3D Ptychography with Differential Aperture Microscopy€¦ · ~ 2 x 1014 0.2 nm In 10x10 nm2. 10...
Transcript of 3D Ptychography with Differential Aperture Microscopy€¦ · ~ 2 x 1014 0.2 nm In 10x10 nm2. 10...
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3D Ptychography with Differential Aperture Microscopy
Gene E. IceOak Ridge National Laboratory
Cornell June 2011
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Vision builds on existing expertise
Achromatic X-ray infrastructure developed on 34-ID-E to study local structure and defects
Elastic strain tensor
Pushes envelope of what is possible
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4 Managed by UT-Battellefor the Department of Energy Presentation_name
Existing infrastructure near what is needed to observe and characterize discrete defects deep in sample
<0.25 x 0.25 x 0.5 m3
strain~5x10-5 (~10 fm)
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X-ray Area Detector
Improve spatial resolutionImprove sensitivity to rotations
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5 Managed by UT-Battellefor the Department of Energy Presentation_name
Differential aperture microscopy resolves submicron along incident beam!
Simplifies data interpretation
Submicron Z resolution
Isolates weak diffraction from strong
First demonstration by Larson et al. on deformed Cu -
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We are pushing in two directions
Improve spatial resolution of focused beam
Explore achromatic coherent diffraction methods
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Nested (Montel) optics will push spatial resolution
More compact
Improved thermal/vibration stability
First tests– ~150 nm beams– Increased intensity
50-100 nm very practical
More recent tests ~100 nm resolution
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New approaches will address remaining technical challenges
Low figure errors at edge-small spot
Figured edge shape-higher efficiency
Novel alignment/angle control
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Focused-beam Coherent Imaging Offers Significant Advantages
• Full field imaging
• Nm resolution
• Focusing improves resolution at expense of field-of-view
Schroer et al. Phys. Rev. Lett. 101(2008)
108 photons/s x 600 seconds=6 x 1010
5 nm
In 100x100 nm2
~ 2 x 10140.2 nm
In 10x10 nm2
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Takahashi et al. reach 2 nm resolution with 1 μm beam
Diffraction-limited focusing (Osaka mirrors)
Treat beam as plane wave at focus
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Takahsi et al. Phys. Rev. B 82 21412 (2010).
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Challenges Sample damage/ heating
– Heating of a thin sample
– TAluminum=10°C @ 4 x 1014 20 keV x-rays/sec
Reconstruction of topologic defects (dislocations)
Signal-to-noise
Extended objects-ptychography
Extended 3D objects
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Coherent diffraction in Bragg mode offers strain sensitivity-but additional Challenge
Must collect multiple reflections to measure strain tensor-rotate sample
Coherent diffraction from a Au nano particle
Robinson et al. approachMost studies to date on small isolated particles
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Can Achromatic Methods Extend Lensless Diffraction Imaging?
Diffraction imaging provides strain tensor 4 Bragg reflections
– Multiple Bragg reflections accessed by Energy Scans
– NO SAMPLE ROTATIONS
Ptychography subdivides sample complexity in two dimensions.
What about 3rd?
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Real revolution will be to extend ptchography to 3 dimensions
Differential aperture provides additional spatial information
– Resolves discrete particles with non-overlapping diffraction
– Can it be used to determine regions contributing coherently, partially coherently and incoherently
Aperture will itself diffract intensity
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Osaka group uses diffraction from knife edge to achieve nm spatial resolution
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Shadow
Det
ecto
r
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First experiments begun
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Nanoscale particles indexed with white beam
However simple surface samples do not work well with white beam orhigh intensity monochromatic beams
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Eutectic pillar samples (Bei/George) provide stable sample
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Locked into matrix
Complicated with multiple pillars illuminated simultaneously
Really need 3D ptychography!
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High Q-space resolution helps separate Mo/NiAl pillar scattering
Real space
pillar 1?Pillar 1
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Summary X-ray imaging needed for things
that can’t be done with electrons.– Buried samples– 3D samples– Samples in environmental chambers
New approaches needed to study real materials.
– 3D ptychrography– Energy scanning methods for
reciprocal space mapping
Existing achromatic hardware provides model for future
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Reconstruction of dislocation still an unsolved challenge
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•Temporary solution compare to models
•Work on alternatives-ptychography near dislocation to characterize strain field
2 vortex
6 vortex
Reconstruction
Sample