FAULT INSERTION TRIALS

FAULT INSERTION TRIALS ON A DIGITAL EXCHANGE

POST_LAYOUT ANALYSIS OF A HIGH-SPEED BOARD

FAULT INSERTION STUDY ON AN ATM SWITCH BOARD

TDR ANALYSIS OF AN OPTICAL ACCESS MODULE

SIGNAL INTEGRITY COMPLIANCE ANALYSIS ON A COMPLEX BOARD

PREDICTIVE ANALYSIS OF FAULT INSERTION EFFECTS ON A

COMPLEX BOARD

FAULT INSERTION TRIALS ON A SDH CROSSCONNECT

TRAFFIC/FAULT TRIALS ON THE TEST-PLANT VERSION

SERIAL FRONT-END FOR SHIELDED CABINETS

FI TRIALS ON A MARCONI CROSSCONNECT

THRIS EMC: PREDICTIVE ANALYSIS OF PCB RADIATED FIELD

RADIATED FIELD TESTS ON A TEST BOARD

PREPARATION OF A BOARD FOR EMC TESTS

FAR CHAMBER MEASURMENTS ON A TEST BOARD

THRIS –EMC NEAR FIELD ANALYZER TOOL FOR TRIALS ON THE FIELD

SCANNING HEAD OF THIS EASYSCAN FOR NEAR FIELD EMISSION

ANALYSIS

EASYSCAN DEVELOPMENT

EMISSION MAPS FROM EASYSCAN

TEST-VEHICULE SPECTRUM ANALYSIS

PIERO IN THE THRIS LAB

TDR ANALYSIS OF THE TEST BOARD FOR ATE-BASED MODELING

THE THRIS BAND ( from the left: GIANCARLO, FLAVIO, PIERO)

OTHER THRIS PEOPLE (FROM THE LEFT: EMMANUEL, FLAVIO, PAOLO, CARLA, GIANCARLO)

PIERO IN THE LAB

DEVELOPMENT OF THE THRIS ATE MODELLING BOARD

BOARD FOR ATE MODELLING

ATE –MODELLING TEST HEAD

ATE MODELLING TEST-ASSEMBLY

EXAMPLE OF TDR-LIKE S11 ACQUISITION FROM

THE ATE MODELLING HEAD

EXPERIMENTAL FIXTURE FOR TDR MEASURMENTS

ON VLSI COMPONENTS.

GIANCARLO (LEFT) AND FLAVIO IN THE LAB

PIERO (LEFT) AND FLAVIO SHOWING THE FULL MODELLING PROCEDURE

COLLECTION OF PICTURES ON ACTUAL THRIS

APPLICATIONS