20 supsi workshop schinke

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Uncertainty of DSR measurements according to approximations defined in the IEC 60904-8 standard K. Bothe, D. Hinken and C. Schinke Calibration and Test Center Solar Cells Institute for Solar Energy Research SUPSI-Workshop, Photoclass Project (4/2017)

Transcript of 20 supsi workshop schinke

Page 1: 20 supsi workshop schinke

Uncertainty of DSR measurements according to

approximations defined in the IEC 60904-8 standard

K. Bothe, D. Hinken and C. SchinkeCalibration and Test Center Solar Cells

Institute for Solar Energy Research

SUPSI-Workshop, Photoclass Project (4/2017)

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DSR system at ISFH CalTeC

• Grating monochromator:280 to 1200nm in 10nm steps

• 48 bias lamps, bias current up to 14A for large-area solar cells

• Three transimpedance amplifiers (small: 250mA, large: 14A, Vmon)

• Two light fields:50x50mm² and 160x160mm²

• Motorized axis for reference and sample cells

• Sample Temperatures from 20 to 40°C (determination of TC)

• ISO 17025 accredited by DAkkS since 2016

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Measurement procedure

• Calibration of monochromatic light and bias light (Ebias) using a WPVS reference solar cell

• DSR measurement of device under test at various (usually 8) bias levels:10, 100, 200, 400, 600, 800, 1000 and 1100 W/m²

• Integration over Ebias

• Calculation of relative sstc-curves, sstc.rel(l) and mismatch correction factor• Determination of ISTC at sun simulator• Scaling of DSR curves and sstc.rel(l) using ISTC

• Difference to PTB approach (previous talk by I. Kröger): Integration is not carried out over Ibias since only relative (unscaled) DSR values are measured

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Measurement uncertainty

• Monte-Carlo uncertainty analysis with 12 uncertainty components:

fdist: Height-difference of reference and DUTfwlshift: Deviation in wavelength of monochromatic lightfbandwidth: Bandwidth of monochromatic lightfTRef: Temperature difference to 25°C of referencefTDUT: Temperature difference to 25°C of DUTfcellinhom: Impact of light inhomogeneity on cells with current collection inhomogeneityfrepRef: Reproducibility of measurement of referencefrepDUT: Reproducibility of measurement of DUTfscale: Uncertainty of Isc from IV measurementfnonlin: Non-linearity of transimpedance amplifierfref: Uncertainty of primary normalfhom: Reproducibility of inhomogeneity correction

DUT meas dist nonlin wlshift bandwidth TRef TDUT scale cellinhom repRef repDUT refh oms s ff ff ff ff ff f / f

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Comparison to PTB:WPVS reference solar cell

• WPVS reference solar cell

• Fixed bias intensity/current

• Curves of PTB (black) and ISFH-CalTeC (red)

• Enavg = 0.1

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Solar Cell Calibration Standards

F. D‘Amore, Solar standards and certification, www.med-desire.eu, 2015

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IEC 60904-8 Ed. 3.0

F. D‘Amore, Solar standards and certification, www.med-desire.eu, 2015

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IEC 60904-8 Ed. 3.0

F. D‘Amore, Solar standards and certification, www.med-desire.eu, 2015

Required for spectral mismatch correction

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IEC 60904-8 Ed. 3.0 complete DSR procedure

Definition of the requirements for the measurement of the spectral responsivity of linear and non-linear photovoltaic devices:

For highest accuracy, the differential spectral responsivity has to be measured under at least 5 different bias light irradiances resulting in short circuit currents between 5% and 110% of the short circuit current under standard test conditions . The spectral responsivity is calculated by integrating over .

complete differential spectral responsivity (DSR) procedure

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IEC 60904-8 Ed. 3.0 simplifications

• Simplifications aiming at determining one or more appropriate bias irradiances at which the measured differential spectral responsivity best approximates the spectral responsivity1. bias ramps at 3 to 5 wavelength with step width of 200nm increasing the

bias light irradiance in 3 to 5 steps corresponding to between 5% and 110% of multicolor bias ramps

2. use of white light instead of monochromatic light white bias ramp

3. bias irradiance resulting in a bias current between 30% to 40% of 30% to 40% bias

4. bias irradiance resulting in a bias current of 10% of if linearity is proven by showing that the differential spectral responsivity does not change by more than 2% when measuring at bias light intensities corresponding to 5% and 15% (not considered: only non-linear cells analyzed here)

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IEC 60904-8 Ed. 3.0 simplifications

• Simplifications aiming at determining one or more appropriate bias irradiances at which the measured differential spectral responsivity best approximates the spectral responsivity1. bias ramps at 3 to 5 wavelength with step width of 200nm increasing the

bias light irradiance in 3 to 5 steps corresponding to between 5% and 110% of multicolor bias ramps

2. use of white light instead of monochromatic light white bias ramp

3. bias irradiance resulting in a bias current between 30% to 40% of 30% to 40% bias

4. bias irradiance resulting in a bias current of 10% of if linearity is proven by showing that the differential spectral responsivity does not change by more than 2% when measuring at bias light intensities corresponding to 5% and 15% (not considered: only non-linear cells analyzed here)

9-25 (+1)

3-5 (+1)

1

3no. o

f mea

sure

men

ts

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Deviations of simplifications comparedto complete DSR procedure

1. Simulation of the DSR of a non-linear c-Si solar cell and analysis according to the complete DSR procedure as well as simplifications 1 to 3

2. Measurement of the DSR of a non-linear c-Si solar cell and analysis according to the complete DSR procedure as well as simplifications 1 to 3

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Simulation approach

Wavelength l [nm]

400 600 800 1000 1200

Measured differential

spectral responsivity s [m

A/W

m2]

0.0

0.2

0.4

0.6

0.8

900 950 1000 1050 11000.4

0.5

0.6

0.7

0,10,25 & 50 W/m2

100

200300

400600-1200

SR

~

Bias intensity [W/m2]

0 200 400 600 800 1000

Differential

s and integrated spectral responsivity s [mA

/W m

2]

0.0

0.2

0.4

0.6

0.8

300nm

500nm

1100nm

700nm

900nm

286 317305

bias ramp

~

s~

s

p-type Cz SiτSRH,n0 = 80 µsτSRH,p0 = 800 µs

J0r,c = 790 fA/cm²

J0e = 59 fA/cm²

SiOSn = 1.22×104 cm/sSp = 5.92 cm/s

• FEM simulation of a PERC c-Si solar cell using SENTAURUS DEVICE

• Silicon dioxide dielectric layer at the rear side with very high interface defect density of 3×1010 cm-2

• curves show high non-linearity• Bias ramps at different wavelengths

yield bias intensity setpoints E0 from 286 to 317 W/m²

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Impact of bias ramp wavelengthand bias irradiance

• How much do the simplifications deviate from the complete DSR method?

• Simplification 1 (Multicolor bias ramps):Deviations below -1.3%

• Simplification 2 (White bias ramp):Deviations below 4.6%

• Simplification 3 (30% bias):Deviations below 3.9%

Wavelength l [nm]

200 400 600 800 1000 1200

Deviation of

s from

s STC

[%]

-2

-1

0

1

2

3

4

5bias intensity

fixed bias irradianceE0=300 W/m2

white bias rampE0=304 W/m2

multicolor rampadjusted bias irradiance

~

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Measurement

Wavelength l [nm]

400 600 800 1000 1200

Measured differential

spectral responsivity s [m

A/W

m2]

0.00

0.01

0.02

0.03

0.04

0.05

800 900 1000 11000.30

0.35

0.40

0.45

0.50

10 W/m2

100

20

200900

1100

~

Bias intensity [W/m2]

0 200 400 600 800 1000 1200

Differential

s and integrated spectral responsivitys [mA

/W m

2]

0.01

0.02

0.03

0.04

0.05

300nm

500nm

1100nm

700nm

900nm

E0=287 301

s

bias ramp

~

s~

Si3N4

p-type Cz Si

• p-type Cz Si without AlOx but with SiN

• curves show high non-linearity

• Bias ramps at different wavelengths yield bias intensity setpoints from 287 to 301 W/m²(Simulation: 286 – 317 W/m²)

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Impact of bias ramp wavelengthand bias irradiance

• How much do the simplifications deviate from the complete DSR method?

• Simplification 1 (Multicolor bias ramps):Deviations below -0.2%

• Simplification 2 (White bias ramp):Deviations below -1%

• Simplification 3 (30% bias):Deviations below -1%

Wavelength l [nm]

200 400 600 800 1000 1200 1400

Deviation of

s from

s STC

[%]

-10

-8

-6

-4

-2

0

2

4

bias ramp wavelengthand corresponding bias intensity

500nm / 169 W/m2

700nm / 126 W/m2

1100nm / 353 W/m2

~

900nm / 301 W/m2

300nm / 146 W/m2

Wavelength l [nm]

200 400 600 800 1000 1200

Deviation of

s from

s STC

[%]

-2

-1

0

1

2

3

multicolor rampadjusted bias irradiance

fixed bias irradianceE0=300 W/m2

~

bias intensity

white bias ramp / E0=314 W/m2

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Summary

• Analysis of non-linear c-Si solar cell (simulation and measurement).• Deviations below 5% were determined from solar cell device

simulations for all approximations.

• Simplification 1 (Multicolor-biasramps) was the most robust approach (deviations below 1.3%).

• Simplification 2 (White-biasramp) showed deviations below 4.6%.• Simplification 3 (30% bias) showed deviations below 3.9%.

• For non-linear solar cells: Use the complete DSR procedure if possible.

• If a simplification is required, use the multicolor-biasramps approach if possible.

Thank you for your attention!

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Bias light intensities

0

500

1000

Bias Intensity [W

/m2]

0

500

1000

Wavelength l [nm]

300 700700 900900 12000

500

1000

0.5% accepted deviation

of DSR from SR

1.0%

5.0%

280 - 290

290

250 - 350

W/m2

W/m2

W/m2