Update on Sensor procurement and October DESY Test Beam

Mathieu Benoit

Sensor Procurement and plans• Proposition for a 64x64 CLICPix like HV-CMOS

sensor – AMS 180nm HV-CMOS process– Option 1 : Dedicated CLICPix Chip (5mm2)

• ~5000 euros for a Run, 64x64 pxiels , 25um pitch, amplification only

• Share with ATLAS : 64x64 pixels, 80% 25um pitch, 20% with ATLAS Like pixel (250x50um), suggested share (~4000 euros CLIC, ~2000 euros ATLAS)

• Possible interest from Glasgow for HV-CMOS with Timepix-Like and FEI4 like pixels, with various level of intelligence

– Analog only, – Digital only,– Digital with adjustable level and smaller than pixel sensitive matrix

TOT=12-15

TOT=8-11

TOT=4-7

TOT=0-3

50um

250u

m

Timepix ASIC

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+

October 2013 setup

DUT

telescope planes

TLU

Timepix DAQ

HV source

Temp. r/o

MiM-TLU

DATURA telescope

DUT Fitpix

Rotation / Transl. Stages

DUT holder

Telescope resolution

Run summary October 2013• 185 good runs (4 assemblies) from Oct 21, 17h to Oct 25, 22h• using same MiM-TLU as in August TB• 15 tracks per Timepix shutter• rotation scans from 0 to 75 degrees• threshold scans (at 0 degrees)• efficient data taking at ~100-150 Hz,

except for intermittent problems with telescope DAQ crashes(under investigation now by DESY Windows expert)

August 2013 TB : 616 632 783 Trigger in 12 days, 81MTrigger/day instead 51MTrigger/day!

Dones & To-Dos (Reconstruction)• Dones :

– All Telescope data now reconstructed(Tracking with EUDET only)– 0 degree incidence data aligned and trackmatched /waiting in the batch

for reco (some space issue to be solved)

• To-Dos : – Fix alignment algorithm with tilted sensors – Align and track-match angle data – Plot Efficiency curve for rTHL scans – Reprocess data with various TOT rebinning – Reprocess data with Calibration – Reproduce TestBeam Data in Simulation (Ongoing)– Note in preparation : Evaluation of Tracking performance of Ultra-Thin Active

Edge Silicon pixel Timepix Assemblies for CLIC Vertex Detector R\&D

Run Summary

Night Crash

THL Scans

Cleaning up beam area

Sample change