Project duration and staffing
Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection
Polarizing properties of embedded symmetric trilayer stacks under conditions of frustrated total internal reflection: erratum
[IEEE 2013 IEEE Workshop on Applications of Computer Vision (WACV) - Clearwater Beach, FL, USA (2013.01.15-2013.01.17)] 2013 IEEE Workshop on Applications of Computer Vision (WACV)
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