Post on 23-Jul-2015
RIFLE
engineering testerfor non-volatile memory cells and arrays
• Fast and reliable results• Reduced engineering effort• Improved cost of ownership
Highest Analog PerformanceFast arbitrary waveform generators
o 100 MHz, up to 36Vo For generation of dynamic pulses and reference
signalso Fully synchronized with the digital engine and
measurement unitHigh-speed PMU
o Current and voltage measuremento 70 MHz sampling rate, hardware filtering engineo Up to 8 channels in parallel, 1k sample buffer per
channelo Up to 5nA accuracy in the low current rangeo Fully synchronized with the signal generation
Easy Test DevelopmentStraightforward development
o Test program implementation, debug and analysis in the same environment
o Device specific functionality implemented in a Windows DLL, using C++ and a powerful library
o Test flow can be implemented in C++ or in VIInstallable on desktop
o Low footprinto No need of lab facilities
Extensive Built-In FunctionalityWide range of applications
o Single cell, test array, producto NAND, NOR, NROM, PCM, FeRAM, MRAM, RRAMo SLC and MLCo Serial/parallel/multiplexed/analog interfaceso Wafer and package level
Built-in functionalityo Digital operations: program/erase/verify/reado Vt and Icell:
IV/distribution/bitmapping/galaxy/edge lookupo Support: continuity/iref/icc/disturbs/…o Customizable user functions
True Interactive TestingInteractive test execution
o On-line selection of test functions and parameterso Immediate execution and availability of results
(including bitmaps) on the screen or in datalogsTest flow execution
o Implemented in VI or C++ languageTest result generation
o Bitmaps and detailed test results can be sent on-line via TCP-IP to BarnieMAT (NplusT data analysis suite) for further analysis
o XML-based datalog
NplusT
would like to thank youfor your time and
consideration
for further information: info@n-plus-t.com