©2010 Cengage Learning Engineering. All Rights Reserved.8-0 Combinational Circuit Design and...

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©2010 Cengage Learning Engineering. All Rights Reserved. 8-1 Combinational Circuit Design and Simulation Using Gates PowerPoint Presentation © 2010. Cengage Learning, Engineering. All Rights Reserved. 1-1 UNIT UNIT 8 8

Transcript of ©2010 Cengage Learning Engineering. All Rights Reserved.8-0 Combinational Circuit Design and...

Page 1: ©2010 Cengage Learning Engineering. All Rights Reserved.8-0 Combinational Circuit Design and Simulation Using Gates PowerPoint Presentation © 2010. Cengage.

©2010 Cengage Learning Engineering. All Rights Reserved. 8-1

Combinational Circuit Design and

Simulation Using Gates

PowerPoint Presentation

© 2010. Cengage Learning, Engineering. All Rights Reserved.

1-1

UNIT UNIT 88

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The scale of IC design

1.Small-scale integrated, SSI: gate number usually less than 10 in a IC.2.Medium-scale integrated, MSI: gate number ~10-100, can operate single and simple function(such as 4-bit adder).3.Large-scale integrated, LSI: gate number ~100- few 1000, can operate as a processor, memory, and programmable module. 4. Very large-scale integrated, VLSI: few 1000-few billions of gates, can operate complex micro-processor, digital signal processing.

A SSI IC

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TLC IC (74系列 )

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Design of circuits with limited gate Fan-in

The physical operation of a IC circuit, you will meet issues such as (1)Gate delay(2)Limited inputs or outputs

What is Fan-in and Fan-out?

1.Fan-in: For a electronics device, the gate speed is limited. Therefore, for a single gate, the inputs is not over 4 or 5. So for a high Fan-in circuit, we will convert it into a multilevel circuit.

#Original is 7 Fan-in, convert to 4.

2. Fan-out: For a typical gate, having a standard load, for example, a invertor having a limited one standard load. When the output load is increased , transition time will increased. The maximum Fan-out is defined to be the largest load it can derived.

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Figure 8.1Design of circuits with limited gate fan-in

Example:

For a two-level circuit ,you will having : two 4-input gates and one 5-input gate

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Convert to NOR-gate circuit

If factoring this function to a multi-level circuit, you will lower the gates inputs:

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Example: Realize the functions using only two-input NAND gates and invertors.

After minimize from each K-map

Each requires a 3-input OR gate

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Step1:We will factor to reducre the number of gate inputs:

We will select this expression because it share the common gate with f1

We need to further reduce the gate input from f3

DeMorgen’s

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Figure 8.3 Realization of Figure 8.2

Because the output gate is OR, we convert to NAND gates circuit

Step2: Convert to a NAND circuit

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Figure 8.4 Propagation Delay in an Inverter

Gate Delays and Timing Diagram

1. This delay is from the transistor or switching elements within gate take time to react to a charge in input.

2. A Propagation delay : nanoseconedFor some type of sequential circuit, even short delays may be important.

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A more detail defination

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A spec. of logic gate

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Figure 8.5 Timing Diagram for AND-NOR Circuit

Example: A timing diagram for AND-NOR Circuit

Assume each gate has a propagation delay of 20 ns

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Figure 8.6 Timing Diagram for Circuit with Delay

Example: A timing diagram for a Circuit delay

Assume each gate has a propagation delay of 2 s

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Figure 8.7 Types of HazardsHazard in combinational logic A unwanted switching transients occurs when different paths from input to output have different propagation delay

突波 或是 雜訊

靜態 1- 雜訊

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Figure 8.8 Detection of a 1-Hazard

If A=C=1, B change from 1 to 0Assume each gate delay is 10ns

1

1

Ideal case: F output always 1But actually, HazardOccurs.

This is called a Inertial delay!(慣性延遲 )

0 glitch(失靈 )

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Figure 8.9 Circuit with Hazard Removed

Hazard can be detected using K-map

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Figure 8.10 Detection of a Static 0-Hazard

注意電路 AND ourput: POS

F= (A+C)(A’+D’)(B’+C’+D)

When A=0,B=1,D=0Then C from 0 to 1.

0-Hazard occurs!

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Figure 8.11 Kanaugh Map Removing Hazards of Figure

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K-map removing Harzards

F= (A+C)(A’+D’)(B’+C’+D)(C+D’)(A+B’+D) (A’+B’+C’)

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Simulation and Testing of logic circuits

As logic circuits become more and more complex, it is very important to simulate a design before actually building it.

Simulation is done for several reason:1.Verify the design is logically correct 2.Verify the timing of logic signal 3.Faulty component

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Figure 8.12For a simulating logic circuit:1.0, 1 , unknown(X), open-circuit(Z, high impedance, hi-Z)2.Probe each gate output: Help to debug the error.

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Table 8.1 AND and OR Functions for four valued

Simulation

Debugging: If a circuit output is wrong, this may due to several possible causes:

1.Incorrect design2.Gates connected wrong3.Wrong input signals

4.Defective gates5.Defective connecting wires.

If output gate has the wrong output and the input is correct, this indicates the Gate is defective.

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Figure 8.13 Logic Circuit with Incorrect Output

Example: How to do the trouble shorting in this device?

A student in lab found that when A=B=C=D=1, the output F is wrong. F= AB(C’D+CD’) + A’B’(C+D)

1. Gate 7 shows that one of the inputs is wrong. (output should be 0)2. Output of Gate-5 is wrong, it should be 0. So Gate-3 is wrong.3. Gate-1 And Gate-2 is correct, so input to Gate-3 is correct. 4. So we can find that Gate-3 is defective.

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HProblem 8.1Chapter 8 HW

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Problem 8.3

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Figure 8.14 Circuit Driving Seven-Segment Module

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K-map

Truth table Chip

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Problem 8.N