good People Copyright © Seoul Semiconductor All Rights Reserved 1 LM80 Reliability...

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