A 200 Frames per Second, 1-Megapixel, Frame Store CCD camera for X-ray imaging

A 200 Frames per Second, 1-Megapixel, Frame Store CCD camera for X-ray imaging

Dionisio Doering(a), Nord Andresen(a), Devis Contarato(a), Peter Denes(a), John Joseph(a), Patrick McVittie(a), Jean-Pierre Walder(a), John Weizeorick(b)

(a)Lawrence Berkeley National Laboratory, Berkeley, CA (USA)(b) Argonne National Laboratory, Argonne, IL (USA)

International Workshop on Semiconductor Pixel Detectors for Particles and Imaging September 3 7, 2012 in Inawashiro, Japan OutlineSensorBuffer chipReadout ICX-ray cameraReadout systemInitial ResultsConclusions2Pixel2012, Inawashiro - JapanThick fully depleted detector3Pixel2012, Inawashiro - Japan

S. HollandSNAP- Super Nova Acceleration Probe

Produced at DALSA/TeledyneMSL@LBNL processedAt VSUB = 115 V,D = 3.7 0.2 mFully depleted charge cloud moves by drift full charge collection good point spread functionFully depleted vs. partially depleted4Pixel2012, Inawashiro - JapandepleteddepletedundepletedPartially depleted charge cloud diffuses in 4 partial charge collection poor point spread function++X-ray sensor efficiencyPixel2012, Inawashiro - Japan5X-ray sensor efficiencyPixel2012, Inawashiro - Japan6X-ray sensor efficiencyPixel2012, Inawashiro - Japan7X-ray sensor efficiencyPixel2012, Inawashiro - Japan8X-ray sensor efficiencyPixel2012, Inawashiro - Japan9Low temperature processHigh temperature processMBE (in R&D)

Constant areataperMini-shift reg.Output stage~300 m pitchbond pads(wire-bondable)

Metal strapping

ParameterValueThick50-300 mmDirect detectionYesFully depletedYesPixel size30 mmPixel matrix1920 x 960Frame storeYes# of outputs192Pixel rate184Mpix/sPixel2012, Inawashiro - Japan1kFSCCD10Speed issues, for the output stage11Pixel2012, Inawashiro - JapanParasitic capacitance leads to a long CCD output rise timeBuffer chip 0.35 mm high voltage CMOSProvide bias for the detectorRecover gain

Input: 2.1nsOutput: 3.7ns

CCD outputrise time : 400 nsVresetVoutVsclkVswFCRIC (1/2)12Pixel2012, Inawashiro - Japan16 channels Gain 8, 2, 1 12 + 1 bit ADCCovers 15-bit dynamic rangeQuantization error always < photostatisticsCDS correlated double sampling PreampMulti-gainintegratorCDSPipelined ADCVoltage integratorOutput = Optimal noise filteringSwitched cap preserves charge

ADUInput signal (V)FCRIC (2/2)13Pixel2012, Inawashiro - Japan

Camera head14Pixel2012, Inawashiro - JapanTop boardBias boardDigitizer boardFrame store maskTemperature sensorsVacuum chamber

Readout system (1/2)15Pixel2012, Inawashiro - JapanRAID Array NodeUserClientCameraHeadShelfManager10 GbE Network1 GbE NetworkCustom InterfaceCustom

TimingModuleData CaptureModuleFabricSwitchHubSys. Config.GUI InterfaceProcessor NodeCamera InterfaceNodeDigitalPSUATCA Chassis Network Connections

Readout system (2/2)16Pixel2012, Inawashiro - JapanImage processingDark image subtraction, Gain correctionZero suppression, Digital integration, BinningCamera head communicationCopper cablesBeing replaced by fiber optics module

Fiber optics moduleCamera Interface Node (CIN)ATCA crateCalibration & X-ray imaging R&D17Pixel2012, Inawashiro - Japan

ALS at beam line 5.3.1ALS at beam line 8.3.2new systems are in production and will be delivered to ALS (8x), APS (2x) and (1x) EXFELA few more will be produced to other places, contracts under negotiation.Power supplyATCAsystem1kFSCCDchiller1kFSCCD X-ray performance

18Pixel2012, Inawashiro - Japan

Future developments for high(er) speed detectors19Pixel2012, Inawashiro - JapanDiffraction CCD

120 mm laser drilled hole5 x 50 mm pixel CCD(spectrographicapplications)Column parallel CCD

65 nm CMOS Pre-process + ADCFor more info, please see Peter Denes talk 9/4 4:20pm Maurice Garcia-Sciveres talk 9/5 8:30amConclusions20Pixel2012, Inawashiro - Japan