2D like photonic crystal using In2O3-SiOxheterostructure nanocolumn arrays and humidity sensing
-
Upload
aniruddha-mondal -
Category
Documents
-
view
213 -
download
0
Transcript of 2D like photonic crystal using In2O3-SiOxheterostructure nanocolumn arrays and humidity sensing
Electron. Mater. Lett., Vol. 10, No. 5 (2014), pp. 975-980
2D Like Photonic Crystal Using In2O3-SiOx Heterostructure Nanocolumn
Arrays and Humidity Sensing
Naorem Khelchand Singh,1 Bijit Choudhuri,
2 Aniruddha Mondal,
2,* Jay Chandra Dhar,1
Tamal Goswami,2 Saptadip Saha,
2 and Chitralekha Ngangbam
3
1Department of Electronics and Communication Engineering, National Institute of Technology, Nagaland, Chumukedima, Dimapur-797103, India
2Department of Electronics and Communication Engineering, National Institute of Technology Agartala, Jirania, Tripura (West) 799055, India
3Department of Electronics and Communication Engineering, National Institute of Technology Manipur, Imphal (West) 795001, India
(received date: 19 November 2013 / accepted date: 14 February 2014 / published date: 10 September 2014)
Abstract: 2D like photonic crystal was fabricated with the help of GLAD synthesized In2O3-SiOx heterostructurenanocolumnar arrays. Different dielectric media like air and water were used to demonstrate the optical charac-teristics and band gap of the crystal. Nearly 33 nm red shift of the band gap was observed for wet sample as com-pared to dry. Broad band UV-Vis absorption has been observed for the dry In2O3-SiOx heterostructurenanocolumnar arrays, which decreases in wet condition. The device shows low current conduction at lowerhumidity, which enhances at higher humidity condition due to the absorption of water molecules from the envi-ronment by the porous surface. The device possesses 5.6 × 10−3 mA/cm2 current at 10%, which increases to 1.4 ×10−1 mA/cm2 at 99% humidity under applied potential of 2 V. The sample shows the color alteration from black(dry) to brown (wet) due to changes in its effective refractive index.
Keywords: GLAD, photonic crystal, heterostructure, FEG-SEM, TEM, humidity sensor
1. INTRODUCTION
The research on optical devices has been inspired by the
existing structures of the lives in nature like butterfly wings,
beetle cuticles, fish, and peacock feathers. The different
colors in a single body of insects were described with the
physical phenomenon of light.[1] The changes in color of
biological species under different environmental conditions
have further extended the idea of making electronic sensors
for a wide range of applications.[2] The basic structures of the
insect’s body surface, which able to show the color changes
can be fabricated by using the modern nanotechnology.[3]
The artificial structure of the exo-skeleton of the Hercules
beetle that acts as three dimensional (3D) photonic crystals
(PC) was fabricated by Kim et al.,[4] which show the color
changes under dry and wet conditions. The two dimensional
(2D) photonic band gap crystals consist of periodic dielectric
arrays. The nanosized holes in the layer between two dielectric
columns can be occupied with mediums of different refractive
indices. Depending on the effective refractive index of the
system, the variation in the visible colors can be obtained.
Therefore, the 2D photonic crystal has advantages in
developing the sensor, which can change the color that can
be visualized to human eye by simply altering the refractive
medium into the nanoholes. The symmetric periodic arrays
of dielectric columns can be considered as an ideal 2D PC.
However, the challenge of fabricating the structures is that
the lattice constant of the photonic crystal must be comparable
to the wavelength of light. To meet the requirements, it needs
state-of-art nanolithography techniques, such as electron-
beam lithography and x-ray lithography. The techniques are
not viable for batch production and therefore costlier. To
overcome the limitation of 2D PC fabrication, the nanoparticles
assisted optical lithography techniques have been used to
serve the purposes.[5] The oblique angle deposition (OAD)[6]
and glancing angle depositions (GLAD) techniques have
been employed to fabricate the 1D photonic crystal using
period arrangements of different dielectrics in one direction.
But there is no report on the fabrication of 2D like PC with
the help of GLAD technique using In2O3-SiOx dielectric
heterostructure nanocolumnar arrays.
In this paper, we use the In2O3-SiOx heterostructure nano-
columns to fabricate 2D PC, with nearly periodic arrays of
the columns. The different dielectric media (air and water)
were used into the nanoholes to demonstrate the optical
characteristics and the changes in the band gap of the crystal.
DOI: 10.1007/s13391-014-3325-1
*Corresponding author: [email protected]©KIM and Springer
976 N. Khelchand Singh et al.
Electron. Mater. Lett. Vol. 10, No. 5 (2014)
The color alteration of the crystal was observed. The current
conduction through the crystal at different humidity conditions
has been described.
2. EXPERIMENTAL PROCEDURE
2.1 Fabrication of In2O3-SiOx heterostructure 2D PC,
Schottky contact and characterization
GLAD was employed to fabricate In2O3-SiOx hetero-
structure nanocolumnar arrays by evaporating 99.999%
pure (MTI USA) SiO and In2O3 inside the chamber of e-beam
evaporator (15F6, HHV India) on n-type Si<100> substrate
at a base pressure of ~2 × 10−5 mbar. The substrates were put
on the substrate holder at a perpendicular distance of 24 cm
from the evaporation source. The substrates were used at a
constant azimuthal rotation of 120 rpm and at an orientation
of 85° with respect to the perpendicular line between the
source material and the planar substrate holder for column
synthesis. The deposition rate of 1.2 A°s−1 was kept constant
for both SiOx and In2O3 (250 nm each), which were monitored
by a quartz crystal. The positions of the substrates were kept
unaltered for all the depositions of SiOx and In2O3 for the
formation of In2O3-SiOx heterostructure nanocolumns. Ag
has been evaporated through the aluminum mask hole of
area 1.77 × 10−6 m2, on the top of nanocolumns to form the
Schottky contact.
The samples were characterized by field emission gun
scanning electron microscopes (FEG-SEM) (JEOL, JSM-
7600 F) and transmission electron microscopy (TEM)
(JEOL, JEM-2010). The optical absorption measurement
was done on the dry as well as the wet samples by a UV-
visible near-infrared spectrophotometer (Lambda 950, Perkin
Elmer) using specular reflection. The current (I)-Voltage (V)
characteristics of the samples were investigated by using a
Keithley 236 source-measure unit through Ag contact, under
different humid conditions.
3. RESULTS AND DISCUSSION
3.1 2D PC and lattice constant
Figure 1(a) shows the top view FEG-SEM images of the
In2O3-SiOx nanocolumns grown on the Si substrate at 85°
GLAD. The white dashed circles between nanocolumns
indicate the presence of nanoholes. The average top diameter
of the columns was calculated ~51.51 nm and the diameter
of the nanoholes was averagely 39.25 nm. Figure 1(b) shows
the TEM image of a typical nanocolumn. The deposited
nanocolumns are unsymmetrical, having the bottom and top
width ~25 nm and ~15 nm respectively. The individual
nanocolumns are coupled to each other. This may be the
reason of difference in top diameter of the nanocolumns
measured from TEM compared to FEG-SEM image. The
bottom of the nanocolumn consists of SiOx, and the top
consists of In2O3, which is clearly seen from the difference in
color contrast of TEM image of the nanocolumn. The lighter
portion of the nanocolumn is SiOx of length ~100 nm and
comparatively the darker portion of the nanocolumn is In2O3
of length ~250 nm. The nanoholes marked in the Fig. 1(a)
are not in ideal periodic arrangement, and are the collection
of small and large sized holes. The competitive growth mode
process during the GLAD deposition is the reason of
formation of under grown nanocolumns.[7] Therefore, the
area of shadowing region will be altered on the sample and
hence the periodicity, as well as the gap between two
nanocolumns. The formation of perpendicular nanocolumnar
arrays all over the sample finally produced the holes. Due to
the high surface mobility of In2O3 under extremely shadowing
condition in GLAD,[8] SiOx columns were grown beneath, to
serve as seed layers for In2O3. So, separate In2O3-SiOx
nanocolumnar arrays were grown on the Si substrate, which
produced nanoholes in the sample. Figure 1(c) shows the
schematic of the In2O3-SiOx heterostructure nanocolumns,
which is periodic along X-Y direction. For the nanocolumn
spacing, this crystal can have photonic bandgap in the XY
Fig. 1. (a) Top view of FEG-SEM images of the In2O3-SiOx nanocol-umns grown on the Si substrate at 85° GLAD, (b) TEM image of atypical nanocolumn, (c) schematic of the In2O3-SiOx heterostructurenanocolumns with periodic array and lattice constant of the photoniccrystal.
N. Khelchand Singh et al. 977
Electron. Mater. Lett. Vol. 10, No. 5 (2014)
plane. Then, by considering the four neighboring nanocolumns,
the said PC may be considered as square lattice and the
lattice constant was calculated as d = 90.76 nm. Therefore,
the incident photon can be reflected from the two consecutive
dielectric nanocolumns separated by the distance of d in the
XY plane to produce the diffraction pattern, similar to Bragg’s
diffraction from two successive planes of a natural crystal.
3.2 Optical propreties and determination of band gap:
Optical absorption measurements done at room temperature
on the dry and wet (water) In2O3-SiOx heterostructure nano-
columnar samples, is displayed in Fig. 2(a). The authors
have reported the absorption in the UV region (270 - 300 nm)
of the In2O3 columnar arrays.[8] No significant absorption has
been produced by the In2O3 column into the visible region
(more than 300 nm).[8] But after introducing the SiOx
columns beneath the In2O3, the light absorption is enhanced
in the visible region beyond the 300 nm (Fig. 2(a)). Therefore,
a broad band UV-Vis absorption has been produced by the
In2O3-SiOx heterostructure nanocolumnar arrays. The dry
sample shows enlarged absorption as compared to wet
sample. In case of dry sample, there are nanoholes between
two existing nanocolumns filled with air (r.i.: 1). The
incident photons then easily penetrated through the holes
and suffered multiple scattering at the wall of the nano-
columns and get absorbed.[9] In wet condition, the nanoholes
are filled by the water (r.i.: 1.33), which reflects the incident
photons from the surface of the sample and consequently,
less penetration of the incident photons into the nanoholes
and hence the absorption by the samples.
The color of the sample changes from black (dry) to
brown in wet condition, displayed inset Fig. 2(a). The fact
may be explained due to the changes of effective refractive
index of the sample in wet environment. The optical band
gap of the dry and wet samples were then estimated 3.77 eV
and ~3.39 eV respectively from (αhν)2 versus hν plot (α is
theabsorption coefficient, hν is the photon energy) (Fig.
2(b)). The band gap at ~3.77 eV is due to the main band
transition of the In2O3 material,[8] which shifted to lower
energy ~3.39 eV under wet condition. Therefore, ~0.38 eV
(~33 nm) red shift of the band gap of the sample was
observed. Figure 2(c) shows the enhancement in reflection
from the wet heterostructure nanocolumn compared to dry
sample. The reflection peaks at ~331 nm and ~364 nm were
Fig. 2. (a) Optical absorption of the In2O3-SiOx nanocolumns and color changes (b) (αhν)2 versus hν plot, (c) reflection Spectrum of In2O3-SiOx
nanocolumns.
978 N. Khelchand Singh et al.
Electron. Mater. Lett. Vol. 10, No. 5 (2014)
observed for dry and wet samples respectively. So, the
related band gap shift (red shift) of ~33 nm was determined
from reflection, which cross-verified the translocation of the
band gap calculated from the absorption spectrum of the
sample. Further, the reflected wavelength from the film can
be determined using Bragg’s equation[10]
λ = 2dneff, for normal incidence (1)
where, λ is the peak wavelength of reflected light, d = lattice
constant of the 2D crystal (90.76 nm), and neff is the effective
refractive index of the sample. The effective refractive index
of the crystal in dry condition can be estimated from the fol-
lowing formula[11]
neff = fnair + a(1 − f )[( × )/VNC
+ (nSiOx× VSiOx
)/VNC] (2)
where, f = 0.52 is the void fraction of the porous structures
for an ideal simple cubic crystal, a is the volume fraction cor-
rection coefficient (introduced into the equations due to dif-
ferent volume nanocolumns and irregular shaped nanoholes
in between). , VSiOx, VNC are the volume of the In2O3
nanocolumn, SiOx nanocolumn and heterostructure In2O3-
SiOx nanocolumn respectively. [From the FEG-SEM top-
view images, the diameter of the nanocolumn was found to
be 51.51 nm and from typical TEM images, the length of
nanocolumns were calculated as = 254 nm, lSiOx=
100 nm and lNC = + lSiOx= 354 nm and also the volume
of the cylindrical shape nanocolumns were = 5.22 ×
105 nm3, = 2.05× 105 nm3, and VNC = 7.27 × 105 nm3].
nair = 1 and = 2.2,[12] = 2.1[13] are the refractive
index of air, In2O3, and SiOx materials, respectively. When
the water penetrates into nanoporous structure, the effective
refractive index of the crystal becomes
n*eff = fnw + a(1 − f) [( × )/VNC
+ ( × /VNC] (3)
where, nw = 1.33 is the refractive index of water. The
photonic bandgap shift, ∆λ in the peak reflected wavelength
nIn2O3VIn2O3
VIn2O3
IIn2O3
IIn2O3
VIn2O3
VSiOx
nIn2O3nSiO
x
nIn2O3VIn2O3
nSiOx
VSiOx
Fig. 3. (a) Schematic diagram of the experimental setup, (b) I-V characteristics of In2O3-SiOx heterostructure nanocolumnar devices (c)Schematic representation of carrier conduction mechanism at Ag/In2O3 Schottky junction.
N. Khelchand Singh et al. 979
Electron. Mater. Lett. Vol. 10, No. 5 (2014)
due to the water penetration can be calculated as ∆λ =
.
Therefore, the bandgap shift from the dry state to wet state
can be estimated as ∆λ = 31 nm, which is closely related
with the experimental value of ~33 nm. The reflective
wavelengths in dry and wet states are ~332 nm (experimental
~331 nm) and ~363 nm (experimental ~364 nm), respectively,
calculated by fitting the correction coefficient as a = 1.26.
3.3 Current-Voltage relationship of In2O3-SiOx nano-
columns at various humidity levels
The current-voltage (I-V) characteristics of the nanocolumns
were measured with a voltage sweeping mode at various
humid points. In this configuration, one electrode is applied
with the sweeping voltage bias, and the other electrode is
grounded. The sample loaded inside the humidity chamber
(home-made), where the humidity was controlled by the
amount of vaporized water droplets, from outside the
chamber (The schematic diagram along with the original
experimental setup is displayed in Fig. 3(a)). The measured
I-V characteristics of the sample are shown in Fig. 3(b) at
different humid conditions ranging from 10% to 99%. The
levels of humidity were measured with the help of standard
sensor (TECXTRA-HR201). The bias was applied at the
two different electrodes through the probes from outside the
chamber, using Keithley (2400) I-V source measure unit.
The device conductivity increases from lower to higher
humidity conditions (Fig. 3(a)). The device produces a very
low current of 5.6 × 10−3 mA/cm2 (at 10% humidity), increases
gradually to 9.1 × 10−2 mA/cm2, 1.3 × 10−1 mA/cm2 and
1.4 × 10−1 mA/cm2 under 2 V biasing at 67%, 71% and 99%
humidity respectively. The Ag produced Schottky contact
with In2O3[14] and under forward bias, a large number of
majority carriers ionize the interface states,[15] which tends to
increase the barrier height. The thermionic emission of
carriers was dominated and therefore, results in the lower
conductivity of the device at low humid conditions. At high
humid conditions, the polar water molecules were absorbed
at the porous surface of the sample, which attracts the large
number of electrons from In2O3 (inherently n-type) and
accumulates at its surface.[16] Then, the In2O3 conduction
band is bent to downward at the surface of the Ag/In2O3, due
to the accumulation of electrons (schematically shown in
Fig. 3(c)), which tends to lower the barrier height at the Ag-
In2O3 junction and may allow high carrier conduction by
thermionic as well as tunneling process. Finally, the absorption
of water molecules at the porous surface of the sample
increases the device conductivity and therefore, indicates the
enhancement of humidity in precise manner.
4. CONCLUSIONS
We have successfully fabricated the 2D like PC with the
help of GLAD synthesized In2O3-SiOx heterostructure nano-
columnar arrays. The lattice constant between two consecutive
dielectric nanocolumns was found to be d = 90.76 nm, which
is used to produce the diffraction pattern. The optical band
gap of the dry and wet samples were 3.77 eV and ~3.39 eV
respectively. The related band gap shifting was ~33 nm,
which were calculated from absorption and reflection
respectively, closely related to the theoretically calculated
shift of ~31 nm from dry state to wet state. The dry sample
shows the enlarged absorption due to the presence of
nanoholes between two existing nanocolumns filled with air
(r.i.: 1) due to the easy penetration of the photon into the hole
and hence, multiple scattering of the incident photon at the
wall of the columns. In case ofthe wet sample, the nanoholes
are filled by water (r.i.: 1.33) and consequently, less penetration
of the incident photons into the nanoholes which produces
less absorption. The color changes have been observed from
black to brown for dry to wet condition respectively. At low
humidity (10%) conditions, the device shows low current
conduction. The junction current was produced mainly by
the thermionic emission process of the carriers over the
junction barrier height. As the humidity level increases
(99%), more water molecules (polar) were absorbed at the
surface of the porous In2O3/SiOx sample, which forced to
bend the semiconductor conduction band at its surface and
accumulated more electrons. The enormous carriers at the
Ag/In2O3-SiOx junction produced the large device current.
The maximum current 1.4 × 10−1 mA/cm2 was produced at
99% humidity under the applied voltage of 2 V. Therefore,
the change in color as well as current conductivity of In2O3-
SiOx nanocolumns was observed by simply changing the
effective refractive index of the medium, which may be used
for the fabrication of good electronic sensor.
ACKNOWLEDGEMENTS
The authors are grateful to Dr. Ardhendu Saha of Electrical
Department, NIT, Agartalafor providing the absorption
measurement, Dr. Syed Arshad Hussain of Tripura University,
Department of Physics for providing the I-V measurement
facility, Dr. Kalyan Kumar Chattopadhyay of Jadavpur
University for providing the TEM measurement facility. The
authors are also thankful to SAIF, IIT Bombay, India for
FEG-SEM measurement, Department of Science and
Technology, Govt. of India, TEQIP- II and NIT Agartala for
financial support.
REFERENCES
1. S. Kinoshita and S. Yoshioka, Chem. Phys. Chem. 6, 1442
(2005).
2. H. Kim, J. Ge, J. Kim, S. Choi, H. Lee, H. Lee, W. Park, Y.
Yin, and S. Kwon, Nat. Photonics 3, 534 (2009).
2d neff*
neff–( ) 2df nw nair–( )=
980 N. Khelchand Singh et al.
Electron. Mater. Lett. Vol. 10, No. 5 (2014)
3. H. Wang and K. Q. Zhang, Sensors 13, 4192 (2013).
4. J. H. Kim, J. H. Moon, S. Y. Lee, and J. Park, Appl. Phys.
Lett. 97, 103701 (2010).
5. M. Athanasiou, T. K. Kim, B. Liu, R. Smith, and T. Wang,
Appl. Phys. Lett. 102, 191108 (2013).
6. M. M. Hawkeye, R. Joseph, J. C. Sit, and M. J. Brett,
Optics Express 18, 13220 (2010).
7. C. M. Zhou and D. Gall, Appl. Phys. Lett. 90, 093103
(2007).
8. A. Mondal, B. Shougaijam, T. Goswami, J. C. Dhar, N. K.
Singh, S. Choudhury, and K. K. Chattopadhay, Appl. Phys.
A, (DOI: 10.1007/s00339-013-7835-8) (2013).
9. O. L. Muskens, S. L. Diedenhofen, B. C. Kaas, R. E. Algra,
E. P. A. M. Bakkers, J. G. Rivas, and A. Lagendijk, Nano
Lett. 9, 930 (2009).
10. D. A. Hiltner and I. M. Krieger, J. Phys. Chem. 73, 2386
(1969).
11. S. G. Romanov, T. Maka, C. M. S. Torres, M. Muller, and
R. Zentel, Thin Opaline Photonic Crystals, Kulwer Aca-
demic, Dordecht (2001).
12. H. Dong, S. Sun, L. Sun, W. Xie, L. Zhou, X. Shen, and Z.
Chen, Appl. Phys. Lett. 98, 011913 (2011).
13. E. D. Palik, Handbook of Optical Constants of Solids,
Volume I, p. 768, Academic Press, San Diego, USA
(1997).
14. O. Lang, C. Pettenkofer, J. F. Sánchez-Royo, A. Segura, A.
Klein, and W. Jaegermann, J. Appl. Phys. 86, 5687 (1999).
15. A. Mondal, N. K. Singh, P. Chinnamuthu, J. C. Dhar, A.
Bhattacharyya, and S. Choudhury, IEEE Photonics Tech-
nol. Lett. 24, 2020 (2012).
16. J. F. Boyle and K. A. Jones, J. Electron. Mater. 6, 717
(1977).