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Page 2: 0$.,/.1(2304,/4 5670.$6*0-(/36-%($.6/30. &**',-&8(/.(9 · with different experiments may be hampered by several uncertaines: – Influence of sample holder material and solder on

Outline•  Measuringcrystallographicchangesusinghighenergysynchrotron

X-raydiffrac8on(XRD)o  SimultaneousmeasurementoflaUcedistor8ons,cri8calcurrent,stress,strainofHTSat77K

o  SimultaneousmeasurementofNb3SnlaUcedistor8ons,stress,strainat4.2K

•  LaUcedistor8onsandelectromechanicalproper8eso Bi-2223o Bi-2212o MgB2o Nb3Sn

•  CanXRDmeasurementshelptoexplainwhyJcofNb3Snwiresismoresensi8vetotransversethantoaxialstress?

2C.Scheuerlein,MEM2016,23March2016

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.V,)+.0/0")#.$#/-+"(%"(/.Q4"&#.3,R"&-8(/.•! X06%"(/$.&/3.+,)+.0/0")#.*+(%(/$.-&/.*0/0%"&%0.@@4%+,-=.$%"(/)'#.&7$("7,/).

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Fit of the LaB6 (110) diffraction peak.

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Why measure simultaneously lattice distortions, critical current, stress and strain?

•  AcomparisonoflaUcedistor8onswithsuperconduc8ngproper8esmeasuredwithdifferentexperimentsmaybehamperedbyseveraluncertain8es:

–  Influenceofsampleholdermaterialandsolderonthestressstateinthesuperconductor

–  Samplegeometry–  Sampleinhomogeneity–  Previoussamplemanipula8on–  Thermalhistoryofthesample–  Strainmeasurementuncertain8es

•  Theseuncertain8escanbeeliminatedorreducedwhenmeasuringelectromechanicalproper8esandlaUcedistor8onsatthesame8me.

•  Suchmeasurementscanmostconvenientlybeperformedwithhightemperaturesuperconductors(HTS)inanopenliquidnitrogencryostat,andwithoutappliedfield.

5C.Scheuerlein,MEM2016,23March2016

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Set-upsforsimultaneousmeasurementoflaUceparametersand(a)Ic,stressandstrainat77K,and(b)stressandstrainat4.2KintheESRFID15beamline

6

4.2Kset-upfromUniGenevaRTand77Kset-up

C.Scheuerlein,MEM2016,23March2016

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7

Superconductorinstrumenta8onandX-raytransparentcryostat

•  Dismountablecryostatmadeofstainlesssteel,encapsulatedbyStyrofoam.WindowsaremadeofsheetsofPET,inwhichX-rayabsorp8onisnegligible.

•  Absor8onof90keVX-raysin7cmofliquidnitrogenisabout50%.

Bi-2212wirewithvoltagetaps,extensometerandcurrentleads.

SampleandgripsImmersedinliquidnitrogen.

C.Scheuerlein,MEM2016,23March2016

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Diffrac8onpajernofBi-2212wireinairandimmersedinliquidnitrogen

Diffrac<onpa?ernoftheBi-2212wireinair.

8

Diffrac<onpa?ernoftheBi-2212wireinliquidnitrogen.

C.Scheuerlein,MEM2016,23March2016

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Outline•  Measuringcrystallographicchangesusinghighenergysynchrotron

X-raydiffrac8on(XRD)o  SimultaneousmeasurementoflaUcedistor8ons,cri8calcurrent,stress,strainofHTSat77K

o  SimultaneousmeasurementofNb3SnlaUcedistor8ons,stress,strainat4.2K

•  LaUcedistor8onsandelectromechanicalproper8eso Bi-2223o Bi-2212o MgB2o Nb3Sn

•  CanXRDmeasurementshelptoexplainwhyJcofNb3Snwiresismoresensi8vetotransversethantoaxialstress?

9C.Scheuerlein,MEM2016,23March2016

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Page 12: 0$.,/.1(2304,/4 5670.$6*0-(/36-%($.6/30. &**',-&8(/.(9 · with different experiments may be hampered by several uncertaines: – Influence of sample holder material and solder on

Outline•  Measuringcrystallographicchangesusinghighenergysynchrotron

X-raydiffrac8on(XRD)o  SimultaneousmeasurementoflaUcedistor8ons,cri8calcurrent,stress,strainofHTSat77K

o  SimultaneousmeasurementofNb3SnlaUcedistor8ons,stress,strainat4.2K

•  LaUcedistor8onsandelectromechanicalproper8eso Bi-2223o Bi-2212o MgB2o Nb3Sn

•  CanXRDmeasurementshelptoexplainwhyJcofNb3Snwiresismoresensi8vetotransversethantoaxialstress?

12C.Scheuerlein,MEM2016,23March2016

Page 13: 0$.,/.1(2304,/4 5670.$6*0-(/36-%($.6/30. &**',-&8(/.(9 · with different experiments may be hampered by several uncertaines: – Influence of sample holder material and solder on

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[,4BBDB.2,"0.:%W:%3K./4\&'60K.`'&@0/%.0'&$8-.$%"&,/K.2,"0.$%"0$$.\$.0:%0/$(@0%0".$%"&,/.&%.II.W.

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Page 15: 0$.,/.1(2304,/4 5670.$6*0-(/36-%($.6/30. &**',-&8(/.(9 · with different experiments may be hampered by several uncertaines: – Influence of sample holder material and solder on

Outline•  Measuringcrystallographicchangesusinghighenergysynchrotron

X-raydiffrac8on(XRD)o  SimultaneousmeasurementoflaUcedistor8ons,cri8calcurrent,stress,strainofHTSat77K

o  SimultaneousmeasurementofNb3SnlaUcedistor8ons,stress,strainat4.2K

•  LaUcedistor8onsandelectromechanicalproper8eso Bi-2223o Bi-2212o MgB2o Nb3Sn

•  CanXRDmeasurementshelptoexplainwhyJcofNb3Snwiresismoresensi8vetotransversethantoaxialstress?

15C.Scheuerlein,MEM2016,23March2016

Page 16: 0$.,/.1(2304,/4 5670.$6*0-(/36-%($.6/30. &**',-&8(/.(9 · with different experiments may be hampered by several uncertaines: – Influence of sample holder material and solder on

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Page 19: 0$.,/.1(2304,/4 5670.$6*0-(/36-%($.6/30. &**',-&8(/.(9 · with different experiments may be hampered by several uncertaines: – Influence of sample holder material and solder on

Outline•  Measuringcrystallographicchangesusinghighenergysynchrotron

X-raydiffrac8on(XRD)o  SimultaneousmeasurementoflaUcedistor8ons,cri8calcurrent,stress,strainofHTSat77K

o  SimultaneousmeasurementofNb3SnlaUcedistor8ons,stress,strainat4.2K

•  LaUcedistor8onsandelectromechanicalproper8eso Bi-2223o Bi-2212o MgB2o Nb3Sn

•  CanXRDmeasurementshelptoexplainwhyJcofNb3Snwiresismoresensi8vetotransversethantoaxialstress?

19C.Scheuerlein,MEM2016,23March2016

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Conclusion•  SeveralintenseBi-2212,Bi-2223,Nb3Sndiffrac8onpeaks,whichcanbefijedin

ordertodetermineaccuratelaUceparameterchanges,canbeacquiredbyXRDintransmissiongeometry.Theacquisi8onofMgB2diffrac8onpeaksinPITwireswithsufficientsignal-to-noiseismorechallenging.

•  Thetemperatureinfluenceonthemechanicalbehaviouroftheindividualwirecons8tuents,fractureofbrijlecomponentsandloadtransferarerevealedbytheXRDelas8cstrainmeasurements.

•  Textureispresentinmostwirecons8tuents.Nb3SntexturemayhaveaninfluenceontheJcsensi8vityofRRPandPITtypewires,butitcannotexplainthedifferentJcresponsetoaxialandtransversestressinBRwires,wheretheNb3Sngrainshavearandomorienta8on.

•  Transversewirecompressionpresumablycausesaninhomogeneousstressandstraindistribu8onintheNb3Snfilaments.Diffrac8onpeakwidthchangesduringapplica8onoftransversecompressivestressat4.2Kcouldbeanindica8onofinhomogeneousstressdistribu8on.

25C.Scheuerlein,MEM2016,23March2016