Certificate of Compliance - Elmarksupport.elmark.com.pl/moxa/products/Komputery_wbudowane...TRC...

TRC Certificate of Compliance

Training Research Co., Ltd.

hereby certifies that

EMC TEST

x86 Ready-to-Run Embedded Computer Model: V481, V481-CE, V481-XPE, V481-T, V481-T-CE, V481-T-XPE

Made by

Moxa Inc. Fl. 4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City,

Taipei, Taiwan, R.O.C.

is fulfilled (As detailed within the test report) EC Directives: 89/336/EEC, 92/31/EEC, 93/68/EEC, 2004/108/EC

EMI: EN 61000-6-4/2001, EN 61000-3-2/2000, EN 61000-3-3/1995 +A1/2001

EMS: EN 61000-6-2/2005→ EN 61000-4-2:2001, EN 61000-4-3:2002 +A1/2002, EN 61000-4-4: 2004,

EN 61000-4-5:2001, EN 61000-4-6:2003, EN 61000-4-8:2001, EN 61000-4-11:2004

Test Date: June 30, 2007

Certificate Registration No.: M47CE080058 March 14, 2008

---------------------------------------- General Manager, Frank Tsai

Nemko Laboratory Authorisation Aut. No.: ELA 131

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Report No.: M47CE080058 Training Research Co., Ltd., TEL: 886-2-26935155, Fax: 886-2-26934440

Report No. M47CE080058 Directives 89/336/EEC, 92/31/EEC, 93/68/EEC, 2004/108/EC Specifications EMC/ EN 61000-6-2/2001; EN 61000-6-4/2001

Applicant Moxa Inc. Applicant Fl. 4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, address Taipei, Taiwan, R.O.C.

Items tested x86 Ready-to-Run Embedded Computer Model No. V481, V481-CE, V481-XPE, V481-T, V481-T-CE, V481-T-XPE EUT Condition Engineering sample; Pre-production; Final production (Sample # M470058) Results Compliance (As detailed within this report) Date 03/14/2008 (month / day / year) (Sample received) 06/28/2007 ~ 06/30/2007 (Test) Prepared by Project Engineer (Jack Tsai) Authorized by General Manager (Frank Tsai) Issue date March 14, 2008 (month / day / year) Modifications None Tested by Training Research Co., Ltd. Office at No. 255, NanYang Street, Hsichih, Taipei Hsien 221, Taiwan Open site at No. 2, Lane 530, Pa-Lian Rd., Sec. 1, Hsichih, Taipei Hsien, Taiwan

Conditions of issue :

(1) This test report shall not be reproduced except in full, without written approval of TRC. And the test

result contained within this report only relate to the sample submitted for testing.

Authorisation Aut. No.: ELA 131

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Contents

CHAPTER 0 EMISSION AND SUSCEPTIBILITY STANDARDS............................ 4

Emission Standards.................................................................................................... 4

Susceptibility Standards............................................................................................. 4

CHAPTER 1 INTRODUCTION .......................................................................... 5

Description of EUT ................................................................................................... 5

Connections of EUT .................................................................................................. 6

Test method ............................................................................................................... 6

Configuration of Test Setup....................................................................................... 7

Connections of equipment ......................................................................................... 7

List of Support Equipment......................................................................................... 8

CHAPTER 2 CONDUCTED EMISSION TEST .................................................. 10

Test condition and setup .......................................................................................... 10

List of test Instrument.............................................................................................. 11

Conducted Test Placement: (Front view and Side view)......................................... 12

CHAPTER 3 RADIATED EMISSION TEST ...................................................... 13

Radiated Test Placement: (Front view and Rear view) ........................................... 15

CHAPTER 4 ELECTROSTATIC DISCHARGES IMMUNITY TEST .................... 16

ESD Test information:............................................................................................. 16

EN 61000-4-2 PHOTO OF TEST SET-UP............................................................. 19

CHAPTER 5 RADIO FREQUENCY IMMUNITY TEST...................................... 20

RS Test information: ............................................................................................... 20

CHAPTER 6 ELECTRIC FAST TRANSIENT/BURST REQUIREMENTS TEST... 24

EFT Test information: ............................................................................................. 24

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CHAPTER 7 SURGE IMMUNITY TEST........................................................... 28

Surge Test information: ........................................................................................... 28

CHAPTER 8 CONTINUOUS WAVE VOLTAGE IMMUNITY TEST ................... 32

CS Test information: ............................................................................................... 32

CHAPTER 9 POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST ...... 36

PFMF Test information: .......................................................................................... 36

CHAPTER 10 VOLTAGE DIP / INTERRUPTION TEST................................... 38

DIP Test information: .............................................................................................. 38

EN 61000-4-11 PHOTO OF TEST SET-UP........................................................... 40

CHAPTER 10 HARMONICS TEST.................................................................... 41

CHAPTER 11 VOLTAGE FLUCTUATION AND FLICKER TEST........................ 42

APPENDIX A ..................................................................................................... 43

Test Result of Conducted Emissions for Mains power............................................ 43

Test Result of Conducted Emission for Telecommunication .................................. 44

APPENDIX B ..................................................................................................... 45

Test Result of Radiated Emission for Horizontal .................................................... 45

Test Result of Radiated Emission for Vertical ........................................................ 45

APPENDIX C ..................................................................................................... 46

Photographs of EUT ................................................................................................ 46

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Chapter 0 Emission and Susceptibility Standards Emission Standards Emission Standard European Standard International Standard

( ) EN 61000-6-3/2001 IEC 61000-6-3/1996

( X ) EN 61000-6-4/2001 IEC 61000-6-4/1997

( ) EN 50081-1/1992

( ) EN 50081-1/8.93

( X ) EN 55011/1998+A1/1999+A2/2002 CISPR 11: 1997+A1/1999+A2/2002

( ) EN 55014/4.93 CISPR 14: 1993

( ) EN 55015/12.93 CISPR 15: 1992

( ) EN 55013/2001 CISPR 13: 2001

( ) EN 55022/98 +A1/2000 +A2/2003 CISPR 22: 2002

( X ) EN 61000-3-2/2000 IEC 61000-3-2: 2000

( X ) EN 61000-3-3/1995 +A1/2001 IEC 61000-3-3: 1994 +A1/2001

Susceptibility Standards Susceptibility Standard European Standard International Standard

( ) EN 61000-6-1/2001 IEC 61000-6-1/1997

( X ) EN 61000-6-2/2005 IEC 61000-6-2/2005

( ) EN 50082-1/1997

( ) EN 50082-2/1994

( ) EN 55024/1998 +A1/2001 +A2/2003 CISPR 24/1997

( ) EN 55020/2002 CISPR 20/2002

( X ) EN 61000-4-2:2001 IEC 61000-4-2:2001

( X ) EN 61000-4-3:2002 +A1/2002 IEC 61000-4-3:2002 +A1/2002

( X ) EN 61000-4-4:2004 IEC 61000-4-4:2004

( X ) EN 61000-4-5:2001 IEC 61000-4-5:2001

( X ) EN 61000-4-6:2003 IEC 61000-4-6:2003

( X ) EN 61000-4-8:2001 IEC 61000-4-8:2001

( X ) EN 61000-4-11:2004 IEC 61000-4-11:2004

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Chapter 1 Introduction Description of EUT

The EUT is Intel x86 embedded computer. The feature is including CPU ( Processor )

Intel ULV Celeron M 1.0GHz Zero Cache CPU North Bridge Intel 82852GM ( GMCH, Graphic Memory Control Hub ) Memory

DDR Slot x 1 ( Maximum 1GB ) South Bridge Intel 82801DB ( ICH4, I/O Control Hub 4 ) Super I/O Winbond W83627EHF with Hardware Monitor Controller. PHY Buffer Intel 82562GZ LAN Controller RealTek Giga LAN 10\100\1000 Mbps RTL8110SCL FLASH Memory

4Mb Flash memory with SST49LF004B Storage Interface

Compact Flash Slot x 1 + IDE Slot ( 44 pin ) Extension Bus

PCI Bus with PCI104 Slot x 1 USB Interface

USB 2.0 Port x 2, Type A connector. Display Interface VGA Port x 1 Keyboard / Mouse Interface PS2 Port x 2 with Y-Cabel. Audio Interface 3.5∮ Phone Jack x 2 ( Blue：Line In, Lime：Line Out ) LAN Interface RJ45 x 2 ( 10/100 Mbps + 10/100/1000 Mbps ) Serial Interface RS-232/422/485 x 8, software-selectable, DB9 RS-232 signals: TxD, RxD, DTR, DSR, RTS, CTS, DCD, GND RS-422 signals: TxD+, TxD-, RxD+, RxD-, GND 4-wire RS-485 signals: TxD+, TxD-, RxD+, RxD-, GND 2-wire RS-485 signals: Data+, Data-, GND TTL signal: TxD, RxD, DTR, DSR, RTS, CTS, DCD, GND * Note: To use the TTL mode, it is necessary to remove the serial line driver IC. built-in 15KV ESD protection for all signals Data bits = 5, 6, 7, 8 Stop bits = 1, 1.5, 2

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Parity = None, Even, Odd, Space, Mark Flow Control = RTS/CTS, XON/XOFF, RS-485 ADDCTM Speed = 50 bps to 921.6 Kbps, support ANY BUAD RATE Power Interface @ V481 Base Board

ATX-10 Pin Connector. RTC Battery

CR2032 ( 220 mAh ) OTHERS

RTC, buzzer, Watchdog Timer, Reset button It offers Serial Ports*8 (DB9 housing), LAN ETH Ports*2 for 10/100 connectivity.

Connections of EUT

(1) The POWER port is connected with the AC mains supply by power cable. (2) The VGA Port connected with a monitor. (3) MIC-IN Port and Audio-OUT Port connected with a Earphone and MIC. (4) The USB port 1 connected with a USB drive. (5) The USB port 2 connected with a mouse. (6) The PS/2 Port connected with a keyboard. (7) The LAN1, LAN2 ports connected to far LAN card. (8) The P1 to P8 ports are terminated with DB9 housing.

Test method

Pretest was found that the emission of operating mode is worse than standby mode. So, the final test is made at the operating mode.

During the measurement, there are two speeds: “10x10Mbps“, “100x100Mbps“ and “continuous TX / RX at Serial Ports*8”, those speeds simultaneous set up. The software provided by the manufacturer to control the EUT in the mode of continuous TX / RX.

The test placement as the photographs showed is the worst case emission placed. (If the emission is close to the ambient, the resolution BW and view resolution will be reduced and the data will be recorded by detection of maximum hold peak mode.)

The testing configuration of test setup is showing in the next page.

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Configuration of Test Setup Connections of equipment

EUT: *VGA Port …………. a monitor

*MIC-IN Port ………. a Earphone and MIC.

*Audio-OUT Port…. a Earphone and MIC.

*USB#1 Port ….. a mouse

*USB#2 Port ….. a USB Flash

*PS/2-key Port ……... a PS/2 keyboard

* Serial Ports*8 DB9 housing

* AC/DC Adaptor … Manufactory: ENG Model: 3A-621DA24 I/P: 100-240VAC 50-60Hz 1.5A MAX. O/P: +24VDC 2.5A MAX. Primary: 182cm length, Non-shielded, without ferrite core Secondary: 158 cm length, Non-shielded, ferrite core

PS/2 Keyboard

PS/2 Mouse

AC mains supply

Far-end

To far LAN

Earphone

Adaptor

USBFlash

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List of Support Equipment

Monitor : Viewsonic

Model No. : VS10781

Serial No. : PST05420152

FCC ID : DOC Approved

Power type : 100 ~ 240V AC 15A 50/60Hz

Power cord : Shielded, 1.83m long, No ferrite core

Data cable : Shielded, 1.46m (1.80m) long, with two ferrite cores (no ferrite core)

PS/2 Mouse : HP

Model No. : M-S34

Serial No. : LZB90714106

FCC ID : DZL211029

Power type : By PC

Power cord : Non-shielded, 1.88m long, No ferrite core

PS/2 Keyboard : HP

Model No. : 5187-0343, KB0133

Serial No. : 265987-AB1 Tch 323686-AB1, B69360MGAPW0HF

FCC ID : DoC Approved

BSMI : 3892C981, R31310

Power type : By PC

Data cable : Shielded, 1.85m length, no ferrite core

Earphones : PHILIPS

Model No : SBC-HE033

Serial No. : 670904

Power type : By EUT

Data Cable : Non-shielded, 1.05 m length, No ferrite core

Flash Drive : City-Netek Inc.

Model No. : CN-2108

Power cord : Shielded, 1.0m length, no ferrite core

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PC : IBM ThinkPad T43

Model No. : 2668-IVE

Serial No. : L3TGYY

FCC ID : N/A, DoC Approved

BSMI : R33B65

DGT : ETC093LPD0126, CTL093LPD0257

Power adaptor : IBM

Part No. : 92P1018

Serial No. : 11S92P1018Z1ZAPU57M9W6 REV: D

BSMI : D33030

Power type : 100 ~ 240VAC / 50 ~ 60Hz, 1.0 ~ 0.4A, Switching

Power cord : Primary: Non-shielded, 1.0m length, Plastic hood, No ferrite core

Secondary: Shielded, 1.84m length, Plastic hood, ferrite core

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Chapter 2 Conducted Emission Test

Test condition and setup All the equipment is placed and setup according to EN 55011.

(1) Mains power: The EUT is assembled on a wooden table, which is 80 cm high and placed 40 cm from the

back-wall, which is a vertical conducting plane. One LISN is for EUT, the other LISN is for support equipment. They are all placed on the conductive ground. The EUT’s LISN connect a line switch box for selecting L1 or L2, then connect to a preamplifier and receiver.

(2) Telecommunication port: The EUT is place as mains disturbance test. The communication line connected to ISN and

then the measuring receiver connected to the ISN to measured the level of voltage disturbance or current probe to measured the level of current disturbance

The spectrum scans from 150KHz to 30MHz. Conducted emission levels are detected at maximum peak mode. But if the maximum peak mode failed or over average limit, it will be measured by average detection mode.

While testing the worst-emission plot printed in the peak detection mode, and there are up to 6 highest emissions to be recorded. The plot is kept as the original data and not included in the test report.

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List of test Instrument

Calibration Date

Instrument Name Model Brand Serial No. Next time

Receiver SCR3102 SCHAFFNER 012 12/09/07

Spectrum Analyzer FSL3 ROHDE & SCHWARZ

100507 12/07/07

LISN 3825/2 EMCO 9411-2284 08/18/07

LISN 3825/2 EMCO 9210-2007 08/18/07

Switch Box Sb-01 TRC 98-04 04/01/08

Pre-amplifier CNIJ69051 TRC 96061 04/01/08

Coaxial cable BNC3200B-0058 JYEBAO CL-003 04/01/08

Coaxial Cable BNC31VB-0316 JYEBAO IF-01C0069-036

04/01/08

Coaxial Cable BNC3200B-0058 JYEBAO CL-05 04/01/08

Isolation Transformer FTB-1-6 MINI- CIRCUITS

15542 04/01/08

20dB attenuator CAT-20 MIN- CIRCUITS

960113 04/01/08

50 Ohm Terminator 370BNM NARDA PWR5W 07/21/07

ISN T400 Schaffner 19104 08/07/07

Current Probe 9208-1 Solar Electronics

0411601 07/12/07

The level of confidence of 95%, the uncertainty of measurement of conducted emission is +3.10dB / -4.84dB.

Test Result: Pass (Appendix A)

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Conducted Test Placement: (Front view and Side view)

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Chapter 3 Radiated Emission Test Test condition and setup Pretest:

Prior to the final test (OATS test), the EUT is placed in an anechoic chamber, and scan from 30MHz to 1GHz. This is done to ensure the radiation is exactly emitted from the EUT.

Final test: Final radiation measurements are made on a 10–meter, open-field test site The EUT is placed on a nonconductive table, which is 0.8m height, the top surface is 1.0 x

1.5 meter. The entire placement is according to EN 55011. The spectrum is examined from 30MHz to 1GHz measured by HP spectrum. The whole range antenna is used to measure frequency from 30MHz to 1GHz.

The final test is used the spectrum analyzer. Measure more than six top marked frequencies generated form pretest by computer step by step at each frequency. The EUT is rotated 360 degrees, and antenna is raised and lowered from 1 to 4 meters to find the maximum emission levels. The antenna is used with both horizontal and vertical polarization. Appropriated preamplifier which is made by TRC is used for improving sensitivity and precautions is taken to avoid overloading .The spectrum analyzer’s 6dB bandwidth is set to 120kHz, and the EUT is measured at quasi-peak (below 1GHz) mode. If the emission is close to the frequency band of ambient, the tester will recheck the data and the corrected data will be written in the test data sheet. If the emission is just within the ambient, the data from shielded room will be taken as the final data.

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Calibration Date

EMI Receiver 8546A HP 3520A00242 09/06/07

RF Filter Section 85460A HP 3448A00217 09/06/07

Small Biconical Antenna

UBAA9114 & BBVU9135

SCHWARZECK 127 12/17/07

Pre-amplifier PA1F TRC 1FAC 04/10/08

Auto Switch Box (>30MHz)

ASB-01 TRC 9904-01 04/10/08

Coaxial Cable (Double shielded, 15 meter)

A30A30-0058-50FS-15M

JYEBAO SMA-01 04/10/08

Coaxial Cable (1.1 meter)

A30A30-0058-50FS-1M JYEBAO SMA-02 04/10/08

100507 12/07/07

Bi-log Antenna VULB 9168 SCHWARZEBECK

9168-231 07/31/07

Coaxial cable N30N30-JBY400 JYEBAO CL-011 04/01/08

Coaxial Cable A30A30-0316 JYEBAO CL-012 04/01/08

Coaxial Cable A30A30-0316 JYEBAO CL-013 04/01/08 ISN ISN T400 SCHAFFNER 19104 08/07/07 Current Probe 9208-1 SOLAR

ELECTRONICS CO.

0411601 07/12/07

The level of confidence of 95% , the uncertainty of measurement of radiated emission is +2.85dB / -2.77dB .

Test Result: Pass (Appendix B)

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Radiated Test Placement: (Front view and Rear view)

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Chapter 4 Electrostatic Discharges Immunity Test

ESD Test information: Test setup: Shielded room Test setup for table-top equipment at laboratory tests:

Ground Reference Plane

Wooden table H=0.8m 470kohmResistor

Insulation

Power Supply

VPC 0.5m X 0.5m

Horizontal coupling place 1.6m X 0.8m

Typical position for indirect discharge to VCP

Typical position for indirect discharge

Typical position for indirect discharge to HCP

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Test levels: (Apply Level 2 and Level 3)

1a — Contact discharge 1b — Air discharge Level Test voltage

(kV) Level Test voltage

(kV) 1 2 1 2 2 4 2 4 3 6 3 8 4 8 4 15 X Special X Special

NOTE: “X” is an open level. The level has to be specified in the dedicated equipment specification. If higher voltages than those shown are specified, special test equipment may be needed.

Test Voltage: 4KV contact discharge 8KV air discharge Indirect Discharges: HCP VCP Polarity: Positive Negative Test points: Each Connector and Enclosure of EUT. Test mode: Ref. Test method of Chapter 1

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Test instruments: Name Model Number Serial Number Selected Best Plus BURST ESD SURGE TRANSIENTS

Best Plus V6.2 199749-019SC

SCHAFFNER EMV AG

NSG 438 INA 4380

BEST EMC Test Instrument

BEST EMC V2.3 (-8, -9)

199918-006SC

Comment: Performance Criteria ( ) A ( X ) B ( ) C General performance criteria of EMS: CRITERION A

The apparatus shall continue to operate as intended. No degradation of performance or loss of

function is allowed below a performance level specified by the manufacturer, when the apparatus is

used as intended.

CRITERION B

The apparatus shall continue to operate as intended after the test. No degradation of performance or

loss of function is allowed below a performance level specified by the manufacturer, when the

apparatus is used as intended.

CRITERION C

Temporary loss of function is allowed, provided the function is self-recoverable or can be restored by

the operation of the controls.

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EN 61000-4-2 PHOTO OF TEST SET-UP

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Chapter 5 Radio Frequency Immunity Test

RS Test information: Test setup: Fully anechoic chamber, According to EN 61000-4-3 Radiated Immunity Test Setup

Test levels: (Apply Level 1, 2 and 3)

Level Test Field Strength (V/m)

1 1 2 3 3 10 X Special

NOTE: the “X” is an open test level. This level may be given in the product specification.

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Test Frequency: 80 ~ 1000 MHz, 10V/m 1400 ~ 2000 MHz, 3V/m 2000 ~ 2700 MHz, 1V/m Modulation: FM % 80% AM Modulation with 1KHz Step size: ≦1% step size Sweep time: 2.5 Second for each frequency Test mode: Refer to test method of Chapter 1 Test instruments: Name Model Number Serial Number Selected Amplifier Research RF Amplifier (0.8 – 3GHz)

15S1G3 305899 X

Amplifier Research 40dB Attenuator

DC7144 305930 X

Mini-Circuits RF Amplifier (20 – 500MHz)

LZT-1 N/A X

Mini-Circuits RF Amplifier (500 – 1GHz)

LZT-2 N/A X

EMCO Bi-log Antenna

3141 9711-1075 X

TRC Horn Antenna

HA0501-05 RS-01 X

HP Signal Generator

8648D 3613A00117 X

HP Power Meter

E4418B GB39291240 X

WG radiation meters

EMC-20 BN2244129 X

WG E-filed

2244 / 90.20 Z-0001 X

GW DC Power Supply

GPR-3520HD A150114 X

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Comment: Performance Criteria ( X ) A ( ) B ( ) C General performance criteria of EMS: CRITERION A

used as intended.

CRITERION B

CRITERION C

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Chapter 6 Electric Fast Transient/Burst Requirements Test

EFT Test information: General test set-up for laboratory type tests:

> 0.25 m

AC mains supply

EFT/B- generator

Coupling / decoupling network (A)

Non-metallic table

Reference plane

EFT/B- generator (B)

AC mains supply Capacitive

coupling clamp

Grounding connectionaccording to the manufacturer’s specification. Length to be specified in the test plan.

Insulating support

Referenceplane

(L) = length between clamp and EUT to be tested, should not be more than 1-meter

(A) = location for supply line coupling (B) = location for signal lines coupling

> 0.25 m

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Test levels: (Apply Level 3)

Open-circuit output test voltage (±10%) and repetition rate of the impulses (±20%) On power supply port, PE On input/output signal, data and

control ports Level

Voltage peak kV

Repetition rate kHz

Voltage peak kV

Repetition rate kHz

1 0.5 5 0.25 5 2 1 5 0.5 5 3 2 5 1 5 4 4 2.5 2 5 X Special Special Special Special

NOTE: the “X” is an open level. The level has to be specified in the dedicated equipment specification

Test setup: According to EN 61000-4-4 Test Voltage: DC Power line 0.5 KV, 5 KH AC Power line 2.0 KV, 5 KHz

Signal & Control line 0.5 KV, 5 KHz 1.0 KV, 5 KHz Polarity: Positive Negative Test Duration: 1 minute 3 minutes Connected lines: Power line shielded Power line non-shielded Signal & Control line non-shielded Signal & Control line shielded

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Test mode: Ref. Test method of Chapter 1. Test instrument: Name Model Number Serial Number Selected Best Plus BURST ESD SURGE TRANSIENTS

KeyTek Instrument EFT Test system

E412 9505206/505207 X

BEST EMC V2.3 (-8, -9)

199918-006SC

used as intended.

CRITERION B

CRITERION C

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Chapter 7 Surge Immunity Test

Surge Test information: Test setup: According to EN 61000-4-5 Test levels: (Apply Level 2 and Level 3)

Level Test Field Strength (kV)

1 0.5 2 1.0 3 2.0 4 4.0 X Special

NOTE: the “X” is an open class. This level may be specified in the product specification.

Coupling Line Voltage(kV) Polarity Coupling Method Load (ohm) L-N 1 Positive./Negative Capacitive 2

L-N to Ground 2 Positive./Negative Capacitive 12 LAN 1 Positive./Negative Capacitive 42

Surge Immunity Test (KeyTek Pulsed-EMI Test System)

PC System Monitor

Ethernet LAN System

Simulator

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Test Voltage: DC Power line 0.5 KV AC Power line Line – Line: 1KV Line – Ground: 2KV

Control line 0.5 KV

Signal 1 KV Voltage waveform: 1.2/50µs Current waveform: 8/20µs Polarity: Positive Negative Connected lines: Power line shielded Power line non-shielded Signal & Control line non-shielded Signal & Control line shielded Test mode: Ref. Test method of Chapter 1. Test instrument: Name Model Number Serial Number Selected Best Plus BURST ESD SURGE TRANSIENTS

BEST EMC V2.3 (-8, -9)

199918-006SC

KeyTek Pulsed-EMI Test System

E501B 0008260 X

E4552A 0008264 X

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used as intended.

CRITERION B

CRITERION C

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Chapter 8 Continuous Wave Voltage Immunity Test

CS Test information: Test setup: According to EN 61000-4-6 Immunity test to RF conducted disturbances: Test levels: (Apply Level 3)

Frequency range 150kHz to 80MHz Voltage level (e.m.f.)

Level Uo [dB(µv)] Uo [V]

1 120 1 2 130 3 3 140 10 X Special

NOTE: the “X” is an open test level.

CDN Auxiliary

equipment 1 Equipment under test CDN

Auxiliary equipment 1

Ground reference plane 0.1 m support

RF — generator

T: Termination 50ohm T2: Power attenuator

CDN: Coupling and decoupling network

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Test Frequency: 0.15 ~ 80MHz Modulation: FM % 80% AM Modulation with 1KHz Step size: ≦1% Step size Signal Strength: 1Vrms 3Vrms 10Vrms Test mode: Ref. Test method of Chapter 1 Test instruments: Name Model Number Serial Number Selected FRANKONIA EMV–Mess–System

CIT-10 103A3113 X

FRANKONIA CDN

M2+M3 A3011015 X

FRANKONIA CDN

T2-801 A3010002

FRANKONIA CDN

T4-801 A3015004 X

FRANKONIA CDN

S1-801 A3005002

SCHAFFNER FM-Koppelzange

KEMZ 801 17045

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used as intended.

CRITERION B

CRITERION C

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Chapter 9 Power Frequency Magnetic Field Immunity Test

PFMF Test information: Test setup: According to EN 61000-4-8 Testing site: Temperature : 23° C Humidity : 64 % RH Test setup: According to EN 61000-4-8 Test method : ( X ) Continuous ( ) Short duration Magnetic Field Strength: ( ) 1A/m ( ) 10A/m ( X ) 100A/m Frequency: 50Hz polarization: ( X ) X polarization ( X ) Y polarization ( X ) Z polarization Test mode: Ref. Test method of Chapter 1 Test Duration: ( X ) 30 seconds ( ) 1~3 seconds Connected lines: ( ) Power line shielded ( X ) Power line non-shielded ( X ) Signal & Control line non-shielded ( ) Signal & Control line shielded ** Power Frequency Magnetic Field in the horizontal and vertical polarity.** Test instruments: Name Model Number Serial Number Selected Partner EMS Tester

Transienter-1000 PIO X

EMC Partner EUT-Power Transient-1000

MF1000-1-75 X

Comment: Performance Criteria: ( X ) A ( ) B ( ) C Test Result : Pass

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Chapter 10 Voltage DIP / Interruption Test DIP Test information: Test setup: According to EN 61000-4-11 Voltage dips: 100% , 1 Period 30% , 25 Period 60% , 10 Period Voltage interruptions: 100% , 250 Periods Test mode: Ref. Test method of Chapter 1 Test instruments: Name Model Number Serial Number Selected Best Plus BURST ESDSURGE TRANSIENTS

BEST EMC V2.3 (-8, -9)

199918-006SC

Partner EMS Tester

Test Report ------------------------------------------------------------------------------- 39/55

Comment: Performance Criteria: Dips (1) 100% ( ) A ( X ) B ( ) C Dips (2) 30% ( ) A ( ) B ( X ) C Dips (3) 60% ( ) A ( ) B ( X ) C Interruptions (1) 100% ( ) A ( ) B ( X ) C General performance criteria of EMS: CRITERION A

used as intended.

CRITERION B

CRITERION C

Test Report ------------------------------------------------------------------------------- 40/55

Test Report ------------------------------------------------------------------------------- 41/55

Chapter 10 Harmonics Test Test information: Test setup: According to EN 61000-3-2 Test Item: Quasi – stationary & Fluctuating Current Harmonics Test. Test mode: Ref. Test method of Chapter 1 Test instrument: Name Model Number Serial Number Harmonic/ Flicker Test System

HP 6843A 3531A-00227

Test Equipment Settings: Quasi-stationary Current

Harmonics Test Fluctuating Current Harmonics Test

Line Voltage 230VAC

230VAC

Line Frequency 50Hz

Device Class A

Test Limit Overrides None

Total Number of Failures None

Total Number of Errors None

Test Result: Pass

Test Report ------------------------------------------------------------------------------- 42/55

Chapter 11 Voltage Fluctuation and Flicker Test

Test information: Test setup: According to EN 61000-3-3 Test mode: Ref. Test method of Chapter 1 Test instrument: Name Model Number Serial Number Harmonic/Flicker Test System

HP 6843A 3531A-00227

Test Equipment Settings Line Voltage

230VAC

Line Frequency

Test Limit Overrides

Total Number of Failures

Pst: (0), Plt: (0) Dc: (0), Dmax (0), Dt (0)

Total Number of Errors

Test Result: Pass

Test Report ------------------------------------------------------------------------------- 43/55

Appendix A Test Result of Conducted Emissions for Mains power

Testing room : Temperature : 25 ° C Humidity : 73 % RH Line 1

READING AMPLITUDE LIMIT Frequency

(kHz) Peak

(dBµV) Quasi-Peak

(dBµV) Average (dBµV)

Quasi-Peak(dBµV)

Average (dBµV)

Margin

191.000 50.19 --- --- 79.00 66.00 -15.81317.000 46.74 --- --- 79.00 66.00 -19.26572.000 45.08 --- --- 73.00 60.00 -14.92

1334.000 45.38 --- --- 73.00 60.00 -14.622208.000 47.50 --- --- 73.00 60.00 -12.503040.000 47.58 --- --- 73.00 60.00 -12.424688.000 47.53 --- --- 73.00 60.00 -12.477360.000 42.51 --- --- 73.00 60.00 -17.49

24120.000 33.12 --- --- 73.00 60.00 -26.88

Line 2 READING AMPLITUDE LIMIT

Frequency (kHz)

Peak (dBµV)

Quasi-Peak(dBµV)

Average (dBµV)

Quasi-Peak(dBµV)

Average (dBµV)

Margin

150.000 52.20 --- --- 79.00 66.00 -13.80191.000 50.25 --- --- 79.00 66.00 -15.75317.000 48.69 --- --- 79.00 66.00 -17.31

1012.000 44.92 --- --- 73.00 60.00 -15.081837.000 46.93 --- --- 73.00 60.00 -13.073040.000 47.42 --- --- 73.00 60.00 -12.584688.000 46.70 --- --- 73.00 60.00 -13.307360.000 43.47 --- --- 73.00 60.00 -16.53

29420.000 33.48 --- --- 73.00 60.00 -26.52

Note: 1. The reading amplitudes are all under limit. 2. Testing result = Amplitude reading + Correction factor (Insertion loss of LISN, Cable loss,

Attenuator, Amplifier and so on)

Test Report ------------------------------------------------------------------------------- 44/55

Test Result of Conducted Emission for Telecommunication

Testing room : Temperature : 25.0 ° C Humidity : 73.0 % RH 10Mbps

(KHz) Peak

(dBµV) Quasi-Peak

Quasi-Peak(dBµV)

Average (dBµV)

Margin

187.000 41.75 --- --- 95.94 82.94 -41.19250.000 36.30 --- --- 94.14 81.14 -44.84504.000 42.85 --- --- 87.00 74.00 -31.15

1437.000 50.59 --- --- 87.00 74.00 -23.411924.000 48.01 --- --- 87.00 74.00 -25.993004.000 42.38 --- --- 87.00 74.00 -31.628610.000 48.10 --- --- 87.00 74.00 -25.90

12250.000 42.48 --- --- 87.00 74.00 -31.5215270.000 36.35 --- --- 87.00 74.00 -37.65

100Mbps

(KHz) Peak

(dBµV) Quasi-Peak

Quasi-Peak(dBµV)

Average (dBµV)

Margin

191.000 41.82 --- --- 95.83 82.83 -41.01366.000 46.10 --- --- 90.83 77.83 -31.73622.000 46.83 --- --- 87.00 74.00 -27.17

1017.000 53.60 --- --- 87.00 74.00 -20.401503.000 51.86 --- --- 87.00 74.00 -22.143030.000 54.70 --- --- 87.00 74.00 -19.305240.000 56.65 --- --- 87.00 74.00 -17.357930.000 54.84 --- --- 87.00 74.00 -19.16

16160.000 62.92 --- --- 87.00 74.00 -11.0823120.000 63.05 --- --- 87.00 74.00 -10.95

Test Report ------------------------------------------------------------------------------- 45/55

Appendix B Test Conditions: Testing room : Temperature : 25 ° C Humidity : 73 % RH Testing site : Temperature : 25 ° C Humidity : 73 % RH Test Result of Radiated Emission for Horizontal

Frequency Reading Amplitude

Ant. Height

Correction Factors

Corrected Amplitude

Class A Limit

Margin

MHz dBµV m degree dB/m dBµV/m dBµV/m dB

250.0070 38.20 3.57 0 -4.95 33.25 47.00 -13.75

331.7640 37.87 1.00 46 -1.81 36.06 47.00 -10.94

500.0150 30.75 2.27 0 2.91 33.66 47.00 -13.34

600.4280 33.76 2.41 327 5.86 39.62 47.00 -7.38 Test Result of Radiated Emission for Vertical

Ant. Height

Correction Factors

Corrected Amplitude

Class A Limit

Margin

120.0010 37.57 1.00 137 -7.26 30.31 40.00 -9.69

145.9220 35.77 1.00 124 -4.72 31.05 40.00 -8.95

196.1960 36.90 3.63 0 -6.57 30.33 40.00 -9.67

596.9610 33.68 2.80 74 5.75 39.43 47.00 -7.57

940.8420 28.84 3.94 0 11.17 40.01 47.00 -6.99

Note: 1. Margin = Amplitude – limit, if margin is minus means under limit. 2. Corrected Amplitude = Reading Amplitude + Correction Factors 3. Correction factor = Antenna factor + (Cable Loss – Amplitude gain) + Switching Box Loss

Test Report ------------------------------------------------------------------------------- 46/55

Appendix C

Photographs of EUT

External Photos of EUT ------------------------------------------------------------ 47/55

Power Supply of EUT --------------------------------------------------------------- 49/55

Internal Photos of EUT ------------------------------------------------------------- 50/55

TRC Certificate of Compliance

Training Research Co., Ltd.

hereby certifies that

EMC TEST

x86 Ready-to-Run Embedded Computer Model: ThinkCore V481, ThinkCore V481-CE, ThinkCore V481-XPE, ThinkCore V481-T, ThinkCore V481-T-CE, ThinkCore V481-T-XPE

Made by

Moxa Technologies Co., Ltd. Fl. 4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City,

Taipei, Taiwan, R.O.C.

is fulfilled (As detailed within the test report) EC Directives: 89/336/EEC, 92/31/EEC, 93/68/EEC, 2004/108/EC

EMI: EN 61000-6-4/2001, EN 61000-3-2/2000, EN 61000-3-3/1995 +A1/2001

EMS: EN 61000-6-2/2005→ EN 61000-4-2:2001, EN 61000-4-3:2002 +A1/2002, EN 61000-4-4: 2004,

EN 61000-4-5:2001, EN 61000-4-6:2003, EN 61000-4-8:2001, EN 61000-4-11:2004

Test Date: June 30, 2007

Certificate Registration No.: M47CE061207 June 30, 2007

---------------------------------------- General Manager, Frank Tsai

Nemko Laboratory Authorisation Aut. No.: ELA 131

Test Report ------------------------------------------------------------------------------- 1/55

Report No. M47CE061207 Directives 89/336/EEC, 92/31/EEC, 93/68/EEC, 2004/108/EC Specifications EMC/ EN 61000-6-2/2001; EN 61000-6-4/2001

Applicant Moxa Technologies Co., Ltd. Applicant Fl. 4, No. 135, Lane 235, Pao-Chiao Rd., Shing Tien City, address Taipei, Taiwan, R.O.C.

Items tested x86 Ready-to-Run Embedded Computer Model No. ThinkCore V481, ThinkCore V481-CE, ThinkCore

V481-XPE, ThinkCore V481-T, ThinkCore V481-T-CE, ThinkCore V481-T-XPE

EUT Condition Engineering sample; Pre-production; Final production (Sample # M471207) Results Compliance (As detailed within this report) Date 06/28/2007 (month / day / year) (Sample received) 06/28/2007 ~ 06/30/2007 (Test) Prepared by Project Engineer (Jack Tsai) Authorized by General Manager (Frank Tsai) Issue date June 30, 2007 (month / day / year) Modifications None Tested by Training Research Co., Ltd. Office at No. 255, NanYang Street, Hsichih, Taipei Hsien 221, Taiwan Open site at No. 2, Lane 530, Pa-Lian Rd., Sec. 1, Hsichih, Taipei Hsien, Taiwan